FREQUENCY MASK TRIGGER WITH NON-UNIFORM BANDWIDTH SEGMENTS
Disclosed is a test and measurement instrument having a multiple variable bandwidth frequency mask. The instrument includes an input processor for receiving an input signal and producing a digital signal, as well as a trigger signal generator for generating a trigger signal on the occurrence of a trigger event. A time to frequency converter converts a frame of digital data from the digital signal into a frequency spectrum having at least two frequency bins of dissimilar frequency widths. Each frequency bin has a power amplitude value. The trigger signal is generated when the power amplitude value of any of the at least two frequency bins violates an associated reference power level. In some cases the output may be shown as a density trace, and the trigger signal generated when any point of the density trace violates an associated density threshold.
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This disclosure is directed toward test and measurement instruments, and, more particularly, to triggers for use in the frequency domain.
BACKGROUNDReal-time spectrum analyzers such as the RSA6100, RSA5100, and RSA3400 families available from Tektronix, Inc. of Beaverton, Oreg. trigger on, capture, and analyze RF signals in real-time. These test and measurement instruments seamlessly capture RF signals so that, unlike conventional swept spectrum analyzers and vector signal analyzers, no data is missed within a specified bandwidth.
These instruments have the capability to trigger on events which occur in the frequency domain. This capability, known as a “frequency mask trigger,” is described in U.S. Pat. No. 5,103,402. The frequency mask trigger calculates the frequency spectrum of real-time data provided by the instrument's receiver system and then compares the frequency spectrum to a user-defined frequency mask. When the frequency spectrum violates the frequency mask, a trigger signal is generated which causes a seamless block of data representing the received RF signal to be stored containing the triggering event as well what happened immediately before and immediately after the triggering event. In this manner the frequency mask trigger waits for a single specific spectral event to occur.
With this background, the advantages and other novel features of the present invention are apparent from the following detailed description when read in conjunction with the appended claims and attached drawings.
SUMMARY OF THE INVENTIONIn some instances, a user may want to trigger on events processed through a set of filters that are not equally spaced. In other words, present triggers are structured to operate only when events are processed through a set of equally spaced, or equal bandwidth, filters placed at regular intervals across the frequency range of interest. This limitation prevents application of triggering events in systems that include spectral measurements in varying bandwidths over the spectral band of interest.
For example, spectral emission masks (SEMs) are commonly used in communication systems as a method of measuring the energy both inside and outside of a defined communications band in order to limit interference in adjacent bands. SEMs may specify that spectral measurements be performed in varying bandwidths over the spectral band of interest. However, because of the previously described limitation where present triggers only operate in bandwidths having a single width, present triggering systems are unable to effectively operate as SEMs.
Swept spectrum analyzers measure SEMs in two ways. They may sweep the entire band defined by the SEM in a narrow resolution bandwidth (RBW), and then mathematically convert the measurement to a new bandwidth(s). This method has two deficiencies. First, when emissions are measured in a narrow bandwidth, transients and impulse noise that occurs faster than the original resolution bandwidth time constant are reduced in amplitude, resulting in measurement error. Second, transient interference occurring over the measurement period can be missed entirely. This is because the swept analyzer measures only a small part of the band at any one time. When a transient occurs outside the resolution bandwidth, it is missed entirely, again causing measurement error. Swept spectrum analyzers may also measure SEMs by sweeping the band defined by the SEM in segments, changing the resolution bandwidth of each segment to the bandwidth required by the SEM. This eliminates the first deficiency described above, but can exacerbate the second deficiency because the segmented sweep can take longer to perform than the single RBW sweep, and more information is lost as a result.
Spectrum analyzers that use contiguous time-domain data transformed into the frequency domain (sometimes called FFT-based analyzers, and a method also used by Real Time Spectrum Analyzers (RTSAs) may avoid both problems described above. They are able to re-process the time domain data in different bandwidths and produce a combined result. Since the analysis in each bandwidth is performed on the same time domain data, both problems described with respect to swept spectrum analyzers above are eliminated. However, all current implementations of this method use a batch-processed signal analysis method. This means that the time domain data must first be stored in memory, recalled, and then processed. During the storage, recall and processing time, significant information is lost that cannot be recovered.
None of the techniques described above can be used to adequately trigger on an SEM violation. While both of the methods can save a resultant measurement where a violation occurred, and the FFT-based method can be used to save the underlying time domain data, neither method processes the measurement in real time, and both methods miss large portions of the incoming data.
Embodiments of the invention address such limitations by including a frequency mask trigger with variable bandwidths over the frequency band to be able to detect violations that occur in the proper detection bandwidths specified by a communication standard, which has the added benefit of easing fault detection and detection. All acquisition samples in multiple bandwidths are processed in real time, such that no samples are missing in the analysis. This analysis is then used to create a trigger to store the acquisitions that caused the violation as defined by the frequency mask.
Accordingly, embodiments of the invention provide for a test and measurement instrument having a frequency mask that is able to trigger for variable bandwidths over the frequency band. A frame of digital data is converted from a digital signal into a frequency spectrum having at least two frequency bins having different bandwidths. Each frequency bin also has a selected power amplitude value. A trigger signal is generated when the power amplitude value of any of the at least two frequency bins violates an associated reference power level.
The objects, advantages and other novel features of the present invention are apparent from the following detailed description when read in conjunction with the appended claims and attached drawings.
Referring now to
Although only two separate output paths A and B are shown emanating from the downconverter 230, in
Depending on the speed of the systems or components in use, these implementations as illustrated in
In operation, if the signal under test 410 were to violate any of the triggers 420-428, circuitry would generate the trigger signal, causing the acquisition memory to store a seamless block of digital data from the digital version of the signal under test. To “violate” the trigger may mean to “exceed,” or “to be less than,” depending on a parameter, which may be user defined.
Because different FFTs 510, 512 were used to create the spectra 520, 522, the rasterized spectra 530, 532 will likewise be different, even though they were created from the same digital signal.
Similar to using different RBWs on the test signal described with reference to
Each of the frequency bins of the bitmap database 541 may include a trigger level, the combination of which makes a frequency mask. This is also referred to as a density threshold. Because the density threshold is made from bins having various widths, due to the different FFTs that ultimately made bitmap database 541, the resultant trigger likewise spans multiple widths.
In practice, the trigger signal is generated when any point of the density trace violates an associated density threshold.
Although many of the embodiments described above include a user interface, it will be appreciated that in other embodiments, those parameters may alternatively be determined automatically by a test and measurement instrument
Although the embodiments illustrated and described above show the present invention being used in a real-time spectrum analyzer, it will be appreciated that embodiments of the present invention may also be used advantageously in any kind of test and measurement instrument that displays frequency domain signals, such as a swept spectrum analyzer, a signal analyzer, a vector signal analyzer, an oscilloscope, and the like.
In various embodiments, components of the invention may be implemented in hardware, software, or a combination of the two, and may comprise a general purpose microprocessor, a digital signal processor (DSP), an application specific integrated circuit (ASIC), a field-programmable gate array (FPGA), or the like.
It will be appreciated from the forgoing discussion that the present invention represents a significant advance in the field of test and measurement equipment. Although specific embodiments of the invention have been illustrated and described for purposes if illustration, it will be understood that various modifications may be made without departing from the sprit and scope of the invention. Accordingly, the invention should not be limited except as by the appended claims.
Claims
1. A test and measurement instrument comprising:
- an input processor for receiving an input signal and producing a digital signal;
- a trigger signal generator for generating a trigger signal on the occurrence of a trigger event; and
- an acquisition memory for storing a seamless block of digital data from the digital signal in response to the trigger signal;
- the trigger signal generator comprising:
- a time to frequency converter for converting a frame of digital data from the digital signal into a frequency spectrum having at least two frequency bins, each frequency bin having a power amplitude value, and the at least two frequency bins having dissimilar frequency widths;
- circuitry for generating the trigger signal when the power amplitude value of any of the at least two frequency bins violates an associated reference power level.
2. The test and measurement instrument of claim 1 in which the associated reference power level is set according to a spectrum emission mask.
3. The test and measurement instrument of claim 1, in which the associated reference power level is set according to a spectrum emission mask standard.
4. The test and measurement instrument of claim 1, in which the associated reference power level is set according to a user-defined spectrum emission mask.
5. The test and measurement instrument of claim 1 in which the time to frequency converter comprises:
- a first downconverter and a first time to frequency transform together used to generate the frequency spectrum for a first of the at least two frequency bins; and
- a second downconverter and a second time to frequency transform together used to generate the frequency spectrum for a second of the at least two frequency bins.
6. The test and measurement instrument of claim 5 in which the first downconverter is a first re-sampler and the second downconverter is a second re-sampler.
7. The test and measurement instrument of claim 5, further comprising a resolution bandwidth window coupled to the first downconverter, and a second resolution bandwidth window coupled to the second downconverter.
8. The test and measurement instrument of claim 1 in which the time to frequency converter comprises:
- a first time to frequency transform structured to accept an output from a downconverter and generate a frequency spectrum for a first of the at least two frequency bins; and
- a second time to frequency transform structured to accept the output from the downconverter and generate a frequency spectrum for a second of the at least two frequency bins.
9. The test and measurement instrument of claim 8, further comprising a first resolution bandwidth window and a second resolution bandwidth window coupled to the downconverter.
10. The test and measurement instrument of claim 8, in which the downconverter is a re-sampler.
11. The test and measurement instrument of claim 1, in which the frame of digital data is converted into a first set of spectra according to a first resultant bandwidth, and a second set of spectra according to a second resultant bandwidth; and further comprising:
- means for combining the first set of spectra to produce a first bitmap database having a plurality of cells arranged in an array of rows and columns;
- means for combining the second set of spectra to produce a second bitmap database having a plurality of cells arranged in an array of rows and columns; and
- means for generating a density trace having a plurality of points, wherein the value of each point indicates a density of one or more of the columns of the first bitmap database and a density of one or more of the columns of the second bitmap database above an associated amplitude threshold.
12. The test and measurement instrument of claim 11, in which the means for generating the trigger signal is structured to generate the trigger signal when any point of the density trace violates an associated density threshold.
13. A method in a test and measurement instrument, the method comprising:
- receiving an input signal and producing a digital signal;
- generating a trigger signal on the occurrence of a trigger event; and
- storing a seamless block of digital data from the digital signal in an acquisition memory in response to the trigger signal; in which
- generating a trigger signal comprises:
- converting a frame of digital data from the digital signal into a frequency spectrum having at least two frequency bins, each frequency bin having a power amplitude value, and the at least two frequency bins having dissimilar frequency widths; and
- generating the trigger signal when the power amplitude value of any of the at least two frequency bins violates an associated reference power level.
14. The method of claim 13, further comprising:
- setting the associated reference power level according to a spectrum emission mask.
15. The method of claim 13, in which converting a frame of digital data from the digital signal into a frequency spectrum having at least two frequency bins comprises:
- using a first downconverter and a first time to frequency transform together to generate the frequency spectrum for a first of the at least two frequency bins; and
- using a second downconverter and a second time to frequency transform together to generate the frequency spectrum for a second of the at least two frequency bins.
16. The method of claim 15, further comprising: and setting a second resolution bandwidth for the second time to frequency transform.
- setting a first resolution bandwidth for the first time to frequency transform;
17. The method of claim 13, in which converting a frame of digital data from the digital signal into a frequency spectrum having at least two frequency bins comprises:
- accepting an output from a down converter and generating a frequency spectrum for a first of the at least two frequency bins using a first time to frequency transform; and
- accepting the output from the down converter and generating a frequency spectrum for a second of the at least two frequency bins using a second time to frequency transform.
18. The method of claim 17, further comprising:
- setting a first resolution bandwidth window for the first time to frequency transform; and
- setting a second resolution bandwidth window for the second time to frequency transform.
19. The method of claim 13 in which converting a frame of digital data from the digital signal into a frequency spectrum having at least two frequency bins comprises:
- converting the frame of digital data into a first set of spectra according to a first resultant bandwidth and into a second set of spectra according to a second resultant bandwidth;
- combining the first set of spectra to produce a first bitmap database having a plurality of cells arranged in an array of rows and columns;
- combining the second set of spectra to produce a second bitmap database having a plurality of cells arranged in an array of rows and columns; and
- generating a density trace having a plurality of points, wherein the value of each point indicates a density of one or more of the columns of the first bitmap database and a density of one or more of the columns of the second bitmap database above an associated amplitude threshold.
20. The method of claim 19 in which generating the trigger signal comprises:
- generating the trigger signal when any point of the density trace violates an associated density threshold.
Type: Application
Filed: Dec 16, 2011
Publication Date: Jun 20, 2013
Patent Grant number: 9702907
Applicant: TEKTRONIX, INC (BEAVERTON, OR)
Inventors: STEVEN W. STANTON (ALOHA, OR), EDWARD C. GEE (CAMAS, WA), ALFRED K. HILLMAN, JR. (BANKS, OR)
Application Number: 13/328,098
International Classification: G06F 19/00 (20110101); G01R 23/18 (20060101);