Patents by Inventor Yuichi Ozawa
Yuichi Ozawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11969334Abstract: An artificial blood vessel 10 comprises: an artificial blood vessel body 12; and a carbon material film 11 that covers the inner wall of the artificial blood vessel body 12. The inner wall which is covered by the carbon material film 11 is configured so that the water vapor adsorption isotherm shows desorption hysteresis.Type: GrantFiled: September 5, 2019Date of Patent: April 30, 2024Assignee: KAKE EDUCATIONAL INSTITUTIONInventors: Yasuhiro Fujii, Susumu Ozawa, Tatsuyuki Nakatani, Yuichi Imai
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Publication number: 20240085806Abstract: The stage apparatus according to the present invention includes a first stage configured to be movable in a first direction, a first driving unit configured to generate a thrust force to move the first stage in the first direction, and a reaction force reducing unit configured to generate a thrust force to reduce a reaction force generated by the generation of the thrust force of the first driving unit. The reaction force reducing unit can generate the thrust forces with different magnitudes from each other at a plurality of positions in a second direction perpendicular to the first direction, and can generate the thrust forces with different magnitudes from each other at a plurality of positions in a third direction perpendicular to the first direction and the second direction.Type: ApplicationFiled: August 3, 2023Publication date: March 14, 2024Inventor: YUICHI OZAWA
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Patent number: 11921405Abstract: A camera can perform two different photographing operations with a lens at different positions without vignetting while preventing entry of light and dust. A camera includes a frame including a film compartment to contain a photographic film and a barrel extending from the film compartment in an optical axis direction, and a lens barrel movable in the barrel in X-direction. The lens barrel includes cylinders movable frontward relative to the barrel, and a cylinder movable frontward relative to the cylinder. The camera includes a rear bellows connecting the frame and the cylinder, and a front bellows connecting the cylinder and the cylinder. In a first photographing state in which the cylinders extend frontward relative to the barrel and the cylinder is accommodated inside the cylinder, the rear bellows is expanded and the front bellows is partially contracted. In a second photographing state, the cylinder extends frontward relative to the cylinder.Type: GrantFiled: December 9, 2020Date of Patent: March 5, 2024Assignees: NIDEC COPAL CORPORATION, FUJIFILM CORPORATIONInventors: Tomihiro Wakayama, Yuichi Ozawa, Yoshiki Murayama, Takehisa Kirihara, Hisashi Tasaka
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Patent number: 11860514Abstract: A camera can perform two different photographing operations with a lens at different positions without vignetting while preventing entry of light and dust. A camera includes a frame including a film compartment to contain a photographic film and a barrel extending from the film compartment in an optical axis direction, and a lens barrel movable in the barrel in X-direction. The lens barrel includes cylinders movable frontward relative to the barrel, and a cylinder movable frontward relative to the cylinder. The camera includes a rear bellows connecting the frame and the cylinder, and a front bellows connecting the cylinder and the cylinder. In a first photographing state in which the cylinders extend frontward relative to the barrel and the cylinder is accommodated inside the cylinder, the rear bellows is expanded and the front bellows is partially contracted. In a second photographing state, the cylinder extends frontward relative to the cylinder.Type: GrantFiled: December 9, 2020Date of Patent: January 2, 2024Assignees: NIDEC COPAL CORPORATION, FUJIFILM CORPORATIONInventors: Tomihiro Wakayama, Yuichi Ozawa, Yoshiki Murayama, Takehisa Kirihara, Hisashi Tasaka
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Publication number: 20230318415Abstract: This method for manufacturing a rotor core includes an injection step of injecting a molten resin material into a magnet housing portion of a laminated core heated to a third temperature by a preheating step. The injection step is a step of injecting the resin material into the magnet housing portion while releasing to the outside of the magnet housing portion a volatile organic compound volatilized by heating the resin material by bringing the resin material into contact with the laminated core heated to the third temperature.Type: ApplicationFiled: March 23, 2021Publication date: October 5, 2023Applicants: AISIN CORPORATION, TOYOBO MC CorporationInventors: Toshiyuki SABURI, Naotaka HAYASHI, Masahito TANIGAWA, Daiki FUNAOKA, Tomohito OYAMA, Yuichi OZAWA, Ryo UETA, Yusaku SAKURABA
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Publication number: 20230086148Abstract: A rotor core includes a thermosetting resin material disposed in a magnet housing portion to fix a permanent magnet in the magnet housing portion. The resin material has a coefficient of linear expansion that is equal to or less than the coefficient of linear expansion of electromagnetic steel sheets.Type: ApplicationFiled: March 23, 2021Publication date: March 23, 2023Applicants: AISIN CORPORATION, TOYOBO CO., LTD.Inventors: Yasunari FURUTA, Toshiyuki SABURI, Masahito TANIGAWA, Daiki FUNAOKA, Tomohito OYAMA, Yuichi OZAWA, Ryo UETA, Yusaku SAKURABA
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Publication number: 20230082542Abstract: An object of the present invention is to provide a crystalline radically polymerizable composition for fixing a magnet of a rotating electric machine rotor core, which is excellent in handleability around room temperature, excellent in fluidity from the injection step to the curing step, and excellent in strength of the cured product. A crystalline radical polymerizable composition for fixing a magnet of a rotating electric machine rotor core of the present invention is characterized by fixing the magnet inserted in a magnet accommodating portion provided in a rotor core of a rotating electric machine formed of a laminated steel sheet and the laminated steel sheet, wherein the crystalline radical polymerizable composition contains at least a crystalline radical polymerizable compound A, an inorganic filler B, a silane coupling agent C, and a radical polymerization initiator D, wherein the crystalline radical polymerizable compound A is solid at 23° C.Type: ApplicationFiled: March 29, 2021Publication date: March 16, 2023Applicants: Japan U-Pica Company, Ltd., AISIN CORPORATION, TOYOBO CO., LTD.Inventors: Tomohito OYAMA, Yuichi OZAWA, Ryo UETA, Yusaku SAKURABA, Motoki KORI, Toshiyuki SABURI, Masahito TANIGAWA, Daiki FUNAOKA
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Publication number: 20230064602Abstract: A watch body and a strap are included. The watch body includes a case body having a cylindrical shape, a movement disposed inside the case body, a cover member covering one opening of the case body, and a case back covering the other opening of the case body and including a transmissive region through which the movement can be visually recognized from the outside and the movement can be visually recognized through the cover member. The strap is attached to the watch body and includes a base facing the case back of the watch body and a strap body coupled to the base. The base includes a decoration at a position overlapping at least a part of the transmissive region, and the decoration can be visually recognized through the cover member.Type: ApplicationFiled: August 30, 2022Publication date: March 2, 2023Inventor: Yuichi OZAWA
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Publication number: 20230037456Abstract: A camera can perform two different photographing operations with a lens at different positions without vignetting while preventing entry of light and dust. A camera includes a frame including a film compartment to contain a photographic film and a barrel extending from the film compartment in an optical axis direction, and a lens barrel movable in the barrel in X-direction. The lens barrel includes cylinders movable frontward relative to the barrel, and a cylinder movable frontward relative to the cylinder. The camera includes a rear bellows connecting the frame and the cylinder, and a front bellows connecting the cylinder and the cylinder. In a first photographing state in which the cylinders extend frontward relative to the barrel and the cylinder is accommodated inside the cylinder, the rear bellows is expanded and the front bellows is partially contracted. In a second photographing state, the cylinder extends frontward relative to the cylinder.Type: ApplicationFiled: December 9, 2020Publication date: February 9, 2023Inventors: Tomihiro WAKAYAMA, Yuichi OZAWA, Yoshiki MURAYAMA, Takehisa KIRIHARA, Hisashi TASAKA
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Patent number: 11485801Abstract: [Problems] An object of the present invention is to provide a crystalline radical polymerizable composition which is excellent in flowability and is easy to handle. [Solution Means] The crystalline radical polymerizable composition for sealing electrical and electronic component according to the present invention is characterized by comprising at least a crystalline radical polymerizable compound, an inorganic filler, a silane coupling agent, and a radical polymerization initiator. In addition, in a preferred embodiment of the crystalline radical polymerizable composition for sealing electrical and electronic component according to the present invention, the crystalline radical polymerizable compound is characterized by comprising one or more selected from unsaturated polyester, epoxy (meth) acrylate, urethane (meth) acrylate, polyester (meth) acrylate, -polyether (meth) acrylate, radical polymerizable monomer and radical polymerizable polymer.Type: GrantFiled: February 20, 2018Date of Patent: November 1, 2022Assignee: Japan U-Pica Company, Ltd.Inventors: Yuichi Ozawa, Tomohito Oyama
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Publication number: 20200231714Abstract: [Problems] An object of the present invention is to provide a crystalline radical polymerizable composition which is excellent in flowability and is easy to handle. [Solution Means] The crystalline radical polymerizable composition for sealing electrical and electronic component according to the present invention is characterized by comprising at least a crystalline radical polymerizable compound, an inorganic filler, a silane coupling agent, and a radical polymerization initiator. In addition, in a preferred embodiment of the crystalline radical polymerizable composition for sealing electrical and electronic component according to the present invention, the crystalline radical polymerizable compound is characterized by comprising one or more selected from unsaturated polyester, epoxy (meth) acrylate, urethane (meth) acrylate, polyester (meth) acrylate, -polyether (meth) acrylate, radical polymerizable monomer and radical polymerizable polymer.Type: ApplicationFiled: February 20, 2018Publication date: July 23, 2020Applicant: Japan U-Pica Company, Ltd.Inventors: Yuichi OZAWA, Tomohito OYAMA
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Patent number: 10481177Abstract: A wafer inspection method improving inspection accuracy and operation efficiency. A method for performing electrical inspection by bringing into contact with pads in chips on a wafer. A chuck step S1 for heating the wafer to an inspection temperature; a first position recognition step S2 for recognizing all the positions of the pads; a second position recognition step S3 for re-recognizing, before performing the electrical inspection, the position of the pads recognizing the positional shifts of the pads due to thermal expansion; and a correction step S4 for correcting contact positions with respect to the probes, the contact positions being corrected on the basis of pad positions, which have been re-recognized in the second position recognition step S3 on the basis of the pad positions recognized in the first position recognition step S2, and which have been updated.Type: GrantFiled: November 26, 2014Date of Patent: November 19, 2019Assignee: Tokyo Seimitsu Co. LTD.Inventors: Yuichi Ozawa, Yasuhito Iguchi, Tetsuo Yoshida, Junzo Koshio
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Publication number: 20190055621Abstract: A steel sheet and a method for producing the steel sheet are provided. The steel sheet is provided having a composition including C: 0.05% to 0.15%, Si: 0.1% or less, Mn: 1.0% to 2.0%, P: 0.10% or less, S: 0.030% or less, Al: 0.10% or less, and N: 0.010% or less, and including one or two or more of Ti, Nb, and V, the remainder being iron and incidental impurities. The steel sheet has a microstructure containing, on an area percent basis, ferrite: 80% or more, and bainite and martensite: 1% to 20% in total. The ferrite has an average grain size of 10.0 ?m or less, and a phase containing bainite and martensite has an average grain size of 3.0 ?m or less. The ratio of the average grain size of the phase containing bainite and martensite to the average grain size of the ferrite is 0.3 or less.Type: ApplicationFiled: March 21, 2017Publication date: February 21, 2019Applicant: JFE Steel CorporationInventors: Taro Kizu, Imanuel Tarigan, Minoru Utake, Yuichi Ozawa
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Patent number: 9983256Abstract: To provide a probing device and a probing method for an electronic device capable of confirming whether or not an electrical inspection has been executed appropriately, with an electrode pad being made in contact with a probe with a predetermined pressure, by utilizing a change in external shapes to be formed on the electrode pad when the probe and the electrode pad are pressed onto each other.Type: GrantFiled: October 16, 2014Date of Patent: May 29, 2018Assignee: Tokyo Seimitsu Co. LTDInventors: Yuichi Ozawa, Yasuhito Iguchi, Tetsuo Yoshida, Junzo Koshio
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Publication number: 20170322236Abstract: A wafer inspection method whereby inspection accuracy and operation efficiency is improved. A method for performing electrical inspection by bringing, at one time, a plurality of probes into contact with a plurality of pads in chips on a wafer. A chuck step S1 for heating the wafer to an inspection temperature; a first position recognition step S2 for recognizing all the positions of the pads of the chips; a second position recognition step S3 for re-recognizing, before performing the electrical inspection, the position of the pads for the purpose of recognizing the positional shifts of the pads due to thermal expansion when the wafer chuck is heated; and a correction step S4 for correcting contact positions with respect to the probes, the contact positions being corrected on the basis of pad positions, which have been re-recognized in the second position recognition step S3 on the basis of the pad positions recognized in the first position recognition step S2, and which have been updated.Type: ApplicationFiled: November 26, 2014Publication date: November 9, 2017Inventors: Yuichi OZAWA, Yasuhito IGUCHI, Tetsuo YOSHIDA, Junzo KOSHIO
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Patent number: 9664733Abstract: A probe device of the present invention measures a position of every chip in a wafer to be inspected to acquire the position as actual measurement data. Then, the probe device calculates a variation amount of an actual measurement position of each chip or a variation amount of a position at which a probe is brought into contact with the each chip of the wafer on the basis of the actual measurement data, and allows a monitor to display a range-of-variation display image that visually displays the variation amount. In the image, a quadrangular area corresponding to the each chip is displayed, and a dot is displayed in each the quadrangular area at a position shifted from a center position thereof in accordance with the variation amount.Type: GrantFiled: August 24, 2015Date of Patent: May 30, 2017Assignee: Tokyo Seimitsu Co., Ltd.Inventors: Yuichi Ozawa, Hiroshi Nishimura, Seiichi Ohta, Yasuhito Iguchi, Kunihiko Chiba, Ken Kato
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Patent number: 9442156Abstract: The present invention provides a probe device that includes an alignment utility function. When a user inputs a condition value for a variation amount (variation range) of a contact position at which a probe is in contact with each chip, in a simulation using actual measurement data acquired by measuring a position of each of all chips in one wafer, a range of variation of each chip is calculated by changing a measurement point at which alignment is performed to calculate a setting of optimum measurement points so that the range of variation is equal to or less than the condition value and the number of measurement points is minimum. Then information on the optimum measurement point is provided to the user.Type: GrantFiled: August 24, 2015Date of Patent: September 13, 2016Assignee: Tokyo Seimitsu Co., Ltd.Inventors: Yuichi Ozawa, Hiroshi Nishimura, Seiichi Ohta, Yasuhito Iguchi, Kunihiko Chiba, Ken Kato
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Publication number: 20150362552Abstract: A probe device of the present invention measures a position of every chip in a wafer to be inspected to acquire the position as actual measurement data. Then, the probe device calculates a variation amount of an actual measurement position of each chip or a variation amount of a position at which a probe is brought into contact with the each chip of the wafer on the basis of the actual measurement data, and allows a monitor to display a range-of-variation display image that visually displays the variation amount. In the image, a quadrangular area corresponding to the each chip is displayed, and a dot is displayed in each the quadrangular area at a position shifted from a center position thereof in accordance with the variation amount.Type: ApplicationFiled: August 24, 2015Publication date: December 17, 2015Applicant: TOKYO SEIMITSU CO., LTD.Inventors: Yuichi Ozawa, Hiroshi Nishimura, Seiichi Ohta, Yasuhito Iguchi, Kunihiko Chiba, Ken Kato
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Publication number: 20150362553Abstract: The present invention provides a probe device that includes an alignment utility function. When a user inputs a condition value for a variation amount (variation range) of a contact position at which a probe is in contact with each chip, in a simulation using actual measurement data acquired by measuring a position of each of all chips in one wafer, a range of variation of each chip is calculated by changing a measurement point at which alignment is performed to calculate a setting of optimum measurement points so that the range of variation is equal to or less than the condition value and the number of measurement points is minimum. Then information on the optimum measurement point is provided to the user.Type: ApplicationFiled: August 24, 2015Publication date: December 17, 2015Applicant: Tokyo Seimitsu Co., Ltd.Inventors: Yuichi Ozawa, Hiroshi Nishimura, Seiichi Ohta, Yasuhito Iguchi, Kunihiko Chiba, Ken Kato
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Publication number: 20150109625Abstract: To provide a probing device and a probing method for an electronic device capable of confirming whether or not an electrical inspection has been executed appropriately, with an electrode pad being made in contact with a probe with a predetermined pressure, by utilizing a change in external shapes to be formed on the electrode pad when the probe and the electrode pad are pressed onto each other.Type: ApplicationFiled: October 16, 2014Publication date: April 23, 2015Inventors: Yuichi Ozawa, Yasuhito Iguchi, Tetsuo Yoshida, Junzo Koshio