Abstract: A liquid crystal display includes an insulation substrate, a gate line and a data line disposed on the insulation substrate, a first passivation layer disposed on the gate line and the data line, a first common electrode which is disposed on the first passivation layer and overlaps with the data line, an insulating layer disposed on the first common electrode, a second common electrode disposed on the insulating layer, a second passivation layer disposed on the second common electrode, and a pixel electrode disposed on the second passivation layer.

Abstract: A liquid crystal display includes a first substrate, a gate line disposed on the first substrate, a data line disposed on the first substrate, a first passivation layer disposed on the gate line and the data line, a color filter disposed on the first passivation layer, a common electrode disposed on the color filter, a light blocking member disposed directly on or directly below the common electrode, a second passivation layer disposed on the common electrode and the light blocking member, and a pixel electrode disposed on the second passivation layer.

Abstract: A display device includes a first substrate, a ground electrode disposed on the first substrate, a thin film transistor disposed on the first substrate, a first passivation layer disposed on the thin film transistor, a light blocking member, and a color filter disposed on the first passivation layer. A field generating electrode is disposed on the light blocking member and the color filter. The ground electrode is arranged on the first substrate in a matrix and is connected to a ground terminal.

Abstract: Disclosed herein is a system and method for controlling electroplating, the method including: measuring current applied to an object to be plated at the time of electroplating, by a current sensor; receiving current data corresponding to the current applied to the object to be plated at the time of electroplating to execute necessary processing, and transmitting the processed current data to the HMI, by the measurement system; receiving the current data from the measurement system to execute necessary processing, and transmitting the processed data to the PLC, by the HMI; receiving the data from the HMI and storing the data in a memory, and then comparing and computing the stored current measurement value and a set current value, to control an output of the rectifier, by the PLC; and controlling the current supplied to the electroplating bath according to the control of the PLC, by the rectifier.

Abstract: An internal voltage generator is disclosed. The internal voltage generator may include a comparator for controlling a voltage of a first node in response to a voltage difference between a reference voltage and an internal voltage, an internal voltage driving portion connected between a driving node and an internal voltage node to apply the internal voltage to the internal voltage node in response to a voltage level of the first node, and/or a leakage current interrupting portion to apply an external voltage to the first node to deactivate the internal voltage driving portion and to interrupt the external voltage applied to the driving node to interrupt a leakage current.

Abstract: A memory device for early stabilization and rapid increase of a power level after deep power down exit includes a deep power down exit pulse generator, a deep power down exit mode signal generator, a current driving unit, a controller and a voltage generator. The deep power down exit pulse generator generates a deep power down exit pulse signal having a predetermined pulse width in response to a deep power down command. The deep power down exit mode signal generator generates a deep power down exit mode bias signal in response to the deep power down exit pulse signal. The current driving unit generates a deep power down exit mode reference voltage in response to the deep power down exit mode bias signal and a reference signal. The controller generates an enable signal in response to the deep power down exit mode bias signal or an active command.

Abstract: An internal voltage generator is disclosed. The internal voltage generator may include a comparator for controlling a voltage of a first node in response to a voltage difference between a reference voltage and an internal voltage, an internal voltage driving portion connected between a driving node and an internal voltage node to apply the internal voltage to the internal voltage node in response to a voltage level of the first node, and/or a leakage current interrupting portion to apply an external voltage to the first node to deactivate the internal voltage driving portion and to interrupt the external voltage applied to the driving node to interrupt a leakage current.

Abstract: A memory device includes a temperature sensor configured to generate a temperature detection signal responsive to a temperature of the memory device and a self-refresh control circuit configured to control a refresh of the memory device responsive to the temperature detection signal. The device further includes a temperature-detection-error sensing circuit configured to assert a temperature-detection-error signal responsive to an error in the temperature detection signal. The temperature-detection-error sensing circuit may be configured to provide the asserted temperature-detection-error signal at a temperature-detection-error sensing pad configured to be coupled to an external device and/or the device may further include a temperature sensor control circuit configured to control the temperature detection signal responsive to the temperature-detection-error signal. Related operating and testing methods may be provided.

Abstract: A level shifter circuit and method thereof are provided. The example level shifter circuit may include a pull-up drive unit driving an output node from a first voltage to a second voltage in response to an input signal, a target voltage for the second voltage higher than a target voltage for the first voltage and the input signal based on the first voltage and a third voltage and a pull-down drive unit driving the output node to the third voltage in response to the input signal, the pull-up and pull-down drive units adjusting current levels of at least one of a pull-up current flowing through the pull-up drive unit and a pull-down current flowing through the pull-down drive unit based on whether the pull-up drive unit and the pull-down drive unit are operating concurrently.

Abstract: A memory device for early stabilization and rapid increase of a power level after deep power down exit includes a deep power down exit pulse generator, a deep power down exit mode signal generator, a current driving unit, a controller and a voltage generator. The deep power down exit pulse generator generates a deep power down exit pulse signal having a predetermined pulse width in response to a deep power down command. The deep power down exit mode signal generator generates a deep power down exit mode bias signal in response to the deep power down exit pulse signal. The current driving unit generates a deep power down exit mode reference voltage in response to the deep power down exit mode bias signal and a reference signal. The controller generates an enable signal in response to the deep power down exit mode bias signal or an active command.

Abstract: A semiconductor memory device supporting a self refresh operation is disclosed and comprises an address buffer unit and an operation control unit. The address buffer unit may be enabled during the self refresh operation by a first external control signal to generate an internal address signal. The operation control unit controls the start of the self refresh operation in response to the internal address signal.

Abstract: A semiconductor memory device having an externally controllable input and output mode is provided. The semiconductor memory device includes a first and second plurality of pads and an input and output mode set circuit electrically connected to the first plurality of pads and the second plurality of pads, for generating a plurality of input and output mode signals. The input and output mode set circuit cuts off signals received from the first plurality of pads, controls the level of each of the input and output mode signals to be at either a logic high level and a logic low level, and sets the input and output mode when a voltage higher than the supply voltage of the semiconductor memory device is applied to one of the second plurality of pads in a test mode.

Abstract: A semiconductor memory device supporting a self refresh operation is disclosed and comprises an address buffer unit and an operation control unit. The address buffer unit may be enabled during the self refresh operation by a first external control signal to generate an internal address signal. The operation control unit controls the start of the self refresh operation in response to the internal address signal.

Abstract: A memory system, memory device, and method for setting an operating mode of a memory device include a memory cell array; row and column decoders which select a row and a column of the memory cell array, respectively, according to a multi-bit address signal; and a mode control circuit which receives at least one bit from the multi-bit address signal used in the selection of the row or the column, and which sets an operating mode of the memory device according to the at least one bit, wherein the operating mode is one of a burst length mode, a DLL reset mode, a test mode, a CAS latency mode, and a burst type mode.

Abstract: A memory device includes a temperature sensor configured to generate a temperature detection signal responsive to a temperature of the memory device and a self-refresh control circuit configured to control a refresh of the memory device responsive to the temperature detection signal. The device further includes a temperature-detection-error sensing circuit configured to assert a temperature-detection-error signal responsive to an error in the temperature detection signal. The temperature-detection-error sensing circuit may be configured to provide the asserted temperature-detection-error signal at a temperature-detection-error sensing pad configured to be coupled to an external device and/or the device may further include a temperature sensor control circuit configured to control the temperature detection signal responsive to the temperature-detection-error signal. Related operating and testing methods may be provided.

Abstract: A memory system, memory device, and method for setting an operating mode of a memory device include a memory cell array; row and column decoders which select a row and a column of the memory cell array, respectively, according to a multi-bit address signal; and a mode control circuit which receives at least one bit from the multi-bit address signal used in the selection of the row or the column, and which sets an operating mode of the memory device according to the at least one bit, wherein the operating mode is one of a burst length mode, a DLL reset mode, a test mode, a CAS latency mode, and a burst type mode.

Abstract: A semiconductor memory device having an externally controllable input and output mode is provided. The semiconductor memory device includes a first and second plurality of pads and an input and output mode set circuit electrically connected to the first plurality of pads and the second plurality of pads, for generating a plurality of input and output mode signals. The input and output mode set circuit cuts off signals received from the first plurality of pads, controls the level of each of the input and output mode signals to be at either a logic high level and a logic low level, and sets the input and output mode when a voltage higher than the supply voltage of the semiconductor memory device is applied to one of the second plurality of pads in a test mode.

Abstract: A semiconductor memory device with a bit line sense enable signal generating circuit is disclosed. The semiconductor memory device includes a word line selection signal generating circuit for generating a word line selection signal for selecting a word line; a delay circuit for generating a delayed signal by delaying a signal to the same extent of time period which is needed for the word line selection signal generating circuit to generate the word line selection signal; and a Schmitt trigger for generating a word line enable detecting signal by receiving an output signal from the delay circuit and that is connected to a power supply voltage which has the same voltage level as the voltage level used to enable the word line. The bit line sense enable signal generating circuit in the present invention occupies a relatively smaller layout area than that of conventional semiconductor memory devices.

Abstract: A semiconductor memory device having an externally controllable input and output mode is provided. The semiconductor memory device includes a first and second plurality of pads and an input and output mode set circuit electrically connected to the first plurality of pads and the second plurality of pads, for generating a plurality of input and output mode signals. The input and output mode set circuit cuts off signals received from the first plurality of pads, controls the level of each of the input and output mode signals to be at either a logic high level and a logic low level, and sets the input and output mode when a voltage higher than the supply voltage of the semiconductor memory device is applied to one of the second plurality of pads in a test mode.

Abstract: In a semiconductor memory device, a circuit for controlling a voltage level applied to a bit line isolation circuit preferably includes a memory cell connected between a cell bit line pair and a word line; a bit line pre-charge circuit; a sense amplifier bit line pre-charge circuit; a charge transfer circuit connected between the cell bit line pair and the sense amplifier bit line pair; a first sense amplifier circuit for amplifying a voltage of the sense amplifier bit line pair to a first voltage in response to a first control signal; and a second sense amplifier circuit for amplifying the voltage of the sense amplifier bit line pair to a second voltage in response to a second control signal. The combination of the two-stage sense amplifier ciruitry allows for the accurate determination of minimally-different logical voltage levels and minimized circuit area.