Patents by Inventor Yuan-Ching Peng
Yuan-Ching Peng has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20210359095Abstract: A semiconductor structure includes a semiconductor substrate; fin active regions protruded above the semiconductor substrate; and a gate stack disposed the fin active regions; wherein the gate stack includes a high-k dielectric material layer, and various metal layers disposed on the high-k dielectric material layer. The gate stack has an uneven profile in a sectional view with a first dimension D1 at a top surface, a second dimension D2 at a bottom surface, and a third dimension D3 at a location between the top surface and the bottom surface, and wherein each of D1 and D2 is greater than D3.Type: ApplicationFiled: April 2, 2021Publication date: November 18, 2021Inventors: Chi-Sheng Lai, Yu-Fan Peng, Li-Ting Chen, Yu-Shan Lu, Yu-Bey Wu, Wei-Chung Sun, Yuan-Ching Peng, Kuei-Yu Kao, Shih-Yao Lin, Chih-Han Lin, Pei-Yi Liu, Jing Yi Yan
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Publication number: 20210343578Abstract: An integrated circuit (IC) structure includes a gate structure, a source epitaxial structure, a drain epitaxial structure, a front-side interconnection structure, a backside dielectric layer, and a backside via. The source epitaxial structure and the drain epitaxial structure are respectively on opposite sides of the gate structure. The front-side interconnection structure is on a front-side of the source epitaxial structure and a front-side of the drain epitaxial structure. The backside dielectric layer is on a backside of the source epitaxial structure and a backside of the drain epitaxial structure and has an air gap therein. The backside via extends through the backside dielectric layer to a first one of the source epitaxial structure and the drain epitaxial structure.Type: ApplicationFiled: January 15, 2021Publication date: November 4, 2021Inventors: Che-Lun Chang, Wei-Yang Lee, Chia-Pin Lin, Yuan-Ching Peng
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Publication number: 20210273103Abstract: A method includes providing a structure having a substrate and a fin. The fin has first and second layers of first and second different semiconductor materials. The first layers and the second layers are alternately stacked over the substrate. The structure further has a sacrificial gate stack engaging a channel region of the fin and gate spacers on sidewalls of the sacrificial gate stack. The method further includes etching a source/drain (S/D) region of the fin, resulting in an S/D trench; partially recessing the second layers exposed in the S/D trench, resulting in a gap between two adjacent layers of the first layers; and depositing a dielectric layer over surfaces of the gate spacers, the first layers, and the second layers. The dielectric layer partially fills the gap, leaving a void sandwiched between the dielectric layer on the two adjacent layers of the first layers.Type: ApplicationFiled: July 31, 2020Publication date: September 2, 2021Inventors: Shih-Chiang Chen, Wei-Yang Lee, Chia-Pin Lin, Yuan-Ching Peng
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Patent number: 9349657Abstract: A method for manufacturing the integrated circuit device including, providing a substrate having a first region and a second region. Forming a dielectric layer over the substrate in the first region and the second region. Forming a sacrificial gate layer over the dielectric layer. Patterning the sacrificial gate layer and the dielectric layer to form gate stacks in the first and second regions. Forming an ILD layer within the gate stacks in the first and second regions. Removing the sacrificial gate layer in the first and second regions. Forming a protector over the dielectric layer in the first region; and thereafter removing the dielectric layer in the second region.Type: GrantFiled: June 17, 2011Date of Patent: May 24, 2016Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Sheng-Hsiung Wang, Hsien-Chin Lin, Yuan-Ching Peng, Chia-Pin Lin, Fan-Yi Hsu, Ya-Jou Hsieh
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Patent number: 9263578Abstract: A semiconductor substructure with improved performance and a method of forming the same is described. In one embodiment, the semiconductor substructure includes a substrate, having an upper surface; a gate structure formed over the substrate; a spacer formed along a sidewall of the gate structure; and a source/drain structure disposed adjacent the gate structure. The source/drain structures is formed of a strain material and is disposed in an recess that extends below the upper surface of the substrate. An interface between the spacer and the source-drain structure can be at least 2 nm above the upper surface of the substrate.Type: GrantFiled: April 28, 2015Date of Patent: February 16, 2016Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Wei-Yang Lee, Yuan-Ching Peng, Chun-Hsiung Tsai
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Patent number: 9224737Abstract: A method includes forming a first fin and a second fin extending above a semiconductor substrate, with a shallow trench isolation (STI) region between them. A space is defined between the first and second fins above a top surface of the STI region. A first height is defined between the top surface of the STI region and top surfaces of the first and second fins. A flowable dielectric material is deposited into the space. The dielectric material has a top surface above the top surface of the STI region, so as to define a second height between the top surface of the dielectric material and the top surfaces of the first and second fins. The second height is less than the first height. First and second fin extensions are epitaxially formed above the dielectric, on the first and second fins, respectively, after the depositing step.Type: GrantFiled: November 26, 2014Date of Patent: December 29, 2015Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Hung-Kai Chen, Hsien-Hsin Lin, Chia-Pin Lin, Chien-Tai Chan, Yuan-Ching Peng
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Publication number: 20150228791Abstract: A semiconductor substructure with improved performance and a method of forming the same is described. In one embodiment, the semiconductor substructure includes a substrate, having an upper surface; a gate structure formed over the substrate; a spacer formed along a sidewall of the gate structure; and a source/drain structure disposed adjacent the gate structure. The source/drain structures is formed of a strain material and is disposed in an recess that extends below the upper surface of the substrate. An interface between the spacer and the source-drain structure can be at least 2 nm above the upper surface of the substrate.Type: ApplicationFiled: April 28, 2015Publication date: August 13, 2015Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.Inventors: Wei-Yang LEE, Yuan-Ching PENG, Chun-Hsiung TSAI
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Patent number: 9029912Abstract: A semiconductor substructure with improved performance and a method of forming the same is described. In one embodiment, the semiconductor substructure includes a substrate, having an upper surface; a gate structure formed over the substrate; a spacer formed along a sidewall of the gate structure; and a source/drain structure disposed adjacent the gate structure. The source/drain structures is formed of a strain material and is disposed in an recess that extends below the upper surface of the substrate. An interface between the spacer and the source-drain structure can be at least 2 nm above the upper surface of the substrate.Type: GrantFiled: January 11, 2013Date of Patent: May 12, 2015Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Wei-Yang Lee, Yuan-Ching Peng, Chun-Hsiung Tsai
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Publication number: 20150115322Abstract: A method includes forming a first fin and a second fin extending above a semiconductor substrate, with a shallow trench isolation (STI) region between them. A space is defined between the first and second fins above a top surface of the STI region. A first height is defined between the top surface of the STI region and top surfaces of the first and second fins. A flowable dielectric material is deposited into the space. The dielectric material has a top surface above the top surface of the STI region, so as to define a second height between the top surface of the dielectric material and the top surfaces of the first and second fins. The second height is less than the first height. First and second fin extensions are epitaxially formed above the dielectric, on the first and second fins, respectively, after the depositing step.Type: ApplicationFiled: November 26, 2014Publication date: April 30, 2015Inventors: Hung-Kai CHEN, Hsien-Hsin LIN, Chia-Pin LIN, Chien-Tai CHAN, Yuan-Ching PENG
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Patent number: 8937353Abstract: A method includes forming a first fin and a second fin extending above a semiconductor substrate, with a shallow trench isolation (STI) region between them. A space is defined between the first and second fins above a top surface of the STI region. A first height is defined between the top surface of the STI region and top surfaces of the first and second fins. A flowable dielectric material is deposited into the space. The dielectric material has a top surface above the top surface of the STI region, so as to define a second height between the top surface of the dielectric material and the top surfaces of the first and second fins. The second height is less than the first height. First and second fin extensions are epitaxially formed above the dielectric, on the first and second fins, respectively, after the depositing step.Type: GrantFiled: March 1, 2010Date of Patent: January 20, 2015Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Hung-Kai Chen, Hsien-Hsin Lin, Chia-Pin Lin, Chien-Tai Chan, Yuan-Ching Peng
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Publication number: 20140197455Abstract: A semiconductor substructure with improved performance and a method of forming the same is described. In one embodiment, the semiconductor substructure includes a substrate, having an upper surface; a gate structure formed over the substrate; a spacer formed along a sidewall of the gate structure; and a source/drain structure disposed adjacent the gate structure. The source/drain structures is formed of a strain material and is disposed in an recess that extends below the upper surface of the substrate. An interface between the spacer and the source-drain structure can be at least 2 nm above the upper surface of the substrate.Type: ApplicationFiled: January 11, 2013Publication date: July 17, 2014Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.Inventors: Wei-Yang LEE, Yuan-Ching PENG, Chun-Hsiung TSAI
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Patent number: 8404538Abstract: A method includes providing a substrate comprising a substrate material, a gate dielectric film above the substrate, and a first spacer adjacent the gate dielectric film. The spacer has a first portion in contact with a surface of the substrate and a second portion in contact with a side of the gate dielectric film. A recess is formed in a region of the substrate adjacent to the spacer. The recess is defined by a first sidewall of the substrate material. At least a portion of the first sidewall underlies at least a portion of the spacer. The substrate material beneath the first portion of the spacer is reflowed, so that a top portion of the first sidewall of the substrate material defining the recess is substantially aligned with a boundary between the gate dielectric film and the spacer. The recess is filled with a stressor material.Type: GrantFiled: October 2, 2009Date of Patent: March 26, 2013Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Kao-Ting Lai, Da-Wen Lin, Hsien-Hsin Lin, Yuan-Ching Peng, Chi-Hsi Wu
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Patent number: 8372719Abstract: A method of removing a hard mask during fabrication of semiconductor devices is provided. A protective layer, such as a bottom anti-reflective coating (BARC) layer or other dielectric layer, is formed over structures formed on a substrate, wherein spacers are formed alongside the structures. In an embodiment, the structures are gate electrodes having a hard mask formed thereon and the spacers are spacers formed alongside the gate electrodes. A photoresist layer is formed over the protective layer, and the photoresist layer may be patterned to remove a portion of the photoresist layer over portions of the protective layer. Thereafter, an etch-back process is performed, such that the protective layer adjacent to the spacers remains to substantially protect the spacers. The hard mask is then removed while the protective layer protects the spacers.Type: GrantFiled: March 15, 2010Date of Patent: February 12, 2013Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Sheng-Hsiung Wang, Fu-Kai Yang, Yuan-Ching Peng, Chi-Cheng Hung
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Publication number: 20120322246Abstract: A method for manufacturing the integrated circuit device including, providing a substrate having a first region and a second region. Forming a dielectric layer over the substrate in the first region and the second region. Forming a sacrificial gate layer over the dielectric layer. Patterning the sacrificial gate layer and the dielectric layer to form gate stacks in the first and second regions. Forming an ILD layer within the gate stacks in the first and second regions. Removing the sacrificial gate layer in the first and second regions. Forming a protector over the dielectric layer in the first region; and thereafter removing the dielectric layer in the second region.Type: ApplicationFiled: June 17, 2011Publication date: December 20, 2012Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Sheng-Hsiung WANG, Hsien-Chin LIN, Yuan-Ching PENG, Chia-Pin LIN, Fan-Yi HSU, Ya-Jou HSIEH
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Publication number: 20110223753Abstract: A method of removing a hard mask during fabrication of semiconductor devices is provided. A protective layer, such as a bottom anti-reflective coating (BARC) layer or other dielectric layer, is formed over structures formed on a substrate, wherein spacers are formed alongside the structures. In an embodiment, the structures are gate electrodes having a hard mask formed thereon and the spacers are spacers formed alongside the gate electrodes. A photoresist layer is formed over the protective layer, and the photoresist layer may be patterned to remove a portion of the photoresist layer over portions of the protective layer. Thereafter, an etch-back process is performed, such that the protective layer adjacent to the spacers remains to substantially protect the spacers. The hard mask is then removed while the protective layer protects the spacers.Type: ApplicationFiled: March 15, 2010Publication date: September 15, 2011Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Sheng-Hsiung Wang, Fu-Kai Yang, Yuan-Ching Peng, Chi-Cheng Hung
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Publication number: 20110210393Abstract: A method includes forming a first fin and a second fin extending above a semiconductor substrate, with a shallow trench isolation (STI) region between them. A space is defined between the first and second fins above a top surface of the STI region. A first height is defined between the top surface of the STI region and top surfaces of the first and second fins. A flowable dielectric material is deposited into the space. The dielectric material has a top surface above the top surface of the STI region, so as to define a second height between the top surface of the dielectric material and the top surfaces of the first and second fins. The second height is less than the first height. First and second fin extensions are epitaxially formed above the dielectric, on the first and second fins, respectively, after the depositing step.Type: ApplicationFiled: March 1, 2010Publication date: September 1, 2011Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.Inventors: Hung-Kai Chen, Hsien-Hsin Lin, Chia-Pin Lin, Chien-Tai Chan, Yuan-Ching Peng
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Publication number: 20110079820Abstract: A method includes providing a substrate comprising a substrate material, a gate dielectric film above the substrate, and a first spacer adjacent the gate dielectric film. The spacer has a first portion in contact with a surface of the substrate and a second portion in contact with a side of the gate dielectric film. A recess is formed in a region of the substrate adjacent to the spacer. The recess is defined by a first sidewall of the substrate material. At least a portion of the first sidewall underlies at least a portion of the spacer. The substrate material beneath the first portion of the spacer is reflowed, so that a top portion of the first sidewall of the substrate material defining the recess is substantially aligned with a boundary between the gate dielectric film and the spacer. The recess is filled with a stressor material.Type: ApplicationFiled: October 2, 2009Publication date: April 7, 2011Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.Inventors: Kao-Ting Lai, Da-Wen Lin, Hsien-Hsin Lin, Yuan-Ching Peng, Chi-Hsi Wu
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Patent number: 7663237Abstract: A semiconductor structure and a method of forming the same using replacement gate processes are provided. The semiconductor structure includes a butted contact coupling a source/drain region, or a silicide on the source/drain region, of a first transistor and a gate extension. The semiconductor structure further includes a contact pad over the source/drain region of the first transistor and electrically coupled to the source/drain region. The addition of the contact pad reduces the contact resistance and the possibility that an open circuit is formed between the butted contact and the source/drain region. The contact pad preferably has a top surface substantially leveled with a top surface of the gate extension.Type: GrantFiled: December 27, 2005Date of Patent: February 16, 2010Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Yuan-Ching Peng, Chloe Hsin-yi Chen, David Hsu-Wei Lwu, Shyue-Shyh Lin, Wei-Ming Chen
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Patent number: 7349234Abstract: A magnetic random access memory (MRAM) device disclosed herein includes an array of magnetic memory cells having magnetoresistive (MR) stacks. The MRAM array also includes a series of bit lines and word lines coupled to the MR stacks. The array layout provides for reduced crosstalk between neighboring memory cells by increasing a distance between neighboring MR stacks along a common conductor without increasing the overall layout area of the MRAM array. Several embodiments are disclosed where neighboring MR stacks are offset such that the MR stacks are staggered. For example, groups of MR stacks coupled to a common word line or to a common bit line can be staggered. The staggered layout provides for increased distance between neighboring MR stacks for a given MRAM array area, thereby resulting in a reduction of crosstalk, for example during write operations.Type: GrantFiled: April 29, 2005Date of Patent: March 25, 2008Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Yuan-Ching Peng, Shyue-Shyh Lin, Wei-Ming Chen
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Publication number: 20070145519Abstract: A semiconductor structure and a method of forming the same using replacement gate processes are provided. The semiconductor structure includes a butted contact coupling a source/drain region, or a silicide on the source/drain region, of a first transistor and a gate extension. The semiconductor structure further includes a contact pad over the source/drain region of the first transistor and electrically coupled to the source/drain region. The addition of the contact pad reduces the contact resistance and the possibility that an open circuit is formed between the butted contact and the source/drain region. The contact pad preferably has a top surface substantially leveled with a top surface of the gate extension.Type: ApplicationFiled: December 27, 2005Publication date: June 28, 2007Inventors: Yuan-Ching Peng, Chloe Chen, David Lwu, Shyue-Shyh Lin, Wei-Ming Chen