Abstract: According to one embodiment, a pixel array unit, an exposure period control unit, and a charge discharge control unit are provided. In the pixel array unit, pixels that accumulate photoelectrically converted charges are arranged in a matrix form. The exposure period control unit controls an exposure period of the pixels with respect to each of lines. The charge discharge control unit performs discharge control of charges accumulated in the pixels in a non-exposure period of the pixels with respect to each of lines.

Abstract: According to one embodiment, an image processing device includes a line memory that stores an input image by a plurality of rows; a defect correcting circuit that performs defect correction on the input image based on image data stored in the line memory; a binning circuit that generates a low pass image having a lower spatial frequency than the input image by binning the input image subjected to the defect correction; a frame buffer that stores the low pass image; a filter that generates a high pass image having a higher spatial frequency than the low pass image by filtering the input image subjected to the defect correction; and a mixing circuit that mixes the low pass image with the high pass image.

Abstract: According to one embodiment, a solid-state imaging device includes a high dynamic range (HDR) synthesizing unit. The HDR synthesizing unit synthesizes a first image signal from a first pixel and a second image signal from a second pixel. The first pixel is a pixel to which a first exposure time is applied. The second pixel is a pixel to which a second exposure time is applied. The second exposure time is shorter than the first exposure time. The first and second horizontal lines form a periodic array. The first horizontal line is a horizontal line formed by the first pixels. The second horizontal line is a horizontal line formed by the second pixels. In the periodic array, a combination of the first horizontal lines and the second horizontal lines of the number which is twice the number of first horizontal lines is formed as units.

Abstract: According to one embodiment, a solid-state imaging device includes a pixel array and a row selection circuit. The pixel array outputs a signal for each cell. The cell includes a plurality of pixels arranged in parallel in a column direction. The cells are arranged such that positions in the column direction of a first cell and a second cell are staggered. The first cell includes a blue pixel and a green pixel. The second cell includes a green pixel and a red pixel. In a binning process in the column direction, the row selection circuit selects rows including the green pixel in the first cell at the same time for the first cell. In the binning process in the column direction, the row selection circuit selects rows including the green pixel in the second cell at the same time for the second cell.

Abstract: According to an embodiment, a high dynamic range synthesizing unit synthesizes first image signal and second image signal. A main control exposure value calculating unit calculates a main control exposure value based on a signal designated as a main control signal between the first image signal and the second image signal. A sub-control exposure value calculating unit multiplies the main control exposure value by a high dynamic range magnification and sets the multiplication result as a sub-control exposure value for a sub-control signal. The sub-control signal causes the main control signal to follow lightness adjustment.

Abstract: According to one embodiment, a selection unit selects a pixel value to be assigned to a target pixel according to a determination result of a defect determining unit. The defect determining unit performs defect determination according to the level of a signal-to-noise ratio (SNR) estimated by an SNR estimating unit. In the case where the defect determining unit determines that the target pixel is a defect, the selection unit outputs a pixel value according to the level of the SNR.

Abstract: According to one embodiment, a second determining unit performs defect determination according to an illumination light component, which is a component of illumination light irradiated onto an object, of pixel values of a plurality of adjacent pixels. A third determining unit performs defect determination according to a reflectivity component, which is a component based on a unique reflectivity of the object, of the pixel values of the plurality of adjacent pixels.

Abstract: According to one embodiment, a light receiver includes a light reception module, a multi-exposure area selector, a multi-exposure controller, and a readout module. The light reception module includes N lines, each of the N lines having a plurality of light receiving elements. The multi-exposure area selector is configured to select one or a plurality of single-exposure lines and one or a plurality of multi-exposure lines. The multi-exposure controller is configured to, per the unit time, perform an exposure on the single-exposure lines one time for a first exposure time; and a first exposure and a second exposure on the multi-exposure lines. The readout module is configured to read exposure amounts of the lines line by line. The multi-exposure controller is configured to start the second exposure on the multi-exposure lines before reading of the exposure amounts of all the single-exposure lines is completed.

Abstract: According to embodiments, an image processing device includes a line-exposure selecting unit. The line-exposure selecting unit is capable of switching a pattern of selecting a first exposure time and a second exposure time. The second exposure time is shorter than the first exposure time. The line-exposure selecting unit switches the pattern according to at least one of a frame rate required of a synthetic image and an image size required of a synthetic image.

Abstract: According to embodiments, an image processing apparatus includes an image signal holding unit. The image processing apparatus uses an image signal passing through the common image signal holding unit to generate first, second and third correction values. The first correction value is a signal value applied to a pixel in which saturation of an output occurs in a saturation determination. The second correction value is a signal value subjected to a noise cancellation process. The third correction value is a signal value applied to a pixel in which defect occurs in a defect determination.

Abstract: According to embodiment, an image processing device includes a black level correcting section. The black level correcting section includes a first input restricting unit and a second input restricting unit. The second input restricting unit performs a second input restriction, having a second signal level range including a moving average as a reference, on a black level signal subjected to a first input restriction by the first input restricting unit. A correction amount calculation unit calculates a difference of an average of signal values subjected to the second input restriction and a black level standard value as a correction value to apply on an effective pixel signal.

Abstract: According to one embodiment, a second determining unit performs defect determination according to an illumination light component, which is a component of illumination light irradiated onto an object, of pixel values of a plurality of adjacent pixels. A third determining unit performs defect determination according to a reflectivity component, which is a component based on a unique reflectivity of the object, of the pixel values of the plurality of adjacent pixels.

Abstract: According to one embodiment, a selection unit selects a pixel value to be assigned to a target pixel according to a determination result of a defect determining unit. The defect determining unit performs defect determination according to the level of a signal-to-noise ratio (SNR) estimated by an SNR estimating unit. In the case where the defect determining unit determines that the target pixel is a defect, the selection unit outputs a pixel value according to the level of the SNR.

Abstract: According to the embodiments, an image processing apparatus includes a weight coefficient calculating unit, a defect-correction-coefficient switching unit, and a convolution operation unit. The weight coefficient calculating unit calculates a weight coefficient for scaling processing. The defect-correction-coefficient switching unit performs switching of the weight coefficient for defect correction for a defect correction target pixel in which a defect is detected.

Abstract: An imaging unit generates first and second image signals imaged using different exposure time based on a reference read voltage. A synthesis circuit synthesizes the first and second image signals generated by the imaging unit. A detection unit detects luminance information of a specified subject using a synthesized image signal outputting from the synthesis circuit. A controller controls the reference read voltage of the imaging unit, the controller determines a first knee point based on luminance information of a specified subject detected by the detection unit, and controls the first knee point according to the reference read voltage.

Abstract: According to one embodiment, a data reproducing device according to the invention includes a frequency difference detector, a phase comparator, a loop filter, an integrator, a first conversion part for converting a value of the integrator into a first conversion value, a second conversion part for converting the value of the integrator into a second conversion value, a first conversion table, a second conversion table, a first D/A converter (DAC), a second D/A converter (DAC), a voltage controlled oscillator (VCO), and a prediction table. The value of the integrator and the first conversion value are associated with each other and stored in the first conversion table in consideration of the characteristics of the VCO. Meanwhile, the value of the integrator and the second conversion value are associated with each other and stored in the second conversion table in consideration of the characteristics of the VCO.

Abstract: An optical disc reproducing device is provided which is capable of setting an optimum PR class for the comprehensive frequency characteristic of an optical disc including the recording characteristic and reproducing characteristic. An optical disc reproducing device according to the present invention relates to an optical disc reproducing device which performs reproduction from an optical disc using the PRML method. The optical disc reproducing device comprises a Viterbi decoding unit which generates binary data using maximum likelihood decoding processing based upon multi-value reproduced data obtained by sampling a reproduced signal from the optical disc. The Viterbi decoding unit generates the binary data based upon an optimum PR class determined based upon the multi-value reproduced data and the binary data in a predetermined determination period.

Abstract: A disk device includes a reading section which reads reflected light and outputs a read signal according to the read reflected light, a processing section which calculates an adjustment value from the read signal, performs predetermined processing on the read signal based on the adjustment value, and outputs a process signal, a detecting section which detects a reading defect in the reading section based on the read signal, a determining section which determines signal quality of the process signal output from the processing section, a storage section which stores the adjustment value calculated by the processing section, in a memory area, based on a result output from the determining section, and a controller which, when the detecting section detects the reading defect, performs control so that the adjustment value is read out of the storage section and is supplied to the processing section.

Abstract: According to one embodiment, An optical disc apparatus includes a decoder including branchmetric calculation section configured to calculate a branchmetric for the signal generated by executing a predetermined process on read signal obtained from a optical disc, pathmetric selection section configured to select a maximum likelihood pathmetric according to the branchmetric calculated by the branchmetric calculation section and a path memory having memory stages, each consisting of memory elements, configured to obtain a decoded signal by shifting the information to be stored in the memory to a memory of a subsequent stage according to the outcome of selection of the pathmetric selection section, and defect detection section configured to detect a defect of the optical disc according to the information possessed by the memory of the last stage or of a specific stage of the path memory.

Abstract: An integrated circuit includes an AD converter and a self-test circuit configured to test the AD converter. The self-test circuit includes a clock generator which generates a clock for allowing the AD converter to AD-convert an external sine wave signal externally input, a sine wave generator which generates an internal sine wave signal in digital form, a subtractor which determines a differential signal between the AD-converted external sine wave signal and the internal sine wave signal, a PLL device which allows a phase-locked loop receiving the differential signal as an input to control a phase of the internal sine wave signal such that the internal sine wave signal is in phase with the external sine wave signal, and a root mean square calculator which calculates a root mean square of the differential signal to generate a diagnostic signal corresponding to the AD converter.