Abstract: A display panel, a method of manufacturing the display panel, and a display device are provided. The display panel includes: an electrode layer; an auxiliary electrode layer opposite to the electrode layer; and a plurality of transparent conductive particles between the electrode layer and the auxiliary electrode layer, wherein the plurality of transparent conductive particles are configured such that the electrode layer and the auxiliary electrode layer are electrically connected with each other.

Abstract: Disclosed is a panel testing device. The panel testing device includes: a supporter and a plurality of test pins disposed on the supporter, wherein the plurality of test pins are in one-to-one correspondence with a plurality of signal pins on the tested panel, any one of the test pins satisfies d?D?d+L; wherein D is a width of the test pin, d is a width of the signal pin corresponding to the test pin, L is a minimum pitch between two adjacent signal pins.

Abstract: The disclosure provides an array substrate, a display panel, a display device, and a method for fabricating the same. The array substrate provided by the present disclosure includes a substrate, a wiring on the substrate, an insulating layer covering the wiring, and a protrusion on the insulating layer and located in a non-display region of the array substrate. Wherein the protrusion is adjacent to the wiring, and wherein a surface, away from the base substrate, of the protrusion is further away from the base substrate than a surface, away from the base substrate, of a portion of the first insulating layer covering the wiring.

Abstract: A manufacturing method of an OLED display panel is provided. At least one of a electroluminescent material layer and a second electrode layer is formed such that a thickness of the second electrode layer in a light emitting region of the OLED display panel is less than that of the second electrode layer in a non-light emitting region of the OLED display panel. The method includes applying charges of a first conductivity type to a layer structure located below a to-be-formed layer and in the light emitting region, applying charges of the first conductivity type to a material of the to-be-formed layer, and applying the material of the to-be-formed layer having the charges of the first conductivity type to the layer structure to form the to-be-formed layer. An OLED display panel manufactured by the above method and an electronic device are further provided.

Abstract: A stockyard joint reclaiming system includes an outer output conveyor, a scraper reclaimer provided with a scraper mechanism, an inner feeder, and an inner output conveyor arranged below a stockpile. The scraper mechanism includes a chain and a scraper installed on a chain. The chain moves forwards or backwards under the action of a driving device to drive the scraper to push materials to a corresponding discharging port. The scraper mechanism drives the scraper through forward or reverse operation of the chain for pushing the materials to the output conveyor and a reclaiming line can be selected. A reclaiming mode is flexible and more output lines are available. When the material level is lower than a horizontal position, the scraper is driven to move through a reverse operation of the chain to push the materials to an upper part of the inner feeder for realizing reclaiming, thereby reducing unnecessary energy consumption and effectively guaranteeing the reclaiming capability of the scraper reclaimer.

Abstract: A display panel, a method of manufacturing the display panel, and a display device are provided. The display panel includes: an electrode layer; an auxiliary electrode layer opposite to the electrode layer; and a plurality of transparent conductive particles between the electrode layer and the auxiliary electrode layer, wherein the plurality of transparent conductive particles are configured such that the electrode layer and the auxiliary electrode layer are electrically connected with each other.

Abstract: An organic light-emitting diode (OLED) array substrate, a display apparatus and a method for repairing a dark spot of the display apparatus or the OLED array substrate are provided by the embodiments of the present disclosure. The OLED array substrate includes: power lines, a connection component, a pixel structure disposed in a pixel region, and the pixel structure includes a driving transistor, and an OLED device. The OLED device includes a first electrode and a second electrode, and the first electrode is electrically connected with the first source/drain electrode of the driving transistor; the connection component is configured to electrically insulating the first electrode from the power lines before repairing the OLED array substrate; and the connection component is further configured to electrically connect the first electrode (anode or cathode) with the power lines in a case of repairing the OLED array substrate.

Abstract: An electrical connection structure, an array substrate and a display device. The electrical connection structure includes a first electrical connection component, which includes: a conductive structure; an insulating layer covering the conductive structure, where at least one first via hole and at least one second via hole are disposed separately in the insulating layer, each first via hole and each second via hole expose a respective part of a surface of the conductive structure; and a conductive connection layer disposed on the insulating layer and covering the at least one first via hole and the at least one second via hole, where the conductive connection layer and the conductive structure are electrically connected with each other through the at least one first via hole and the at least one second via hole. The electrical connection structure can reduce undercut phenomena that occur at via holes in the insulating layer.

Abstract: Disclosed is a panel testing device. The panel testing device includes: a supporter and a plurality of test pins disposed on the supporter, wherein the plurality of test pins are in one-to-one correspondence with a plurality of signal pins on the tested panel, any one of the test pins satisfies d?D?d+L; wherein D is a width of the test pin, d is a width of the signal pin corresponding to the test pin, L is a minimum pitch between two adjacent signal pins.

Abstract: An organic light-emitting diode (OLED) array substrate, a display apparatus and a method for repairing a dark spot of the display apparatus or the OLED array substrate are provided by the embodiments of the present disclosure. The OLED array substrate includes: power lines, a connection component, a pixel structure disposed in a pixel region, and the pixel structure includes a driving transistor, and an OLED device. The OLED device includes a first electrode and a second electrode, and the first electrode is electrically connected with the first source/drain electrode of the driving transistor; the connection component is configured to electrically insulating the first electrode from the power lines before repairing the OLED array substrate; and the connection component is further configured to electrically connect the first electrode (anode or cathode) with the power lines in a case of repairing the OLED array substrate.

Abstract: A stockyard joint reclaiming system includes an outer output conveyor, a scraper reclaimer provided with a scraper mechanism, an inner feeder, and an inner output conveyor arranged below a stockpile. The scraper mechanism includes a chain and a scraper installed on a chain. The chain moves forwards or backwards under the action of a driving device to drive the scraper to push materials to a corresponding discharging port. The scraper mechanism drives the scraper through forward or reverse operation of the chain for pushing the materials to the output conveyor and a reclaiming line can be selected. A reclaiming mode is flexible and more output lines are available. When the material level is lower than a horizontal position, the scraper is driven to move through a reverse operation of the chain to push the materials to an upper part of the inner feeder for realizing reclaiming, thereby reducing unnecessary energy consumption and effectively guaranteeing the reclaiming capability of the scraper reclaimer.

Abstract: There are provided an array substrate and a method of manufacturing the same, a display panel and a display device. The array substrate includes a substrate and and an array region and a peripheral wire region formed on the substrate, peripheral wires in the peripheral wire region each including a plurality of vacancy patterns. Adjacent edges of the non-vacancy patterns of the peripheral wires define shielding regions such that the maximum circle region contained in the shielding regions has a maximum diameter of a first threshold value. The vacancy patterns of each of the peripheral wires have a total area of a second threshold value. The resistivity of the peripheral wire is in a range from 0 to 2.83×10?8 ?·m. The embodiments of the present disclosure address problem in prior art that a peripheral wire blocks curing of the frame sealing glue in the display panel so that the frame sealing glue is cured insufficiently and throughout of the display panel is thus degraded.

Abstract: An electrical connection structure, an array substrate and a display device. The electrical connection structure includes a first electrical connection component, which includes: a conductive structure; an insulating layer covering the conductive structure, where at least one first via hole and at least one second via hole are disposed separately in the insulating layer, each first via hole and each second via hole expose a respective part of a surface of the conductive structure; and a conductive connection layer disposed on the insulating layer and covering the at least one first via hole and the at least one second via hole, where the conductive connection layer and the conductive structure are electrically connected with each other through the at least one first via hole and the at least one second via hole. The electrical connection structure can reduce undercut phenomena that occur at via holes in the insulating layer.

Abstract: The present disclosure provides an organic electroluminescent display backpanel, cover and device, wherein the backpanel comprises a backpanel body and a plurality of supporting columns, the backpanel body comprises a substrate and an array of organic electroluminescent elements formed on the substrate, and the supporting column is disposed at a side of the array of organic electroluminescent elements away from the substrate.

Abstract: An arrangement structure of a stacker and a reclaimer, comprises a stacker, a reclaimer, a stacker travelling track, a reclaimer travelling track, a material input conveyor, a material output conveyor, a material storage yard, and a closed material storage shed. The stacker and the material input conveyor are inside the reclaimer, and the reclaimer upwards straddles the stacker and the material input conveyor. The stacker and the material input conveyor penetrate through an internal space of the reclaimer. An arrangement form that a rack of the reclaimer upwards straddles the stacker is adopted so that a problem of interference caused when the stacker is as high as an upper travelling platform of the reclaimer is solved. The upper travelling platform of the reclaimer does not need to be independently arranged.

Abstract: The present disclosure provides an array substrate and a method of manufacturing the same, and a display device comprising the array substrate. The array substrate comprises: a substrate; gate lines and data lines arranged to intersect one another on the substrate; a gate line connection conducting wire layer provided between the gate lines and the substrate and below the gate lines; and/or, a data line connection conducting wire layer provided in regions of the array substrate corresponding to the data lines; wherein the gate line connection conducting wire layer is electrically isolated from the data line connection conducting wire layer.

Abstract: The present disclosure discloses a method and system of determining a location of a line fault of a panel. The method comprises: connecting a front end point of a metal wire that is determined to have suffered the line fault to a probe of a test instrument, the other probe of the test instrument being connected to a common electrode wire; performing a fusing-off processing on the metal wire according to a preset rule; and determining the location of the line fault of the metal wire based on a variation in the readings from the test instrument upon the fusing-off of the metal wire. The system comprises: a test instrument, one probe of which being connected to a front end point of a metal wire that is determined to have suffered the line fault, the other probe of which being connected to a common electrode wire; and a laser for performing a fusing-off processing on the metal wire.

Abstract: A rolling apparatus, comprising a mounting bracket, a supporting platform and a rolling device; the mounting bracket is disposed above the supporting platform, and the rolling device is disposed on the mounting bracket so as to be located above the supporting platform; wherein the supporting platform is configured to support a display panel thereon; and the rolling device is configured to perform a rolling process on the display panel at a predetermined pressure. A rolling method, comprising supporting a display panel; and rolling the display panel at a predetermined pressure to cause an observable defection resulted from a foreign substance within the display panel. With the rolling apparatus and the rolling method, the display panel containing foreign substance will be detected as a defective product during the Cell Test so as not to enter the modular process, thereby avoiding any waste of module materials.

Abstract: There are provided an array substrate and a method of manufacturing the same, a display panel and a display device, The array substrate includes a substrate and and an array region and a peripheral wire region formed on the substrate, peripheral wires in the peripheral wire region each including a plurality of vacancy patterns. Adjacent edges of the non-vacancy patterns of the peripheral wires define shielding regions such that the maximum circle region contained in the shielding regions has a maximum diameter of a first threshold value. The vacancy patterns of each of the peripheral wires have a total area of a second threshold value. The resistivity of the peripheral wire is in a range from 0 to 2.83×10?8 ?·m. The embodiments of the present disclosure address problem in prior art that a peripheral wire blocks curing of the frame sealing glue in the display panel so that the frame sealing glue is cured insufficiently and throughout of the display panel is thus degraded.

Abstract: The present disclosure discloses a method and system of determining a location of a line fault of a panel. The method comprises: connecting a front end point of a metal wire that is determined to have suffered the line fault to a probe of a test instrument, the other probe of the test instrument being connected to a common electrode wire; performing a fusing-off processing on the metal wire according to a preset rule; and determining the location of the line fault of the metal wire based on a variation in the readings from the test instrument upon the fusing-off of the metal wire. The system comprises: a test instrument, one probe of which being connected to a front end point of a metal wire that is determined to have suffered the line fault, the other probe of which being connected to a common electrode wire; and a laser for performing a fusing-off processing on the metal wire.