Patents by Inventor Zhengang Chen

Zhengang Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11688467
    Abstract: Described herein are embodiments related to defect detection in memory components of memory systems with time-varying bit error rate. A processing device determines that a bit error rate (BER) corresponding to a read operation to read a unit of data in a memory component satisfies a threshold criterion, determines a write-to-read (W2R) delay for the read operation, wherein the W2R delay comprises a difference between a time of the read operation and a write timestamp indicating when the unit of data was written to the memory component, and determines whether the W2R delay is within a W2R delay range corresponding to an initial read voltage level used by the read operation to read the unit of data. The processing device initiates a defect detection operation responsive to the W2R delay being within the W2R delay range, the defect detection operation to detect time-varying defects in the memory component.
    Type: Grant
    Filed: June 14, 2021
    Date of Patent: June 27, 2023
    Assignee: Micron Technology, Inc.
    Inventors: Zhengang Chen, Sai Krishna Mylavarapu, Zhenlei Shen, Tingjun Xie, Charles S. Kwong
  • Publication number: 20230195381
    Abstract: Methods, systems, and devices for a corrective read of a memory device with reduced latency are described. A memory system may identify a read error based on accessing a memory device, and may select a trim setting for a performing a corrective read operation based on a data retention condition associated with the accessed memory device. Such a data retention condition may be associated with a data retention duration, or a cross-temperature condition, among other criteria or combinations thereof. In some implementations, the memory system may select from a subset of possible trim settings, which may be associated with relevant process corners. For example, the memory system may select between a first trim setting that is associated with a relatively large cross-temperature and a relatively short data retention duration and a second trim setting that is associated with a relatively small cross-temperature and a relatively long data retention duration.
    Type: Application
    Filed: December 22, 2021
    Publication date: June 22, 2023
    Inventors: Tao Liu, Zhengang Chen, Ting Luo
  • Patent number: 11632132
    Abstract: A processing device in a memory system receives a request to read data from a memory device. In response to receiving the request, the processing device performs an iterative error correction process on the data, wherein at least one iteration after a first iteration in the error correction process uses a criterion that is based at least partially on a previous iteration or partial iteration, and wherein performing the iterative error correction process comprises flipping any bits in the data having an associated number of unsatisfied parity check equations that satisfies a threshold criterion associated with the previous iteration.
    Type: Grant
    Filed: September 16, 2021
    Date of Patent: April 18, 2023
    Assignee: Micron Technology, Inc.
    Inventors: Eyal En Gad, Zhengang Chen, Sivagnanam Parthasarathy, Yoav Weinberg
  • Patent number: 11625299
    Abstract: Methods, systems, and devices for inserting temperature information into a codeword are described. A memory system may determine that a predetermined set of bits of a codeword has been received. Based on determining that the predetermine set of bits has been received, the memory system may replace bits of the codeword with temperature information that indicates a temperature of the memory system. The memory system may then store the codeword comprising the temperature information in a memory array.
    Type: Grant
    Filed: December 20, 2021
    Date of Patent: April 11, 2023
    Assignee: Micron Technology, Inc.
    Inventors: Stephen D. Hanna, Zhengang Chen
  • Patent number: 11615830
    Abstract: A media management operation can be performed at a memory sub-system at a current frequency. An operating characteristic associated with the memory sub-system can be identified. The operating characteristic can reflect at least one of a write count, a bit error rate, or a read-retry trigger rate. A determination can be made as to whether the identified operating characteristic satisfies an operating characteristic criterion. In response to determining that the operating characteristic satisfies the characteristic criterion, the media management operation can be performed at a different frequency relative to the current frequency.
    Type: Grant
    Filed: June 4, 2021
    Date of Patent: March 28, 2023
    Assignee: Micron Technology, Inc.
    Inventors: Tingjun Xie, Seungjune Jeon, Zhengang Chen, Zhenlei Shen, Charles See Yeung Kwong
  • Publication number: 20230086696
    Abstract: A plurality of codewords are programmed to one or more memory pages of a memory sub-system. Each memory page of the memory sub-system is associated with a logical unit of a plurality of logical units of the memory sub-system and at least one of a plane of a plurality of planes of the memory sub-system or a block of a plurality of blocks of the memory sub-system. Each codeword of the plurality of codewords comprises host data and base parity bits. A plurality of additional parity bits are programmed to the one or more memory pages of the memory sub-system, wherein each additional parity bit of the plurality of additional parity bits is associated with a codeword of the plurality of standard codewords. A first set of redundancy metadata is generated corresponding to each of the additional parity bits. The first set of redundancy metadata is programmed to a memory page separate from any memory page storing the additional parity bits.
    Type: Application
    Filed: September 17, 2021
    Publication date: March 23, 2023
    Inventors: Zhengang Chen, Sivagnanam Parthasarathy
  • Publication number: 20230082008
    Abstract: A method that includes writing a plurality of codewords to a plurality of memory blocks of a memory device, where each of the plurality of codewords has a physical codeword index corresponding to a respective memory block in which each codeword is written, and assigning a virtual codeword index to each of the plurality of codewords to provide a plurality of virtual codeword indices, where assigning the virtual codeword index to each of the plurality of codewords is based, at least in part, on a location in a virtual block among a plurality of virtual blocks of memory cells corresponding to the physical codeword index of each codeword among the plurality of codewords.
    Type: Application
    Filed: November 21, 2022
    Publication date: March 16, 2023
    Inventors: Xiangang Luo, Zhengang Chen
  • Publication number: 20230052044
    Abstract: Methods, systems, and devices for a dynamic error control configuration for memory systems are described. The memory system may receive a read command and retrieve a set of data from a location of the memory system based on the read command. The memory system may perform a first type of error control operation on the set of data to determine whether the set of data includes one or more errors. If the set of data includes the one or more errors, the memory system may retrieve a second set of data from the location of the memory system and determine whether a syndrome weight satisfies a threshold. The memory system may perform a second type of error control operation on the second set of data based on determining that the syndrome weight satisfies the threshold.
    Type: Application
    Filed: January 25, 2022
    Publication date: February 16, 2023
    Inventors: Deping He, Zhengang Chen
  • Patent number: 11579809
    Abstract: A method described herein involves identifying a first time associated with a read operation that retrieves data of a write unit at a memory sub-system, identifying a second time associated with a write operation that stored the data of the write unit at the memory sub-system, and performing a refresh operation for the data of the write unit at the memory sub-system based on a difference between the first time associated with the read operation and the second time associated with the write operation.
    Type: Grant
    Filed: May 27, 2021
    Date of Patent: February 14, 2023
    Assignee: Micron Technology, Inc.
    Inventors: Tingjun Xie, Zhengang Chen
  • Patent number: 11561734
    Abstract: A system includes a memory component; and a processing device, operatively coupled with the memory component. The processing device is to perform operations including receiving a read request with respect to data stored at a physical address of the memory component; determining whether an indicator of the physical address is stored in a write transaction catalog; in response to determining that the physical address is stored in the write transaction catalog, determining a time difference between when the read request was received and when the data was written; reading the data stored at the physical address using a first read voltage level in response to determining that the time difference is less than a threshold criterion; and reading the data stored at the physical address using a second read voltage level in response to determining that the time difference is equal to or greater than the threshold criterion.
    Type: Grant
    Filed: May 27, 2021
    Date of Patent: January 24, 2023
    Assignee: MICRON TECHNOLOGY, INC.
    Inventors: Zhengang Chen, Tingjun Xie
  • Publication number: 20230015706
    Abstract: A system can include a memory component and a processing device. The processing device can receive an indication to remove a group of memory cells of a memory sub-system from a logical address space that is used to access the memory sub-system. The processing device can, responsive to receiving the indication, remove the group of memory cells of the memory sub-system from the logical address space. The processing device can program the group of memory cells that have been removed from the logical address space with a voltage state.
    Type: Application
    Filed: September 26, 2022
    Publication date: January 19, 2023
    Inventors: Tingjun Xie, Zhengang Chen, Zhenlei Shen
  • Patent number: 11545230
    Abstract: An apparatus includes a memory and a controller. The memory may be configured to store data. The controller may be configured to process a plurality of input/output requests to a plurality of blocks of the memory that are not marked as bad on a block list, perform a code rate test that programs the plurality of blocks of the memory at three or more code rates of an error correction code scheme, and mark any of the plurality of blocks identified as bad during the code rate test on the block list.
    Type: Grant
    Filed: August 27, 2019
    Date of Patent: January 3, 2023
    Assignee: Seagate Technology LLC
    Inventors: Zhengang Chen, David Patmore, Yingji Ju, Erich F. Haratsch
  • Publication number: 20220413714
    Abstract: A method includes determining one or more quality attributes for memory cells of a memory device, receiving a memory access request involving data written to at least a portion of the memory cells, and determining whether the memory access request corresponds to a random read operation or a sequential read operation. The method further includes responsive to determining that the memory access request corresponds to a random read operation or responsive to determining that the one or more quality attributes for memory cells are greater than a threshold quality level, or both, selecting a read mode for use in performance of the random read operation and performing the random read operation using the selected read mode.
    Type: Application
    Filed: June 24, 2021
    Publication date: December 29, 2022
    Inventors: Guang Hu, Jianmin Huang, Zhengang Chen
  • Patent number: 11526395
    Abstract: A read operation to retrieve data stored at a memory device is performed. Whether the data retrieved from the memory device includes an error that is not correctable is determined. Responsive to determining that the data retrieved from the memory device comprises the error that is not correctable, a buffer in a data path along which a write operation was performed to write the data at the memory device is searched for the data.
    Type: Grant
    Filed: November 20, 2020
    Date of Patent: December 13, 2022
    Assignee: MICRON TECHNOLOGY, INC.
    Inventors: Wei Wang, Jiangli Zhu, Ying Yu Tai, Ning Chen, Zhengang Chen, Cheng Yuan Wu
  • Patent number: 11520491
    Abstract: A method that includes writing a plurality of codewords to a plurality of memory blocks of a memory device, where each of the plurality of codewords has a physical codeword index corresponding to a respective memory block in which each codeword is written, and assigning a virtual codeword index to each of the plurality of codewords to provide a plurality of virtual codeword indices, where assigning the virtual codeword index to each of the plurality of codewords is based, at least in part, on a location in a virtual block among a plurality of virtual blocks of memory cells corresponding to the physical codeword index of each codeword among the plurality of codewords.
    Type: Grant
    Filed: April 12, 2021
    Date of Patent: December 6, 2022
    Assignee: Micron Technology, Inc.
    Inventors: Xiangang Luo, Zhengang Chen
  • Publication number: 20220376709
    Abstract: Codewords of an error correcting code can be received. The codewords can be separated into multiple segments. The segments of the codewords can be distributed in an error correcting layout across a plurality of dies where at least a portion of the error correcting (EC) layout constitutes a first layout in the form of a Latin Square.
    Type: Application
    Filed: August 3, 2022
    Publication date: November 24, 2022
    Inventors: Wei Wu, Zhenlei Shen, Zhengang Chen
  • Publication number: 20220326858
    Abstract: A method that includes writing a plurality of codewords to a plurality of memory blocks of a memory device, where each of the plurality of codewords has a physical codeword index corresponding to a respective memory block in which each codeword is written, and assigning a virtual codeword index to each of the plurality of codewords to provide a plurality of virtual codeword indices, where assigning the virtual codeword index to each of the plurality of codewords is based, at least in part, on a location in a virtual block among a plurality of virtual blocks of memory cells corresponding to the physical codeword index of each codeword among the plurality of codewords.
    Type: Application
    Filed: April 12, 2021
    Publication date: October 13, 2022
    Inventors: Xiangang Luo, Zhengang Chen
  • Patent number: 11455194
    Abstract: An indication that an allocation unit of a memory sub-system has become unmapped can be received. In response to receiving the indication that the allocation unit of the memory sub-system has become unmapped, the allocation unit can be programmed with a data pattern. Data to be written to the unmapped allocation unit can be received. A write operation can be performed to program the received data at the unmapped allocation unit by using a read voltage that is based on the data pattern.
    Type: Grant
    Filed: July 12, 2019
    Date of Patent: September 27, 2022
    Assignee: MICRON TECHNOLOGY, INC.
    Inventors: Tingjun Xie, Zhengang Chen, Zhenlei Shen
  • Publication number: 20220294473
    Abstract: A processing device in a memory system reads a sense word from a memory device and executes a plurality of parity check equations on corresponding subsets of the sense word to determine a plurality of parity check equation results. The processing device determines a syndrome for the sense word using the plurality of parity check equation results, determines whether the syndrome for the sense word satisfies a codeword criterion, and responsive to the syndrome for the sense word not satisfying the codeword criterion, performs an iterative low density parity check (LDPC) correction process, wherein at least one criterion of the iterative LDPC correction process is adjusted after a threshold number of iterations is performed.
    Type: Application
    Filed: June 2, 2022
    Publication date: September 15, 2022
    Inventors: Eyal En Gad, Zhengang Chen, Sivagnanam Parthasarathy, Yoav Weinberg
  • Patent number: 11438012
    Abstract: Codewords of an error correcting code can be received. The codewords can be separated into multiple segments. The segments of the codewords can be distributed in an error correcting layout across a plurality of dies where at least a portion of the error correcting layout constitutes a Latin Square (LS) layout.
    Type: Grant
    Filed: November 29, 2018
    Date of Patent: September 6, 2022
    Assignee: Micron Technology, Inc.
    Inventors: Wei Wu, Zhenlei Shen, Zhengang Chen