Abstract: A method of an integrated circuit chip, includes: calculating a first slope of distance-to-spatial relation under first design condition according to spatial distance difference between two circuit elements within integrated circuit chip and a spatial process variation under first design condition; calculating a second slope of the distance-to-spatial relation under a second design condition according to the spatial distance difference and a spatial process variation under second design condition; calculating a ratio coefficient and an exponential coefficient according to the first slope, the second slope, a global process variation under the first design condition, and a global process variation under the second design condition; calculating a third slope of the distance-to-spatial relation under a third design condition according to the ratio coefficient and the exponential coefficient; and estimating a spatial process variation under the third design condition according to the third slope and the spatial d

Abstract: A critical path analysis method includes: obtaining multiple critical paths of a digital circuit; sorting the critical paths according to stage counts of the critical paths and dividing the critical paths into batches; using a simulation program with integrated circuit emphasis (SPICE) tool to analyze the batches sequentially to generate a static timing analysis (STA) report with respect to the critical paths.

Abstract: An integrated circuit simulation method is performed by a processor and includes: obtaining a register transfer level (RTL) waveform set obtained by performing an RTL simulation based on a circuit, where the circuit is generated in an RTL design stage and includes a register having an internal net and a data output port, and the RTL waveform set includes a first waveform corresponding to the data output port of the register; obtaining a netlist and delay information obtained by performing a logic synthesis based on the circuit, where the netlist includes a first node and a second node, the first node corresponds to the internal net of the register, and the second node corresponds to the data output port of the register; applying the first waveform to the first node; and triggering the register according to the delay information to obtain a second waveform at the second node.

Abstract: A circuit check method and an electronic apparatus applicable to a to-be-tested circuit are provided. The to-be-tested circuit has one or more first nodes related to a gate voltage of one or more transistor devices and a plurality of second nodes. The circuit check method includes: setting endpoint voltages of a plurality of input interface ports of the to-be-tested circuit; obtaining a first node voltage of the first node according to a conduction path of the to-be-tested circuit and the gate voltage of the transistor device; obtaining a second node voltage of each second node according to the conduction path, the endpoint voltages, and the first node voltage; and performing circuit static check on the to-be-tested circuit by applying the first node voltage and the second node voltage.

Abstract: A static timing analysis method and a static timing analysis system are provided. The static timing analysis methods includes: obtaining a standard cell library file for describing a plurality of standard cells; performing topology mapping on the standard cell library file to find out a target sequential cell from the standard cells, in which the sequential cell includes a logic gate, a selection circuit and a register circuit; executing a logic test process to find out a pin combination that has a mutual non-controllable relationship, and removing timing constraints related to the pin combination that are taken as redundant timing constraints from the standard cell library file, so as to generate an optimized standard library file; and perform a static timing analysis on a target circuit design according to the optimized standard cell library file.

Abstract: A circuit verification method, including the following steps: inputting a circuit design data to a processor, wherein the circuit design data includes a plurality of logic circuits and a plurality of detection nodes, each logic circuit includes a control terminal and a plurality of input terminals, and is configured to output a signal to the detection node; inputting a plurality of first-stage property command to the processor to generate a plurality of first-stage formal commands, and the first-stage formal commands are configured to verify whether signals of the detection nodes remain stable when a signals of the control terminal of each of the logic circuits does not changed; finding a first part of the detection nodes by a formal method according to the first-stage formal commands; and finding a second part of the detection nodes by a formal method.

Abstract: A margin correction method and a margin correction system for static timing analysis are provided. The margin calibration method includes: measuring dies on a to-be-tested chip with a target circuit to obtain performance data records; obtaining simulation data records for simulating performances of the dies; executing a static timing analysis (STA) tool to obtain timing analysis results; statistically calculating a simulation process corner based on the timing analysis results; obtaining a measurement process corner based on the performance data records; establishing a statistical model that defines a margin as a difference between the measurement process corner and the simulation process corner; substituting the timing analysis results and the measurement process corner into the statistical model and execute a model fitting algorithm, for fitting the statistical model to a target model to obtain the margin; and obtaining calibrated timing analysis results.

Abstract: A method for establishing a variation model related to circuit characteristics for performing circuit simulation includes: performing first, second, third, and fourth Monte Carlo simulation operations according to a first netlist file and predetermined process model data to generate a first, a second, a third, and a fourth performance simulation results, respectively, where the first netlist file is arranged to indicate a basic circuit in a circuit system; and execute a performance simulation results expansion procedure according to the first, the second, the third, and the fourth performance simulation results to generate a plurality of performance simulation results to establish the variation model, for performing the circuit simulation to generate at least one circuit simulation result according to one or more performance simulation results among the plurality of performance simulation results, where the number of the plurality of performance simulation results is greater than four.

Abstract: A processing system is adapted to execute a method for testing power leakage of a circuit. The method includes: obtaining a plurality of undefined nets according to a netlist and power mode information; obtaining a trace path according to the undefined nets and the power mode information; and determining whether there is a risk of power leakage in the trace path, and outputting a testing result.

Abstract: A circuit simulation method includes the following operations: performing Monte Carlo simulations in parallel according to a first netlist file and process model data, in order to generate a performance simulation result, in which the first netlist file is configured to indicate a basic circuit in a circuitry; selecting component parameters lower than a predetermined yield rate according to the performance simulation result; and determining whether an estimated yield rate of the circuitry meets the predetermined yield rate according to the component parameters.

Abstract: Disclosed is an IC voltage determining method including: executing a static timing analysis according to a circuit design to obtain data of a critical path and then generating a netlist; executing a circuit parameter simulation and Monte Carlo simulation with the netlist according to a regular voltage and prescribed parameters to obtain a circuit parameter reference value and a variance of circuit parameter values; executing an adaptive voltage scaling analysis according to a voltage range to obtain a voltage-versus-parameter relation indicative of the number of times that each of circuit parameter deviations that are respectively associated with predetermined voltages within the predetermined voltage range is of the variance; and testing an IC according to the regular voltage to obtain a circuit parameter test value and determining the IC voltage according to the voltage-versus-parameter relation and a difference between the circuit parameter test value and the circuit parameter reference value.

Abstract: An integrated circuit simulation method is performed by a processor and includes: obtaining a register transfer level (RTL) waveform set obtained by performing an RTL simulation based on a circuit, where the circuit is generated in an RTL design stage and includes a register having an internal net and a data output port, and the RTL waveform set includes a first waveform corresponding to the data output port of the register; obtaining a netlist and delay information obtained by performing a logic synthesis based on the circuit, where the netlist includes a first node and a second node, the first node corresponds to the internal net of the register, and the second node corresponds to the data output port of the register; applying the first waveform to the first node; and triggering the register according to the delay information to obtain a second waveform at the second node.

Abstract: An IC design data base generating method, including: receiving a condition parameter, which comprises a process parameter and an operating parameter range comprising at least one operating parameter; and testing at least one cell according to the process parameter and the operating parameter range to generate a delay value data base. The delay value data base comprises a plurality of delay values, wherein the plurality of delay values for an identical cell correspond to the operating parameter range with an identical type but different value. An IC design method using the delay value data base is also disclosed.

Abstract: A clock deadlock detecting system includes a memory and a processor. The memory is configured to store at least one computer program. The processor is configured to execute the at least one computer program to perform following operations: extracting hierarchy information of a plurality of integrated clock gating (ICG) cells, in which the hierarchy information is a description of a circuit structure of the ICG cells; generating at least one checking property according to integrated circuit design information and the hierarchy information; determining whether the ICG cells satisfy the at least one checking property according to the integrated circuit design information and a formal method to determine whether the ICG cells is expected to fall into at least one clock deadlock state, so as to generate a determination result; and modifying the integrated circuit design information according to the determination result.

Abstract: A circuit check method and an electronic apparatus applicable to a to-be-tested circuit are provided. The to-be-tested circuit has one or more first nodes related to a gate voltage of one or more transistor devices and a plurality of second nodes. The circuit check method includes: setting endpoint voltages of a plurality of input interface ports of the to-be-tested circuit; obtaining a first node voltage of the first node according to a conduction path of the to-be-tested circuit and the gate voltage of the transistor device; obtaining a second node voltage of each second node according to the conduction path, the endpoint voltages, and the first node voltage; and performing circuit static check on the to-be-tested circuit by applying the first node voltage and the second node voltage.

Abstract: A method of detecting the relations between the pins of a circuit and a computer program product thereof are provided. The method includes: retrieving a circuit description file describing a circuit; retrieving at least one data pin and at least one clock pin of the circuit; converting the circuit to a cell level; and tracing the circuit in the cell level to identify multiple flip-flops coupled to the clock pin; tracing the circuit in the cell level to identify a target flip-flop coupled to the data pin; and determining whether the data pin is related to the clock pin according to the data signal and the clock signal of the target flip-flop.

Abstract: A method of detecting a circuit malfunction in a register transfer level, RTL, design stage is disclosed. The method comprises obtaining signal points of each register from a circuit model based on the RTL design stage, generating a property list according to the signal points of each register, wherein the property list includes a property to be verified for each signal point, performing a formal verification operation according to the circuit model and the property list, to determine whether the property of the property list for each signal point in the circuit model is true, and generating a circuit malfunction result according to the signal point whose property is not true.

Abstract: A method of detecting the relations between the pins of a circuit and a computer program product thereof are provided. The method includes: retrieving a circuit description file describing a circuit; retrieving at least one data pin and at least one clock pin of the circuit; converting the circuit to a cell level; and tracing the circuit in the cell level to identify multiple flip-flops coupled to the clock pin; tracing the circuit in the cell level to identify a target flip-flop coupled to the data pin; and determining whether the data pin is related to the clock pin according to the data signal and the clock signal of the target flip-flop.

Abstract: The present disclosure discloses a glitch occurring point detection method to detect at least one glitch occurring point in an under-test circuit that includes the steps outlined below. An IC design file is retrieved to further retrieve a plurality of input nodes, at least one output node and a plurality of power nodes corresponding to the under-test circuit in the IC design file. Signals are fed to the input nodes and the power nodes such that a DC analysis is performed on a plurality of internal circuit nodes in the under-test circuit and a plurality of candidate floating points that do not have any charging or discharging path connected thereto are retrieved according to the DC analysis. Each of the candidate floating points capable of triggering the output node during the operation of the under-test circuit are determined to be the glitch occurring point.

Abstract: An IC design data base generating method, including: receiving a condition parameter, which comprises a process parameter and an operating parameter range comprising at least one operating parameter; and testing at least one cell according to the process parameter and the operating parameter range to generate a delay value data base. The delay value data base comprises a plurality of delay values, wherein the plurality of delay values for an identical cell correspond to the operating parameter range with an identical type but different value. An IC design method using the delay value data base is also disclosed.