Abstract: A semiconductor device transmitting a plurality of data using a multilevel signal includes a parity bit control unit generating a parity bit that varies with a number of data in which a most significant bit (MSB) and least significant bit (LSB) are different. A data conversion unit either inversely outputs the MSB or the LSB, or outputs the data without a change in response to the parity bit. Transmission units transmit data provided by the data conversion unit using the multilevel signal.

Abstract: An output circuit having a variable swing level of a terminated output data signal is disclosed. The output circuit includes a control circuit configured to generate a first control signal and a second control signal in response to a voltage swing level selection signal and an output enable signal. The output circuit further includes an output driving circuit configured to, in response to the first and second control signals, perform on-die termination in an input mode and configured to control swing level of a signal output from the output circuit in an output mode.

Abstract: A transceiver for controlling a swing width of an output voltage includes a transmitter and a receiver for receiving an output voltage of a transmitter. The transmitter includes a first signal converter that outputs changed data generated by changing a voltage level of data in response to a mode control signal for selecting a test mode or a normal mode, an output voltage control circuit for controlling a voltage level of an output node of the transmitter in response to the changed data, and a first termination circuit for supplying a changed power supply voltage generated by changing a voltage level of a power supply voltage of the output node of the transmitter, or is turned off, in response to a test mode enable signal or the changed data. The receiver includes a second termination circuit that operates as a resistor having a resistance value that varies in response to the test mode enable signal or a test mode disable signal.

Abstract: A memory controller includes an I/O circuit, a read latency detector and a clock domain synchronizer. The I/O circuit transmits a first signal to a semiconductor memory device, receives a reflected signal returned from the semiconductor memory device, and delays the reflected signal in response to a delay selection signal to generate a second signal. The reflected signal is provided by reflection of the first signal from the semiconductor memory device. The read latency detector generates the first signal in response to a system clock signal, and generates a read latency signal in response to the system clock signal, a hold signal, and the second signal. The clock domain synchronizer generates the delay selection signal and the hold signal in response to the system clock signal and the second signal.

Abstract: Phase correction circuits and methods for reducing phase skew between multiphase clock signals and a semiconductor device including the circuit are provided. The semiconductor device includes a phase correction circuit and an output buffer. The phase correction circuit corrects phase skew between multiphase clock signals and generates skew-corrected clock signals. The output buffer outputs data in synchronization with the skew-corrected clock signals. The phase correction circuit includes a phase corrector, a replication output buffer, a phase detector, and a controller. The phase corrector corrects a duty cycle of a first clock signal, a duty cycle of a second clock signal, and phase skew between the first and second clock signals and generates skew-corrected first and second clock signals. The replication output buffer has the same structure as a data output buffer and outputs replication data in synchronization with the skew-corrected first and second clock signals.

Abstract: A clock generating apparatus includes a clock generator and a controllable delay line. The clock generator receives an external clock signal and generates multiple clock signals having different phases by delaying the external clock signal. The controllable delay line receives one of the multiple clock signals as a first clock signal and delays the first clock signal by a first interval in response to an externally applied control signal. The delayed first clock signal is input to the clock generator.

Abstract: A semiconductor device transmitting a plurality of data using a multilevel signal includes a parity bit control unit generating a parity bit that varies with a number of data in which a most significant bit (MSB) and least significant bit (LSB) are different. A data conversion unit either inversely outputs the MSB or the LSB, or outputs the data without a change in response to the parity bit. Transmission units transmit data provided by the data conversion unit using the multilevel signal.

Abstract: In a circuit and method for correcting skew among a plurality of communication channels used in communicating with a memory circuit, and in a memory controller and memory controlling method, and in a memory system and method, the circuit for correcting skew includes a transmitting circuit for transmitting a reference signal to input ends of the plurality of channels and through the plurality of channels, and a plurality of receiving circuits for receiving at the input ends of the plurality of channels a respective plurality of reflected signals, the reflected signals being reflected from respective output ends of the plurality of channels. A detection circuit receives the reflected signals and detects relative signal propagation time differences between the plurality of channels. A delay circuit coupled to at least one of the channels sets a signal propagation delay in the at least one of the channels based on the detected relative signal propagation time differences.

Abstract: A semiconductor device, a method related to the semiconductor device, and a printed circuit board are disclosed. The semiconductor device includes a chip, a package including a plurality of power voltage terminals and a plurality of ground voltage terminals, wherein the chip is disposed in the package. The semiconductor device further includes an impedance circuit connected between a DC component power voltage terminal and a ground voltage, wherein the DC component power voltage terminal is one of the plurality of power voltage terminals, and an AC component interrupter connected between the DC component power voltage terminal and a power voltage. Both the AC component and a DC component of the power voltage are applied to each of the power voltage terminals except the DC component second power voltage terminal, and the ground voltage is applied to each of the ground voltage terminals.

Abstract: An output circuit having a variable swing level of a terminated output data signal is disclosed. The output circuit includes a control circuit configured to generate a first control signal and a second control signal in response to a voltage swing level selection signal and an output enable signal. The output circuit further includes an output driving circuit configured to, in response to the first and second control signals, perform on-die termination in an input mode and configured to control swing level of a signal output from the output circuit in an output mode.

Abstract: A transmission system and method may be provided. The transmission system may transmit 2-bit data for each transmission line set and each transmission line set may include first, second and/or third transmission lines arranged in order. The first, second and/or third transmission lines may respectively transmit first, second and/or third signals each having one of first, second and/or third values such that a combination of a first electric field between the first and second transmission lines and a second electric field between the second and third transmission lines may be made depending on a logic state of the 2-bit data. The transmission system may transmit differential signals using a smaller number of transmission lines and the transmission system may transmit a larger number of signals in the same circuit area.

Abstract: A data transceiver system may include an error corrector. The error corrector may include a plurality of delay units, each delay unit being configured to delay a corresponding data signal among a plurality of data signals by a time in response to a corresponding delay code among a plurality of delay codes and outputting the delayed data signal, an error detector configured to receive the plurality of delay codes, determine whether an error has occurred, and output an error signal according to the determination in a data frame lock operation, and a delay controller configured to set initial values of the plurality of delay codes to a predetermined value, vary and output each of the plurality of delay codes in response to a lock signal, and reset initial values the plurality of delay codes in response to the error signal in the data frame lock operation.

Abstract: A preamplifier circuit includes a differential amplifying unit, an offset detection unit and a reference signal generation unit. The differential amplifying unit compares an input signal pair with a reference signal pair to generate an output signal pair. The offset detection unit detects an offset of the output signal pair received from the differential amplifying unit to generate a calibration signal in an offset calibration mode. The reference signal generation unit adjusts the reference signal pair based on the calibration signal, and the reference signal pair is fed-back to the differential amplifying unit.

Abstract: In one embodiment, the apparatus includes a driver circuit configured such that for each symbol in a set of possible symbols, the driver circuit generates at least one data signal at an associated voltage level. Here, adjacent voltage levels defme an associated voltage interval, and the driver circuit is configured to generate the voltage levels such that a central voltage interval is less than at least one of the voltage intervals adjacent to the central voltage interval.

Abstract: In the example embodiments, test signals sent from a transmitting system are received at a receiving system. The receiving system generates a determination signal indicating, in one embodiment, whether received signals have a desired relationship with respect to a clock signal at the receiving system. Timing of the clock signal or timing for transmitting signals may be adjusted based on the determination. In another embodiment, the receiving system generates a determination signal indicating whether the pulse width of a lone pulse signal equals a desired time interval. Equalization or pre-emphasis is controlled based on the determination signal.

Abstract: A clock generating apparatus includes a clock generator and a controllable delay line. The clock generator receives an external clock signal and generates multiple clock signals having different phases by delaying the external clock signal. The controllable delay line receives one of the multiple clock signals as a first clock signal and delays the first clock signal by a first interval in response to an externally applied control signal. The delayed first clock signal is input to the clock generator.

Abstract: An output driver includes a pull-up unit including a pull-up element and a first inductive peaking element connected in series between a first voltage and an output node and a pull-down unit including a pull-down element and a second inductive peaking element connected in series between a second voltage and the output node. The pull-up and pull-down elements receive an input data signal and adjust a voltage level of the output node, and the first and second inductive peaking elements perform an inductive peaking operation when the input data signal transitions.

Abstract: A stress detection circuit includes a function block and a detection signal generation circuit. The function block outputs a first voltage such that the first voltage is varied depending on an extent that the function block is stressed. The detection signal generation circuit generates a stress detection signal based on the first voltage and a second voltage during a test mode. The stress detection signal represents integration of the function block, and a level of the second voltage corresponds to a level of the first voltage before the function block is stressed.

Abstract: A communication system using multi-phase clock signals. The communication system includes a transmitter and a receiver. The transmitter outputs first data and a clock signal based on first multi-phase clock signals, and performs a coarse lock operation on the clock signal in response to a bit lock detection signal indicating whether or not the first data are bit-locked. The receiver receives the first data and the clock signal from the transmitter, generates second multi-phase clock signals based on the clock signal, generates second data by sampling the first data based on the second multi-phase clock signals, and performs a fine lock operation on the second multi-phase clock signals in response to the bit lock detection signal. Therefore, a jitter noise may be reduced and a size of a multi-phase clock generator included in the receiver may be reduced.

Abstract: In a semiconductor device and method for decreasing noise of an output driver block, the semiconductor device monitors differentially amplified voltages output from an output driver block and controls a voltage level at a cross-over point between the differentially amplified voltages so that noise that may be caused by reactance occurring in the output driver block can be removed and so that inter-symbol interference (ISI) that may be caused when a voltage level of a serialized input data is interfered with a voltage level of previously input data can be prevented.