Patents by Inventor Yutaka Kato

Yutaka Kato has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220390925
    Abstract: The present invention can detect early an abnormality or signs of abnormality in a workpiece. A sensor system 1 is provided with: a first sensor 30a that measures a workpiece; a second sensor 30b that measures the workpiece in a relatively longer cycle than the first sensor 30a; and a master unit 10. The master unit 10 includes: an acquisition unit 11 that acquires data measured by the first sensor 30a and data measured by the second sensor 30b; and a generation unit 12 that generates learning data which is used for machine learning of a learning model and in which the acquired data of the first sensor 30a is regarded as input data and the acquired data of the second sensor 30b is regarded as label data indicating a property of the input data.
    Type: Application
    Filed: December 1, 2020
    Publication date: December 8, 2022
    Applicant: OMRON Corporation
    Inventors: Yusuke IIDA, Norihiro TOMAGO, Kohei TANISUE, Yutaka KATO, Masanori TAKAHASHI
  • Publication number: 20220248675
    Abstract: In production of crops of agriculture and horticulture or the like, damage caused by diseases is still large, and, due to factors such as occurrence of resistant diseases to existing drugs, development of new agrohorticultural fungicides is desired. The present invention provides an agrohorticultural fungicide and a method of use thereof, an active ingredient thereof being a compound represented by the general formula (I) or salts thereof: {wherein R1 denotes a hydrogen atom or (C1-C6)alkyl group or the like. R2 denotes a hydrogen atom or the like. R3 denotes a hydrogen atom or (C1-C6)alkyl group or the like. R4 denotes a (C1-C6)alkyl group, (C3-C6)cycloalkyl group or aryl group or the like. X1 and X2 denote a hydrogen atom or halogen atom or the like. Y denotes an oxygen atom.}.
    Type: Application
    Filed: June 19, 2020
    Publication date: August 11, 2022
    Inventors: Naoya FUJITA, Yutaka KATO
  • Publication number: 20220199786
    Abstract: Provided is a highly reliable semiconductor device in which an influence on device characteristics can be reduced while improving a high temperature and high humidity bias resistance of a termination structure (termination region) of a chip by a relatively simple method. The semiconductor device includes an active region disposed on a main surface of a semiconductor substrate, and a termination region disposed on the main surface so as to surround the active region. The termination region includes an interlayer insulating film formed on the main surface of the semiconductor substrate, and an organic protective film formed so as to cover the interlayer insulating film. An insulating film having a thickness of 100 nm or less and containing nitrogen is provided between the interlayer insulating film and the organic protective film.
    Type: Application
    Filed: November 22, 2021
    Publication date: June 23, 2022
    Applicant: Hitachi Power Semiconductor Device, Ltd.
    Inventors: Shigeo Tokumitsu, Masaki Shiraishi, Yutaka Kato, Tetsuo Oda
  • Patent number: 11368603
    Abstract: Provided is an image processing device which has: an image input part configured to input a multi-spectral image which includes N (N is an integer of 4 or more) channels corresponding to N bands; a reference vector setting part configured to cause a user to set, as three reference vectors, three types of N-dimensional vectors having sensitivities of the respective N bands as elements; and a conversion part configured to convert the multi-spectral image into a 3-channel image including three channels by decomposing a spectral distribution of each pixel of the multi-spectral image on the basis of the three reference vectors.
    Type: Grant
    Filed: May 22, 2019
    Date of Patent: June 21, 2022
    Assignee: OMRON Corporation
    Inventor: Yutaka Kato
  • Publication number: 20220146716
    Abstract: An optical unit included in an image sensor includes an optical system including at least a liquid lens, a first plastic lens located on an object side of the liquid lens, and a second plastic lens located on an image side of the liquid lens, an electrode to apply a voltage to the liquid lens, and a temperature sensor located near the liquid lens. A controller controls the voltage to be applied from the electrode to the liquid lens in accordance with a temperature measured by the temperature sensor.
    Type: Application
    Filed: February 25, 2020
    Publication date: May 12, 2022
    Inventors: Yasuhito UETSUJI, Kosuke WATANABE, Yutaka KATO
  • Patent number: 11324219
    Abstract: An amide compound represented by the general formula [I]: or a salt thereof, an agricultural and horticultural microbicide comprising the compound or the salt as an active ingredient, and a method for using the agricultural and horticultural microbicide.
    Type: Grant
    Filed: March 1, 2019
    Date of Patent: May 10, 2022
    Assignee: Nihon Nohyaku Co., Ltd.
    Inventors: Keiichi Yamada, Yutaka Abe, Yutaka Kato, Ayuko Nakauchi, Yuki Saito, Shunsuke Fuchi
  • Patent number: 11330148
    Abstract: Provided is an image processing device which has: an image input part configured to input a multi-spectral image which includes N (N is an integer of 4 or more) channels corresponding to N bands; a reference vector setting part configured to cause a user to set, as three reference vectors, three types of N-dimensional vectors having sensitivities of the respective N bands as elements; and a conversion part configured to convert the multi-spectral image into a 3-channel image including three channels by decomposing a spectral distribution of each pixel of the multi-spectral image on the basis of the three reference vectors.
    Type: Grant
    Filed: May 22, 2019
    Date of Patent: May 10, 2022
    Assignee: OMRON Corporation
    Inventor: Yutaka Kato
  • Patent number: 11303821
    Abstract: An illumination device includes illumination units for irradiating light on an object and a substrate member, which is an example of a holding mechanism for detachably holding the illumination units according to a predetermined disposition rule. The substrate member has a connection part for electrically connecting with a controller. The substrate member holds a part of the illumination units by linking parts.
    Type: Grant
    Filed: January 16, 2019
    Date of Patent: April 12, 2022
    Assignee: OMRON Corporation
    Inventors: Shingo Inazumi, Jaewook Hwang, Yutaka Kato
  • Patent number: 11245842
    Abstract: To provide an appearance inspection system capable of reduce labor for setting an imaging condition by a designer when a plurality of inspection target positions on a target is sequentially imaged. An appearance inspection system includes an imaging condition decision part and a route decision part. The imaging condition decision part decides a plurality of imaging condition candidates including a relative position between a workpiece and an imaging device for at least one inspection target position among a plurality of inspection target positions. The route decision part decides a change route of an imaging condition for sequentially imaging the plurality of inspection target positions by selecting one imaging condition among the plurality of imaging condition candidates so that a pre-decided requirement is satisfied.
    Type: Grant
    Filed: January 18, 2019
    Date of Patent: February 8, 2022
    Assignee: OMRON Corporation
    Inventor: Yutaka Kato
  • Patent number: 11218642
    Abstract: The disclosure provides an appearance inspection system that can reduce subject blurring when an object is imaged while changing a relative position of an imaging device with respect to the object. A first control unit causes the imaging device to perform imaging when the imaging device reaches an imaging position corresponding to the inspection target position. A second control unit changes at least one of the position and the orientation of the imaging device in a direction in which a relative movement between a field of view of the imaging device and the inspection target position according to the change in the relative position along a designated path is canceled out during a predetermined period including a time point at which the imaging device reaches the imaging position.
    Type: Grant
    Filed: February 17, 2019
    Date of Patent: January 4, 2022
    Assignee: OMRON Corporation
    Inventor: Yutaka Kato
  • Publication number: 20210298299
    Abstract: An object of the present invention is to provide novel means and method for efficiently controlling a harmful organism that is difficult to control by treatment with a single agrochemical compound.
    Type: Application
    Filed: November 1, 2019
    Publication date: September 30, 2021
    Inventors: Yutaka Kato, Ryosuke Tanaka
  • Publication number: 20210281713
    Abstract: Provided is an image processing device which has: an image input part configured to input a multi-spectral image which includes N (N is an integer of 4 or more) channels corresponding to N bands; a reference vector setting part configured to cause a user to set, as three reference vectors, three types of N-dimensional vectors having sensitivities of the respective N bands as elements; and a conversion part configured to convert the multi-spectral image into a 3-channel image including three channels by decomposing a spectral distribution of each pixel of the multi-spectral image on the basis of the three reference vectors.
    Type: Application
    Filed: May 22, 2019
    Publication date: September 9, 2021
    Applicant: OMRON Corporation
    Inventor: Yutaka KATO
  • Patent number: 11084153
    Abstract: A stapler is configured to bind a workpiece using a staple made of a non-metal soft material. The staple has a crown portion and a pair of leg portions formed by bending both longitudinal ends of the crown portion toward one direction. The stapler includes a placing base, a penetrating part, an opening, and a pressing portion. The opening is provided on the placing base so that the one pair of cutting blades and the one pair of leg portions of the staple inserted into the workpiece pass through the opening. The pressing portion that is provided in the opening of the placing base and suppresses deformation of the workpiece caused by a force applied to the workpiece from the cutting blades when the cutting blades penetrate the workpiece.
    Type: Grant
    Filed: September 22, 2016
    Date of Patent: August 10, 2021
    Assignee: MAX CO., LTD.
    Inventors: Hiroaki Takahashi, Yutaka Kato
  • Patent number: 11080836
    Abstract: An appearance inspection system includes a setting part, a movement mechanism, and a control part. The setting part sets a route passing through a plurality of imaging positions in order. The setting part sets the route so that a first time necessary for the movement mechanism to move an imaging device from a first imaging position to a second imaging position among the plurality of imaging positions is longer than a second time necessary for a process of changing a first imaging condition corresponding to the first imaging position to a second imaging condition corresponding to the second imaging position by the control part. The control part starts the process of changing the first imaging condition to the second imaging condition earlier by the second time or more than a scheduled time at which the imaging device arrives at the second imaging position.
    Type: Grant
    Filed: January 18, 2019
    Date of Patent: August 3, 2021
    Assignee: OMRON Corporation
    Inventors: Yutaka Kato, Yasuhito Uetsuji
  • Patent number: 11080843
    Abstract: An image inspecting apparatus includes at least one image capturing part, a lighting part, a control part including a moving part, a searching part analyzing an image captured by the image capturing part under a first image capturing condition and searching for a defect candidate from an object under inspection, and a determining part. When the searching part finds the defect candidate from the object under inspection, the control part controls an image capturing condition such that a part where the defect candidate is found by the searching part is photographed under a second image capturing condition that is clearer than the first image capturing condition. The determining part analyzes an image captured by the image capturing part under the second image capturing condition and determines whether the defect of the object under inspection is present or absent.
    Type: Grant
    Filed: December 14, 2018
    Date of Patent: August 3, 2021
    Assignee: OMRON Corporation
    Inventors: Shingo Inazumi, Yutaka Kato
  • Patent number: 11022560
    Abstract: An image inspection device which can image an object with a plurality of cameras in a state in which the object is optimally illuminated and which can also be downsized is provided. The image inspection device includes a plurality of imaging parts that image the object, an illumination part that is disposed between the object and the plurality of imaging parts and radiates light toward the object and has a light-transmissive property, and a control part that controls the plurality of imaging parts and the illumination part. The illumination part includes a plurality of illumination elements which are arranged in a matrix and are allowed to be turned on independently. The control part controls the plurality of illumination elements to cause the illumination part to illuminate a region of the object corresponding to a field of view of the plurality of imaging parts.
    Type: Grant
    Filed: December 14, 2018
    Date of Patent: June 1, 2021
    Assignee: OMRON Corporation
    Inventor: Yutaka Kato
  • Patent number: 10984515
    Abstract: The disclosure provide an image inspection device and an illumination device. The image inspection device includes a photographing part; an illumination part including a light guide plate disposed at any position between the object and the photographing part; and a control part. The illumination part includes a first light emitting part and a second light emitting part disposed around the light guide plate; and a first reflective part and a second reflective part. The reflective parts are configured so that a light emitting surface of the light guide plate has an emission intensity distribution of a first pattern when the first light emitting part emits light under control of the control part, and the light emitting surface has an emission intensity distribution of a second pattern different from the first pattern when the second light emitting part emits light under control of the control part.
    Type: Grant
    Filed: October 17, 2018
    Date of Patent: April 20, 2021
    Assignee: OMRON Corporation
    Inventor: Yutaka Kato
  • Patent number: 10984516
    Abstract: Provided are an image inspection device and an illumination device capable of thinning and downsizing the illumination device. An image inspection device includes a photographing part photographing an object, a light transmissive illumination part, and an optical member. The illumination part is arranged between the object and the photographing part and has a light emitting surface arranged to face the object. The optical member is arranged on the light emitting surface of the illumination part and transmits light emitted by the illumination part toward the object. The optical member includes a plurality of optical regions. The optical regions are arranged so as to surround a central region of the light emitting surface centered on an optical axis of the photographing part, and are configured to emit light having mutually different color characteristics toward the object.
    Type: Grant
    Filed: October 17, 2018
    Date of Patent: April 20, 2021
    Assignee: OMRON Corporation
    Inventor: Yutaka Kato
  • Patent number: 10939024
    Abstract: An image processing system, an image processing device and an image processing method that can improve performance of an image measurement are provided. A control device controls a light emission portion in a manner that each of plural types of partial regions set on a light emission surface emits light, and controls a camera to image an object in synchronization with light emission of each of the plural types of partial regions. The control device performs an image measurement of the object based on reflection profile information which is generated based on a plurality of input images, and the reflection profile information shows a relationship between positions within the light emission surface and degrees of light reflected at attention sites of the object and incident to the camera with respect to light irradiated from the position to the object.
    Type: Grant
    Filed: February 14, 2019
    Date of Patent: March 2, 2021
    Assignee: OMRON Corporation
    Inventor: Yutaka Kato
  • Patent number: 10909672
    Abstract: An appearance inspection system enabling a route to be easily set when a target is imaged while causing a relative position of an imaging device with respect to the target to be different is provided. A decision part decides a plurality of relative position candidates of the imaging device with respect to the target at which focus of a lens module is possible on the inspection target position with regard to each of a plurality of the inspection target positions on the target. A selection part selects relative positions one by one from corresponding plurality of relative position candidates for each of the plurality of inspection target positions and selects a route candidate satisfying a preset requirement from a plurality of route candidates generated by sequentially connecting the plurality of selected relative positions as a designation route.
    Type: Grant
    Filed: January 16, 2019
    Date of Patent: February 2, 2021
    Assignee: OMRON Corporation
    Inventors: Shingo Inazumi, Yutaka Kato, Naoya Nakashita