Abstract: An culture vessel includes one or more recesses, each having a flat bottom surface, and a side surface extending upward from the peripheral edge of the bottom surface and including a rough surface with arithmetic mean roughness of 0.18 ?m to 5.0 ?m. The rough surface is water repellent and reduces meniscus formation on the peripheral edge of the upper surface of the culture solution. This suppresses a reduction in light amount at the peripheral edges of recesses due to meniscus formation. On the side surfaces of recesses, secondary illumination light is diffused and reflected. This suppresses formation of an image (ghost) of a biological sample by the secondary illumination light. Accordingly, it is possible to suppress a reduction in the amount of light due to meniscus formation in the culture solution and to reduce formation of an image of the biological sample by the secondary illumination light.

Abstract: Provided is a refrigeration cycle device including: a refrigeration cycle circuit comprising a compressor configured to compress a refrigerant; an operating state detector configured to detect an operating state of the refrigeration cycle circuit; a protection target value determinator configured to determine, based on the operating state, a protection target value of a protection variable regarding the refrigeration cycle circuit; and a rotation speed determinator configured to determine an operating rotation speed of the compressor, based at least on the protection target value and a capability target value of a temperature adjusted by the refrigeration cycle circuit. Thereby, it is possible to prevent the performance from being unnecessarily restricted.

Abstract: A semiconductor device includes a processor unit, a memory storing a boot program, a reset controller and an address check unit. The reset controller controls a reset for the processor unit based on a reset request and outputs a boot address for the boot program to be executed after reset release to the processor unit. The address check unit performs a tampering check for the boot address output from the reset controller and outputs a boot address error signal based on a tampering check result.

Abstract: A shielded flat cable includes multiple conductors arrayed in parallel along a first plane, a resin insulating layer including first and second resin insulating layers that cover the conductors, the first plane being sandwiched between the first and second resin insulating layers, a shield layer that covers an outer surface of the resin insulating layer and that includes an adhesive, and a pair of flame-retardant resin films that cover an outer surface of the shield layer. The pair of resin films have a first bonding section and a second bonding section where the pair of resin films are bonded to each other. The outer surface of the shield layer has a first portion that contacts the first bonding section and a second portion that contacts the second bonding section. The shield layer has a third bonding section where the adhesive is bonded to each other.

Abstract: There is provided: an optical system including a focus lens group having positive refractive power and configured to move along an optical axis when focusing from an infinite-distance object to a short-distance object, and satisfying predetermined conditional expressions; and an imaging device including the optical system. The focus lens group includes a lens subgroup A, an aperture stop, and a lens subgroup B in order from the object side. The lens subgroup A includes a negative lens, a positive lens, and a positive lens in order from the image side. The lens subgroup B includes a negative lens and a positive lens in order from the object side.

Abstract: The present disclosure provides a refrigeration cycle apparatus, including a compressor to compress a sucked refrigerant, a condenser to condense the refrigerant discharged from the compressor to exchange heat, a receiver to store the refrigerant discharged from the condenser, an evaporator to evaporate the refrigerant discharged from the receiver to exchange heat, an upstream expansion valve provided at a pipe between the condenser and the receiver, a downstream expansion valve provided at a pipe between the receiver and the evaporator, and a controller to control an opening degree of the upstream expansion valve and an opening degree of the downstream expansion valve in conjunction with each other so as to keep an opening degree ratio between the opening ratio of the upstream expansion valve and the opening ratio of the downstream expansion valve constant.

Abstract: Semiconductor nanoparticles are provided. The semiconductor nanoparticles contains Ag, at least one of In and Ga, and Se. An Ag content is 10 mol % to 30 mol %, a total content of the at least one of In and Ga is 15 mol % to 35 mol %, and an Se content is 35 mol % to 55 mol % in the semiconductor nanoparticles. The semiconductor nanoparticles emit light having an emission spectrum with a peak emission wavelength in a range of 500 nm to 900 nm, and a half bandwidth of 250 meV or less upon irradiation with light in a wavelength range of 350 nm to less than 500 nm.

Abstract: In a SiC power MISFET having a lateral surface of a trench formed in an upper surface of a SiC epitaxial substrate as a channel region, a silicon carbide semiconductor device having low resistance, high performance, and high reliability is realized. As a means therefor, a SiC power MISFET is formed as an island-shaped unit cell on an upper surface of an n-type SiC epitaxial substrate that is provided with a drain region on a bottom surface thereof, the SiC power MISFET including: an n-type current diffusion region that surrounds a p-type body layer contact region and an n-type source region in the indicated order in a plan view; a p-type body layer and an n-type JFET region; a trench that is formed on the body layer so as to span between the source region and the current diffusion region adjacent each other in a first direction and extends in the first direction; and a gate electrode embedded in the trench with a gate insulating film therebetween.

Abstract: A strength meter in a relay attack determination device is disposed on a portable device and measures a reception strength by a plurality of times in each of a request signal and a request signal received from an in-vehicle device. A comparator executes a comparative process of the request signal and the request signal by using average values of the reception strength measured by the strength meter. A variation calculator calculates variation in the reception strength measured by a plurality of times in the strength meter regarding the request signal. The comparator, in a case where the variation in the reception strength exceeds a threshold value indicating a communication failure in the request signal, determines the relay attack regardless of a result of the comparative process.

Abstract: An image correction method according to an aspect of the present disclosure includes receiving an input of selecting one of a first method for correcting a shape of an image projected from a projector onto a projection surface and a second method that is a method for correcting the shape of the image and is different from the first method, outputting a signal for causing the projector to project a first pattern image when the first method is selected, generating first correction data for correcting the shape of the image using the first method based on a first captured image that is acquired by imaging the projection surface and includes the projection surface and a first projection image appearing on the projection surface by projecting the first pattern image, outputting a signal for causing the projector to project a second pattern image different from the first pattern image when the second method is selected, and generating second correction data for correcting the shape of the image using the second met

Abstract: Provided is a method for manufacturing a semiconductor nanoparticle, the method includes performing a heat treatment of a first mixture containing a silver (Ag) salt, an alkali metal salt, a salt containing at least one of indium (In) and gallium (Ga), a sulfur source, and an organic solvent. A ratio of the number of atoms of an alkali metal to the total number of atoms of Ag and the alkali metal in the first mixture is greater than 0 and less than 1.

Abstract: The present invention is drawn to a raw material for chemical deposition for producing a ruthenium thin film or a ruthenium compound thin film by a chemical deposition method, containing an organoruthenium compound represented by the following formula 1, and further containing ?-diketone that is the same as a ligand of the organoruthenium compound. The raw material for chemical deposition of the present invention is inhibited in discoloration/precipitation even when heated at a high temperature, and enables to form a stable ruthenium thin film or ruthenium compound thin film. wherein substituents R1 and R2 are each hydrogen, or a linear or branched alkyl group.

Abstract: There is provided: an optical system including a focus lens group having positive refractive power and configured to move along an optical axis when focusing from an infinite-distance object to a short-distance object, and satisfying predetermined conditional expressions; and an imaging device including the optical system. The focus lens group includes a lens subgroup A, an aperture stop, and a lens subgroup B in order from the object side. The lens subgroup A includes a negative lens, a positive lens, and a positive lens in order from the image side. The lens subgroup B includes a negative lens and a positive lens in order from the object side.

Abstract: A debug apparatus for performing allocation of target programs in which temperature is uniformized is provided. The debug apparatus receives temperature data measured by temperature sensors from a semiconductor device. The debug apparatus determines, as an analysis result of the temperature data, a CPU where the number of target programs executed is to be decreased and a CPU where the number of target programs executed is to be increased. The debug apparatus changes allocation of the target programs executed by a plurality of CPUs in the semiconductor device based on the analysis result of the temperature data.

Abstract: A method for detecting a pattern image includes causing a projector to display a first pattern image, acquiring a first captured image that is an image, captured with a camera, of the first pattern image, performing detection of a second pattern image corresponding to the first pattern image from the first captured image, when the detection of the second pattern image from the first captured image fails, performing first correction that increases possibility of successful detection of the second pattern image on the first captured image to acquire a second captured image, and performs detection of the second pattern image from the second captured image.

Abstract: A zoom lens according to the present invention includes sequentially from an object side: a first lens group having negative refractive power, and a second lens group having positive refractive power, and performs a magnification change operation by changing a gap between the adjacent lens groups. The zoom lens has specific optical characteristics represented by four expressions relating to the second lens group.

Abstract: An electric connection inspection device includes: a cooling plate; an insulating plate provided on the cooling plate; a first measurement electrode provided on the insulating plate; and a second measurement electrode and a third measurement electrode provided above the first measurement electrode and located apart from the first measurement electrode. The insulating plate includes a variable thermal resistance mechanism. A semiconductor device can be installed between the first measurement electrode and the second measurement electrode and between the first measurement electrode and the third measurement electrode.

Abstract: A semiconductor device includes a processor unit, a memory storing a boot program, a reset controller and an address check unit. The reset controller controls a reset for the processor unit based on a reset request and outputs a boot address for the boot program to be executed after reset release to the processor unit. The address check unit performs a tampering check for the boot address output from the reset controller and outputs a boot address error signal based on a tampering check result.

Abstract: A debug apparatus for performing allocation of target programs in which temperature is uniformized is provided. The debug apparatus receives temperature data measured by temperature sensors from a semiconductor device. The debug apparatus determines, as an analysis result of the temperature data, a CPU where the number of target programs executed to be decreased and a CPU where the number of target programs executed is to be increased. The debug apparatus changes allocation of the target programs executed by a plurality of CPUs in the semiconductor device based on the analysis result of the temperature data.

Abstract: The present invention has an object to provide a refrigeration cycle apparatus. A refrigeration cycle apparatus according to the present invention includes: a compressor; and a control apparatus configured to calculate a rotation number command of the compressor. The control apparatus includes a capacity controller configured to calculate the rotation number of the compressor as a capacity rotation number, a protection controller configured to calculate the rotation number of the compressor as a protection rotation number and a rotation number selection unit configured to select any one of the capacity rotation number and the protection rotation number as the rotation number command of the compressor. The rotation number command of the compressor is calculated so that at least any one of causing the current capacity value to approach the capacity target value and causing the protection variable to approach the protection target value is satisfied.