Abstract: A solid-state image pick-up device of the present disclosure includes a pixel array unit obtained by disposing a plurality of unit pixels, each of which includes a photoelectric conversion unit, in a matrix form, an amplifier unit that adjusts a level of a pixel signal output from a unit pixel through a vertical signal line provided to correspond to column arrangement of the pixel array unit, a sample and hold unit that samples and holds a pixel signal passing through the amplifier unit, and an analog-digital conversion unit that converts the pixel signal output from the sample and hold unit into a digital signal. Further, the sample and hold unit includes at least three capacitors that hold pixel signals and performs fetching of a pixel signal to one capacitor and outputting of an image signal fetched to another capacitor in advance to the analog-digital conversion unit in parallel.

Abstract: It makes it easier to reduce the line capacitance of vertical signal lines in a solid-state image sensor in which signals are output via the vertical signal lines. The solid-state image sensor is provided with a logic circuit, a pixel circuit, and a negative capacitance circuit. In the solid-state image sensor, the logic circuit processes an analog signal. Also, in the solid-state image sensor, the pixel circuit generates an analog signal by photoelectric conversion, and outputs the analog signal to the logic circuit via a predetermined signal line. In the solid-state image sensor, the negative capacitance circuit is connected to the predetermined signal line.

Abstract: There is provided an imaging device including a pixel array section including pixel units two-dimensionally arranged in a matrix pattern, each pixel unit including a photoelectric converter, and a plurality of column signal lines disposed according to a first column of the pixel units. The imaging device further includes an analog to digital converter that is shared by the plurality of column signal lines.

Abstract: To prevent a decline in image quality by reducing a fluctuation in an image signal that is based on a fluctuation in a voltage of a negative voltage power source. An image signal output unit is controlled in accordance with a first control signal indicating either voltage state of an on voltage for causing a conductive state and an off voltage having a polarity different from that of the on voltage, and outputs an analog image signal corresponding to the electric charge held by an electric charge holding unit in the conductive state. A reset unit is controlled in accordance with a second control signal indicating either voltage state of the on voltage and the off voltage, resets the electric charge holding unit in the conductive state, transmits a fluctuation in the off voltage to the electric charge holding unit, and fluctuates the analog image signal.

Abstract: The present technique relates to an image pickup element and an electronic apparatus which enable a higher-quality image to be obtained. An image pickup element includes an input sense portion configured to produce a noise correction signal portion includes a first transistor and a second transistor configuring a current mirror circuit, a switch provided between a gate of the first transistor and a gate of the second transistor, and a capacitive element one electrode of which is connected between the switch and the gate of the second transistor on an output side of the current mirror circuit, and the other electrode of which is connected to the predetermined power source.

Abstract: The present invention aims to reduce power consumption in an ADC that performs AD conversion of a single-ended signal. A pair of sampling capacitors samples the single-ended signal. After the single-ended signal has been sampled, the connection control unit performs positive-side connection control of connecting both ends of one of the pair of sampling capacitors across a positive-side signal line and a predetermined ground potential and performs negative-side connection control of connecting both ends of the other of the pair of sampling capacitors across a negative-side signal line and the predetermined ground potential. A conversion unit converts a differential signals from the positive-side signal line and the negative-side signal line that have respectively undergone the positive-side connection control and the negative-side connection control into a digital signal.

Abstract: There is provided an imaging device including a pixel array section including pixel units two-dimensionally arranged in a matrix pattern, each pixel unit including a photoelectric converter, and a plurality of column signal lines disposed according to a first column of the pixel units. The imaging device further includes an analog to digital converter that is shared by the plurality of column signal lines.

Abstract: An imaging element comprises a photoelectric conversion unit formed in a pixel region and configured to convert light into electrical charge. Further, the imaging element includes a transistor formed in the pixel region and configured to transfer electric charge from the photoelectric conversion unit. The photoelectric conversion unit of the imaging element may be connected to a well of the pixel region, where the well of the pixel region has a negative potential.

Abstract: Provided is an image sensor including: a pixel section configured to include a plurality of pixels arranged therein; and an AD conversion unit configured to perform analog-to-digital (AD) conversion on a pixel signal on the basis of a result of comparison between a first voltage of a signal, which is obtained by adding, via capacitances, the pixel signal of the pixel and a reference signal that linearly changes in a direction opposite to the pixel signal, with a second voltage serving as a reference.

Abstract: A semiconductor apparatus, a solid-state image sensing apparatus, and a camera system capable of reducing interference between signals transmitted through adjacent via holes, preventing an increase in the number of the via holes, reducing the area of a chip having sensors thereon and the number of mounting steps thereof. First and second chips are bonded together to form a laminated structure, a wiring between the first chip and the second chip being connected through via holes, the first chip transmitting signals obtained by time-discretizing analog signals generated by respective sensors to the second chip through the corresponding via holes, the second chip sampling the signals transmitted from the first chip through the via holes at a timing different from a timing at which the signals are sampled by the first chip and quantizing the sampled signals to obtain digital signals.

Abstract: An imaging element comprises a photoelectric conversion unit formed in a pixel region and configured to convert light into electrical charge. Further, the imaging element includes a transistor formed in the pixel region and configured to transfer electric charge from the photoelectric conversion unit. The photoelectric conversion unit of the imaging element may be connected to a well of the pixel region, where the well of the pixel region has a negative potential.

Abstract: There is provided an imaging device including a pixel array section including pixel units two-dimensionally arranged in a matrix pattern, each pixel unit including a photoelectric converter, and a plurality of column signal lines disposed according to a first column of the pixel units. The imaging device further includes an analog to digital converter that is shared by the plurality of column signal lines.

Abstract: The present technology relates to a sensor, a driving method, and an electronic device that are capable of improving the dynamic range and noise of AD conversion. An AD conversion unit includes a comparator configured to compare an electric signal with a reference signal having a variable level, and performs AD conversion of the electric signal by using a result of the comparison between the electric signal and the reference signal by the comparator. An attenuation unit attenuates the electric signal supplied to the comparator in accordance with the amplitude of the electric signal. The present technology is applicable to, for example, a case where AD conversion is performed on an electric signal.

Abstract: There is provided an imaging device including a pixel array section including pixel units two-dimensionally arranged in a matrix pattern, each pixel unit including a photoelectric converter, and a plurality of column signal lines disposed according to a first column of the pixel units. The imaging device further includes an analog to digital converter that is shared by the plurality of column signal lines.

Abstract: To prevent a decline in image quality by reducing a fluctuation in an image signal that is based on a fluctuation in a voltage of a negative voltage power source. An image signal output unit is controlled in accordance with a first control signal indicating either voltage state of an on voltage for causing a conductive state and an off voltage having a polarity different from that of the on voltage, and outputs an analog image signal corresponding to the electric charge held by an electric charge holding unit in the conductive state. A reset unit is controlled in accordance with a second control signal indicating either voltage state of the on voltage and the off voltage, resets the electric charge holding unit in the conductive state, transmits a fluctuation in the off voltage to the electric charge holding unit, and fluctuates the analog image signal.

Abstract: The present invention aims to reduce power consumption in an ADC that performs AD conversion of a single-ended signal. A pair of sampling capacitors samples the single-ended signal. After the single-ended signal has been sampled, the connection control unit performs positive-side connection control of connecting both ends of one of the pair of sampling capacitors across a positive-side signal line and a predetermined ground potential and performs negative-side connection control of connecting both ends of the other of the pair of sampling capacitors across a negative-side signal line and the predetermined ground potential. A conversion unit converts a differential signals from the positive-side signal line and the negative-side signal line that have respectively undergone the positive-side connection control and the negative-side connection control into a digital signal.

Abstract: There is provided a solid-state imaging device including an imaging unit including a plurality of image sensors, and an analog to digital (AD) conversion unit including a plurality of AD converters arranged in a row direction, each AD converter performing AD conversion of an electrical signal output by the image sensor. Each of the AD converters includes a comparator having a differential pair at an input stage, the differential pair including a first transistor and a second transistor, the first and second transistors are each divided into an equal number of a plurality of division transistors, and an arrangement pattern of the plurality of division transistors constituting the comparator in a predetermined column and an arrangement pattern of the plurality of division transistors constituting the comparator in an adjacent column adjacent to the predetermined column are different from each other.

Abstract: To reduce fluctuations in image signals when the voltage of a negative power supply supplied to pixels changes. A pixel operates based on a first ground potential applied to a first ground line and outputs an analog image signal according to emitted light. An analog-digital converter operates based on a second ground potential applied to a second ground line, the second ground potential higher than the first ground potential, and converts the analog image signal into a digital image signal based on a reference voltage as a standard for the conversion. A reference voltage generation unit operates based on the second ground potential and generates the reference voltage. A reference voltage correction unit corrects the reference voltage generated according to a change in the first ground potential and supplies the reference voltage to the analog-digital converter.

Abstract: The present technique relates to an image pickup element and an electronic apparatus which enable a higher-quality image to be obtained. An image pickup element includes an input sense portion configured to produce a noise correction signal for correcting a noise generated in a predetermined power source. The input sense portion includes a first transistor and a second transistor configuring a current mirror circuit, a switch provided between a gate of the first transistor and a gate of the second transistor, and a capacitive element one electrode of which is connected between the switch and the gate of the second transistor on an output side of the current mirror circuit, and the other electrode of which is connected to the predetermined power source.

Abstract: To reduce fluctuations in image signals when the voltage of a negative power supply supplied to pixels changes. A pixel operates based on a first ground potential applied to a first ground line and outputs an analog image signal according to emitted light. An analog-digital converter operates based on a second ground potential applied to a second ground line, the second ground potential higher than the first ground potential, and converts the analog image signal into a digital image signal based on a reference voltage as a standard for the conversion. A reference voltage generation unit operates based on the second ground potential and generates the reference voltage. A reference voltage correction unit corrects the reference voltage generated according to a change in the first ground potential and supplies the reference voltage to the analog-digital converter.