Patents by Inventor Yoshiki Hasegawa

Yoshiki Hasegawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240078174
    Abstract: An information storage device includes a storage unit, a control unit, an allocation information storage unit, a QoS parameter storage unit, and a monitoring result storage unit. The control unit creates and manages a logical storage area using the storage area of the storage unit when a storage area allocation request is received. The allocation information storage unit stores allocation information related to logical storage areas. The QoS parameter storage unit stores quality requests expected to be satisfied for a communication for using the logical storage area. The control unit monitors the operating state and characteristics of the storage unit and the communication status, and stores the results in the monitoring result storage unit. The control unit derives internal QoS parameters to be set in the information storage device from the information stored in the allocation information storage unit, the QoS parameter storage unit, and the monitoring result storage unit.
    Type: Application
    Filed: September 5, 2023
    Publication date: March 7, 2024
    Inventors: Takeshi ISHIHARA, Yohei HASEGAWA, Kenta YASUFUKU, Shohei ONISHI, Yoshiki SAITO, Junpei KIDA
  • Publication number: 20240071660
    Abstract: A soft magnetic alloy powder comprises a component having a compositional formula ((Fe(1?(?+?))Co?Ni?)(1??)X1?)(1?(a+b+c+d+e))BaPbSicCdCre in atomic ratio. X1 comprises at least one selected from specific elements. Values of a, b, c, d, e, ?, ?, and ? of the compositional formula satisfy specific ranges. The soft magnetic alloy powder comprises soft magnetic alloy particles including soft magnetic alloy particles having a particle size of (0.95×D90) or more and (1.05×D90) or less. An average Wadell's circularity of the soft magnetic alloy particles having the particle size of (0.95×D90) or more and (1.05×D90) or less is 0.75 or more. A variance of Wadell's circularity of the soft magnetic alloy particles having the particle size of (0.95×D90) or more and (1.05×D90) or less is 0.035 or less.
    Type: Application
    Filed: August 30, 2023
    Publication date: February 29, 2024
    Applicant: TDK CORPORATION
    Inventors: Akito HASEGAWA, Yoshiki KAJIURA, Masakazu HOSONO, Kazuhiro YOSHIDOME
  • Publication number: 20240071663
    Abstract: A soft magnetic alloy powder comprises first particles to fifth particles, each having a particle size within a specific range. Among the first particles to the fifth particles, nth particles have an average particle size xn (?m), an average circularity yn, and a variance zn of circularity, where nth is any ordinal number from first to fifth. Points (xn, yn) (n=1 to 5) plotted in an xy plane define an approximate straight line having a slope “my” of ?0.0030 or more. Points (xn, zn) (n=1 to 5) plotted in an xz plane define an approximate straight line having a slope “mz” of 0.00050 or less.
    Type: Application
    Filed: August 30, 2023
    Publication date: February 29, 2024
    Applicant: TDK CORPORATION
    Inventors: Masakazu HOSONO, Kazuhiro YOSHIDOME, Akito HASEGAWA, Yoshiki KAJIURA
  • Patent number: 11022534
    Abstract: An analyzing device is provided, which can accurately analyze information related to generation sources. A generation source analyzing device is provided, which includes a measurement value acquiring unit to acquire time-series measurement values of a concentration of each of a plurality of measured object components at a measurement point, a correlation calculating unit to calculate a correlation value between the time-series measurement values of at least one set of the measured object components, and a generation source analyzing unit to analyze information related to generation sources of at least one measured object component based on the correlation value calculated by the correlation calculating unit.
    Type: Grant
    Filed: February 22, 2018
    Date of Patent: June 1, 2021
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Naoki Takeda, Bo Li, Yoshiki Hasegawa, Kazuhiro Koizumi, Yu Kawamura
  • Patent number: 10302610
    Abstract: To analyze a generation source of a target component emitted in a form of a gas. To provide a generation source analyzing device comprising an acquiring section which acquires a concentration measurement value of a gas which includes a target component, and a concentration measurement value of a particle component which is generated in association with the gas, and an analyzing section which analyzes a distance from a measurement point to a generation source of the target component based on a concentration measurement value of the gas and a concentration measurement value of the particle component. The acquiring section may acquire a concentration measurement value of a precursor gas which becomes a raw material which generates the particle component, and a concentration measurement value of a secondary generated particle component which is generated from the precursor gas.
    Type: Grant
    Filed: April 24, 2017
    Date of Patent: May 28, 2019
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Naoki Takeda, Yoshiki Hasegawa, Kazuhiro Koizumi, Bo Li
  • Patent number: 10302564
    Abstract: A water quality analyzer for analyzing sample water. The water quality analyzer includes an excitation light irradiating optical system configured to irradiate the sample water with first light, a component in the sample water being excited by the first light to emit fluorescence, a scattered light irradiating optical system configured to irradiate the sample water with second light, the second light being scattered by microparticles in the sample water to form the scattered light, a fluorescence detecting optical system configured to detect a portion of the second light that has passed through the sample water, and to detect the emitted fluorescence, and a scattered light detecting optical system configured to detect a portion of the first light that has passed through the sample water, and to detect the scattered light.
    Type: Grant
    Filed: May 1, 2018
    Date of Patent: May 28, 2019
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Yoshiki Hasegawa, Kazuhiro Koizumi
  • Patent number: 10283337
    Abstract: Despite the desire to measure the composition and concentration of the microparticles included in a gaseous body sample serving as the measurement target, there is a problem that measurement cannot be performed accurately due to the effect of substances other than the gaseous body sample adsorbing to a trapping body of the analyzing apparatus that traps the microparticles, for example. Therefore, provided is a microparticle composition analyzing apparatus that analyzes composition of microparticles contained in a gaseous body sample, comprising a gas analyzer and a control section that sequentially introduces into the gas analyzer a comparative gas and a sample gas caused by the microparticles generated by irradiating the gaseous body sample with a laser.
    Type: Grant
    Filed: July 22, 2016
    Date of Patent: May 7, 2019
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Naoki Takeda, Kazuhiro Koizumi, Takamasa Asano, Yoshiki Hasegawa
  • Publication number: 20180292302
    Abstract: An analyzing device is provided, which can accurately analyze information related to generation sources. A generation source analyzing device is provided, which includes a measurement value acquiring unit to acquire time-series measurement values of a concentration of each of a plurality of measured object components at a measurement point, a correlation calculating unit to calculate a correlation value between the time-series measurement values of at least one set of the measured object components, and a generation source analyzing unit to analyze information related to generation sources of at least one measured object component based on the correlation value calculated by the correlation calculating unit.
    Type: Application
    Filed: February 22, 2018
    Publication date: October 11, 2018
    Inventors: Naoki TAKEDA, Bo LI, Yoshiki HASEGAWA, Kazuhiro KOIZUMI, Yu KAWAMURA
  • Publication number: 20180246035
    Abstract: A water quality analyzer for analyzing sample water. The water quality analyzer includes an excitation light irradiating optical system configured to irradiate the sample water with first light, a component in the sample water being excited by the first light to emit fluorescence, a scattered light irradiating optical system configured to irradiate the sample water with second light, the second light being scattered by microparticles in the sample water to form the scattered light, a fluorescence detecting optical system configured to detect a portion of the second light that has passed through the sample water, and to detect the emitted fluorescence, and a scattered light detecting optical system configured to detect a portion of the first light that has passed through the sample water, and to detect the scattered light.
    Type: Application
    Filed: May 1, 2018
    Publication date: August 30, 2018
    Applicant: FUJI ELECTRIC CO., LTD.
    Inventors: Yoshiki Hasegawa, Kazuhiro Koizumi
  • Patent number: 10012628
    Abstract: A multifunctional particle analysis device includes a particle measuring device and a particle composition analysis device. Calibration particles for which at least the number, size, and composition thereof are known are input to the particle measuring device and the particle composition analysis device and analyzed. The sensitivity of the particle measuring device is calibrated in accordance with the number and size of the calibration particles as measured by the particle measuring device, and the sensitivity of the particle composition analysis device is calibrated in accordance with the mass composition of the calibration particles as measured by the particle composition analysis device. Moreover, the irradiation axis of particles that enter the particle composition analysis device relative to a capturing unit is calibrated in accordance with a state in which the calibration particles are captured on the capturing unit of the particle composition analysis device.
    Type: Grant
    Filed: March 11, 2016
    Date of Patent: July 3, 2018
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Yoshiki Hasegawa, Kazuhiro Koizumi, Takamasa Asano, Naoki Takeda
  • Patent number: 9896402
    Abstract: The present invention provides a method for producing a reduction reaction product, wherein recovery of the reaction solvent and/or distillation is carried out after adding a nitrogen-containing compound into a reaction liquid of a reduction reaction that has been conducted using a transition metal complex. The present invention is capable of suppressing decrease in the optical purity of the reduction reaction product due to the transition metal complex used as a catalyst.
    Type: Grant
    Filed: November 4, 2011
    Date of Patent: February 20, 2018
    Assignee: TAKASAGO INTERNATIONAL CORPORATION
    Inventors: Hideki Nara, Yoshiki Hasegawa
  • Patent number: 9857282
    Abstract: A particle analyzing apparatus including a particle measuring section that measures a number or concentration of particles in a sample gas; a component analyzing section that measures an amount of each component of the particles in the sample gas; a flow path that branches into a first flow path that introduces the sample gas to the particle measuring section and a second flow path that introduces the sample gas to the component analyzing section; a first adjusting section that is provided in the first flow path and dilutes the sample gas with a dilution gas and introduces the diluted sample gas to the particle measuring section to adjust a measurement range of the particle measuring section; and a second adjusting section that is provided in the second flow path and adjusts an introduction time during which the sample gas is introduced to the component analyzing section.
    Type: Grant
    Filed: November 30, 2016
    Date of Patent: January 2, 2018
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Yoshiki Hasegawa, Naoki Takeda, Kazuhiro Koizumi, Takamasa Asano
  • Publication number: 20170315105
    Abstract: To analyze a generation source of a target component emitted in a form of a gas. To provide a generation source analyzing device comprising an acquiring section which acquires a concentration measurement value of a gas which includes a target component, and a concentration measurement value of a particle component which is generated in association with the gas, and an analyzing section which analyzes a distance from a measurement point to a generation source of the target component based on a concentration measurement value of the gas and a concentration measurement value of the particle component. The acquiring section may acquire a concentration measurement value of a precursor gas which becomes a raw material which generates the particle component, and a concentration measurement value of a secondary generated particle component which is generated from the precursor gas.
    Type: Application
    Filed: April 24, 2017
    Publication date: November 2, 2017
    Inventors: Naoki TAKEDA, Yoshiki HASEGAWA, Kazuhiro KOIZUMI, Bo LI
  • Publication number: 20170292903
    Abstract: A particle component analyzing device is provided. The particle component analyzing device comprises: a catching body which catches a particle in an aerosol which is subject to measurement, an energy beam irradiating unit which irradiates an energy beam to the particle which is caught by the catching body, and an analyzer which analyzes at least any of a component and an amount of the particle based on a desorbed component of the particle which is desorbed from the catching body by irradiation of the energy beam, wherein the catching body has a temperature measuring unit, the particle component analyzing device further comprising a controlling unit which controls an output of the energy beam irradiating unit based on a temperature of the catching body which is measured by the temperature measuring unit.
    Type: Application
    Filed: March 30, 2017
    Publication date: October 12, 2017
    Inventors: Yoshiki HASEGAWA, Naoki TAKEDA, Kazuhiro KOIZUMI, Takamasa ASANO
  • Publication number: 20170212030
    Abstract: A particle analyzing apparatus including a particle measuring section that measures a number or concentration of particles in a sample gas; a component analyzing section that measures an amount of each component of the particles in the sample gas; a flow path that branches into a first flow path that introduces the sample gas to the particle measuring section and a second flow path that introduces the sample gas to the component analyzing section; a first adjusting section that is provided in the first flow path and dilutes the sample gas with a dilution gas and introduces the diluted sample gas to the particle measuring section to adjust a measurement range of the particle measuring section; and a second adjusting section that is provided in the second flow path and adjusts an introduction time during which the sample gas is introduced to the component analyzing section.
    Type: Application
    Filed: November 30, 2016
    Publication date: July 27, 2017
    Inventors: Yoshiki HASEGAWA, Naoki TAKEDA, Kazuhiro KOIZUMI, Takamasa ASANO
  • Patent number: 9671325
    Abstract: A particle measuring device includes: an optical resonator that reflects laser light back and forth between two facing reflective mirrors in order to amplify an energy of that laser light and form resonant laser light; a particle transport unit that transports particles in an aerosol to be measured across a beam path of the resonant laser light; a scattered light receiving unit that receives scattered light produced when the particles in the aerosol are irradiated by the resonant laser light; and a processor that receives light reception signals from the scattered light receiving unit, wherein the processor outputs light reception pulses according to the light reception signals and calculates time intervals between the light reception pulses that are temporally adjacent.
    Type: Grant
    Filed: March 11, 2016
    Date of Patent: June 6, 2017
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Naoki Takeda, Kazuhiro Koizumi, Takamasa Asano, Yoshiki Hasegawa
  • Publication number: 20170154762
    Abstract: In a microparticle composition analyzing apparatus, when a depressurized chamber is opened to atmospheric pressure in order to replace a trap, a certain amount of time is needed to vacuum out the entire depressurized chamber again and return the depressurized chamber to the reduced pressure state, and this causes an increase in the dead time of the measurement. Provided is a trap replacement mechanism including a rod that supports a trap for trapping microparticles and a connection portion that includes at least a portion of an auxiliary space connected to a depressurized space in which the trap is provided. The trap can be withdrawn from the depressurized space to the auxiliary space side and opened to atmospheric pressure while the depressurized space is kept in a depressurized state, by moving the rod.
    Type: Application
    Filed: October 25, 2016
    Publication date: June 1, 2017
    Inventors: Naoki TAKEDA, Yoshiki HASEGAWA, Kazuhiro KOIZUMI, Takamasa ASANO
  • Publication number: 20170069476
    Abstract: Despite the desire to measure the composition and concentration of the microparticles included in a gaseous body sample serving as the measurement target, there is a problem that measurement cannot be performed accurately due to the effect of substances other than the gaseous body sample adsorbing to a trapping body of the analyzing apparatus that traps the microparticles, for example. Therefore, provided is a microparticle composition analyzing apparatus that analyzes composition of microparticles contained in a gaseous body sample, comprising a gas analyzer and a control section that sequentially introduces into the gas analyzer a comparative gas and a sample gas caused by the microparticles generated by irradiating the gaseous body sample with a laser.
    Type: Application
    Filed: July 22, 2016
    Publication date: March 9, 2017
    Inventors: Naoki TAKEDA, Kazuhiro KOIZUMI, Takamasa ASANO, Yoshiki HASEGAWA
  • Publication number: 20170003221
    Abstract: A particle measuring device includes: an optical resonator that reflects laser light back and forth between two facing reflective mirrors in order to amplify an energy of that laser light and form resonant laser light; a particle transport unit that transports particles in an aerosol to be measured across a beam path of the resonant laser light; a scattered light receiving unit that receives scattered light produced when the particles in the aerosol are irradiated by the resonant laser light; and a processor that receives light reception signals from the scattered light receiving unit, wherein the processor outputs light reception pulses according to the light reception signals and calculates time intervals between the light reception pulses that are temporally adjacent.
    Type: Application
    Filed: March 11, 2016
    Publication date: January 5, 2017
    Applicant: Fuji Electric Co., Ltd.
    Inventors: Naoki TAKEDA, Kazuhiro KOIZUMI, Takamasa ASANO, Yoshiki HASEGAWA
  • Publication number: 20160377539
    Abstract: A multifunctional particle analysis device includes a particle measuring device and a particle composition analysis device. Calibration particles for which at least the number, size, and composition thereof are known are input to the particle measuring device and the particle composition analysis device and analyzed. The sensitivity of the particle measuring device is calibrated in accordance with the number and size of the calibration particles as measured by the particle measuring device, and the sensitivity of the particle composition analysis device is calibrated in accordance with the mass composition of the calibration particles as measured by the particle composition analysis device. Moreover, the irradiation axis of particles that enter the particle composition analysis device relative to a capturing unit is calibrated in accordance with a state in which the calibration particles are captured on the capturing unit of the particle composition analysis device.
    Type: Application
    Filed: March 11, 2016
    Publication date: December 29, 2016
    Applicant: Fuji Electric Co., Ltd.
    Inventors: Yoshiki HASEGAWA, Kazuhiro KOIZUMI, Takamasa ASANO, Naoki TAKEDA