Patents by Inventor Yuji Wakamiya
Yuji Wakamiya has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9304140Abstract: A sample analyzer comprising: a sample dispenser for dispensing a sample into a reaction container; a sample transporter for sequentially transports a plurality of reaction containers along a transporting path; a processing station including a plurality of processing sections and a transferring section that transfers a reaction container between the sample transporter and the processing sections; and a controller is disclosed. The sample dispenser sequentially dispenses samples at intervals. The controller alternates the interval when problem occurred at any of the processing sections.Type: GrantFiled: October 3, 2011Date of Patent: April 5, 2016Assignee: SYSMEX CORPORATIONInventor: Yuji Wakamiya
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Patent number: 9201083Abstract: A sample analyzer for performing analysis regarding a predetermined measurement item by using a combination of at least a first reagent and a second reagent, the sample analyzer comprising: a reagent container holder configured to hold a first reagent container which contains the first reagent and which includes a first storage medium, and a second reagent container which contains the second reagent and which includes a second storage medium; a writer configured to write information into the first storage medium and the second storage medium; and a controller configured to control the writer to write, into the first storage medium of the first reagent container, identification information for identifying the second reagent container which is paired with the first reagent container is disclosed. A reagent management method is also disclosed.Type: GrantFiled: March 10, 2011Date of Patent: December 1, 2015Assignee: SYSMEX CORPORATIONInventor: Yuji Wakamiya
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Publication number: 20150330878Abstract: Herewith disclosed is a sample analyzer comprising: a measurement section configured to perform a measurement on a sample and generate a measurement value according to the concentration of an analyte in the sample; a memory storing a calibration curve; an analysis section; an output section; and an instruction receiver. When the instruction receiver receives an instruction to perform a diluting measurement on a calibration sample, the measurement section dilutes the calibration sample by a predetermined ratio and performs a measurement on the diluted calibration sample, and the analysis section determines the concentration of the analyte in the diluted calibration sample by applying a measurement value obtained from the diluted calibration sample to the calibration curve. Information generated based on the determined concentration and the known concentration is output.Type: ApplicationFiled: July 28, 2015Publication date: November 19, 2015Inventors: Masaki SHIBA, Tomoyuki NISHIDA, Yuji WAKAMIYA
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Patent number: 9151703Abstract: Herewith disclosed is a sample analyzer comprising: a measurement section configured to perform a measurement on a sample and generate a measurement value according to the concentration of an analyte in the sample; a memory storing a calibration curve; an analysis section; an output section; and an instruction receiver. When the instruction receiver receives an instruction to perform a diluting measurement on a calibration sample, the measurement section dilutes the calibration sample by a predetermined ratio and performs a measurement on the diluted calibration sample, and the analysis section determines the concentration of the analyte in the diluted calibration sample by applying a measurement value obtained from the diluted calibration sample to the calibration curve. Information generated based on the determined concentration and the known concentration is output.Type: GrantFiled: January 18, 2013Date of Patent: October 6, 2015Assignee: SYSMEX CORPORATIONInventors: Masaki Shiba, Tomoyuki Nishida, Yuji Wakamiya
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Patent number: 8871147Abstract: A sample analyzer comprising: a measurement unit holds a reagent to be used in a sample measurement and measures a sample by using the reagent; a memory storing a usage amount of the reagent used by the measurement unit; a controller calculates an estimated usage amount of the reagent for a specific day, based on the usage amount of the reagent stored in the memory; and a display, wherein the controller controls the display to show a screen including graphic information illustrating a remaining amount of the reagent held by the measurement unit and the estimated usage amount of the reagent for the specific day, first numerical information indicating, by means of a numerical value, the remaining amount of the reagent, and second numerical information indicating an excess or shortage amount of the remaining amount of the reagent relative to the estimated usage amount of the reagent.Type: GrantFiled: April 25, 2012Date of Patent: October 28, 2014Assignee: Sysmex CorporationInventors: Yuji Wakamiya, Tomohiro Okuzaki
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Publication number: 20140295562Abstract: Disclosed is a sample analyzer, comprising: a container storage configured to store a plurality of reagent containers; a setting chamber including within a setting portion on which at least one reagent container is set; a container detector for detecting the reagent container on the setting portion; a gate to open and close an entrance of the setting chamber; a transferring section configured to hold the reagent container on the setting portion and transfer it to the container storage; and a controller programmed to initiate the transferring section to transfer the reagent container from the setting portion to the container storage if the reagent container is set on the setting portion when the entrance of the setting chamber is closed by the gate.Type: ApplicationFiled: December 20, 2013Publication date: October 2, 2014Applicant: Sysmex CorporationInventors: Yuji WAKAMIYA, Tomohiro OKUZAKI
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Patent number: 8778268Abstract: Specimen analyzer includes a first holding section for holding a container; a first mechanism section for executing a first operation for the container on the first holding section; a second holding section for holding the container; a first transfer mechanism section for transferring the container from the first holding section to the second one; a second mechanism section for executing a second operation for the container on the second one; an error detector for detecting error in the first mechanism section; and an error controller for controlling the operation of the first holding section, the first and second operation so that the first operation and the transfer operation of the first holding section would be stopped while the second operation would be continued in case of the error in the first mechanism section. An abnormality control method of the analyzer and computer program product are also disclosed.Type: GrantFiled: October 21, 2008Date of Patent: July 15, 2014Assignee: Sysmex CorporationInventors: Hisato Takehara, Yuji Wakamiya, Tomoyuki Nishida
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Publication number: 20130344622Abstract: A position adjustment method for a movable unit in a sample analyzer which includes: a measurement section which causes a movable unit to operate in order to measure a sample; and a communication section for performing communication with outside, includes: a terminal screen displaying step of causing a portable terminal device to display a position adjustment screen for accepting an input for changing a position of the movable unit, the portable terminal device configured to be able to perform communication with the communication section; and a movement executing step of causing the measurement section to execute a movement of a corresponding movable unit in accordance with the input for changing the position received by the communication section.Type: ApplicationFiled: August 27, 2013Publication date: December 26, 2013Applicant: SYSMEX COPORATIONInventor: Yuji WAKAMIYA
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Patent number: 8535607Abstract: The present invention is to present a sample analyzer which is capable of prevent consumable part which does not adapt to the sample analyzer from being used and maintain measurement precision. The sample analyzer 10 includes barcode reader 60 for obtaining serial number for identifying pipette tip 80 from barcode 83; containing section 21a for containing pipette tips 80 used by a predetermined mechanism section; CPU 34a for obtaining a number of the pipette tips 80 which have been used by the mechanism section; CPU 51a for obtaining a number of the usable pipette tips 80; warning screens 76, 77, 79 for giving a predetermined warning to a user, when the number obtained by CPU 34a is in a predetermined relationship with the number obtained by CPU 51a.Type: GrantFiled: March 28, 2008Date of Patent: September 17, 2013Assignee: Sysmex CorporationInventors: Yuji Wakamiya, Tomohiro Okuzaki, Hisato Takehara
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Patent number: 8430321Abstract: The present invention is a sample analyzer for analyzing a sample by using a reagent contained in a reagent container, which includes: a reagent container holder configured to hold a reagent container to which an information storage medium is attached; an actuator configured to actuate the reagent container holder to move the reagent container held by the reagent container holder to a first position and a second position different from the first position; a reagent aspirator configured to aspirate a reagent from the reagent container when the reagent container is located at the first position; an information communication section configured to write reagent amount information regarding an amount of the reagent in the reagent container, into the information storage medium attached to the reagent container when the reagent container is located at the second position; and a controller configured to control at least the actuator and the information communication section.Type: GrantFiled: May 25, 2011Date of Patent: April 30, 2013Assignee: Sysmex CorporationInventors: Kazutoshi Tokunaga, Yuji Wakamiya
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Patent number: 8425839Abstract: A sample analyzer is disclosed that comprising: a first reagent container to hold a first reagent container with a first record section which contains a first reagent management information; a second reagent container holder to hold a second reagent container with a second record section which contains a second reagent management information; a first information reader; a second information reader; a registration section for registering the combination of the first reagent and the second reagent based on the first reagent management information; a measurement section for conducting a measurement of a predetermined analysis item by using the first reagent and the second reagent corresponding to the combination registered by the registration section; and a processing section for processing a measurement result obtained by the measurement section, and for obtaining an analysis result of the sample.Type: GrantFiled: March 28, 2008Date of Patent: April 23, 2013Assignee: Sysmex CorporationInventors: Yuji Wakamiya, Tomohiro Okuzaki, Hisato Takehara
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Publication number: 20130034466Abstract: A measuring section 2 is provided with a rotatable reaction table 200 for rapidly starting the measurement of a new sample even when an abnormal operation has stopped the measurement operations of many cuvettes. A controller 4 detects a residual cuvette remaining on the reaction table 200 when a measurement start instruction is received. When a residual cuvette is present, the controller 4 determines whether the residual cuvette will cause interference, and when the residual cuvette will not cause interference, sets the new sample on the reaction table 200, rotates the reaction table 200 and sequentially processes the cuvettes. In conjunction therewith, when a residual cuvette is moved to the end position C56, the liquid is aspirated and discarded through a discarding port W via a drain unit 282.Type: ApplicationFiled: August 2, 2012Publication date: February 7, 2013Inventors: Yuji Wakamiya, Tomoyuki Nishida
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Patent number: 8366998Abstract: A sample analyzer includes an order receiver for receiving an analyzing order of a sample having analyzing item information; an analyzing section for analyzing a sample according to the analyzing order received by the order receiver; a calculator for counting a first number of analyses by the analyzing section in a first counting period, and a second number of analyses by the analyzing section in a second counting period different from the first counting period; a selection receiver for receiving a selection of either one of the first counting period and the second counting period; an output section; and an output controller for outputting a number of analyses in the counting period received by the selection receiver to the output section based on the counted result by the calculator is disclosed. A sample analyzing method is also disclosed.Type: GrantFiled: September 19, 2008Date of Patent: February 5, 2013Assignee: Sysmex CorporationInventors: Yuji Wakamiya, Tomohiro Okuzaki, Hisato Takehara
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Patent number: 8335662Abstract: The invention provides a sample analyzer by which a position of any error status in the sample analyzer can be easily found by a user to allow the user to carry out an error recovery operation in an accurate and prompt manner. The sample analyzer 1 comprises a sensor for detecting a status of a measurement unit 2 including an error status; a display section 400b; and a controller 400a for controlling the display section 400b so as to display recovery information for recovering the measurement unit 2 from the error status and an error-occurring place image regarding a place where an error has occurred, when the sensor detects the error status of the measurement unit 2.Type: GrantFiled: March 23, 2010Date of Patent: December 18, 2012Assignee: Sysmex CorporationInventors: Yuji Wakamiya, Tomohiro Okuzaki, Hisato Takehara
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Patent number: 8329103Abstract: An sample analyzer, which enables to confirm an analysis remaining time for each sample and a total analysis remaining time for all samples set in the analyzer, so that time management for both each sample and all samples can be easily performed, is disclosed. Specifically, an analyzing unit analyzes a sample by executing an analysis sequence including a predetermined number of analyzing steps, and an control device calculates an analysis remaining time for each sample based on the number of analyzing steps. Control device acquires a total analysis remaining time by calculating the analysis remaining time for the sample in which sample information is lastly inputted. The display member displays the analysis remaining time and the total analysis remaining time.Type: GrantFiled: September 18, 2008Date of Patent: December 11, 2012Assignee: Sysmex CorporationInventors: Yuji Wakamiya, Tomohiro Okuzaki, Hisato Takehara
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Publication number: 20120275956Abstract: A sample analyzer comprising: a measurement unit holds a reagent to be used in a sample measurement and measures a sample by using the reagent; a memory storing a usage amount of the reagent used by the measurement unit; a controller calculates an estimated usage amount of the reagent for a specific day, based on the usage amount of the reagent stored in the memory; and a display, wherein the controller controls the display to show a screen including graphic information illustrating a remaining amount of the reagent held by the measurement unit and the estimated usage amount of the reagent for the specific day, first numerical information indicating, by means of a numerical value, the remaining amount of the reagent, and second numerical information indicating an excess or shortage amount of the remaining amount of the reagent relative to the estimated usage amount of the reagent.Type: ApplicationFiled: April 25, 2012Publication date: November 1, 2012Inventors: Yuji Wakamiya, Tomohiro Okuzaki
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Patent number: 8279715Abstract: A sample analyzing apparatus is provided with a memory for storing a schedule of maintenance, a display, and a controller for displaying on the display a screen of calendar format, wherein the screen includes a date display area for displaying a date and a maintenance item display area for displaying a maintenance item scheduled on the date.Type: GrantFiled: September 12, 2011Date of Patent: October 2, 2012Assignee: Sysmex CorporationInventors: Yuji Wakamiya, Tomohiro Okuzaki, Hisato Takehara
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Patent number: 8231830Abstract: A sample analyzer: measures a measurement sample including a sample and a reagent; creates a calibration curve based on first measurement data obtained by measuring a measurement standard sample including a standard sample and the reagent; provides calibration curve specifying information for specifying the calibration curve to the calibration curve; acquires an analysis result by processing second measurement data obtained by measuring the measurement sample based on the calibration curve; and stores the analysis result and the calibration curve specifying information provided to the calibration curve used in the process of the second measurement data in correspondence to each other.Type: GrantFiled: March 18, 2008Date of Patent: July 31, 2012Assignee: Sysmex CorporationInventors: Yuji Wakamiya, Tomohiro Okuzaki, Hisato Takehara
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Publication number: 20120087830Abstract: A sample analyzer comprising: a sample dispenser for dispensing a sample into a reaction container; a sample transporter for sequentially transports a plurality of reaction containers along a transporting path; a processing station including a plurality of processing sections and a transferring section that transfers a reaction container between the sample transporter and the processing sections; and a controller is disclosed. The sample dispenser sequentially dispenses samples at intervals. The controller alternates the interval when problem occurred at any of the processing sections.Type: ApplicationFiled: October 3, 2011Publication date: April 12, 2012Inventor: Yuji Wakamiya
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Publication number: 20120004742Abstract: A sample analyzing apparatus is provided with a memory for storing a schedule of maintenance, a display, and a controller for displaying on the display a screen of calendar format, wherein the screen includes a date display area for displaying a date and a maintenance item display area for displaying a maintenance item scheduled on the date.Type: ApplicationFiled: September 12, 2011Publication date: January 5, 2012Inventors: Yuji Wakamiya, Tomohiro Okuzaki, Hisato Takehara