Patents by Inventor Yoshikazu Takeyama

Yoshikazu Takeyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10878917
    Abstract: A memory system includes a semiconductor storage device and a memory controller for the semiconductor storage device. The semiconductor storage device includes a plurality of blocks including a plurality of memory cell transistors. The plurality of blocks includes a first block and a second block. The memory cell transistor in the first block stores data having a first number of bits during a first period and stores data having a second number of bits larger than the first number during a second period that begins after the first period ends.
    Type: Grant
    Filed: August 30, 2019
    Date of Patent: December 29, 2020
    Assignee: Toshiba Memory Corporation
    Inventor: Yoshikazu Takeyama
  • Publication number: 20200143891
    Abstract: A memory system includes a semiconductor storage device and a memory controller for the semiconductor storage device. The semiconductor storage device includes a plurality of blocks including a plurality of memory cell transistors. The plurality of blocks includes a first block and a second block. The memory cell transistor in the first block stores data having a first number of bits during a first period and stores data having a second number of bits larger than the first number during a second period that begins after the first period ends.
    Type: Application
    Filed: August 30, 2019
    Publication date: May 7, 2020
    Inventor: Yoshikazu TAKEYAMA
  • Patent number: 10089257
    Abstract: According to one embodiment, a semiconductor storage device includes a plurality of semiconductor chips and a control unit. The plurality of semiconductor chips is configured to connect to a signal transmission path and is controlled individually by individual chip enable signals. The plurality of semiconductor chips each includes a termination circuit connected to the signal transmission path. When one of the semiconductor chips is selected to input or output data, the control unit activates the termination circuit provided in the semiconductor chip that is not selected based on a first instruction signal and the chip enable signal.
    Type: Grant
    Filed: April 23, 2018
    Date of Patent: October 2, 2018
    Assignee: TOSHIBA MEMORY CORPORATION
    Inventors: Yoshikazu Takeyama, Masaru Koyanagi, Akio Sugahara
  • Publication number: 20180239721
    Abstract: According to one embodiment, a semiconductor storage device includes a plurality of semiconductor chips and a control unit. The plurality of semiconductor chips is configured to connect to a signal transmission path and is controlled individually by individual chip enable signals. The plurality of semiconductor chips each includes a termination circuit connected to the signal transmission path. When one of the semiconductor chips is selected to input or output data, the control unit activates the termination circuit provided in the semiconductor chip that is not selected based on a first instruction signal and the chip enable signal.
    Type: Application
    Filed: April 23, 2018
    Publication date: August 23, 2018
    Applicant: Toshiba Memory Corporation
    Inventors: Yoshikazu TAKEYAMA, Masaru KOYANAGI, Akio SUGAHARA
  • Patent number: 9977752
    Abstract: According to one embodiment, a semiconductor storage device includes a plurality of semiconductor chips and a control unit. The plurality of semiconductor chips is configured to connect to a signal transmission path and is controlled individually by individual chip enable signals. The plurality of semiconductor chips each includes a termination circuit connected to the signal transmission path. When one of the semiconductor chips is selected to input or output data, the control unit activates the termination circuit provided in the semiconductor chip that is not selected based on a first instruction signal and the chip enable signal.
    Type: Grant
    Filed: April 18, 2017
    Date of Patent: May 22, 2018
    Assignee: TOSHIBA MEMORY CORPORATION
    Inventors: Yoshikazu Takeyama, Masaru Koyanagi, Akio Sugahara
  • Publication number: 20170220493
    Abstract: According to one embodiment, a semiconductor storage device includes a plurality of semiconductor chips and a control unit. The plurality of semiconductor chips is configured to connect to a signal transmission path and is controlled individually by individual chip enable signals. The plurality of semiconductor chips each includes a termination circuit connected to the signal transmission path. When one of the semiconductor chips is selected to input or output data, the control unit activates the termination circuit provided in the semiconductor chip that is not selected based on a first instruction signal and the chip enable signal.
    Type: Application
    Filed: April 18, 2017
    Publication date: August 3, 2017
    Applicant: Kabushiki Kaisha Toshiba
    Inventors: Yoshikazu TAKEYAMA, Masaru Koyanagi, Akio Sugahara
  • Patent number: 9659652
    Abstract: According to one embodiment, a semiconductor storage device includes a plurality of semiconductor chips and a control unit. The plurality of semiconductor chips is configured to connect to a signal transmission path and is controlled individually by individual chip enable signals. The plurality of semiconductor chips each includes a termination circuit connected to the signal transmission path. When one of the semiconductor chips is selected to input or output data, the control unit activates the termination circuit provided in the semiconductor chip that is not selected based on a first instruction signal and the chip enable signal.
    Type: Grant
    Filed: July 21, 2016
    Date of Patent: May 23, 2017
    Assignee: KABUSHIKI KAISHA TOSHIBA
    Inventors: Yoshikazu Takeyama, Masaru Koyanagi, Akio Sugahara
  • Patent number: 9620218
    Abstract: According to one embodiment, each memory chip included in a memory package includes a first storage unit that stores therein first information that is n-bit information and is a comparison target of a chip address, and is used for identifying its own memory chip, a second storage unit that stores therein second information for determining an effective bit of the n-bit first information, and a control unit that determines an effective bit of the n-bit first information and an effective bit of the chip address based on the second information.
    Type: Grant
    Filed: August 16, 2016
    Date of Patent: April 11, 2017
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Yoshikazu Takeyama, Yuji Nagai
  • Patent number: 9543033
    Abstract: According to one embodiment, a semiconductor memory device includes a memory cell array, a first circuit, and a second circuit. The first circuit executes program and read. The program is processing for changing a threshold voltage of a memory cell to a voltage according to data. The data includes first data of a bit and second data of a bit. The program of the second data is executed after the program of the first data. The read includes measuring the threshold voltage. The second circuit manipulates a flag in accordance with execution of the program of the second data. In a case where the second data is a target of the read, the second circuit refers to the flag. In a case where the flag indicates non-execution of the program of the second data, the second circuit aborts the measuring before the measuring of the threshold voltage is completed.
    Type: Grant
    Filed: March 1, 2016
    Date of Patent: January 10, 2017
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Koichi Shinohara, Yoshikazu Takeyama
  • Publication number: 20160358656
    Abstract: According to one embodiment, each memory chip included in a memory package includes a first storage unit that stores therein first information that is n-bit information and is a comparison target of a chip address, and is used for identifying its own memory chip, a second storage unit that stores therein second information for determining an effective bit of the n-bit first information, and a control unit that determines an effective bit of the n-bit first information and an effective bit of the chip address based on the second information.
    Type: Application
    Filed: August 16, 2016
    Publication date: December 8, 2016
    Applicant: Kabushiki Kaisha Toshiba
    Inventors: Yoshikazu TAKEYAMA, Yuji NAGAI
  • Publication number: 20160329099
    Abstract: According to one embodiment, a semiconductor storage device includes a plurality of semiconductor chips and a control unit. The plurality of semiconductor chips is configured to connect to a signal transmission path and is controlled individually by individual chip enable signals. The plurality of semiconductor chips each includes a termination circuit connected to the signal transmission path. When one of the semiconductor chips is selected to input or output data, the control unit activates the termination circuit provided in the semiconductor chip that is not selected based on a first instruction signal and the chip enable signal.
    Type: Application
    Filed: July 21, 2016
    Publication date: November 10, 2016
    Applicant: Kabushiki Kaisha Toshiba
    Inventors: Yoshikazu TAKEYAMA, Masaru KOYANAGI, Akio SUGAHARA
  • Publication number: 20160267999
    Abstract: According to one embodiment, a semiconductor memory device includes: memory cells; word lines electrically connected to gates of the memory cell; and an interconnect electrically connected to one end of the memory cells. A first potential for applying to a selected memory cell in a read operation is determined based on a potential of the interconnect during sequentially increasing or decreasing a potential of the word line.
    Type: Application
    Filed: September 8, 2015
    Publication date: September 15, 2016
    Applicant: Kabushiki Kaisha Toshiba
    Inventors: Yoshikazu TAKEYAMA, Yuji Nagai, Katsuaki Isobe
  • Patent number: 9443595
    Abstract: According to one embodiment, each memory chip included in a memory package includes a first storage unit that stores therein first information that is n-bit information and is a comparison target of a chip address, and is used for identifying its own memory chip, a second storage unit that stores therein second information for determining an effective bit of the n-bit first information, and a control unit that determines an effective bit of the n-bit first information and an effective bit of the chip address based on the second information.
    Type: Grant
    Filed: January 20, 2016
    Date of Patent: September 13, 2016
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Yoshikazu Takeyama, Yuji Nagai
  • Patent number: 9431078
    Abstract: According to one embodiment, a semiconductor storage device includes a plurality of semiconductor chips and a control unit. The plurality of semiconductor chips is configured to connect to a signal transmission path and is controlled individually by individual chip enable signals. The plurality of semiconductor chips each includes a termination circuit connected to the signal transmission path. When one of the semiconductor chips is selected to input or output data, the control unit activates the termination circuit provided in the semiconductor chip that is not selected based on a first instruction signal and the chip enable signal.
    Type: Grant
    Filed: September 10, 2013
    Date of Patent: August 30, 2016
    Assignee: KABUSHIKI KAISHA TOSHIBA
    Inventors: Yoshikazu Takeyama, Masaru Koyanagi, Akio Sugahara
  • Publication number: 20160141033
    Abstract: According to one embodiment, each memory chip included in a memory package includes a first storage unit that stores therein first information that is n-bit information and is a comparison target of a chip address, and is used for identifying its own memory chip, a second storage unit that stores therein second information for determining an effective bit of the n-bit first information, and a control unit that determines an effective bit of the n-bit first information and an effective bit of the chip address based on the second information.
    Type: Application
    Filed: January 20, 2016
    Publication date: May 19, 2016
    Applicant: Kabushiki Kaisha Toshiba
    Inventors: Yoshikazu TAKEYAMA, Yuji NAGAI
  • Patent number: 9286960
    Abstract: According to one embodiment, each memory chip included in a memory package includes a first storage unit that stores therein first information that is n-bit information and is a comparison target of a chip address, and is used for identifying its own memory chip, a second storage unit that stores therein second information for determining an effective bit of the n-bit first information, and a control unit that determines an effective bit of the n-bit first information and an effective bit of the chip address based on the second information.
    Type: Grant
    Filed: July 29, 2014
    Date of Patent: March 15, 2016
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Yoshikazu Takeyama, Yuji Nagai
  • Publication number: 20150262696
    Abstract: According to one embodiment, a controller switches modes including a normal operating mode in which power resources of a volatile memory, a data storage unit, and a power control unit are all ON, a first mode in which the power resource of the volatile memory is OFF, and the power resources of the data storage unit and the power control unit are both ON, and a second mode in which the power resources of the volatile memory and the data storage unit are both OFF, and the power resource of the power control unit is ON. Upon receiving a low power consumption instruction command from a host, the controller stores management information to return to the normal operating mode into the volatile storage unit, and shifts the state of the memory system from the normal operating mode to the first mode.
    Type: Application
    Filed: September 3, 2014
    Publication date: September 17, 2015
    Applicant: Kabushiki Kaisha Toshiba
    Inventors: Akihiro SAKATA, Norikazu YOSHIDA, Toshikatsu HIDA, Yoshikazu TAKEYAMA, Shinichi KANNO
  • Publication number: 20150131397
    Abstract: According to one embodiment, each memory chip included in a memory package includes a first storage unit that stores therein first information that is n-bit information and is a comparison target of a chip address, and is used for identifying its own memory chip, a second storage unit that stores therein second information for determining an effective bit of the n-bit first information, and a control unit that determines an effective bit of the n-bit first information and an effective bit of the chip address based on the second information.
    Type: Application
    Filed: July 29, 2014
    Publication date: May 14, 2015
    Applicant: Kabushiki Kaisha Toshiba
    Inventors: Yoshikazu TAKEYAMA, Yuji NAGAI
  • Patent number: 8976586
    Abstract: According to one embodiment, a semiconductor memory device includes a memory cell array including a plurality of memory cells, a random number generation circuit configured to generate a random number, and a controller configured to control the memory cell array and the random number generation circuit. The random number generation circuit includes a random number control circuit configured to generate a random number parameter based on data which is read out from the memory cell by a generated control parameter, and a pseudo-random number generation circuit configured to generate the random number by using the random number parameter as a seed value.
    Type: Grant
    Filed: February 17, 2012
    Date of Patent: March 10, 2015
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Yuji Nagai, Atsushi Inoue, Yoshikazu Takeyama
  • Publication number: 20140146607
    Abstract: According to one embodiment, a semiconductor memory device includes a memory cell array including a plurality of memory cells, a random number generation circuit configured to generate a random number, and a controller configured to control the memory cell array and the random number generation circuit. The random number generation circuit includes a random number control circuit configured to generate a random number parameter based on data which is read out from the memory cell by a generated control parameter, and a pseudo-random number generation circuit configured to generate the random number by using the random number parameter as a seed value.
    Type: Application
    Filed: February 17, 2012
    Publication date: May 29, 2014
    Applicant: Kabushiki Kaisha Toshiba
    Inventors: Yuji Nagai, Atsushi Inoue, Yoshikazu Takeyama