Patents by Inventor Yoshiei Hasegawa

Yoshiei Hasegawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8721372
    Abstract: Respective plungers are slidably supported in a stable manner without fluctuation, and reliable electrical contact is achieved. In a contact of the present invention, a first plunger and a second plunger include tip end portions provided on tip end sides, slidably supported, and contacting two respective members and sliding portions provided on proximal end sides, formed in halved shapes of the respective plungers, slidably overlapped with each other, and inserted in a compression coil spring. Each of the sliding portions is set to have a length to be slidably supported together with the tip end portion of the other plunger.
    Type: Grant
    Filed: February 5, 2010
    Date of Patent: May 13, 2014
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventor: Yoshiei Hasegawa
  • Publication number: 20120214356
    Abstract: Respective plungers are slidably supported in a stable manner without fluctuation, and reliable electrical contact is achieved. In a contact of the present invention, a first plunger and a second plunger include tip end portions provided on tip end sides, slidably supported, and contacting two respective members and sliding portions provided on proximal end sides, formed in halved shapes of the respective plungers, slidably overlapped with each other, and inserted in a compression coil spring. Each of the sliding portions is set to have a length to be slidably supported together with the tip end portion of the other plunger.
    Type: Application
    Filed: February 5, 2010
    Publication date: August 23, 2012
    Applicant: KABUSHIKI KAISHA NIHON MICRONICS
    Inventor: Yoshiei Hasegawa
  • Patent number: 7764073
    Abstract: The electrical connecting apparatus comprises: a wiring base plate having a first surface provided with a plurality of first conductive portions; a probe base plate having a second surface provided with a plurality of second conductive portions with its second surface opposed to the lower surface; a plurality of screws for removably coupling the wiring base plate and the probe base plate; and a connecting device for electrically connecting the first and second conductive portions.
    Type: Grant
    Filed: April 18, 2005
    Date of Patent: July 27, 2010
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventor: Yoshiei Hasegawa
  • Patent number: 7728608
    Abstract: A method for assembling an electrical connecting apparatus having a support member, a probe board, and spacers arranged between the support member and the probe board. A height of at least either each abutting part of the support member or each abutting part of the probe board facing the abutting part is measured, and a length of each of the plurality of spacers is measured. Based on measurement values obtained by these measurements, a spacer appropriate for maintaining tips of numerous probes provided on the probe board on the same plane is selected for each pair of the both abutting parts.
    Type: Grant
    Filed: October 24, 2005
    Date of Patent: June 1, 2010
    Assignee: Kabushiki Naisha Nihon Micronics
    Inventor: Yoshiei Hasegawa
  • Publication number: 20090284273
    Abstract: A method for assembling an electrical connecting apparatus having a support member, a probe board, and spacers arranged between the support member and the probe board. A height of at least either each abutting part of the support member or each abutting part of the probe board facing the abutting part is measured, and a length of each of the plurality of spacers is measured. Based on measurement values obtained by these measurements, a spacer appropriate for maintaining tips of numerous probes provided on the probe board on the same plane is selected for each pair of the both abutting parts.
    Type: Application
    Filed: October 24, 2005
    Publication date: November 19, 2009
    Applicant: KABUSHIKI KAISHA NIHON MICRONICS
    Inventor: Yoshiei Hasegawa
  • Patent number: 7559773
    Abstract: The present invention prevents damage of adjacent mounting portions caused by heat at the time of mounting of contactors and further reduces the arrangement pitch of the contactors. An electrical connecting apparatus uses at least four types of contactors different in terms of at least the shapes of seat portions and the height positions of arm portions. Each of such contactors has a seat portion mounted on a mounting portion of a board, an arm portion extending in the left-right direction from the lower end of the seat portion, and a probe tip portion extending downward from the tip end portion of the arm portion and having a probe tip at the lower end. These contactors are mounted in parallel in a cantilevered manner alternately in the front-back direction with the mounting positions to the board displaced in the left-right direction.
    Type: Grant
    Filed: October 7, 2008
    Date of Patent: July 14, 2009
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventor: Yoshiei Hasegawa
  • Patent number: 7532020
    Abstract: A probe assembly having a plurality of probes, each of which is secured to an anchor portion on a probe base plate, extends in a direction apart from the anchor portion through a fulcrum, has a tip at the front end thereof, and the tip is elastically deformable at its front end side when pressed against a corresponding electrode pad. Two probe groups are constituted: in the first group, the tips are arranged on one side of an imaginary straight line of the probe base plate, while in the second probe group, the tips are arranged on the other side of the imaginary straight line. The numbers of the probes of both probe groups are different, and a part of the probes forming one probe group with more probes are arranged in the opposite direction to that of the other probes of the same probe group.
    Type: Grant
    Filed: June 4, 2007
    Date of Patent: May 12, 2009
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Yoshiei Hasegawa, Masashi Hasegawa
  • Publication number: 20090117759
    Abstract: The present invention prevents damage of adjacent mounting portions caused by heat at the time of mounting of contactors and further reduces the arrangement pitch of the contactors. An electrical connecting apparatus uses at least four types of contactors different in terms of at least the shapes of seat portions and the height positions of arm portions. Each of such contactors has a seat portion mounted on a mounting portion of a board, an arm portion extending in the left-right direction from the lower end of the seat portion, and a probe tip portion extending downward from the tip end portion of the arm portion and having a probe tip at the lower end. These contactors are mounted in parallel in a cantilevered manner alternately in the front-back direction with the mounting positions to the board displaced in the left-right direction.
    Type: Application
    Filed: October 7, 2008
    Publication date: May 7, 2009
    Applicant: Kabushiki Kaisha Nihon Micronics
    Inventor: Yoshiei Hasegawa
  • Publication number: 20090061658
    Abstract: The electrical connecting apparatus comprises: a wiring base plate having a first surface provided with a plurality of first conductive portions; a probe base plate having a second surface provided with a plurality of second conductive portions with its second surface opposed to the lower surface; a plurality of screws for removably coupling the wiring base plate and the probe base plate; and a connecting device for electrically connecting the first and second conductive portions.
    Type: Application
    Filed: April 18, 2005
    Publication date: March 5, 2009
    Applicant: Kabushiki Kaisha Nihon Micronics
    Inventor: Yoshiei Hasegawa
  • Patent number: 7377788
    Abstract: An electrical connecting apparatus comprises: a base plate provided with a first and a second mounting portion groups respectively having a plurality of first and second mounting portions arranged so as to be alternately positioned in a first direction; and a first and a second contact groups respectively having a plurality of first and second contacts individually mounted on the first and second mounting portions and in a cantilever state, the first and second contacts being displaced from each other in a second direction intersecting the first direction at the mounting positions on the base plate. This prevents any damage to adjacent mounting portions due to heat at the time of mounting the contacts, so that an arrangement pitch of the contacts can be made small.
    Type: Grant
    Filed: July 11, 2006
    Date of Patent: May 27, 2008
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventor: Yoshiei Hasegawa
  • Publication number: 20080007282
    Abstract: A probe assembly having a plurality of probes, each of which is secured to an anchor portion on a probe base plate, extends in a direction apart from the anchor portion through a fulcrum, has a tip at the front end thereof, and the tip is elastically deformable at its front end side when pressed against a corresponding electrode pad. Two probe groups are constituted: in the first group, the tips are arranged on one side of an imaginary straight line of the probe base plate, while in the second probe group, the tips are arranged on the other side of the imaginary straight line. The numbers of the probes of both probe groups are different, and a part of the probes forming one probe group with more probes are arranged in the opposite direction to that of the other probes of the same probe group.
    Type: Application
    Filed: June 4, 2007
    Publication date: January 10, 2008
    Applicant: KABUSHIKI KAISHA NIHON MICRONICS
    Inventors: Yoshiei Hasegawa, Masashi Hasegawa
  • Patent number: 7255575
    Abstract: In the electrical connecting apparatus, a plurality of pins on a ceramic base plate so as to project from one face of the ceramic base plate, a resin base plate including a plurality of conductive portions electrically connected to those pins on the other face of the ceramic base plate and a plurality of recesses opening on the side of the ceramic base plate in the socket device so as to receive pins individually are disposed, and a plurality of pairs of holding members for releaseably holding the pins received in the recesses are provided, thereby coupling the ceramic base plate with the socket device and coupling the socket device with the wiring base plate.
    Type: Grant
    Filed: October 20, 2006
    Date of Patent: August 14, 2007
    Inventor: Yoshiei Hasegawa
  • Publication number: 20070159194
    Abstract: A probing apparatus comprising: an inspection stage for receiving a flat plate-like device under test with a plurality of electrodes and moving the device under test on the inspection stage in at least three directions, that is, an X direction and a Y direction intersecting each other within a parallel plane to the device under test, and a Z direction intersecting both the directions; a probe card having a plurality of probes and spaced apart from the inspection stage in the Z direction such that the probe tips face the inspection stage; a displacement mechanism for relatively displacing the probe card and the inspection stage for adjustment of parallelism of the device under test on the inspection stage and the probe card; a plurality of measuring instruments respectively for measuring the interval between the inspection stage and the probe card and arranged at intervals in one of the inspection stage and the probe card in the X direction and the Y direction; a control portion for controlling at least the me
    Type: Application
    Filed: January 9, 2007
    Publication date: July 12, 2007
    Inventors: Yoshiei Hasegawa, Hikaru Masuda, Katsuo Yasuda, Kenichi Washio, Masashi Hasegawa
  • Publication number: 20070159192
    Abstract: A probing apparatus comprising: an inspection stage for receiving a flat plate-like device under test with a plurality of electrodes and moving the device under test on the inspection stage in at least three directions, that is, an X direction and a Y direction intersecting each other within a parallel plane to the device under test, and a Z direction intersecting both the directions; a probe card having a plurality of probes and spaced apart from the inspection stage in the Z direction such that the probe tips face the inspection stage; a displacement mechanism for relatively displacing the probe card and the inspection stage for adjustment of parallelism of the device under test on the inspection stage and the probe card; a plurality of measuring instruments respectively for measuring the interval between the inspection stage and the probe card and arranged at intervals in one of the inspection stage and the probe card in the X direction and the Y direction; a control portion for controlling at least the me
    Type: Application
    Filed: January 4, 2007
    Publication date: July 12, 2007
    Inventors: Yoshiei Hasegawa, Hikaru Masuda, Katsuo Yasuda, Kenichi Washio, Masashi Hasegawa
  • Publication number: 20070096749
    Abstract: An electrical connecting apparatus comprises: a base plate provided with a first and a second mounting portion groups respectively having a plurality of first and second mounting portions arranged so as to be alternately positioned in a first direction; and a first and a second contact groups respectively having a plurality of first and second contacts individually mounted on the first and second mounting portions and in a cantilever state, the first and second contacts being displaced from each other in a second direction intersecting the first direction at the mounting positions on the base plate. This prevents any damage to adjacent mounting portions due to heat at the time of mounting the contacts, so that an arrangement pitch of the contacts can be made small.
    Type: Application
    Filed: July 11, 2006
    Publication date: May 3, 2007
    Inventor: Yoshiei Hasegawa
  • Publication number: 20070099446
    Abstract: In the electrical connecting apparatus, a plurality of pins on a ceramic base plate so as to project from one face of the ceramic base plate, a resin base plate including a plurality of conductive portions electrically connected to those pins on the other face of the ceramic base plate and a plurality of recesses opening on the side of the ceramic base plate in the socket device so as to receive pins individually are disposed, and a plurality of pairs of holding members for releaseably holding the pins received in the recesses are provided, thereby coupling the ceramic base plate with the socket device and coupling the socket device with the wiring base plate.
    Type: Application
    Filed: October 20, 2006
    Publication date: May 3, 2007
    Inventor: Yoshiei Hasegawa
  • Patent number: 7165975
    Abstract: An electrical connecting apparatus is characterized by inserting a first pin having a flange portion into a through hole of an elastic body via a seat, by disposing a second pin in the through hole so as to adjoin in the axial direction of the through hole relative to the first pin, and by bringing the first and second pins into contact in a plane region having a certain angle to the axis of the through hole.
    Type: Grant
    Filed: February 10, 2003
    Date of Patent: January 23, 2007
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Yoshiei Hasegawa, Masayoshi Hasegawa, Eichi Osato
  • Publication number: 20060128175
    Abstract: An electrical connecting apparatus is characterized by inserting a first pin having a flange portion into a through hole of an elastic body via a seat, by disposing a second pin in the through hole so as to adjoin in the axial direction of the through hole relative to the first pin, and by bringing the first and second pins into contact in a plane region having a certain angle to the axis of the through hole.
    Type: Application
    Filed: February 10, 2003
    Publication date: June 15, 2006
    Inventors: Yoshiei Hasegawa, Masayoshi Hasegawa, Eiichi Osato
  • Patent number: 6672877
    Abstract: A contactor block is characterized by including a beam-like holder having an underside and a retreat portion formed on a side following the underside; and a contact sheet provided with a plurality of contactors at intervals in the longitudinal direction of the holder and disposed in the outer periphery of the holder so as to be located on the underside of the holder.
    Type: Grant
    Filed: December 16, 2002
    Date of Patent: January 6, 2004
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventor: Yoshiei Hasegawa
  • Publication number: 20030224635
    Abstract: A contactor block is characterized by including a beam-like holder having an underside and a retreat portion formed on a side following the underside; and a contact sheet provided with a plurality of contactors at intervals in the longitudinal direction of the holder and disposed in the outer periphery of the holder so as to be located on the underside of the holder.
    Type: Application
    Filed: December 16, 2002
    Publication date: December 4, 2003
    Inventor: Yoshiei Hasegawa