Patents by Inventor Yung-Yu Lin

Yung-Yu Lin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210335694
    Abstract: A semiconductor device includes a through-substrate via extending from a frontside to a backside of a semiconductor substrate. The through-substrate via includes a concave or a convex portion adjacent to the backside of the semiconductor substrate. An isolation film is formed on the backside of the semiconductor substrate. A conductive layer includes a first portion formed on the concave or convex portion of the through substrate via and a second portion formed on the isolation film. A passivation layer partially covers the conductive layer.
    Type: Application
    Filed: July 2, 2021
    Publication date: October 28, 2021
    Inventors: Yung-Chi Lin, Hsin-Yu Chen, Ming-Tsu Chung, HsiaoYun Lo, Hong-Ye Shih, Chia-Yin Chen, Ku-Feng Yang, Tsang-Jiuh Wu, Wen-Chih Chiou
  • Publication number: 20210320538
    Abstract: A winding structure of motor stator includes a stator core, two insulation members, an upper cap, a lower cap, and a coil. The two insulation members are disposed on two winding grooves of the stator core respectively. The upper cap and the lower cap are disposed on a top end and a bottom end of the stator core respectively. The coil is wound on the upper cap, the two insulation members, and the lower cap. Stopping pieces facing each other are formed on two sides of each of the upper cap and the lower cap. Each of the stopping pieces is separated from the coil without contact.
    Type: Application
    Filed: April 14, 2020
    Publication date: October 14, 2021
    Inventors: Yung-Yu LIN, Ching-Hui HSU, Jui-Yang HSU
  • Patent number: 11144485
    Abstract: An interface for a semiconductor device includes a master device and a plurality of slave devices. The interface includes a master interface and a slave interface. The master interface is implemented in the master device and includes a master bond pattern of master bonds arranged as a first array. The slave interface is implemented each slave device and includes a slave bond pattern of slave bonds arranged as a second array. The first array of the master bonds includes a first central row and first data rows in two parts being symmetric to the first central row. The second array of the slave bonds includes a second central row and second data rows in two parts being symmetric to the second central row. The first central row and the second central row are aligned in connection, and the first data rows are connected to the second data rows.
    Type: Grant
    Filed: September 30, 2020
    Date of Patent: October 12, 2021
    Assignees: Global Unichip Corporation, Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Igor Elkanovich, Amnon Parnass, Pei Yu, Li-Ken Yeh, Yung-Sheng Fang, Sheng-Wei Lin, Tze-Chiang Huang, King Ho Tam, Ching-Fang Chen
  • Publication number: 20210223699
    Abstract: A method of removing a photoresist, a laminate, a method of forming a metallic pattern, a polyimide resin, and a stripper are provided. The method of removing the photoresist includes forming a release layer on a substrate, the release layer having a first surface and a second surface opposite to each other, wherein the first surface of the release layer is in contact with the substrate; forming a photoresist layer on the second surface of the release layer; and removing the release layer and the photoresist layer. The release layer is formed by a polyimide resin. The polyimide resin is obtained by performing a polymerization of tetracarboxylic dianhydrides, diamines, and phenolamines. The diamines include hydroxyfluorinated diamines, benzoic acid diamines, and aminotetramethyldisiloxanes.
    Type: Application
    Filed: January 5, 2021
    Publication date: July 22, 2021
    Applicant: eChem Solutions Corp.
    Inventors: Tz-Jin Yang, Yung-Yu Lin, Chi-Yu Lai, Ming-Che Chung, Che-Wei Chang
  • Publication number: 20150209812
    Abstract: The present invention provides a device and method for repairing a pattern on an array substrate, said device comprising: an illuminating unit, for illuminating a mask after the mask is disposed above a substrate so as to expose a layer on the substrate that is to be etched to light to form an exposed pattern on that layer; a checking unit, for checking the exposed pattern on the layer to be etched for determining whether a coating defect is occurred in the exposed pattern; and a coating unit, for coating a protection layer at where the coating defect is located when the coating defect is determined to be existed in the exposed pattern. The present invention not only has high efficiency, but also low cost.
    Type: Application
    Filed: September 3, 2012
    Publication date: July 30, 2015
    Applicant: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
    Inventor: Yung-yu Lin
  • Patent number: 9074886
    Abstract: A line-width measurement device and a measurement method using the same are disclosed. The line-width measurement device has a platform, an image capturing device and a color-mixing light source device. The image capturing device captures an image of a pattern under measurement in a measurement area of the platform. The color-mixing light source device correspondingly provides illumination to the measurement area. The color-mixing light source device has a plurality of monochromatic light sources and adjusts the brightness scale of each monochromatic light source according to the matching rate of the pattern under measurement and a standard pattern to provide suitable color-mixed lights for illumination. Therefore, the present invention can provide a better measurement environment to further enhance accuracy of line-width measurement.
    Type: Grant
    Filed: July 19, 2012
    Date of Patent: July 7, 2015
    Assignee: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
    Inventors: Yung-yu Lin, Qingping Wang
  • Patent number: 8994936
    Abstract: The present invention discloses a pattern matching method, which is used in measurement process for line width measuring machine, comprising: reading a standard pattern used for matching on the at least one predetermined position of a measured sample; respectively comparing each standard pattern of the measured sample with prestored multiple designed original images corresponding to the standard pattern; determining that the pattern matching is successful if the standard pattern on the measured sample successfully compares with at least one designed original image, and proceeding with the subsequent line width measurement process; otherwise, determining that the pattern matching is failed. The present invention also discloses a corresponding pattern matching method and a line width measuring machine. According to the embodiment of the present invention, it can improve the accuracy and the success rate of the pattern matching when measuring the line width.
    Type: Grant
    Filed: November 27, 2012
    Date of Patent: March 31, 2015
    Assignee: Shenzhen China Star Optoelectronics Technology Co., Ltd
    Inventor: Yung-Yu Lin
  • Patent number: 8908170
    Abstract: The present invention provides a method for detecting a defect of a display panel and related defect detecting device. The method includes: utilizing lights having different colors to illuminate the display panel; obtaining a plurality of corresponding grey-scale diagrams when the lights illuminate the display panel; and determining whether the display panel has a defect. If the grey-scale diagrams indicate a grey-scale difference, determining that the display panel has a defect. In this way, the present invention is able to raise defect detecting ability for the display panel and prevent from missing the defects.
    Type: Grant
    Filed: January 4, 2013
    Date of Patent: December 9, 2014
    Assignee: Shenzhen China Star Optoelectronics Technology Co., Ltd.
    Inventor: Yung-Yu Lin
  • Patent number: 8836936
    Abstract: The present invention discloses an inspecting device for detecting whether there is an appearance of debris on a surface of a glass substrate, including a laser unit, a platform, and an image sensor unit. The surface of the platform is coated with a light-absorbing material so as to absorb laser beams penetrating through the glass substrate to prevent the image sensor unit from receiving the reflected laser beam from the underside of the glass substrate. Besides, the present invention discloses an inspecting apparatus for detecting whether there is an appearance of debris on a surface of a glass substrate, using the inspecting device given above, and a method for conducting inspection. The inspecting device features a simplified configuration; the method is easy to operate; and the device can effectively prevent the background interference from the underside of glass substrates when determining whether there is an appearance of debris on top surfaces of glass substrates.
    Type: Grant
    Filed: February 19, 2013
    Date of Patent: September 16, 2014
    Assignee: Shenzhen China Star Optoelectronics Technology Co., Ltd
    Inventor: Yung-Yu Lin
  • Publication number: 20140218725
    Abstract: The present invention discloses an inspecting device for detecting whether there is an appearance of debris on a surface of a glass substrate, including a laser unit, a platform, and an image sensor unit. The suface of the platform is coated with a light-absorbing material so as to absorb laser beams penetrating through the glass substrate to prevent the image sensor unit from receiving the reflected laser beam from the underside of the glass substrate. Besides, the present invention discloses an inspecting apparatus for detecting whether there is an appearance of debris on a surface of a glass substrate, using the inspecting device given above, and a method for conducting inspection. The inspecting device features a simplified configuration; the method is easy to operate; and the device can effectively prevent the backgrotmd interference from the underside of glass substrates when determining whether there is an appearance of debris on top surfaces of glass substrates.
    Type: Application
    Filed: February 19, 2013
    Publication date: August 7, 2014
    Applicant: Shenzhen China Star Optoelectronics Technology Co., Ltd.
    Inventor: Yung-yu Lin
  • Publication number: 20140185048
    Abstract: The present invention provides a method for detecting a defect of a display panel and related defect detecting device. The method includes: utilizing lights having different colors to illuminate the display panel; obtaining a plurality of corresponding grey-scale diagrams when the lights illuminate the display panel; and determining whether the display panel has a defect. If the grey-scale diagrams indicate a grey-scale difference, determining that the display panel has a defect. In this way, the present invention is able to raise defect detecting ability for the display panel and prevent from missing the defects.
    Type: Application
    Filed: January 4, 2013
    Publication date: July 3, 2014
    Applicant: Shenzhen China Star Optoelectronics Technology Co. Ltd.
    Inventor: Yung-Yu Lin
  • Patent number: 8737936
    Abstract: An amplitude modulation circuit in a polar transmitter includes a digital-to-analog converter (DAC), a filter, a gm stage, and a calibration module. The DAC is arranged to be coupled to an amplitude modulation signal input in a normal mode. The filter is coupled to the DAC, and the gm stage is coupled to the filter. The calibration module has an input coupled to the gm stage, and an output coupled to a node on a path between the DAC and the gm stage. A method for calibrating an amplitude offset in the polar transmitter includes: generating an amplitude offset calibration signal according to an amplitude modulation signal generated from the gm stage; and transmitting the amplitude offset calibration signal via the output of the calibration module to a node on a path between the DAC and the gm stage so as to calibrate the amplitude offset.
    Type: Grant
    Filed: October 23, 2011
    Date of Patent: May 27, 2014
    Assignee: Mediatek Inc.
    Inventors: Hsin-Hung Chen, Hsiang-Hui Chang, Chun-Pang Wu, Yung-Yu Lin, Jong-Woei Chen
  • Publication number: 20140139828
    Abstract: The present invention discloses a pattern matching method, which is used in measurement process for line width measuring machine, comprising: reading a standard pattern used for matching on the at least one predetermined position of a measured sample; respectively comparing each standard pattern of the measured sample with prestored multiple designed original images corresponding to the standard pattern; determining that the pattern matching is successful if the standard pattern on the measured sample successfully compares with at least one designed original image, and proceeding with the subsequent line width measurement process; otherwise, determining that the pattern matching is failed. The present invention also discloses a corresponding pattern matching method and a line width measuring machine. According to the embodiment of the present invention, it can improve the accuracy and the success rate of the pattern matching when measuring the line width.
    Type: Application
    Filed: November 27, 2012
    Publication date: May 22, 2014
    Inventor: Yung-Yu Lin
  • Publication number: 20140132760
    Abstract: The present invention provides an apparatus for measuring line width, for capturing an image of a pattern to be measured. The apparatus for measuring line width includes at least: a first backlight source and a second backlight source, the first backlight source and the second backlight source being disposed respectively under the pattern to be measured and projecting backlight onto the pattern to be measured; an image capturing device, disposed above the pattern to be measured for capturing the image of the pattern. As such, the present invention effectively avoids causing shadows and improves the precision of image capturing of the image capturing device, as well as reduces the number of required light sources to reduce the cost of modification and maintenance of the apparatus for measuring line width.
    Type: Application
    Filed: November 27, 2012
    Publication date: May 15, 2014
    Applicant: Shenzhen China Star Optoelectronics Technology Co., Ltd.
    Inventor: Yung-Yu Lin
  • Publication number: 20140055603
    Abstract: Disclosed is an automatic optical inspection device. The automatic optical inspection device comprises a substrate support platform, a sensor fixed platform, an image sensor, and a backlight source. The automatic optical inspection device of the present invention is capable of inspecting defects in an interior of a substrate for solving the technical problem that the conventional automatic optical inspection device fails to inspect the defects in the interior of the substrate.
    Type: Application
    Filed: September 21, 2012
    Publication date: February 27, 2014
    Applicant: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
    Inventor: Yung-yu Lin
  • Publication number: 20140009602
    Abstract: A line-width measurement device and a measurement method using the same are disclosed. The line-width measurement device has a platform, an image capturing device and a color-mixing light source device. The image capturing device captures an image of a pattern under measurement in a measurement area of the platform. The color-mixing light source device correspondingly provides illumination to the measurement area. The color-mixing light source device has a plurality of monochromatic light sources and adjusts the brightness scale of each monochromatic light source according to the matching rate of the pattern under measurement and a standard pattern to provide suitable color-mixed lights for illumination. Therefore, the present invention can provide a better measurement environment to further enhance accuracy of line-width measurement.
    Type: Application
    Filed: July 19, 2012
    Publication date: January 9, 2014
    Applicant: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
    Inventors: Yung-yu Lin, Qingping Wang
  • Patent number: 8466594
    Abstract: A motor stator includes a body member having multiple wire-winding grooves that is formed of a stack of silicon steel plates and defines axially a middle section and two end sections, the wire-dinging grooves in the end sections being greater than in the middle section, two wire racks each having foot tubes respectively inserted into the end sections of the body member in the wire-winding grooves beyond the middle section, the foot tubes having an inner diameter not less than the part of the wire-winding grooves corresponding to the middle section, and insulation sheets having a length greater than the height of the middle section of the body member and being respectively set in the wire-winding grooves and the corresponding foot tubes.
    Type: Grant
    Filed: February 14, 2012
    Date of Patent: June 18, 2013
    Assignee: Lidashi Industry Co., Ltd.
    Inventor: Yung-Yu Lin
  • Patent number: 8462960
    Abstract: A signal processing system and related method are disclosed. The signal processing system includes a signal processing module, powered by a low supply voltage, for processing signals; and an interface module, coupled to the signal processing module, powered by a high supply voltage, for outputting signals generated from the signal processing module; wherein the interface module comprises a plurality of high-voltage functional blocks integrated therein, and each of the functional blocks is configured to perform a predetermined interface functionality. In this way, the bill-of-material (BOM) cost can be reduced.
    Type: Grant
    Filed: May 28, 2008
    Date of Patent: June 11, 2013
    Assignee: Mediatek Inc.
    Inventors: Sheng-Jui Huang, Yung-Yu Lin, Jen-Che Tsai, Tzueng-Yau Lin, Yau-Wai Wong, Chih-Horng Weng, Chi-Hui Wang
  • Publication number: 20130140936
    Abstract: A motor stator includes a body member having multiple wire-winding grooves that is formed of a stack of silicon steel plates and defines axially a middle section and two end sections, the wire-dinging grooves in the end sections being greater than in the middle section, two wire racks each having foot tubes respectively inserted into the end sections of the body member in the wire-winding grooves beyond the middle section, the foot tubes having an inner diameter not less than the part of the wire-winding grooves corresponding to the middle section, and insulation sheets having a length greater than the height of the middle section of the body member and being respectively set in the wire-winding grooves and the corresponding foot tubes.
    Type: Application
    Filed: February 14, 2012
    Publication date: June 6, 2013
    Inventor: Yung-Yu LIN
  • Publication number: 20120113246
    Abstract: The present invention discloses a line-width inspection device. The line-width inspection device has a platform, an image capturing device, a main light source device and at least one compensation light source device. The image capturing device is mounted above the platform, aligned with an inspection area of the platform and captures images of a pattern under inspection in the inspection area. The main light source device is disposed above the platform and correspondingly provides forward illumination to the inspection area, and an incident direction thereof is perpendicular to the platform. The at least one compensation light source device is mounted above the platform and provides compensation illumination to the inspection area. The additional compensation light source device can prevent edges of the pattern under inspection from occurring shadows and affecting image capturing, so as to enhance precision of image capturing.
    Type: Application
    Filed: November 26, 2010
    Publication date: May 10, 2012
    Applicant: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
    Inventors: Chengming He, Yung-yu Lin