Patents by Inventor Yoshiyuki Ooba

Yoshiyuki Ooba has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20050230830
    Abstract: In a metal film production apparatus, a copper plate member is etched with a Cl2 gas plasma within a chamber to form a precursor comprising a Cu component and a Cl2 gas; and the temperatures of the copper plate member and a substrate and a difference between their temperatures are controlled as predetermined, to deposit the Cu component of the precursor on the substrate, thereby forming a film of Cu. In this apparatus, Cl* is formed in an excitation chamber of a passage communicating with the interior of the chamber to flow a Cl2 gas, and the Cl* is supplied into the chamber to withdraw a Cl2 gas from the precursor adsorbed onto the substrate, thereby promoting a Cu film formation reaction. The apparatus has a high film formation speed, can use an inexpensive starting material, and can minimize impurities remaining in the film.
    Type: Application
    Filed: May 19, 2005
    Publication date: October 20, 2005
    Inventors: Hitoshi Sakamoto, Naoki Yahata, Toshihiko Nishimori, Yoshiyuki Ooba, Hiroshi Tonegawa, Ikumasa Koshiro, Yuzuru Ogura
  • Patent number: 6755920
    Abstract: A low-alloy heat-resistant steel may be used to manufacturing a large element which has uniform superior high temperature properties through a surface layer to a center part. The low-alloy heat-resistant steel comprises carbon in an amount of 0.20 to 0.35% by weight, silicon in an amount of 0.005 to 0.35% by weight, manganese in an amount of 0.05 to 1.0% by weight, nickel in an amount of 0.05 to 0.3% by weight, chromium in an amount of 0.8 to 2.5% by weight, molybdenum in an amount of 0.1 to 1.5% by weight, tungsten in an amount of 0.1 to 2.5% by weight, vanadium in an amount of 0.05 to 0.3% by weight, phosphorus in an amount not greater than 0.012% by weight, sulfur in an amount not greater than 0.005% by weight, copper in an amount not greater than 0.10% by weight, aluminum in an amount not greater than 0.01% by weight, arsenic in an amount not greater than 0.01% by weight, tin in an amount not greater than 0.01% by weight, antimony in an amount not greater than 0.
    Type: Grant
    Filed: March 4, 2002
    Date of Patent: June 29, 2004
    Assignee: Mitsubishi Heavy Industries, Ltd.
    Inventors: Masatomo Kamada, Akitsugu Fujita, Yoshiyuki Ooba, Yoshihiro Okamura, Makoto Yamaguchi
  • Publication number: 20040029384
    Abstract: In a metal film production apparatus, a copper plate member is etched with a Cl2 gas plasma within a chamber to form a precursor comprising a Cu component and a Cl2 gas; and the temperatures of the copper plate member and a substrate and a difference between their temperatures are controlled as predetermined, to deposit the Cu component of the precursor on the substrate, thereby forming a film of Cu. In this apparatus, Cl* is formed in an excitation chamber of a passage communicating with the interior of the chamber to flow a Cl2 gas, and the Cl* is supplied into the chamber to withdraw a Cl2 gas from the precursor adsorbed onto the substrate, thereby promoting a Cu film formation reaction. The apparatus has a high film formation speed, can use an inexpensive starting material, and can minimize impurities remaining in the film.
    Type: Application
    Filed: March 7, 2003
    Publication date: February 12, 2004
    Inventors: Hitoshi Sakamoto, Naoki Yahata, Toshihiko Nishimori, Yoshiyuki Ooba, Hiroshi Tonegawa, Ikumasa Koshiro, Yuzuru Ogura
  • Publication number: 20030145790
    Abstract: A metal film production apparatus and method supply a source gas containing chlorine, as a halogen, to the interior of a chamber such that the source gas is intermittently supplied, to form a Cu component of a precursor into a film on a substrate, while suppressing a relative increase in etching particles. Thus, the source gas is supplied in the full presence of plasma particles contributing to film formation. Moreover, the source gas is supplied in a state in which a Cu film formed is not etched with the etching particles. Consequently, the Cu film is reliably increased with respect to the film formation time to increase the film formation speed.
    Type: Application
    Filed: January 23, 2003
    Publication date: August 7, 2003
    Inventors: Hitoshi Sakamoto, Naoki Yahata, Yoshiyuki Ooba
  • Publication number: 20030091739
    Abstract: A Cl2 gas plasma is generated at a site within a chamber between a substrate and a metal member. The metal member is etched with the Cl2 gas plasma to form a precursor. A nitrogen gas is excited in a manner isolated from the chamber accommodating the substrate. A metal nitride is formed upon reaction between excited nitrogen and the precursor, and formed as a film on the substrate. After film formation of the metal nitride, a metal component of the precursor is formed as a film on the metal nitride on the substrate. In this manner, a barrier metal film with excellent burial properties and a very small thickness is produced at a high speed, with diffusion of metal being suppressed and adhesion to the metal being improved.
    Type: Application
    Filed: October 23, 2002
    Publication date: May 15, 2003
    Inventors: Hitoshi Sakamoto, Naoki Yahata, Ryuichi Matsuda, Yoshiyuki Ooba, Toshihiko Nishimori
  • Publication number: 20030034101
    Abstract: A low-alloy heat-resistant steel may be used to manufacturing a large element which has uniform superior high temperature properties through a surface layer to a center part. The low-alloy heat-resistant steel comprises carbon in an amount of 0.20 to 0.35% by weight, silicon in an amount of 0.005 to 0.35% by weight, manganese in an amount of 0.05 to 1.0% by weight, nickel in an amount of 0.05 to 0.3% by weight, chromium in an amount of 0.8 to 2.5% by weight, molybdenum in an amount of 0.1 to 1.5% by weight, tungsten in an amount of 0.1 to 2.5% by weight, vanadium in an amount of 0.05 to 0.3% by weight, phosphorus in an amount not greater than 0.012% by weight, sulfur in an amount not greater than 0.005% by weight, copper in an amount not greater than 0.10% by weight, aluminum in an amount not greater than 0.01% by weight, arsenic in an amount not greater than 0.01% by weight, tin in an amount not greater than 0.01% by weight, antimony in an amount not greater than 0.
    Type: Application
    Filed: March 4, 2002
    Publication date: February 20, 2003
    Applicant: MITSUBISHI HEAVY INDUSTRIES LTD.
    Inventors: Masatomo Kamada, Akitsugu Fujita, Yoshiyuki Ooba, Yoshihiro Okamura, Makoto Yamaguchi