Abstract: It makes it easier to reduce the line capacitance of vertical signal lines in a solid-state image sensor in which signals are output via the vertical signal lines. The solid-state image sensor is provided with a logic circuit, a pixel circuit, and a negative capacitance circuit. In the solid-state image sensor, the logic circuit processes an analog signal. Also, in the solid-state image sensor, the pixel circuit generates an analog signal by photoelectric conversion, and outputs the analog signal to the logic circuit via a predetermined signal line. In the solid-state image sensor, the negative capacitance circuit is connected to the predetermined signal line.

Abstract: An imaging element comprises a photoelectric conversion unit formed in a pixel region and configured to convert light into electrical charge. Further, the imaging element includes a transistor formed in the pixel region and configured to transfer electric charge from the photoelectric conversion unit. The photoelectric conversion unit of the imaging element may be connected to a well of the pixel region, where the well of the pixel region has a negative potential.

Abstract: A bridge device (120-1) which can effectively reduce the waste of the band resource in the upstream bus connected to a management device is realized by including: a first input/output port (221); a second input/output port (222); a group information keeping unit (228) to keep a group identifier and a correspondence between one or more terminal devices and the group identifier, the group identifier identifying a group that includes one or more terminal devices to be connected to the second input/output port (222), the one or more terminal devices belonging to the group; an extended-request processing unit (224) to generate, when an extended-request frame including destination information corresponding to the group identifier for requesting state information of the one or more terminal devices belonging to the group is inputted to the first input/output port (221), a request frame to be outputted from the second input/output port (222) to each of the one or more terminal devices belonging to the group, on the b

Abstract: An imaging element comprises a photoelectric conversion unit formed in a pixel region and configured to convert light into electrical charge. Further, the imaging element includes a transistor formed in the pixel region and configured to transfer electric charge from the photoelectric conversion unit. The photoelectric conversion unit of the imaging element may be connected to a well of the pixel region, where the well of the pixel region has a negative potential.

Abstract: There is provided an imaging device that includes a pixel, the pixel comprising: a photodetector; a control transistor; a capacitor coupled to the photodetector; a reset transistor coupled between the control transistor and the capacitor; an amplifier transistor having a gate terminal coupled to the capacitor; and a select transistor coupled to the amplifier transistor; a first signal line coupled to the select transistor; and a first amplifying circuit including a first input terminal coupled to the first signal line and a second input terminal configured to receive a first reference signal and an output terminal coupled to the control transistor.

Abstract: The present disclosure relates to a solid-state imaging device, an AD converter, and an electronic apparatus that improve a crosstalk characteristic. The AD converter includes a comparator that compares the pixel signal with the reference signal, a pixel signal side capacitor, and a reference signal side capacitor. The pixel signal side capacitor and the reference signal side capacitor are formed such that a first parasitic capacity and a second parasitic capacity are substantially the same. The present technology is applicable to a CMOS image sensor, for example.

Abstract: To reduce fluctuations in image signals when the voltage of a negative power supply supplied to pixels changes. A pixel operates based on a first ground potential applied to a first ground line and outputs an analog image signal according to emitted light. An analog-digital converter operates based on a second ground potential applied to a second ground line, the second ground potential higher than the first ground potential, and converts the analog image signal into a digital image signal based on a reference voltage as a standard for the conversion. A reference voltage generation unit operates based on the second ground potential and generates the reference voltage. A reference voltage correction unit corrects the reference voltage generated according to a change in the first ground potential and supplies the reference voltage to the analog-digital converter.

Abstract: To reduce fluctuations in image signals when the voltage of a negative power supply supplied to pixels changes. A pixel operates based on a first ground potential applied to a first ground line and outputs an analog image signal according to emitted light. An analog-digital converter operates based on a second ground potential applied to a second ground line, the second ground potential higher than the first ground potential, and converts the analog image signal into a digital image signal based on a reference voltage as a standard for the conversion. A reference voltage generation unit operates based on the second ground potential and generates the reference voltage. A reference voltage correction unit corrects the reference voltage generated according to a change in the first ground potential and supplies the reference voltage to the analog-digital converter.

Abstract: The present disclosure relates to a solid-state imaging device, an AD converter, and an electronic apparatus that improve a crosstalk characteristic. The AD converter includes a comparator that compares the pixel signal with the reference signal, a pixel signal side capacitor, and a reference signal side capacitor. The pixel signal side capacitor and the reference signal side capacitor are formed such that a first parasitic capacity, and a second parasitic capacity are substantially the same. The present technology is applicable to a CMOS image sensor, for example.

Abstract: An imaging element comprises a photoelectric conversion unit formed in a pixel region and configured to convert light into electrical charge. Further, the imaging element includes a transistor formed in the pixel region and configured to transfer electric charge from the photoelectric conversion unit. The photoelectric conversion unit of the imaging element may be connected to a well of the pixel region, where the well of the pixel region has a negative potential.

Abstract: The present disclosure relates to a solid-state imaging device, an AD converter, and an electronic apparatus that improve a crosstalk characteristic. The AD converter includes a comparator that compares the pixel signal with the reference signal, a pixel signal side capacitor, and a reference signal side capacitor. The pixel signal side capacitor and the reference signal side capacitor are formed such that a first parasitic capacity, and a second parasitic capacity are substantially the same. The present technology is applicable to a CMOS image sensor, for example.

Abstract: An imaging element comprises a photoelectric conversion unit formed in a pixel region and configured to convert light into electrical charge. Further, the imaging element includes a transistor formed in the pixel region and configured to transfer electric charge from the photoelectric conversion unit. The photoelectric conversion unit of the imaging element may be connected to a well of the pixel region, where the well of the pixel region has a negative potential.

Abstract: The present disclosure relates to a solid-state image-capturing element and electronic device capable of improving the linearity of illuminance values. The dynamic-range expander 118 expands dynamic range of a pixel value for each pixel based on the pixel value having different exposure times of a plurality of pixels. The integrator 119 integrates pixel values having the dynamic range expanded by the dynamic-range expander 118 and generates an illuminance value. The present disclosure is applicable to complementary metal-oxide semiconductor (CMOS) image sensor or the like used in, for example, an illuminometer.

Abstract: A sealant applying apparatus includes a fastener rotating unit which supports a fastener to be rotatable around a central axis, and a sealant discharging unit which applies a sealant to the fastener by discharging the sealant. The fastener rotating unit includes a first holding member and a second holding member which hold the fastener to be rotatable, and a base which supports the first and second holding members. The first holding member is installed to the base to be exchangeable.

Abstract: To reduce fluctuations in image signals when the voltage of a negative power supply supplied to pixels changes. A pixel operates based on a first ground potential applied to a first ground line and outputs an analog image signal according to emitted light. An analog-digital converter operates based on a second ground potential applied to a second ground line, the second ground potential higher than the first ground potential, and converts the analog image signal into a digital image signal based on a reference voltage as a standard for the conversion. A reference voltage generation unit operates based on the second ground potential and generates the reference voltage. A reference voltage correction unit corrects the reference voltage generated according to a change in the first ground potential and supplies the reference voltage to the analog-digital converter.

Abstract: To reduce fluctuations in image signals when the voltage of a negative power supply supplied to pixels changes. A pixel operates based on a first ground potential applied to a first ground line and outputs an analog image signal according to emitted light. An analog-digital converter operates based on a second ground potential applied to a second ground line, the second ground potential higher than the first ground potential, and converts the analog image signal into a digital image signal based on a reference voltage as a standard for the conversion. A reference voltage generation unit operates based on the second ground potential and generates the reference voltage. A reference voltage correction unit corrects the reference voltage generated according to a change in the first ground potential and supplies the reference voltage to the analog-digital converter.

Abstract: A fastener applying apparatus includes: an insertion mechanism for inserting a fastener into a fastener hole in an object to be fastened; a support mechanism for supporting the insertion mechanism; and a fastener conveying device for conveying the fastener to the insertion mechanism. The insertion mechanism includes a holding portion for holding a shank portion of the fastener. The fastener conveying device includes a gripping portion for gripping the fastener in a axial direction of the fastener.

Abstract: The present disclosure relates to a solid-state imaging device, an AD converter, and an electronic apparatus that improve a crosstalk characteristic. The AD converter includes a comparator that compares the pixel signal with the reference signal, a pixel signal side capacitor, and a reference signal side capacitor. The pixel signal side capacitor and the reference signal side capacitor are formed such that a first parasitic capacity, and a second parasitic capacity are substantially the same. The present technology is applicable to a CMOS image sensor, for example.

Abstract: An imaging element comprises a photoelectric conversion unit formed in a pixel region and configured to convert light into electrical charge. Further, the imaging element includes a transistor formed in the pixel region and configured to transfer electric charge from the photoelectric conversion unit. The photoelectric conversion unit of the imaging element may be connected to a well of the pixel region, where the well of the pixel region has a negative potential.

Abstract: A case, in which an inner bottom surface is formed, and a chuck tool in which a lower surface is formed are provided. The inner bottom surface is a concave surface. The lower surface is a concave surface. An elongated member chucking apparatus changes an orientation of an elongated member inside the case to a predetermined orientation with respect to the chuck tool by sandwiching the elongated member between the inner bottom surface and the lower surface. The elongated member is held by the chuck tool in the predetermined orientation.