Patents by Inventor Yuji Wakamiya

Yuji Wakamiya has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210018526
    Abstract: Disclosed is a sample analysis system comprising a cleaning liquid preparation apparatus that prepares a cleaning liquid, and a sample analyzer that comprises a measurement unit that measures a sample and a reservoir that stores the cleaning liquid prepared by the cleaning liquid preparation apparatus. The sample analyzer cleans at least a part of the measurement unit with the cleaning liquid. The cleaning liquid preparation apparatus selectively executes a first supply mode to supply the cleaning liquid to the reservoir when a liquid amount in the reservoir reaches a first amount, and a second supply mode to supply the cleaning liquid to the reservoir when the liquid amount in the reservoir reaches a second amount less than the first amount.
    Type: Application
    Filed: October 2, 2020
    Publication date: January 21, 2021
    Applicant: SYSMEX CORPORATION
    Inventors: Ryuki TAKAGI, Yuji WAKAMIYA
  • Publication number: 20210011041
    Abstract: A sample measurement system and method of transporting of racks are provided that collectively supply the consumables to the sample measurement units. The sample measurement system includes: sample measurement units that perform measurement on samples by using consumables; a setting part in which a user sets consumable racks housing the consumables; a first transport path that supplies the consumable racks set in the setting part to one of the sample measurement units; a collector that is arranged adjacent to the setting part and that collects empty racks that are emptied after being transported to at least one of the sample measurement units; and a second transport path that transports the empty racks to the collector.
    Type: Application
    Filed: September 28, 2020
    Publication date: January 14, 2021
    Applicant: SYSMEX CORPORATION
    Inventors: Kouichi MASUTANI, Yuji WAKAMIYA
  • Publication number: 20210011040
    Abstract: A sample measurement system according to an embodiment may include: sample measurement units that perform measurement on samples by using consumables; a consumable setting unit in which a consumable rack storing the consumables to be supplied to the sample measurement units is set; a sample setting unit in which a sample rack storing the samples to be supplied to the sample measurement units is set; a first transport path that transports the consumable rack from the consumable setting unit to at least one of the sample measurement units; and a second transport path that transports the sample rack from the sample setting unit to at least one of the sample measurement units.
    Type: Application
    Filed: September 25, 2020
    Publication date: January 14, 2021
    Applicant: SYSMEX CORPORATION
    Inventors: Kouichi MASUTANI, Yuji WAKAMIYA
  • Publication number: 20210011039
    Abstract: A sample measurement system according to an embodiment may include: sample measurement units that receive supply of containers and perform measurement on samples; a rack setting unit in which a rack storing the containers to be supplied to at least one of the sample measurement units is set; a first transport path that transports the containers from the rack setting unit to at least one of the sample measurement units; a second transport path that is provided at a position different from the first transport path in a height direction and that transports the containers from at least one of the sample measurement units to the rack setting unit; and a transfer path that transfers the containers between the first transport path and the second transport path.
    Type: Application
    Filed: September 24, 2020
    Publication date: January 14, 2021
    Applicant: SYSMEX CORPORATION
    Inventors: Kouichi MASUTANI, Yuji WAKAMIYA
  • Publication number: 20200408792
    Abstract: The present invention facilitates comprehension of the actual positions of constituent units of a sample measurement system regardless of a direction in which a user faces. The present invention provides a display device (6, 60) for displaying information about a sample measurement system (1) for measuring a sample, a display unit (509), a display control unit (101) that displays an image indicating an arrangement of a predetermined part of the sample measurement system on the display unit, and a receiving unit (102, 105) for receiving information on a display direction when displaying the arrangement of the predetermined part, wherein the display control unit (101) changes a display direction of the arrangement of the predetermined part according to the information.
    Type: Application
    Filed: June 25, 2020
    Publication date: December 31, 2020
    Inventors: Atsushi KUMAGAI, Yuji WAKAMIYA
  • Publication number: 20200408793
    Abstract: The invention allows a rack storage mode to be set in accordance with the situation in a facility. A testing system 1 includes a storage device 240 for storing a rack R holding containers A in which samples tested by the testing units 13 and 14 are accommodated, and the storage device 240 includes a table 130 capable of accommodating a plurality of racks R, a setting unit 230 for setting a first mode for starting storage of a plurality of racks R from a first end 130a of the table 130 and a second mode for starting storage of a plurality of racks R from a second end 130b of the table 130, and a moving device 102 for moving the rack R according to the mode set by the setting unit 230.
    Type: Application
    Filed: June 26, 2020
    Publication date: December 31, 2020
    Inventors: Atsushi KUMAGAI, Yuji WAKAMIYA
  • Patent number: 10844259
    Abstract: Disclosed is a silica-based composite fine particle dispersion including a silica-based composite fine particle which comprises a mother particle containing amorphous silica as a main component with a child particle containing crystalline ceria as a main component on a surface thereof. Features of the silica-based composite fine particle include a silica to ceria mass ratio of 100:11 to 316, and when subjected to X-ray diffraction, only the crystalline phase of ceria is detected, and when subjected to X-ray diffraction for measurement, the crystalline ceria has a crystallite diameter of 10 to 25 nm.
    Type: Grant
    Filed: April 5, 2017
    Date of Patent: November 24, 2020
    Assignee: JGC Catalysts and Chemicals Ltd.
    Inventors: Yuji Tawarazako, Michio Komatsu, Kazuhiro Nakayama, Yukihiro Iwasaki, Yoshinori Wakamiya, Shota Kawakami, Shinya Usuda
  • Patent number: 10830783
    Abstract: Disclosed is a sample analysis system comprising a cleaning liquid preparation apparatus that prepares a cleaning liquid, and a sample analyzer that comprises a measurement unit that measures a sample and a reservoir that stores the cleaning liquid prepared by the cleaning liquid preparation apparatus. The sample analyzer cleans at least a part of the measurement unit with the cleaning liquid. The cleaning liquid preparation apparatus selectively executes a first supply mode to supply the cleaning liquid to the reservoir when a liquid amount in the reservoir reaches a first amount, and a second supply mode to supply the cleaning liquid to the reservoir when the liquid amount in the reservoir reaches a second amount less than the first amount.
    Type: Grant
    Filed: October 13, 2016
    Date of Patent: November 10, 2020
    Assignee: SYSMEX CORPORATION
    Inventors: Ryuki Takagi, Yuji Wakamiya
  • Patent number: 10730755
    Abstract: A subject of this invention is to provide a dispersion liquid of a silica-based composite particle, which can rapidly polish silica film, Si wafer or even hard-to-process material, can concurrently achieve high surface accuracy (less scratches, etc.), and can suitably be used for surface polishing of semiconductor devices including semiconductor substrate and wiring board, by virtue of its impurity-free nature. The subject is solved by a dispersion liquid of a silica-based composite particle that contains a silica-based composite particle that has a core particle mainly composed of amorphous silica, and bound thereto a ceria particle mainly composed of crystalline ceria, further has a silica film that covers them.
    Type: Grant
    Filed: March 30, 2016
    Date of Patent: August 4, 2020
    Assignee: JGC Catalysts and Chemicals Ltd.
    Inventors: Yuji Tawarazako, Yoshinori Wakamiya, Shingo Kashiwada, Kazuaki Inoue, Kazuhiro Nakayama, Michio Komatsu
  • Patent number: 10514376
    Abstract: A position adjustment method for a movable unit in a sample analyzer which includes: a measurement section which causes a movable unit to operate in order to measure a sample; and a communication section for performing communication with outside, includes: a terminal screen displaying step of causing a portable terminal device to display a position adjustment screen for accepting an input for changing a position of the movable unit, the portable terminal device configured to be able to perform communication with the communication section; and a movement executing step of causing the measurement section to execute a movement of a corresponding movable unit in accordance with the input for changing the position received by the communication section.
    Type: Grant
    Filed: August 27, 2013
    Date of Patent: December 24, 2019
    Assignee: SYSMEX CORPORATION
    Inventor: Yuji Wakamiya
  • Patent number: 10302666
    Abstract: A sample analyzing method of a sample analyzer for measuring samples, using a reagent container which comprises a writable and readable storage medium, the sample analyzing method including: storing information regarding a remaining amount of a reagent in the reagent container to a memory of the analyzer read from the storage medium; updating the information in the memory in response to an aspiration of the reagent; and writing updated information in the memory to the storage medium when an aspiration of the reagent in a plurality of measurements is completed. The writing of the updated information is postponed until the aspiration of the reagent in the plurality of measurements is completed.
    Type: Grant
    Filed: February 17, 2017
    Date of Patent: May 28, 2019
    Assignee: SYSMEX CORPORATION
    Inventors: Yuji Wakamiya, Kazutoshi Tokunaga
  • Publication number: 20190153279
    Abstract: Disclosed is a silica-based composite fine particle dispersion including a silica-based composite fine particle which comprises a mother particle containing amorphous silica as a main component with a child particle containing crystalline ceria as a main component on a surface thereof. Features of the silica-based composite fine particle include a silica to ceria mass ratio of 100:11 to 316, and when subjected to X-ray diffraction, only the crystalline phase of ceria is detected, and when subjected to X-ray diffraction for measurement, the crystalline ceria has a crystallite diameter of 10 to 25 nm.
    Type: Application
    Filed: April 5, 2017
    Publication date: May 23, 2019
    Inventors: Yuji Tawarazako, Michio Komatsu, Kazuhiro Nakayama, Yukihiro Iwasaki, Yoshinori Wakamiya, Shota Kawakami, Shinya Usuda
  • Patent number: 9915594
    Abstract: Herewith disclosed is a sample analyzer comprising: a measurement section configured to perform a measurement on a sample and generate a measurement value according to the concentration of an analyte in the sample; a memory storing a calibration curve; an analysis section; an output section; and an instruction receiver. When the instruction receiver receives an instruction to perform a diluting measurement on a calibration sample, the measurement section dilutes the calibration sample by a predetermined ratio and performs a measurement on the diluted calibration sample, and the analysis section determines the concentration of the analyte in the diluted calibration sample by applying a measurement value obtained from the diluted calibration sample to the calibration curve. Information generated based on the determined concentration and the known concentration is output.
    Type: Grant
    Filed: July 28, 2015
    Date of Patent: March 13, 2018
    Assignee: Sysmex Corporation
    Inventors: Masaki Shiba, Tomoyuki Nishida, Yuji Wakamiya
  • Publication number: 20170160298
    Abstract: A sample analyzing method of a sample analyzer for measuring samples, using a reagent container which comprises a writable and readable storage medium, the sample analyzing method including: storing information regarding a remaining amount of a reagent in the reagent container to a memory of the analyzer read from the storage medium; updating the information in the memory in response to an aspiration of the reagent; and writing updated information in the memory to the storage medium when an aspiration of the reagent in a plurality of measurements is completed. The writing of the updated information is postponed until the aspiration of the reagent in the plurality of measurements is completed.
    Type: Application
    Filed: February 17, 2017
    Publication date: June 8, 2017
    Applicant: SYSMEX CORPORATION
    Inventors: Yuji WAKAMIYA, Kazutoshi TOKUNAGA
  • Publication number: 20170108524
    Abstract: Disclosed is a sample analysis system comprising a cleaning liquid preparation apparatus that prepares a cleaning liquid, and a sample analyzer that comprises a measurement unit that measures a sample and a reservoir that stores the cleaning liquid prepared by the cleaning liquid preparation apparatus. The sample analyzer cleans at least a part of the measurement unit with the cleaning liquid. The cleaning liquid preparation apparatus selectively executes a first supply mode to supply the cleaning liquid to the reservoir when a liquid amount in the reservoir reaches a first amount, and a second supply mode to supply the cleaning liquid to the reservoir when the liquid amount in the reservoir reaches a second amount less than the first amount.
    Type: Application
    Filed: October 13, 2016
    Publication date: April 20, 2017
    Applicant: SYSMEX CORPORATION
    Inventors: Ryuki TAKAGI, Yuji WAKAMIYA
  • Patent number: 9606133
    Abstract: A specimen analyzer for continuously measuring a plurality of samples, using a reagent container which comprises a wirelessly writable and readable storage medium is disclosed. A specimen analyzing method is also disclosed. The analyzer comprises a reagent dispenser, a measurement unit, a memory which stores information regarding a remaining amount of the reagent in a reagent container, and a wireless communication unit. The analyzer causes the reagent dispenser to continuously carry out aspiration of the reagent from the reagent container, updates the information in the memory in response to an aspiration of the reagent by the reagent dispenser, and causes the wireless communication unit to write the information in the memory to the storage medium when the continuous aspiration is completed.
    Type: Grant
    Filed: March 22, 2011
    Date of Patent: March 28, 2017
    Assignee: SYSMEX CORPORATION
    Inventors: Yuji Wakamiya, Kazutoshi Tokunaga
  • Patent number: 9581608
    Abstract: A sample analyzer transports a first rack and a second rack, the first rack including a first number of supporters for supporting containers that contain biological samples of subjects, and the second rack including a second number of supporters for supporting containers that contain standard samples. The sample analyzer determines whether a transport object is the first rack or the second rack. When it has been determined that the transport object is the second rack, the sample analyzer performs a transporting operation according to the second rack and measure the standard samples in the containers supported by the second rack in a predetermined order, and prepares a calibration curve used for analyzing a measurement result of a biological sample, based on a plurality of measurement results of the standard samples.
    Type: Grant
    Filed: September 27, 2012
    Date of Patent: February 28, 2017
    Assignee: Sysmex Corporation
    Inventors: Makoto Ueda, Yuji Wakamiya, Toshikatsu Fukuju, Kazunori Mototsu
  • Patent number: 9304140
    Abstract: A sample analyzer comprising: a sample dispenser for dispensing a sample into a reaction container; a sample transporter for sequentially transports a plurality of reaction containers along a transporting path; a processing station including a plurality of processing sections and a transferring section that transfers a reaction container between the sample transporter and the processing sections; and a controller is disclosed. The sample dispenser sequentially dispenses samples at intervals. The controller alternates the interval when problem occurred at any of the processing sections.
    Type: Grant
    Filed: October 3, 2011
    Date of Patent: April 5, 2016
    Assignee: SYSMEX CORPORATION
    Inventor: Yuji Wakamiya
  • Patent number: 9201083
    Abstract: A sample analyzer for performing analysis regarding a predetermined measurement item by using a combination of at least a first reagent and a second reagent, the sample analyzer comprising: a reagent container holder configured to hold a first reagent container which contains the first reagent and which includes a first storage medium, and a second reagent container which contains the second reagent and which includes a second storage medium; a writer configured to write information into the first storage medium and the second storage medium; and a controller configured to control the writer to write, into the first storage medium of the first reagent container, identification information for identifying the second reagent container which is paired with the first reagent container is disclosed. A reagent management method is also disclosed.
    Type: Grant
    Filed: March 10, 2011
    Date of Patent: December 1, 2015
    Assignee: SYSMEX CORPORATION
    Inventor: Yuji Wakamiya
  • Publication number: 20150330878
    Abstract: Herewith disclosed is a sample analyzer comprising: a measurement section configured to perform a measurement on a sample and generate a measurement value according to the concentration of an analyte in the sample; a memory storing a calibration curve; an analysis section; an output section; and an instruction receiver. When the instruction receiver receives an instruction to perform a diluting measurement on a calibration sample, the measurement section dilutes the calibration sample by a predetermined ratio and performs a measurement on the diluted calibration sample, and the analysis section determines the concentration of the analyte in the diluted calibration sample by applying a measurement value obtained from the diluted calibration sample to the calibration curve. Information generated based on the determined concentration and the known concentration is output.
    Type: Application
    Filed: July 28, 2015
    Publication date: November 19, 2015
    Inventors: Masaki SHIBA, Tomoyuki NISHIDA, Yuji WAKAMIYA