Patents by Inventor Yuko Sasaki

Yuko Sasaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220133805
    Abstract: The present invention relates to a pharmaceutical composition for treating amyotrophic lateral sclerosis. More specifically, the present invention relates to a pharmaceutical composition for treating amyotrophic lateral sclerosis, wherein the pharmaceutical composition comprises mesenchymal stem cells and is intravenously administered.
    Type: Application
    Filed: March 13, 2020
    Publication date: May 5, 2022
    Applicants: Sapporo Medical University, Nipro Corporation
    Inventors: Osamu HONMOU, Masanori SASAKI, Yuko SASAKI, Shinichi OKA, Masahito NAKAZAKI, Rie MAEZAWA
  • Publication number: 20220125850
    Abstract: The present invention relates to a pharmaceutical composition containing mesenchymal stem cells administered to a patient subjected to stenting. The present invention relates specifically to: a pharmaceutical composition for repairing and regenerating tissue, comprising mesenchymal stem cells, wherein the pharmaceutical composition is administered to a patient subjected to stenting; and the prevention of in-stent neointimal hyperplasia or in-stent restenosis with the pharmaceutical composition.
    Type: Application
    Filed: February 7, 2020
    Publication date: April 28, 2022
    Applicants: Sapporo Medical University, Nipro Corporation
    Inventors: Osamu HONMOU, Masanori SASAKI, Yuko SASAKI, Shinichi OKA, Masahito NAKAZAKI, Rie MAEZAWA
  • Patent number: 11152186
    Abstract: An object of the present disclosure is to propose a charged particle beam device capable of appropriately evaluating and setting a beam aperture angle. As one aspect for achieving the above-described object, provided is a charged particle beam device which includes a plurality of lenses and controls the plurality of lenses so as to set a focus at a predetermined height of a sample and to adjust the beam aperture angle. The charged particle beam device generates a first signal waveform based on a detection signal obtained by scanning with the beam in a state where the focus is set at a first height that is a bottom portion of a pattern formed on the sample, calculates a feature amount of a signal waveform on a bottom edge of the pattern based on the first signal waveform, and calculates the beam aperture angle based on the calculated feature amount.
    Type: Grant
    Filed: March 15, 2019
    Date of Patent: October 19, 2021
    Assignee: Hitachi High-Tech Corporation
    Inventors: Wataru Yamane, Minoru Yamazaki, Yuko Sasaki, Wataru Mori, Takashi Doi
  • Patent number: 10991542
    Abstract: The purpose of the present invention is to provide a charged particle beam device which adjusts brightness and contrast or adjusts focus and the like appropriately in a short time even if there are few detected signals. Proposed as an aspect for achieving this purpose is a charged particle beam device provided with: a detector for detecting charged particles obtained on the basis of irradiation of a specimen with a charged particle beam emitted from a charged particle source; and a control unit for processing a signal obtained on the basis of the output of the detector, wherein the control unit performs statistical processing on gray level values in a predetermined region of an image generated on the basis of the output of the detector, and executes signal processing for correcting a difference between a statistical value obtained by the statistical processing and reference data relating to the gray level values of the image.
    Type: Grant
    Filed: January 27, 2017
    Date of Patent: April 27, 2021
    Assignee: Hitachi High-Tech Corporation
    Inventors: Ryota Watanabe, Yuko Sasaki, Kazunari Asao, Makoto Suzuki, Wataru Mori, Minoru Yamazaki
  • Patent number: 10770266
    Abstract: A charged particle beam device includes an electron source which generates an electron beam, an objective lens which is applied with a coil current to converge the electron beam on a sample, a control unit which controls the current to be applied to the objective lens, a hysteresis characteristic storage unit which stores hysteresis characteristic information of the objective lens, a history information storage unit which stores history information related to the coil current, and an estimation unit which estimates a magnetic field generated by the objective lens on the basis of the coil current, the history information, and the hysteresis characteristic information.
    Type: Grant
    Filed: June 10, 2019
    Date of Patent: September 8, 2020
    Assignee: Hitachi High-Tech Corporation
    Inventors: Tomohito Nakano, Toshiyuki Yokosuka, Yuko Sasaki, Minoru Yamazaki, Yuzuru Mochizuki
  • Patent number: 10707047
    Abstract: A measuring device for measuring a sample by emitting a charged particle beam includes a particle source, an electronic lens, a detector, a stage, a sensor for measuring the environment, and a control device, in which the control device includes a control module having a height calculation module configured to calculate a height estimation value indicating an estimated height of the sample at a measurement position; and a correction value calculation module configured to calculate a correction value reflecting a change of the environment based on the measurement position of the sample and an amount of change of the environment measured by the sensor, and the control module corrects the height estimation value based on the correction value, and sets a control value for controlling focus adjustment using the electronic lens based on the corrected height estimation value.
    Type: Grant
    Filed: August 31, 2016
    Date of Patent: July 7, 2020
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Noritsugu Takahashi, Makoto Sakakibara, Wataru Mori, Hajime Kawano, Yuko Sasaki
  • Patent number: 10692687
    Abstract: A low noise blanking unit corresponds to a wide range of acceleration voltages (from several times higher than related voltages to low acceleration voltages) of an electron beam. A blanking unit of the measurement and inspection device includes a blanking control circuit, in which (i) an upper and a lower blanking electrodes are arranged in the irradiation direction of an electron beam; electrodes on the reverse sides of two opposing electrodes in each of the blanking electrodes arranged in the same direction are connected with the ground, (ii) when blanking is ON, positive voltages are output to remaining electrodes of the upper blanking electrode and negative voltages are output to remaining electrodes of the lower blanking electrode, and (iii) when the blanking is OFF, the same ground reference signal is output to the remaining electrodes of the upper blanking electrode and to the remaining electrodes of the lower blanking electrode.
    Type: Grant
    Filed: January 18, 2019
    Date of Patent: June 23, 2020
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Wen Li, Shinichi Murakami, Hiroyuki Takahashi, Yuko Sasaki, Minoru Yamazaki, Hajime Kawano
  • Patent number: 10566172
    Abstract: A charged particle beam apparatus with reduced frequency of lens resetting operations and thus with improved throughput. The apparatus includes an electron source configured to generate an electron beam, an objective lens to which coil current is adapted to be applied to converge the electron beam on a sample, a focal position adjustment device configured to adjust the focal position of the electron beam, a detector configured to detect electrons from the sample, a display unit configured to display an image of the sample in accordance with a signal from the detector, a storage unit configured to store information on the hysteresis characteristics of the objective lens, and an estimation unit configured to estimate a magnetic field generated by the objective lens on the basis of the coil current, the amount of adjustment of the focal position by the focal position adjustment device, and the information on the hysteresis characteristics.
    Type: Grant
    Filed: November 8, 2018
    Date of Patent: February 18, 2020
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Tomohito Nakano, Toshiyuki Yokosuka, Yuko Sasaki, Minoru Yamazaki, Yuzuru Mochizuki
  • Publication number: 20200035449
    Abstract: A charged particle beam device includes an electron source which generates an electron beam, an objective lens which is applied with a coil current to converge the electron beam on a sample, a control unit which controls the current to be applied to the objective lens, a hysteresis characteristic storage unit which stores hysteresis characteristic information of the objective lens, a history information storage unit which stores history information related to the coil current, and an estimation unit which estimates a magnetic field generated by the objective lens on the basis of the coil current, the history information, and the hysteresis characteristic information.
    Type: Application
    Filed: June 10, 2019
    Publication date: January 30, 2020
    Inventors: Tomohito NAKANO, Toshiyuki YOKOSUKA, Yuko SASAKI, Minoru YAMAZAKI, Yuzuru MOCHIZUKI
  • Publication number: 20190362931
    Abstract: The purpose of the present invention is to provide a charged particle beam device which adjusts brightness and contrast or adjusts focus and the like appropriately in a short time even if there are few detected signals. Proposed as an aspect for achieving this purpose is a charged particle beam device provided with: a detector for detecting charged particles obtained on the basis of irradiation of a specimen with a charged particle beam emitted from a charged particle source; and a control unit for processing a signal obtained on the basis of the output of the detector, wherein the control unit performs statistical processing on gray level values in a predetermined region of an image generated on the basis of the output of the detector, and executes signal processing for correcting a difference between a statistical value obtained by the statistical processing and reference data relating to the gray level values of the image.
    Type: Application
    Filed: January 27, 2017
    Publication date: November 28, 2019
    Inventors: Ryota WATANABE, Yuko SASAKI, Kazunari ASAO, Makoto SUZUKI, Wataru MORI, Minoru YAMAZAKI
  • Publication number: 20190318906
    Abstract: A low noise blanking unit corresponds to a wide range of acceleration voltages (from several times higher than related voltages to low acceleration voltages) of an electron beam. A blanking unit of the measurement and inspection device includes a blanking control circuit, in which (i) an upper and a lower blanking electrodes are arranged in the irradiation direction of an electron beam; electrodes on the reverse sides of two opposing electrodes in each of the blanking electrodes arranged in the same direction are connected with the ground, (ii) when blanking is ON, positive voltages are output to remaining electrodes of the upper blanking electrode and negative voltages are output to remaining electrodes of the lower blanking electrode, and (iii) when the blanking is OFF, the same ground reference signal is output to the remaining electrodes of the upper blanking electrode and to the remaining electrodes of the lower blanking electrode.
    Type: Application
    Filed: January 18, 2019
    Publication date: October 17, 2019
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Wen LI, Shinichi MURAKAMI, Hiroyuki TAKAHASHI, Yuko SASAKI, Minoru YAMAZAKI, Hajime KAWANO
  • Publication number: 20190311875
    Abstract: An object of the present disclosure is to propose a charged particle beam device capable of appropriately evaluating and setting a beam aperture angle. As one aspect for achieving the above-described object, provided is a charged particle beam device which includes a plurality of lenses and controls the plurality of lenses so as to set a focus at a predetermined height of a sample and to adjust the beam aperture angle. The charged particle beam device generates a first signal waveform based on a detection signal obtained by scanning with the beam in a state where the focus is set at a first height that is a bottom portion of a pattern formed on the sample, calculates a feature amount of a signal waveform on a bottom edge of the pattern based on the first signal waveform, and calculates the beam aperture angle based on the calculated feature amount.
    Type: Application
    Filed: March 15, 2019
    Publication date: October 10, 2019
    Inventors: Wataru YAMANE, Minoru YAMAZAKI, Yuko SASAKI, Wataru MORI, Takashi DOI
  • Publication number: 20190227067
    Abstract: [Problem] The present invention addresses the problem of providing a novel biomarker which makes it possible to find the prognosis of glioma, the risk of distant recurrence of glioma, the invasion ability of glioma cells and the like and also makes it possible to detect the prognosis, the risk, the invasion ability or the like in an earlier stage of a therapy of glioma. [Solution] The present invention relates to a method for evaluating the prognosis of glioma, said method comprising the steps of: detecting ACTC1 protein and/or mRNA encoding the protein in a glioma-containing sample collected from a patient; and determining that the prognosis of the glioma is poor when the ACTC1 protein and/or the mRNA encoding the protein is detected in the aforementioned step. According to the present invention, the prognosis of glioma, the risk of distant recurrence of glioma, the invasion ability and the like can be evaluated using a novel biomarker, i.e., ACTC1 protein and/or mRNA encoding the protein.
    Type: Application
    Filed: July 28, 2016
    Publication date: July 25, 2019
    Applicant: SAPPORO MEDICAL UNIVERSITY
    Inventors: Osamu HONMOU, Masahiko WANIBUCHI, Shunya OHTAKI, Masanori SASAKI, Yuko SASAKI, Nobuhiro MIKUNI
  • Publication number: 20190206654
    Abstract: A measuring device for measuring a sample by emitting a charged particle beam includes a particle source, an electronic lens, a detector, a stage, a sensor for measuring the environment, and a control device, in which the control device includes a control module having a height calculation module configured to calculate a height estimation value indicating an estimated height of the sample at a measurement position; and a correction value calculation module configured to calculate a correction value reflecting a change of the environment based on the measurement position of the sample and an amount of change of the environment measured by the sensor, and the control module corrects the height estimation value based on the correction value, and sets a control value for controlling focus adjustment using the electronic lens based on the corrected height estimation value.
    Type: Application
    Filed: August 31, 2016
    Publication date: July 4, 2019
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Noritsugu TAKAHASHI, Makoto SAKAKIBARA, Wataru MORI, Hajime KAWANO, Yuko SASAKI
  • Publication number: 20190183937
    Abstract: The present invention relates to a life extension agent containing CD24-negative mesenchymal stem cells and the treatment of dementia, cerebral infarction, spinal cord injury and the like using the life extension agent.
    Type: Application
    Filed: April 13, 2017
    Publication date: June 20, 2019
    Applicants: Sapporo Medical University, Nipro Corporation
    Inventors: Osamu Honmou, Masanori Sasaki, Yuko Sasaki, Rie Maezawa, Shinichi Oka, Masahito Nakazaki
  • Patent number: 10319558
    Abstract: Provided is a multifunctional charged particle beam device capable of inclining a beam with little aberration. The aberration is corrected by forming a local divergent field with a multipole, parallel current lines, or the like, matching the beam axis with the local divergent field via a conventional rotationally symmetric lens, deflector or astigmatism corrector, and counteracting an aberration occurring from another rotationally symmetric convex lens field.
    Type: Grant
    Filed: May 2, 2014
    Date of Patent: June 11, 2019
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yuko Sasaki, Hiroyuki Ito
  • Publication number: 20190172676
    Abstract: A charged particle beam apparatus with reduced frequency of lens resetting operations and thus with improved throughput. The apparatus includes an electron source configured to generate an electron beam, an objective lens to which coil current is adapted to be applied to converge the electron beam on a sample, a focal position adjustment device configured to adjust the focal position of the electron beam, a detector configured to detect electrons from the sample, a display unit configured to display an image of the sample in accordance with a signal from the detector, a storage unit configured to store information on the hysteresis characteristics of the objective lens, and an estimation unit configured to estimate a magnetic field generated by the objective lens on the basis of the coil current, the amount of adjustment of the focal position by the focal position adjustment device, and the information on the hysteresis characteristics.
    Type: Application
    Filed: November 8, 2018
    Publication date: June 6, 2019
    Inventors: Tomohito NAKANO, Toshiyuki YOKOSUKA, Yuko SASAKI, Minoru YAMAZAKI, Yuzuru MOCHIZUKI
  • Publication number: 20190117700
    Abstract: The present invention relates to a synapse formation promoter and a brain plasticity promoter comprising CD24-negative mesenchymal stem cells prepared from a patient's own bone marrow aspirate and treatment of dementia, chronic-phase cerebral infarction, chronic-phase spinal cord injury, mental diseases, and the like using the synapse formation promoter and brain plasticity promoter.
    Type: Application
    Filed: April 26, 2017
    Publication date: April 25, 2019
    Applicants: Sapporo Medical University, Nipro Corporation
    Inventors: Osamu Honmou, Masanori SASAKI, Rie MAEZAWA, Shinichi OKA, Yuko SASAKI, Masahito NAKAZAKI, Toshihiko YAMASHITA
  • Patent number: 10232026
    Abstract: Disclosed is a vaccine which has a high therapeutic effect on mycoplasma infection and is highly safe. For the purpose of developing effective therapeutic methods for mycoplasma infection, mycoplasma-mimic particles which are effective as a vaccine for mycoplasma infection are provided, and also provided are bacterium-mimic particles including common bacteria. Bacterium-mimic particles such as mycoplasma-mimic particles can be provided by producing liposome particles in which a lipid antigen specific to a pathogenic bacterium such as mycoplasma is contained as a liposome-constituting lipid component. The administration of the mycoplasma-mimic particles enables the induction of a potent immunological activity in living bodies. The mycoplasma-mimic particles can be used as an excellent vaccine for the prevention or treatment of mycoplasma infection.
    Type: Grant
    Filed: December 13, 2016
    Date of Patent: March 19, 2019
    Assignees: NATIONAL INSTITUTE OF INFECTIOUS DISEASES, M BIO TECHNOLOGY INC.
    Inventors: Kazuhiro Matsuda, Koji Ichiyama, Sachie Matsuda, Yuko Sasaki, Yoshichika Arakawa, Ryo Harasawa, Yoshihiro Nishida, Norio Katayama, Yasuo Endo, Nobuo Nomura
  • Publication number: 20190002833
    Abstract: Provided is new means for reducing risk of cerebral hemorrhage associated with a reperfusion therapy for vessel occlusion (for example, administration of a medicament including a thrombolytic agent, a platelet aggregation inhibitor, and an anticoagulant agent, or physical removal of a blood clot) and treating an ischemic vascular disorder more effectively. The present invention relates to a medicament for treating an ischemic vascular disorder, comprising mesenchymal stem cells, wherein the medicament is used in combination with a reperfusion therapy for vessel occlusion and more specifically, to a medicament for treating an ischemic vascular disorder, wherein the medicament reduces risk of cerebral hemorrhage associated with the reperfusion therapy for vessel occlusion and extends a time window in which the therapy is applicable.
    Type: Application
    Filed: December 26, 2016
    Publication date: January 3, 2019
    Applicants: Sapporo Medical University, Nipro Corporation
    Inventors: Osamu Honmou, Masahito Nakazaki, Masanori Sasaki, Yuko Sasaki, Shinichi Oka