Patents by Inventor Zhongwei Chen

Zhongwei Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250233166
    Abstract: A nitrogen-doped graphitized carbon material and a preparation method thereof are provided. The preparation method includes the following steps: adding graphitized carbon, pyrrole, concentrated hydrochloric acid and a non-noble metal ion compound into water sequentially in that order and mixing uniformly to obtain a mixture, and finally adding an ammonium persulfate solution into the mixture to prepare polypyrrole-coated graphitized carbon, and performing high-temperature annealing treatment and washing on the polypyrrole-coated graphitized carbon to prepare the nitrogen-doped graphitized carbon material. The prepared nitrogen-doped graphitized carbon material includes a coating layer and a substrate, the coating layer is coated on a surface of the substrate, the coating layer is epitaxially grown graphitized nitrogen-doped carbon, and the substrate is graphitized carbon.
    Type: Application
    Filed: January 13, 2025
    Publication date: July 17, 2025
    Inventors: Rongyue Wang, Xuanxuan Bi, Zhongwei Chen
  • Publication number: 20250232945
    Abstract: A multi-beam apparatus for observing a sample with high resolution and high throughput is proposed. In the apparatus, a source-conversion unit forms plural and parallel images of one single electron source by deflecting plural beamlets of a parallel primary-electron beam therefrom, and one objective lens focuses the plural deflected beamlets onto a sample surface and forms plural probe spots thereon. A movable condenser lens is used to collimate the primary-electron beam and vary the currents of the plural probe spots, a pre-beamlet-forming means weakens the Coulomb effect of the primary-electron beam, and the source-conversion unit minimizes the sizes of the plural probe spots by minimizing and compensating the off-axis aberrations of the objective lens and condenser lens.
    Type: Application
    Filed: January 17, 2025
    Publication date: July 17, 2025
    Applicant: ASML Netherlands B.V.
    Inventors: Weiming REN, Xuedong LIU, Xuerang HU, Zhongwei CHEN
  • Patent number: 12341185
    Abstract: A battery cell and method for manufacturing the same are provided. The battery cell includes a binder-free dough-like cathode separated from a sponge zinc anode by a separator and a hybrid aqueous electrolyte.
    Type: Grant
    Filed: August 9, 2019
    Date of Patent: June 24, 2025
    Inventors: Janak Handa, Zhongwei Chen
  • Patent number: 12341150
    Abstract: A three-dimensionally ordered macroporous (3DOM) metal-organic framework material (MOF)-based quasi-solid-state electrolyte thin film for a safe quasi-solid-state lithium secondary battery are provided by the present invention. In detail, the above quasi-solid-state electrolyte combines 3DOM-MOFs and the electrolytes like polymer and traditional liquid electrolyte. The special pore structures in 3DOM-MOFs could both fill the polymer electrolyte and liquid electrolyte with macropores and micropores, respectively. This unique structure could significantly enhance the Li+ conductivity rate through the different kinds of electrolytes in the corresponding pore structures as well as improve the battery performance. More importantly, this quasi-solid-state electrolyte is much safer than the traditional organic electrolyte. It should be easy to scale-up since the procedures are simple.
    Type: Grant
    Filed: March 22, 2020
    Date of Patent: June 24, 2025
    Assignee: SOLID ULTRABATTERY INC.
    Inventor: Zhongwei Chen
  • Patent number: 12300458
    Abstract: The device includes a beam source for generating an electron beam, a beam guiding tube passed through an objective lens, an objective lens for generating a magnetic field in the vicinity of the specimen to focus the particles of the particle beam on the specimen, a control electrode having a potential for providing a retarding field to the particle beam near the specimen to reduce the energy of the particle beam when the beam collides with the specimen, a deflection system including a plurality of deflection units situated along the optical axis for deflecting the particle beam to allow scanning on the specimen with large area, at least one of the deflection units located in the retarding field of the beam, the remainder of the deflection units located within the central bore of the objective lens, and a detection unit to capture secondary electron (SE) and backscattered electrons (BSE).
    Type: Grant
    Filed: October 31, 2023
    Date of Patent: May 13, 2025
    Assignee: ASML Netherlands B.V.
    Inventors: Shuai Li, Zhongwei Chen
  • Publication number: 20250112023
    Abstract: A multi-beam apparatus for observing a sample with high resolution and high throughput is proposed. In the apparatus, a source-conversion unit changes a single electron source into a virtual multi-source array, a primary projection imaging system projects the array to form plural probe spots on the sample, and a condenser lens adjusts the currents of the plural probe spots. In the source-conversion unit, the image-forming means is on the upstream of the beamlet-limit means, and thereby generating less scattered electrons. The image-forming means not only forms the virtual multi-source array, but also compensates the off-axis aberrations of the plurality of probe spots.
    Type: Application
    Filed: September 9, 2024
    Publication date: April 3, 2025
    Inventors: Weiming REN, Shuai LI, Xuedong LIU, Zhongwei CHEN
  • Patent number: 12249114
    Abstract: The disclosure belongs to the field of visible light communication, and specifically discloses a stripe image processing method and apparatus for camera optical communication. The method includes: obtaining a stripe image data set, the stripe image data set including a stripe image sample and a stripe sequence label corresponding to the stripe image sample and a stripe-free image label; based on the stripe image sample and the stripe sequence label corresponding to the stripe image sample and the stripe-free image label, training a generative adversarial network to obtain an image reconstruction model and a stripe extraction model; among them, the image reconstruction model serves as a generator of the generative adversarial network, and the stripe extraction model serves as a discriminator of the generative adversarial network.
    Type: Grant
    Filed: August 5, 2024
    Date of Patent: March 11, 2025
    Assignees: Hubei University of Economics, Dachang Technology Development Co., Ltd
    Inventors: Wenping Liu, Qian Deng, Guoqiang Fu, Sihan Li, Zeliang Huang, Zhongwei Chen, Yamin Li
  • Patent number: 12237143
    Abstract: A multi-beam apparatus for observing a sample with high resolution and high throughput is proposed. In the apparatus, a source-conversion unit forms plural and parallel images of one single electron source by deflecting plural beamlets of a parallel primary-electron beam therefrom, and one objective lens focuses the plural deflected beamlets onto a sample surface and forms plural probe spots thereon. A movable condenser lens is used to collimate the primary-electron beam and vary the currents of the plural probe spots, a pre-beamlet-forming means weakens the Coulomb effect of the primary-electron beam, and the source-conversion unit minimizes the sizes of the plural probe spots by minimizing and compensating the off-axis aberrations of the objective lens and condenser lens.
    Type: Grant
    Filed: December 21, 2023
    Date of Patent: February 25, 2025
    Assignee: ASML Netherlands B.V.
    Inventors: Weiming Ren, Xuedong Liu, Xuerang Hu, Zhongwei Chen
  • Patent number: 12191109
    Abstract: Disclosed herein is an apparatus comprising: a source of charged particles configured to emit a beam of charged particles along a primary beam axis of the apparatus; a condenser lens configured to cause the beam to concentrate around the primary beam axis; an aperture; a first multi-pole lens; a second multi-pole lens; wherein the first multi-pole lens is downstream with respect to the condenser lens and upstream with respect to the second multi-pole lens; wherein the second multi-pole lens is downstream with respect to the first multi-pole lens and upstream with respect to the aperture.
    Type: Grant
    Filed: May 8, 2023
    Date of Patent: January 7, 2025
    Assignee: ASML Netherlands B.V.
    Inventors: Xuedong Liu, Qingpo Xi, Youfei Jiang, Weiming Ren, Xuerang Hu, Zhongwei Chen
  • Publication number: 20240379325
    Abstract: Systems and methods for implementing charged particle flooding in a charged particle beam apparatus are disclosed. According to certain embodiments, a charged particle beam system includes a charged particle source and a controller which controls the charged particle beam system to emit a charged particle beam in a first mode where the beam is defocused and a second mode where the beam is focused on a surface of a sample.
    Type: Application
    Filed: February 2, 2024
    Publication date: November 14, 2024
    Applicant: ASML Netherlands B.V.
    Inventors: Frank Nan ZHANG, Zhongwei CHEN, Yixiang WANG, Ying Crystal SHEN
  • Publication number: 20240362778
    Abstract: A rapid and automatic virus imaging and analysis system includes (i) electron optical sub-systems (EOSs), each of which has a large field of view (FOV) and is capable of instant magnification switching for rapidly scanning a virus sample; (ii) sample management sub-systems (SMSs), each of which automatically loads virus samples into one of the EOSs for virus sample scanning and then unloads the virus samples from the EOS after the virus sample scanning is completed; (iii) virus detection and classification sub-systems (VDCSs), each of which automatically detects and classifies a virus based on images from the EOS virus sample scanning; and (iv) a cloud-based collaboration sub-system for analyzing the virus sample scanning images, storing images from the EOS virus sample scanning, and storing and analyzing machine data associated with the EOSs, the SMSs, and the VDCSs.
    Type: Application
    Filed: July 8, 2024
    Publication date: October 31, 2024
    Applicant: BORRIES PTE. LTD.
    Inventors: Zhongwei Chen, Xiaoming Chen, Daniel Tang, Liang-Fu Fan
  • Patent number: 12087541
    Abstract: A multi-beam apparatus for observing a sample with high resolution and high throughput is proposed. In the apparatus, a source-conversion unit changes a single electron source into a virtual multi-source array, a primary projection imaging system projects the array to form plural probe spots on the sample, and a condenser lens adjusts the currents of the plural probe spots. In the source-conversion unit, the image-forming means is on the upstream of the beamlet-limit means, and thereby generating less scattered electrons. The image-forming means not only forms the virtual multi-source array, but also compensates the off-axis aberrations of the plurality of probe spots.
    Type: Grant
    Filed: August 30, 2021
    Date of Patent: September 10, 2024
    Assignee: ASML Netherlands B.V.
    Inventors: Weiming Ren, Shuai Li, Xuedong Liu, Zhongwei Chen
  • Publication number: 20240213533
    Abstract: An additive for a functionalized metal-organic framework material of a low temperature lithium-ion battery, and a low temperature electrolyte and a low temperature lithium-ion battery using the additive. The electrolyte comprises an organic solvent, a composite lithium salt and an additive, wherein in percentages by mass, the content of the organic solvent is 80-89%, the content of the composite lithium salt is 10-15%, the content of the additive is 0.1-10%, and the additive is an MOF-functionalized additive. The use of the electrolyte in a lithium-ion battery can significantly improve the stability thereof, and increases the conductivity, the degree of dissociation and the solubility of the electrolyte at a low temperature, enhances the conduction rate of Lit, and improves the structure of a negative electrode solid phase interface film of the lithium-ion battery, and then reduces the low temperature impedance thereof, and improves the high rate capability of the battery.
    Type: Application
    Filed: December 7, 2018
    Publication date: June 27, 2024
    Inventor: Zhongwei Chen
  • Publication number: 20240145209
    Abstract: The device includes a beam source for generating an electron beam, a beam guiding tube passed through an objective lens, an objective lens for generating a magnetic field in the vicinity of the specimen to focus the particles of the particle beam on the specimen, a control electrode having a potential for providing a retarding field to the particle beam near the specimen to reduce the energy of the particle beam when the beam collides with the specimen, a deflection system including a plurality of deflection units situated along the optical axis for deflecting the particle beam to allow scanning on the specimen with large area, at least one of the deflection units located in the retarding field of the beam, the remainder of the deflection units located within the central bore of the objective lens, and a detection unit to capture secondary electron (SE) and backscattered electrons (BSE).
    Type: Application
    Filed: October 31, 2023
    Publication date: May 2, 2024
    Inventors: Shuai LI, Zhongwei Chen
  • Publication number: 20240128044
    Abstract: A multi-beam apparatus for observing a sample with high resolution and high throughput is proposed. In the apparatus, a source-conversion unit forms plural and parallel images of one single electron source by deflecting plural beamlets of a parallel primary-electron beam therefrom, and one objective lens focuses the plural deflected beamlets onto a sample surface and forms plural probe spots thereon. A movable condenser lens is used to collimate the primary-electron beam and vary the currents of the plural probe spots, a pre-beamlet-forming means weakens the Coulomb effect of the primary-electron beam, and the source-conversion unit minimizes the sizes of the plural probe spots by minimizing and compensating the off-axis aberrations of the objective lens and condenser lens.
    Type: Application
    Filed: December 21, 2023
    Publication date: April 18, 2024
    Applicant: ASML Netherlands B.V.
    Inventors: Weiming REN, Xuedong LIU, Xuerang HU, Zhongwei CHEN
  • Patent number: 11935720
    Abstract: A field-emission type electron source includes (i) a single-crystal tungsten rod having a sharpened terminus and (ii) a mass of ZrO formed only on a portion of the surface, or the entire surface, of the sharpened terminus. In preferred design, the single-crystal tungsten rod is placed in a gaseous medium that consists of oxygen and a non-oxygen gas. The molar ratio between oxygen and the non-oxygen gas is greater than 1:1.
    Type: Grant
    Filed: October 20, 2023
    Date of Patent: March 19, 2024
    Inventors: Dazhi Chen, Zhongwei Chen
  • Patent number: 11929232
    Abstract: Systems and methods for implementing charged particle flooding in a charged particle beam apparatus are disclosed. According to certain embodiments, a charged particle beam system includes a charged particle source and a controller which controls the charged particle beam system to emit a charged particle beam in a first mode where the beam is defocused and a second mode where the beam is focused on a surface of a sample.
    Type: Grant
    Filed: September 18, 2020
    Date of Patent: March 12, 2024
    Assignee: ASML Netherlands B.V.
    Inventors: Frank Nan Zhang, Zhongwei Chen, Yixiang Wang, Ying Crystal Shen
  • Patent number: 11887807
    Abstract: A multi-beam apparatus for observing a sample with high resolution and high throughput is proposed. In the apparatus, a source-conversion unit forms plural and parallel images of one single electron source by deflecting plural beamlets of a parallel primary-electron beam therefrom, and one objective lens focuses the plural deflected beamlets onto a sample surface and forms plural probe spots thereon. A movable condenser lens is used to collimate the primary-electron beam and vary the currents of the plural probe spots, a pre-beamlet-forming means weakens the Coulomb effect of the primary-electron beam, and the source-conversion unit minimizes the sizes of the plural probe spots by minimizing and compensating the off-axis aberrations of the objective lens and condenser lens.
    Type: Grant
    Filed: January 23, 2023
    Date of Patent: January 30, 2024
    Assignee: ASML Netherlands B.V.
    Inventors: Weiming Ren, Xuedong Liu, Xuerang Hu, Zhongwei Chen
  • Publication number: 20240014003
    Abstract: A multi-beam apparatus for observing a sample with high resolution and high throughput and in flexibly varying observing conditions is proposed. The apparatus uses a movable collimating lens to flexibly vary the currents of the plural probe spots without influencing the intervals thereof, a new source-conversion unit to form the plural images of the single electron source and compensate off-axis aberrations of the plural probe spots with respect to observing conditions, and a pre-beamlet-forming means to reduce the strong Coulomb effect due to the primary-electron beam.
    Type: Application
    Filed: June 30, 2023
    Publication date: January 11, 2024
    Applicant: ASML Netherlands B.V.
    Inventors: Shuai LI, Weiming REN, Xuedong LIU, Juying DOU, Xuerang HU, Zhongwei CHEN
  • Patent number: 11854762
    Abstract: The present invention provides a MEMS sample holder comprising an observation section. The observation section includes a first layer, a second layer, and a sample compartment between the first layer and the second layer. The sample compartment is configured for filling a liquid sample and observing the liquid sample filled therewithin. The sample compartment has one, two or more windows through which an electron beam can pass. Each of the windows is formed on two cavities including a first cavity on the first layer and a second cavity on the second layer that is opposite to the first cavity across the sample compartment.
    Type: Grant
    Filed: February 16, 2023
    Date of Patent: December 26, 2023
    Assignee: BORRIES PTE. LTD.
    Inventors: Wei Fang, Xiaoming Chen, Daniel Tang, Liang-Fu Fan, Zhongwei Chen