Abstract: A nanostructure comprising at least one semiconductor nanoparticle bound to a photocatalytic unit of a photosynthetic organism is disclosed. The nanoparticle and a binding between the nanoparticle and the photocatalytic unit are selected such that transfer of electrons from the photocatalytic unit to the nanoparticle is prevented or suppressed relative to transfer of excitons from the nanoparticle to the photocatalytic unit. Uses of same and methods of fabricating devices with same are also disclosed. Nanostructures comprising electrically conductive nanoparticles are also disclosed.

Abstract: An optoelectronic device is disclosed. The device comprises one or more modified photocatalytic units, and a semiconductor surface. The modified photocatalytic unit is attached to the semiconductor surface such that when light is absorbed by the photocatalytic unit, an electric field is generated at sufficient amount to induce charge carrier locomotion within the semiconductor. In some embodiments a plurality of photocatalytic unit is attached to the semiconductor surface in oriented manner. The optoelectronic device can be operative in dry environment.

Abstract: Scanning probe apparatus, comprising: a) a tip-electrode which is coupled to be maintained at a first potential; b) a counter-electrode which is positioned in proximity with the tip electrode and which is coupled to be maintained at a second potential differing from the first potential by a value greater than approximately 150 volts; and c) positioning instrumentation, which is adapted to maintain the tip-electrode at a distance from a surface while scanning the tip-electrode parallel to the surface, and controls the position of the tip-electrode in a scanning direction parallel to the surface to within a resolution sufficient so that the apparatus can be used as a scanning probe microscope.

Abstract: Scanning probe apparatus, comprising: a) a tip-electrode which is coupled to be maintained at a first potential; b) a counter-electrode which is positioned in proximity with the tip electrode and which is coupled to be maintained at a second potential differing from the first potential by a value greater than approximately 150 volts; and c) positioning instrumentation, which is adapted to maintain the tip-electrode at a distance from a surface while scanning the tip-electrode parallel to the surface, and controls the position of the tip-electrode in a scanning direction parallel to the surface to within a resolution sufficient so that the apparatus can be used as a scanning probe microscope.

Abstract: Scanning probe apparatus, including a tip-electrode which is coupled to be held at a substantially ground potential, a counter-electrode which is positioned in proximity to the tip-electrode, a voltage source, coupled to maintain the counter-electrode at a non-ground potential, and positioning-instrumentation, which is adapted to maintain the tip-electrode at a suitable position relative to a surface of a ferroelectric sample located in a space between the tip-electrode and the counter-electrode. The apparatus generates an electric field in the ferroelectric sample greater than a coercive field of the sample.

Abstract: Scanning probe apparatus, including a tip-electrode which is coupled to be held at a substantially ground potential, a counter-electrode which is positioned in proximity to the tip-electrode, a voltage source, coupled to maintain the counter-electrode at a non-ground potential, and positioning-instrumentation, which is adapted to maintain the tip-electrode at a suitable position relative to a surface of a ferroelectric sample located in a space between the tip-electrode and the counter-electrode. The apparatus generates an electric field in the ferroelectric sample greater than a coercive field of the sample.