Abstract: An information handling system includes multiple dual in-line memory modules (DIMMs) and a basic input/output system (BIOS). The DIMMs form a memory system of the information handling system. The BIOS begins a system boot of the information handling system, and performs a first memory reference code training. Based on the first memory reference code training, the BIOS discovers a bad DIMM of the DIMMs, and stores information associated with the bad DIMM. The BIOS reboots the information handling system. During the reboot, the BIOS retrieves the information associated with the bad DIMM. The BIOS disables a slot associated with the bad DIMM. In response to the slot being disabled, the BIOS performs a second memory reference code training. Based on the second memory reference code training, the BIOS downgrades the memory system to a closest possible DIMM population.

Abstract: A method of fabricating a HEMT includes the following steps. A substrate having a group III-V channel layer, a group III-V barrier layer, a group III-V gate layer, and a gate etch stop layer disposed thereon is provided. A passivation layer is formed to cover the group III-V barrier layer and the gate etch stop layer. A gate contact hole and at least one source/drain contact hole are formed in the passivation layer, where the gate contact hole exposes the gate etch stop layer, and the at least one source/drain contact hole exposes the group III-V channel layer. In addition, a conductive layer is conformally disposed on a top surface of the passivation layer and in the gate contact hole and the at least one source/drain contact hole.

Abstract: An optoelectronic package and a method for producing the optoelectronic package are provided. The optoelectronic package includes a carrier, a photonic device, a first encapsulant and a second encapsulant. The photonic device is disposed on the carrier. The first encapsulant covers the carrier and is disposed around the photonic device. The second encapsulant covers the first encapsulant and the photonic device. The first encapsulant has a topmost position and a bottommost position, and the topmost position is not higher than a surface of the photonic device.

Abstract: A method of fabricating a semiconductor structure includes forming a GaN-based semiconductor layer on a substrate, forming a silicon-containing insulating layer on the GaN-based semiconductor layer, forming a recess in the silicon-containing insulating layer in a first etching step, wherein the first etching step is performed by using a fluorine-containing etchant and applying a first bias power, and enlarging the recess to extend into the GaN-based semiconductor layer in a second etching step, wherein the second etching step is performed by using the same fluorine-containing etchant as the first etching step and applying a second bias power that is greater than the first bias power. In addition, a method of fabricating a high electron mobility transistor is provided.

Abstract: A semiconductor structure includes a ceramic substrate, a first bonding layer, a second bonding layer, a cavity, and a semiconductor layer. The ceramic substrate includes holes on its surface. The first bonding layer is disposed on the surface of the ceramic substrate, and the second bonding layer is bonded to the first bonding layer. The cavity is disposed above the hole and enclosed by the first bonding layer and the second bonding layer. The semiconductor layer extends over the cavity and is disposed along the surface of the second bonding layer.

Abstract: A semiconductor structure includes a substrate, a semiconductor epitaxial layer, a semiconductor barrier layer, a first semiconductor device, a doped isolation region, and at least one isolation pillar. The substrate includes a core layer and a composite material layer, the semiconductor epitaxial layer is disposed on the substrate, and the semiconductor barrier layer is disposed on the semiconductor epitaxial layer. The first semiconductor device is disposed on the substrate, where the first semiconductor device includes a first semiconductor cap layer disposed on the semiconductor barrier layer. The doped isolation region is disposed at one side of the first semiconductor device. At least a portion of the isolation pillar is disposed in the doped isolation region, and the isolation pillar surrounds at least a portion of the first semiconductor device and penetrates the composite material layer.

Abstract: A semiconductor device is provided. The semiconductor device includes a substrate; a buffer layer on the substrate; a channel layer on the buffer layer; a barrier layer on the channel layer; a doped compound semiconductor layer on a portion of the barrier layer; an un-doped first capping layer on the doped compound semiconductor layer; a gate structure on the un-doped first capping layer; and source/drain structures on opposite sides of the gate structure. There is a channel region in the channel layer that is adjacent to the interface between the channel layer and the barrier layer.

Abstract: A high electron mobility transistor (HEMT) includes a semiconductor channel layer, a semiconductor barrier layer, a patterned semiconductor capping layer, and a patterned semiconductor protection layer disposed on a substrate in sequence. The HEMT further includes an interlayer dielectric layer and a gate electrode. The interlayer dielectric layer covers the patterned semiconductor capping layer and the patterned semiconductor protection layer, and includes a gate contact hole. The gate electrode is disposed in the gate contact hole and electrically coupled to the patterned semiconductor capping layer, where the patterned semiconductor protection layer is disposed between the gate electrode and the patterned semiconductor capping layer. The resistivity of the patterned semiconductor protection layer is between the resistivity of the patterned semiconductor capping layer and the resistivity of the interlayer dielectric layer.

Abstract: A method of fabricating a HEMT includes the following steps. A substrate having a group III-V channel layer, a group III-V barrier layer, a group III-V gate layer, and a gate etch stop layer disposed thereon is provided. A passivation layer is formed to cover the group III-V barrier layer and the gate etch stop layer. A gate contact hole and at least one source/drain contact hole are formed in the passivation layer, where the gate contact hole exposes the gate etch stop layer, and the at least one source/drain contact hole exposes the group III-V channel layer. In addition, a conductive layer is conformally disposed on a top surface of the passivation layer and in the gate contact hole and the at least one source/drain contact hole.

Abstract: A high electron mobility transistor (HEMT) includes a group III-V channel layer, a passivation layer, a group III-V barrier layer, a gate structure, and a source/drain electrode. The passivation layer is disposed on the group III-V channel layer and includes a gate contact hole and a source/drain contact hole, and the group III-V barrier layer is disposed between the group III-V channel layer and the passivation layer. The gate structure includes group III-V gate layer, a gate etch stop layer, and a gate electrode which are stacked in sequence. The gate electrode is disposed in the gate contact hole and conformally covers a portion of the top surface of the passivation layer. The source/drain electrode is disposed in the source/drain contact hole and conformally covers another portion of the top surface of the passivation layer.

Abstract: A semiconductor structure includes a substrate, a semiconductor epitaxial layer, a semiconductor barrier layer, a first semiconductor device, a doped isolation region, and at least one isolation pillar. The substrate includes a core layer and a composite material layer, the semiconductor epitaxial layer is disposed on the substrate, and the semiconductor barrier layer is disposed on the semiconductor epitaxial layer. The first semiconductor device is disposed on the substrate, where the first semiconductor device includes a first semiconductor cap layer disposed on the semiconductor barrier layer. The doped isolation region is disposed at one side of the first semiconductor device. At least a portion of the isolation pillar is disposed in the doped isolation region, and the isolation pillar surrounds at least a portion of the first semiconductor device and penetrates the composite material layer.

Abstract: A method of manufacturing copolymer includes mixing and reacting a polyester, an aliphatic polyol or an aliphatic polyol oligomer, and a first catalyst in a first region of a screw to form a polyester polyol, and side-feeding a lactone or a lactam to a second region of the screw to copolymerize the lactone or a lactam and the polyester polyol to form a copolymer, wherein the first region and the second region are continuous connecting regions.

Abstract: A semiconductor structure and a method for manufacturing the same are provided. The semiconductor structure includes a substrate and a seed layer on the substrate. The substrate includes a base and a composite layer encapsulating the base. The semiconductor structure also includes an epitaxial layer on the seed layer. The semiconductor structure also includes a semiconductor device on the epitaxial layer, and an interlayer dielectric layer on the epitaxial layer. The interlayer dielectric layer covers the semiconductor device. The semiconductor structure further includes a via structure that penetrates at least the composite layer of the substrate and is in contact with the base.

Abstract: A semiconductor device includes and an active region and a peripheral region. The peripheral region includes a seal region. The semiconductor device includes a substrate and a seed layer one the substrate. The semiconductor device also includes a GaN-containing composite layer on the seed layer, and the GaN-containing composite layer is disposed in the active region and the peripheral region. The semiconductor device also includes a gate electrode, a source electrode and a drain electrode disposed on the GaN-containing composite layer within the active region. The source electrode and the drain electrode are disposed at two opposite sides of the gate electrode. The semiconductor device further includes a sealing structure, and the sealing structure includes a barrier structure and a seal component in the seal region. The barrier structure is disposed around the active region. The barrier structure penetrates the GaN-containing composite layer and the seed layer.

Abstract: A method of fabricating a semiconductor structure includes forming a GaN-based semiconductor layer on a substrate, forming a silicon-containing insulating layer on the GaN-based semiconductor layer, forming a recess in the silicon-containing insulating layer in a first etching step, wherein the first etching step is performed by using a fluorine-containing etchant and applying a first bias power, and enlarging the recess to extend into the GaN-based semiconductor layer in a second etching step, wherein the second etching step is performed by using the same fluorine-containing etchant as the first etching step and applying a second bias power that is greater than the first bias power. In addition, a method of fabricating a high electron mobility transistor is provided.

Abstract: A semiconductor device includes a base and a conductive layer to form a composite substrate. The conductive layer covers a surface of the base. The semiconductor device also includes a dielectric layer covering the conductive layer. The conductive layer is disposed between the dielectric layer and the base. The semiconductor device further includes a GaN-containing composite layer, a gate electrode disposed over the GaN-containing composite layer, a source electrode and a drain electrode disposed on the GaN-containing composite layer. The source electrode and the drain electrode are disposed at two opposite sides of the gate electrode. In addition, a method for manufacturing the semiconductor device with a composite substrate is provided.

Abstract: A high electron mobility transistor (HEMT) includes a group III-V channel layer, a passivation layer, a group III-V barrier layer, a gate structure, and a source/drain electrode. The passivation layer is disposed on the group III-V channel layer and includes a gate contact hole and a source/drain contact hole, and the group III-V barrier layer is disposed between the group III-V channel layer and the passivation layer. The gate structure includes group III-V gate layer, a gate etch stop layer, and a gate electrode which are stacked in sequence. The gate electrode is disposed in the gate contact hole and conformally covers a portion of the top surface of the passivation layer. The source/drain electrode is disposed in the source/drain contact hole and conformally covers another portion of the top surface of the passivation layer.

Abstract: A semiconductor device is provided. The semiconductor device includes a substrate; a buffer layer on the substrate; a channel layer on the buffer layer; a barrier layer on the channel layer; a doped compound semiconductor layer on a portion of the barrier layer; an un-doped first capping layer on the doped compound semiconductor layer; a gate structure on the un-doped first capping layer; and source/drain structures on opposite sides of the gate structure. There is a channel region in the channel layer that is adjacent to the interface between the channel layer and the barrier layer.

Abstract: A method of fabricating a semiconductor structure includes forming a GaN-based semiconductor layer on a substrate, forming a silicon-containing insulating layer on the GaN-based semiconductor layer, forming a recess in the silicon-containing insulating layer in a first etching step, wherein the first etching step is performed by using a fluorine-containing etchant and applying a first bias power, and enlarging the recess to extend into the GaN-based semiconductor layer in a second etching step, wherein the second etching step is performed by using the same fluorine-containing etchant as the first etching step and applying a second bias power that is greater than the first bias power. In addition, a method of fabricating a high electron mobility transistor is provided.

Abstract: A semiconductor structure is provided. The semiconductor structure includes: a substrate; a source structure and a drain structure disposed on the substrate; a gate structure disposed on the substrate and between the source structure and the drain structure; a first field plate disposed on the substrate; a first oxide layer disposed between the substrate and the first field plate; a second field plate disposed on the first field plate, wherein the second field plate is closer to the drain structure than the first field plate; a planarized second oxide layer disposed between the first oxide layer and the second field plate; and a third field plate disposed on the second field plate, wherein the third field plate is closer to the drain structure than the second field plate.