Abstract: A method is provided for testing an antenna array of a DUT using a probe antenna, the antenna array including multiple antenna elements. The method includes providing a correction table that includes predetermined correction data of differences between far field antenna patterns from different positions in a far field of the antenna array and a middle field antenna pattern from a position in a middle field of the antenna array, where the middle field satisfies near field criteria for the antenna array and satisfies far field criteria for each antenna element in the antenna array; measuring an antenna pattern at a first position in the middle field of the antenna array; retrieving predetermined correction data from the correction table corresponding to a second position located in the far field of the antenna array; and translating the measured antenna pattern to the far field by adding the retrieved predetermined correction data.

Abstract: A power tool includes a tool housing and a motor assembly received in the tool housing. The motor assembly has a rear end portion, a front end portion, and a motor output shaft. A transmission housing is coupled to the motor housing with a transmission received in the transmission housing, to which the motor output shaft is drivingly coupled. A partition assembly includes a rear cover covering a rear end portion of the transmission housing that faces the front end portion of the motor. The rear cover of the transmission housing and the front end portion of the motor together define at least a first labyrinth path and a second labyrinth path therebetween configured to inhibit grease or dust migration between the transmission housing and the motor assembly.

Abstract: A test system for testing a device under test includes: a signal processor configured to generate a plurality of independent signals and to apply first fading channel characteristics to each of the independent signals to generate a plurality of first faded test signals; a test system interface configured to provide the plurality of first faded test signals to one or more signal input interfaces of the device under test (DUT); a second signal processor configured to apply second fading channel characteristics to a plurality of output signals of the DUT to generate a plurality of second faded test signals, wherein the second fading channel characteristics are derived from the first fading channel characteristics; and one or more test instruments configured to measure at least one performance characteristic of the DUT from the plurality of second faded test signals.

Abstract: A test system for testing a device under test includes: a signal processor configured to generate a plurality of independent signals and to apply first fading channel characteristics to each of the independent signals to generate a plurality of first faded test signals; a test system interface configured to provide the plurality of first faded test signals to one or more signal input interfaces of the device under test (DUT); a second signal processor configured to apply second fading channel characteristics to a plurality of output signals of the DUT to generate a plurality of second faded test signals, wherein the second fading channel characteristics are derived from the first fading channel characteristics; and one or more test instruments configured to measure at least one performance characteristic of the DUT from the plurality of second faded test signals.

Abstract: A test system includes a single-channel signal generator configured to generate an autocorrelation test signal to be distributed to each of a plurality of RF channels of a device under test (DUT). A time offset network includes a plurality of time offset channels each corresponding to one of the plurality of RF channels of the DUT, and is configured to, in combination with the DUT, provide corresponding autocorrelation test signals each with a different time delay as respective RF channel test signals. A single-channel measurement instrument is configured to process a single-channel test signal, based upon a combination of the RF channel test signals, to independently measure at least one characteristic of each of the RF channels of the DUT. The time offset network may be configured to be coupled between the single-channel signal generator and the DUT. Or, the time offset network may be configured to be coupled between the DUT and the single-channel measurement instrument.

Abstract: A testing system includes a test chamber including an array of spaced-apart probe antennas and a positioner configured to support a device under test (DUT) having an array of digital antenna elements, a radio frequency (RF) signal generator and analyzer configured to send and receive RF test signals to/from the spaced-apart probe antennas, and an RF switch component configured to selectively couple the RF signal generator and analyzer to the array of spaced-apart probe antennas within the test chamber.

Abstract: A test system includes a single-channel signal generator configured to generate an autocorrelation test signal to be distributed to each of a plurality of RF channels of a device under test (DUT). A time offset network includes a plurality of time offset channels each corresponding to one of the plurality of RF channels of the DUT, and is configured to, in combination with the DUT, provide corresponding autocorrelation test signals each with a different time delay as respective RF channel test signals. A single-channel measurement instrument is configured to process a single-channel test signal, based upon a combination of the RF channel test signals, to independently measure at least one characteristic of each of the RF channels of the DUT. The time offset network may be configured to be coupled between the single-channel signal generator and the DUT. Or, the time offset network may be configured to be coupled between the DUT and the single-channel measurement instrument.

Abstract: A multilevel triggering system of a signal analysis instrument outputs a complex trigger signal. The triggering system includes a trigger controlled buffer for receiving and buffering an input signal, triggering function modules, and a triggering matrix. Each triggering function module performs a corresponding triggering function for detecting a corresponding triggering condition. The triggering matrix includes multiple triggering levels, each of which is configurable to include at least one trigger block and each trigger block being configurable to implement one of the triggering function modules. Each trigger block generates a corresponding block trigger when the triggering condition of the corresponding triggering function module is detected in the buffered input signal.

Abstract: A system and method for determining the performance of a channel emulator includes an input signal, at least one transmitter configured to receive the input signal, the at least one transmitter coupled to at least one receiver through the channel emulator, the at least one transmitter configured to transmit the input signal through the channel emulator, the at least one receiver configured to receive a faded receive signal. The system also comprises a signal processor configured to receive a processor signal and the faded receive signal, the signal processor configured to correlate the processor signal and the faded receive signal to develop a correlated signal that represents a channel impulse of the channel emulator. The channel impulse of the channel emulator is used to extract at least one channel coefficient that reflects the performance of the channel emulator.

Abstract: A system and method for determining the performance of a channel emulator includes an input signal, at least one transmitter configured to receive the input signal, the at least one transmitter coupled to at least one receiver through the channel emulator, the at least one transmitter configured to transmit the input signal through the channel emulator, the at least one receiver configured to receive a faded receive signal. The system also comprises a signal processor configured to receive a processor signal and the faded receive signal, the signal processor configured to correlate the processor signal and the faded receive signal to develop a correlated signal that represents a channel impulse of the channel emulator. The channel impulse of the channel emulator is used to extract at least one channel coefficient that reflects the performance of the channel emulator.