Abstract: A pure copper sheet of the present invention has a composition including 99.96 mass % or more of Cu, 0.01 mass ppm or more and 3.00 mass ppm or less of P, 10.0 mass ppm or less of a total content of Pb, Se, and Te, 3.0 mass ppm or more of a total content of Ag and Fe, and inevitable impurities as a balance, in which an average crystal grain size of crystal grains on a rolled surface is 10 ?m or more, an aspect ratio of the crystal grain on the rolled surface is set to 2.0 or less, and a length percentage of the small tilt grain boundary and the subgrain boundary with respect to all grain boundaries is set to 80% or less in terms of partition fraction.

Abstract: A strength meter in a relay attack determination device is disposed on a portable device and measures a reception strength by a plurality of times in each of a request signal and a request signal received from an in-vehicle device. A comparator executes a comparative process of the request signal and the request signal by using average values of the reception strength measured by the strength meter. A variation calculator calculates variation in the reception strength measured by a plurality of times in the strength meter regarding the request signal. The comparator, in a case where the variation in the reception strength exceeds a threshold value indicating a communication failure in the request signal, determines the relay attack regardless of a result of the comparative process.

Abstract: A light detector is configured such that a light receiving portion having APDs and a peripheral portion are provided on a first principal surface of a p-type semiconductor substrate, and further includes a back electrode provided on a second principal surface of the semiconductor substrate and a p-type first separation portion provided between the light receiving portion and the peripheral portion. The APD has, on a first principal surface side, an n-type region and a p-epitaxial layer contacting the n-type region in a Z-direction. The peripheral portion has an n-type MISFET provided at a p-well and an n-well provided to surround entire side and bottom portions of the p-well.

Abstract: The insulation resistance testing device of the present disclosure includes a first magnetic current sensor disposed between the control unit and the ground, and a first damping resistor disposed in series with the first magnetic current sensor between the control unit and the ground. The insulation resistance testing device of the present disclosure includes a second magnetic current sensor disposed between the positive terminal and the ground of the battery pack, and a second damping resistor disposed in series with the second magnetic current sensor between the positive terminal and the ground.

Abstract: An image correction method according to an aspect of the present disclosure includes receiving an input of selecting one of a first method for correcting a shape of an image projected from a projector onto a projection surface and a second method that is a method for correcting the shape of the image and is different from the first method, outputting a signal for causing the projector to project a first pattern image when the first method is selected, generating first correction data for correcting the shape of the image using the first method based on a first captured image that is acquired by imaging the projection surface and includes the projection surface and a first projection image appearing on the projection surface by projecting the first pattern image, outputting a signal for causing the projector to project a second pattern image different from the first pattern image when the second method is selected, and generating second correction data for correcting the shape of the image using the second met

Abstract: An object of the present disclosure is to implement, at a low cost, highly accurate color calibration in a printing apparatus that performs printing using fluorescent ink. One embodiment of the present invention is an image processing apparatus that includes: a processing unit configured to perform processing relating to color calibration in a printing apparatus that prints an image on a printing medium using fluorescent printing material; and an execution unit configured to perform calibration processing of the printing apparatus based on a measured value that is obtained by measuring a patch chart for obtaining information on an amount of application of the fluorescent printing material in the printing apparatus, wherein a patch included in the patch chart is printed with the fluorescent printing material and subtractive color mixture printing material and at least one dot of the subtractive color mixture printing material covers a dot of the fluorescent printing material.

Abstract: The present invention is drawn to a raw material for chemical deposition for producing a ruthenium thin film or a ruthenium compound thin film by a chemical deposition method, containing an organoruthenium compound represented by the following formula 1, and further containing ?-diketone that is the same as a ligand of the organoruthenium compound. The raw material for chemical deposition of the present invention is inhibited in discoloration/precipitation even when heated at a high temperature, and enables to form a stable ruthenium thin film or ruthenium compound thin film. wherein substituents R1 and R2 are each hydrogen, or a linear or branched alkyl group.

Abstract: Provided is a method for manufacturing a semiconductor nanoparticle, the method includes performing a heat treatment of a first mixture containing a silver (Ag) salt, an alkali metal salt, a salt containing at least one of indium (In) and gallium (Ga), a sulfur source, and an organic solvent. A ratio of the number of atoms of an alkali metal to the total number of atoms of Ag and the alkali metal in the first mixture is greater than 0 and less than 1.

Abstract: A debug apparatus for performing allocation of target programs in which temperature is uniformized is provided. The debug apparatus receives temperature data measured by temperature sensors from a semiconductor device. The debug apparatus determines, as an analysis result of the temperature data, a CPU where the number of target programs executed is to be decreased and a CPU where the number of target programs executed is to be increased. The debug apparatus changes allocation of the target programs executed by a plurality of CPUs in the semiconductor device based on the analysis result of the temperature data.

Abstract: There is provided: an optical system including a focus lens group having positive refractive power and configured to move along an optical axis when focusing from an infinite-distance object to a short-distance object, and satisfying predetermined conditional expressions; and an imaging device including the optical system. The focus lens group includes a lens subgroup A, an aperture stop, and a lens subgroup B in order from the object side. The lens subgroup A includes a negative lens, a positive lens, and a positive lens in order from the image side. The lens subgroup B includes a negative lens and a positive lens in order from the object side.

Abstract: A method for detecting a pattern image includes causing a projector to display a first pattern image, acquiring a first captured image that is an image, captured with a camera, of the first pattern image, performing detection of a second pattern image corresponding to the first pattern image from the first captured image, when the detection of the second pattern image from the first captured image fails, performing first correction that increases possibility of successful detection of the second pattern image on the first captured image to acquire a second captured image, and performs detection of the second pattern image from the second captured image.

Abstract: A zoom lens according to the present invention includes sequentially from an object side: a first lens group having negative refractive power, and a second lens group having positive refractive power, and performs a magnification change operation by changing a gap between the adjacent lens groups. The zoom lens has specific optical characteristics represented by four expressions relating to the second lens group.

Abstract: An electric connection inspection device includes: a cooling plate; an insulating plate provided on the cooling plate; a first measurement electrode provided on the insulating plate; and a second measurement electrode and a third measurement electrode provided above the first measurement electrode and located apart from the first measurement electrode. The insulating plate includes a variable thermal resistance mechanism. A semiconductor device can be installed between the first measurement electrode and the second measurement electrode and between the first measurement electrode and the third measurement electrode.

Abstract: A semiconductor device includes a processor unit, a memory storing a boot program, a reset controller and an address check unit. The reset controller controls a reset for the processor unit based on a reset request and outputs a boot address for the boot program to be executed after reset release to the processor unit. The address check unit performs a tampering check for the boot address output from the reset controller and outputs a boot address error signal based on a tampering check result.

Abstract: A debug apparatus for performing allocation of target programs in which temperature is uniformized is provided. The debug apparatus receives temperature data measured by temperature sensors from a semiconductor device. The debug apparatus determines, as an analysis result of the temperature data, a CPU where the number of target programs executed to be decreased and a CPU where the number of target programs executed is to be increased. The debug apparatus changes allocation of the target programs executed by a plurality of CPUs in the semiconductor device based on the analysis result of the temperature data.

Abstract: The present invention has an object to provide a refrigeration cycle apparatus. A refrigeration cycle apparatus according to the present invention includes: a compressor; and a control apparatus configured to calculate a rotation number command of the compressor. The control apparatus includes a capacity controller configured to calculate the rotation number of the compressor as a capacity rotation number, a protection controller configured to calculate the rotation number of the compressor as a protection rotation number and a rotation number selection unit configured to select any one of the capacity rotation number and the protection rotation number as the rotation number command of the compressor. The rotation number command of the compressor is calculated so that at least any one of causing the current capacity value to approach the capacity target value and causing the protection variable to approach the protection target value is satisfied.

Abstract: Provided is a method for manufacturing a semiconductor nanoparticle, the method includes performing a heat treatment of a first mixture containing a silver (Ag) salt, an alkali metal salt, a salt containing at least one of indium (In) and gallium (Ga), a sulfur source, and an organic solvent. A ratio of the number of atoms of an alkali metal to the total number of atoms of Ag and the alkali metal in the first mixture is greater than 0 and less than 1.

Abstract: A second control unit of a projector specifies a first area in a liquid crystal panel corresponding to a projection area based on the projection area in a first captured image formed by imaging of a screen, a first image in the first captured image, and the first image in the liquid crystal panel, draws a second image larger than the first image within the first area, and specifies a second area in the liquid crystal panel corresponding to the projection area based on the projection area in a second captured image formed by imaging of the screen with an image light corresponding to the second image projected thereon, the second image in the second captured image, and the second image in the liquid crystal panel.

Abstract: An autonomous driving system configured to perform an autonomous driving of a vehicle includes a lane change determination unit configured to determine a necessity of an operation intervention for a lane change of the vehicle by a driver of the vehicle during the autonomous driving, a lane change request unit configured to request the driver to perform the operation intervention for the lane change of the vehicle when the lane change determination unit determines that it is necessary to perform the operation intervention for the lane change of the vehicle by the driver, and a mode switching unit configured to switch a steering torque mode for a lane keep control in the autonomous driving from a normal steering torque mode to a weak steering torque mode when the driver is requested to perform the operation intervention for the lane change of the vehicle.