Patents by Inventor Yung-Yu Lin
Yung-Yu Lin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240099005Abstract: Memory devices and methods of forming the same are provided. A memory device of the present disclosure includes a bottom dielectric layer, a gate structure extending vertically from the bottom dielectric layer, a stack structure, and a dielectric layer extending between the gate structure and the stack structure. The stack structure includes a first silicide layer, a second silicide layer, an oxide layer extending bet ween the first and second silicide layers, a channel region over the oxide layer and extending between the first and second silicide layers, and an isolation layer over the second silicide layer. The first and second silicide layers include cobalt, titanium, tungsten, or palladium.Type: ApplicationFiled: November 30, 2023Publication date: March 21, 2024Inventors: Sheng-Chih Lai, Chung-Te Lin, Yung-Yu Chen
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Patent number: 11934027Abstract: An optical system affixed to an electronic apparatus is provided, including a first optical module, a second optical module, and a third optical module. The first optical module is configured to adjust the moving direction of a first light from a first moving direction to a second moving direction, wherein the first moving direction is not parallel to the second moving direction. The second optical module is configured to receive the first light moving in the second moving direction. The first light reaches the third optical module via the first optical module and the second optical module in sequence. The third optical module includes a first photoelectric converter configured to transform the first light into a first image signal.Type: GrantFiled: June 21, 2022Date of Patent: March 19, 2024Assignee: TDK TAIWAN CORP.Inventors: Chao-Chang Hu, Chih-Wei Weng, Chia-Che Wu, Chien-Yu Kao, Hsiao-Hsin Hu, He-Ling Chang, Chao-Hsi Wang, Chen-Hsien Fan, Che-Wei Chang, Mao-Gen Jian, Sung-Mao Tsai, Wei-Jhe Shen, Yung-Ping Yang, Sin-Hong Lin, Tzu-Yu Chang, Sin-Jhong Song, Shang-Yu Hsu, Meng-Ting Lin, Shih-Wei Hung, Yu-Huai Liao, Mao-Kuo Hsu, Hsueh-Ju Lu, Ching-Chieh Huang, Chih-Wen Chiang, Yu-Chiao Lo, Ying-Jen Wang, Shu-Shan Chen, Che-Hsiang Chiu
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Publication number: 20220275205Abstract: A polyimide resin composition, a polyimide resin adhesive layer, a laminate, and a manufacturing method of an electronic component are provided. The polyimide resin composition includes a polyimide resin. The polyimide resin is obtained by the polymerization reaction of a diamine (A) and a tetracarboxylic dianhydride (B). The diamine (A) includes a diamine (A-1) represented by following Formula (I-1) and a diamine (A-2) represented by following Formula (I-2). A molar ratio ((A-1):(A-2)) of the diamine (A-1) to the diamine (A-2) is 0.1:0.2 to 0.6.Type: ApplicationFiled: June 21, 2021Publication date: September 1, 2022Applicant: eChem Solutions Corp.Inventors: Yung-Yu Lin, Chi-Yu Lai, Che-Wei Chang
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Patent number: 11211840Abstract: A winding structure of motor stator includes a stator core, two insulation members, an upper cap, a lower cap, and a coil. The two insulation members are disposed on two winding grooves of the stator core respectively. The upper cap and the lower cap are disposed on a top end and a bottom end of the stator core respectively. The coil is wound on the upper cap, the two insulation members, and the lower cap. Stopping pieces facing each other are formed on two sides of each of the upper cap and the lower cap. Each of the stopping pieces is separated from the coil without contact.Type: GrantFiled: April 14, 2020Date of Patent: December 28, 2021Assignee: LIDASHI INDUSTRY CO., LTD.Inventors: Yung-Yu Lin, Ching-Hui Hsu, Jui-Yang Hsu
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Publication number: 20210320538Abstract: A winding structure of motor stator includes a stator core, two insulation members, an upper cap, a lower cap, and a coil. The two insulation members are disposed on two winding grooves of the stator core respectively. The upper cap and the lower cap are disposed on a top end and a bottom end of the stator core respectively. The coil is wound on the upper cap, the two insulation members, and the lower cap. Stopping pieces facing each other are formed on two sides of each of the upper cap and the lower cap. Each of the stopping pieces is separated from the coil without contact.Type: ApplicationFiled: April 14, 2020Publication date: October 14, 2021Inventors: Yung-Yu LIN, Ching-Hui HSU, Jui-Yang HSU
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Publication number: 20210223699Abstract: A method of removing a photoresist, a laminate, a method of forming a metallic pattern, a polyimide resin, and a stripper are provided. The method of removing the photoresist includes forming a release layer on a substrate, the release layer having a first surface and a second surface opposite to each other, wherein the first surface of the release layer is in contact with the substrate; forming a photoresist layer on the second surface of the release layer; and removing the release layer and the photoresist layer. The release layer is formed by a polyimide resin. The polyimide resin is obtained by performing a polymerization of tetracarboxylic dianhydrides, diamines, and phenolamines. The diamines include hydroxyfluorinated diamines, benzoic acid diamines, and aminotetramethyldisiloxanes.Type: ApplicationFiled: January 5, 2021Publication date: July 22, 2021Applicant: eChem Solutions Corp.Inventors: Tz-Jin Yang, Yung-Yu Lin, Chi-Yu Lai, Ming-Che Chung, Che-Wei Chang
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Publication number: 20150209812Abstract: The present invention provides a device and method for repairing a pattern on an array substrate, said device comprising: an illuminating unit, for illuminating a mask after the mask is disposed above a substrate so as to expose a layer on the substrate that is to be etched to light to form an exposed pattern on that layer; a checking unit, for checking the exposed pattern on the layer to be etched for determining whether a coating defect is occurred in the exposed pattern; and a coating unit, for coating a protection layer at where the coating defect is located when the coating defect is determined to be existed in the exposed pattern. The present invention not only has high efficiency, but also low cost.Type: ApplicationFiled: September 3, 2012Publication date: July 30, 2015Applicant: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.Inventor: Yung-yu Lin
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Patent number: 9074886Abstract: A line-width measurement device and a measurement method using the same are disclosed. The line-width measurement device has a platform, an image capturing device and a color-mixing light source device. The image capturing device captures an image of a pattern under measurement in a measurement area of the platform. The color-mixing light source device correspondingly provides illumination to the measurement area. The color-mixing light source device has a plurality of monochromatic light sources and adjusts the brightness scale of each monochromatic light source according to the matching rate of the pattern under measurement and a standard pattern to provide suitable color-mixed lights for illumination. Therefore, the present invention can provide a better measurement environment to further enhance accuracy of line-width measurement.Type: GrantFiled: July 19, 2012Date of Patent: July 7, 2015Assignee: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.Inventors: Yung-yu Lin, Qingping Wang
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Patent number: 8994936Abstract: The present invention discloses a pattern matching method, which is used in measurement process for line width measuring machine, comprising: reading a standard pattern used for matching on the at least one predetermined position of a measured sample; respectively comparing each standard pattern of the measured sample with prestored multiple designed original images corresponding to the standard pattern; determining that the pattern matching is successful if the standard pattern on the measured sample successfully compares with at least one designed original image, and proceeding with the subsequent line width measurement process; otherwise, determining that the pattern matching is failed. The present invention also discloses a corresponding pattern matching method and a line width measuring machine. According to the embodiment of the present invention, it can improve the accuracy and the success rate of the pattern matching when measuring the line width.Type: GrantFiled: November 27, 2012Date of Patent: March 31, 2015Assignee: Shenzhen China Star Optoelectronics Technology Co., LtdInventor: Yung-Yu Lin
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Patent number: 8908170Abstract: The present invention provides a method for detecting a defect of a display panel and related defect detecting device. The method includes: utilizing lights having different colors to illuminate the display panel; obtaining a plurality of corresponding grey-scale diagrams when the lights illuminate the display panel; and determining whether the display panel has a defect. If the grey-scale diagrams indicate a grey-scale difference, determining that the display panel has a defect. In this way, the present invention is able to raise defect detecting ability for the display panel and prevent from missing the defects.Type: GrantFiled: January 4, 2013Date of Patent: December 9, 2014Assignee: Shenzhen China Star Optoelectronics Technology Co., Ltd.Inventor: Yung-Yu Lin
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Patent number: 8836936Abstract: The present invention discloses an inspecting device for detecting whether there is an appearance of debris on a surface of a glass substrate, including a laser unit, a platform, and an image sensor unit. The surface of the platform is coated with a light-absorbing material so as to absorb laser beams penetrating through the glass substrate to prevent the image sensor unit from receiving the reflected laser beam from the underside of the glass substrate. Besides, the present invention discloses an inspecting apparatus for detecting whether there is an appearance of debris on a surface of a glass substrate, using the inspecting device given above, and a method for conducting inspection. The inspecting device features a simplified configuration; the method is easy to operate; and the device can effectively prevent the background interference from the underside of glass substrates when determining whether there is an appearance of debris on top surfaces of glass substrates.Type: GrantFiled: February 19, 2013Date of Patent: September 16, 2014Assignee: Shenzhen China Star Optoelectronics Technology Co., LtdInventor: Yung-Yu Lin
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Publication number: 20140218725Abstract: The present invention discloses an inspecting device for detecting whether there is an appearance of debris on a surface of a glass substrate, including a laser unit, a platform, and an image sensor unit. The suface of the platform is coated with a light-absorbing material so as to absorb laser beams penetrating through the glass substrate to prevent the image sensor unit from receiving the reflected laser beam from the underside of the glass substrate. Besides, the present invention discloses an inspecting apparatus for detecting whether there is an appearance of debris on a surface of a glass substrate, using the inspecting device given above, and a method for conducting inspection. The inspecting device features a simplified configuration; the method is easy to operate; and the device can effectively prevent the backgrotmd interference from the underside of glass substrates when determining whether there is an appearance of debris on top surfaces of glass substrates.Type: ApplicationFiled: February 19, 2013Publication date: August 7, 2014Applicant: Shenzhen China Star Optoelectronics Technology Co., Ltd.Inventor: Yung-yu Lin
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Publication number: 20140185048Abstract: The present invention provides a method for detecting a defect of a display panel and related defect detecting device. The method includes: utilizing lights having different colors to illuminate the display panel; obtaining a plurality of corresponding grey-scale diagrams when the lights illuminate the display panel; and determining whether the display panel has a defect. If the grey-scale diagrams indicate a grey-scale difference, determining that the display panel has a defect. In this way, the present invention is able to raise defect detecting ability for the display panel and prevent from missing the defects.Type: ApplicationFiled: January 4, 2013Publication date: July 3, 2014Applicant: Shenzhen China Star Optoelectronics Technology Co. Ltd.Inventor: Yung-Yu Lin
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Patent number: 8737936Abstract: An amplitude modulation circuit in a polar transmitter includes a digital-to-analog converter (DAC), a filter, a gm stage, and a calibration module. The DAC is arranged to be coupled to an amplitude modulation signal input in a normal mode. The filter is coupled to the DAC, and the gm stage is coupled to the filter. The calibration module has an input coupled to the gm stage, and an output coupled to a node on a path between the DAC and the gm stage. A method for calibrating an amplitude offset in the polar transmitter includes: generating an amplitude offset calibration signal according to an amplitude modulation signal generated from the gm stage; and transmitting the amplitude offset calibration signal via the output of the calibration module to a node on a path between the DAC and the gm stage so as to calibrate the amplitude offset.Type: GrantFiled: October 23, 2011Date of Patent: May 27, 2014Assignee: Mediatek Inc.Inventors: Hsin-Hung Chen, Hsiang-Hui Chang, Chun-Pang Wu, Yung-Yu Lin, Jong-Woei Chen
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Publication number: 20140139828Abstract: The present invention discloses a pattern matching method, which is used in measurement process for line width measuring machine, comprising: reading a standard pattern used for matching on the at least one predetermined position of a measured sample; respectively comparing each standard pattern of the measured sample with prestored multiple designed original images corresponding to the standard pattern; determining that the pattern matching is successful if the standard pattern on the measured sample successfully compares with at least one designed original image, and proceeding with the subsequent line width measurement process; otherwise, determining that the pattern matching is failed. The present invention also discloses a corresponding pattern matching method and a line width measuring machine. According to the embodiment of the present invention, it can improve the accuracy and the success rate of the pattern matching when measuring the line width.Type: ApplicationFiled: November 27, 2012Publication date: May 22, 2014Inventor: Yung-Yu Lin
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Publication number: 20140132760Abstract: The present invention provides an apparatus for measuring line width, for capturing an image of a pattern to be measured. The apparatus for measuring line width includes at least: a first backlight source and a second backlight source, the first backlight source and the second backlight source being disposed respectively under the pattern to be measured and projecting backlight onto the pattern to be measured; an image capturing device, disposed above the pattern to be measured for capturing the image of the pattern. As such, the present invention effectively avoids causing shadows and improves the precision of image capturing of the image capturing device, as well as reduces the number of required light sources to reduce the cost of modification and maintenance of the apparatus for measuring line width.Type: ApplicationFiled: November 27, 2012Publication date: May 15, 2014Applicant: Shenzhen China Star Optoelectronics Technology Co., Ltd.Inventor: Yung-Yu Lin
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Publication number: 20140055603Abstract: Disclosed is an automatic optical inspection device. The automatic optical inspection device comprises a substrate support platform, a sensor fixed platform, an image sensor, and a backlight source. The automatic optical inspection device of the present invention is capable of inspecting defects in an interior of a substrate for solving the technical problem that the conventional automatic optical inspection device fails to inspect the defects in the interior of the substrate.Type: ApplicationFiled: September 21, 2012Publication date: February 27, 2014Applicant: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.Inventor: Yung-yu Lin
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Publication number: 20140009602Abstract: A line-width measurement device and a measurement method using the same are disclosed. The line-width measurement device has a platform, an image capturing device and a color-mixing light source device. The image capturing device captures an image of a pattern under measurement in a measurement area of the platform. The color-mixing light source device correspondingly provides illumination to the measurement area. The color-mixing light source device has a plurality of monochromatic light sources and adjusts the brightness scale of each monochromatic light source according to the matching rate of the pattern under measurement and a standard pattern to provide suitable color-mixed lights for illumination. Therefore, the present invention can provide a better measurement environment to further enhance accuracy of line-width measurement.Type: ApplicationFiled: July 19, 2012Publication date: January 9, 2014Applicant: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.Inventors: Yung-yu Lin, Qingping Wang
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Patent number: 8466594Abstract: A motor stator includes a body member having multiple wire-winding grooves that is formed of a stack of silicon steel plates and defines axially a middle section and two end sections, the wire-dinging grooves in the end sections being greater than in the middle section, two wire racks each having foot tubes respectively inserted into the end sections of the body member in the wire-winding grooves beyond the middle section, the foot tubes having an inner diameter not less than the part of the wire-winding grooves corresponding to the middle section, and insulation sheets having a length greater than the height of the middle section of the body member and being respectively set in the wire-winding grooves and the corresponding foot tubes.Type: GrantFiled: February 14, 2012Date of Patent: June 18, 2013Assignee: Lidashi Industry Co., Ltd.Inventor: Yung-Yu Lin
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Patent number: 8462960Abstract: A signal processing system and related method are disclosed. The signal processing system includes a signal processing module, powered by a low supply voltage, for processing signals; and an interface module, coupled to the signal processing module, powered by a high supply voltage, for outputting signals generated from the signal processing module; wherein the interface module comprises a plurality of high-voltage functional blocks integrated therein, and each of the functional blocks is configured to perform a predetermined interface functionality. In this way, the bill-of-material (BOM) cost can be reduced.Type: GrantFiled: May 28, 2008Date of Patent: June 11, 2013Assignee: Mediatek Inc.Inventors: Sheng-Jui Huang, Yung-Yu Lin, Jen-Che Tsai, Tzueng-Yau Lin, Yau-Wai Wong, Chih-Horng Weng, Chi-Hui Wang