Patents Assigned to Tektronix, Inc.
  • Patent number: 11041884
    Abstract: A test and measurement instrument includes a coefficient storage facility coupled to a programmable filter. The coefficient storage facility is configured to store at least two pre-determined filter coefficient sets, and configured to pass a selected one of the at least two pre-determined filter coefficient sets to the filter based on a measurement derived using a compensation oscillator. The measurement may include clock delay and clock skew. In some examples the test and measurement instrument may additionally adjust clock delay and/or clock skew in addition to selecting appropriate filter coefficients.
    Type: Grant
    Filed: June 24, 2019
    Date of Patent: June 22, 2021
    Assignee: Tektronix, Inc.
    Inventors: Daniel G. Knierim, Barton T. Hickman
  • Patent number: 11041880
    Abstract: A test and measurement probe coupler that may include a substrate, a first signal tap conductor, a first signal contact, a first ground tap conductor, and a first ground contact. The first signal tap conductor may extends a first length along the substrate. The first signal contact may be electrically coupled to the first signal tap conductor, and the first ground tap conductor may extend a second length along the substrate. The first ground tap conductor may be substantially parallel to the first signal tap conductor. The first ground tap conductor may be disposed in a first lateral direction away from the first signal tap conductor, and the first ground contact electrically may be coupled to the first ground tap conductor.
    Type: Grant
    Filed: October 16, 2018
    Date of Patent: June 22, 2021
    Assignee: Tektronix, Inc.
    Inventor: Josiah A. Bartlett
  • Patent number: 11018964
    Abstract: An apparatus and method that captures a complete history of serial network Link Training negotiations by continuously monitoring multiple analog signals representing both sides of full duplex lanes in real-time by pattern matching the Link Training Frame Marker and the subsequent negotiation request/response data values. The apparatus and method compare the digitized version of the incoming signal against a nominal pattern at the start to find the Frame Markers and Control Channel data, storing only those Control Channel data values that do not match the current compare pattern, and further by updating the current compare pattern to the new pattern just received, so that only the transitions in the data values are stored, thereby vastly reducing the amount of data presented to the user, but nonetheless retaining the complete substantive history of the Link Training negotiations.
    Type: Grant
    Filed: December 30, 2016
    Date of Patent: May 25, 2021
    Assignee: Tektronix, Inc.
    Inventors: David L. Kelly, Patrick A. Smith, Jed H. Andrews, Keith D. Rule
  • Publication number: 20210148975
    Abstract: A system for acquiring a test-and-measurement signal from a device under test (DUT) including a test-and-measurement probe, a user interface, a robot, and a controller. The probe is configured to acquire an electronic signal from the DUT. The user interface displays a digital representation of a physical electronic circuit of the DUT, including portrayals of virtual nodes that correspond to actual nodes on the DUT. The robot is configured to automatically position the probe with respect to the DUT. The controller is configured to receive from the user interface an electronic indication of a selected node of the digital representation of the physical electronic circuit, where the selected node is one of the virtual nodes. The controller is further configured to provide instructions to the robot to automatically position the probe to a position on the physical electronic circuit corresponding to the actual node.
    Type: Application
    Filed: November 13, 2020
    Publication date: May 20, 2021
    Applicant: Tektronix, Inc.
    Inventors: Sam J. Strickling, David Everett Burgess
  • Publication number: 20210148951
    Abstract: An accessory device has a test port, an instrument port to connect to an instrument having an operating bandwidth, and one or more configurable signal paths connectable between the test port and the instrument port to convert a signal from the test port having a first frequency range to a signal having a second frequency range different than the first frequency range. A test and measurement system has a test and measurement instrument having an operating bandwidth, and an accessory device. The accessory device has a first instrument port to connect the accessory device to the test and measurement instrument, a test port to connect the accessory device to a device under test, and one or more configurable signal paths connectable between the test port and the instrument port to down-convert a signal from the test port having a first frequency range to a signal having a second frequency range lower than the first frequency range.
    Type: Application
    Filed: November 16, 2020
    Publication date: May 20, 2021
    Applicant: Tektronix, Inc.
    Inventors: Daniel G. Knierim, Josiah A. Bartlett, Amr Haj-Omar, Donald J. Dalebroux, Barton T. Hickman, Alexander Krauska
  • Publication number: 20210148640
    Abstract: A thermal management system for a test-and-measurement probe that includes a thermally insulated shroud and a fluid inlet conduit. The shroud is configured to enclose a first portion of a probe head of the probe within an interior cavity of the shroud, while permitting a second portion of the probe head to extend out of the shroud. The shroud further includes a fluid outlet passageway configured to permit a heat-transfer fluid to pass from a probe-head end of the interior cavity, through the interior cavity of the shroud, and out of the shroud through an access portion of the shroud. The fluid inlet conduit enters the shroud through the access portion of the shroud, extends through the interior cavity of the shroud, and is configured to introduce the heat-transfer fluid to the probe-head end of the interior cavity.
    Type: Application
    Filed: November 12, 2020
    Publication date: May 20, 2021
    Applicant: Tektronix, Inc.
    Inventors: Julie A. Campbell, David Thomas Engquist, Sam J. Strickling
  • Publication number: 20210149781
    Abstract: A test and measurement device includes an input port for receiving a bus conducting data from a device under test, and processing element coupled to the input port. The processing element is configured to execute instructions that cause the processing element to determine a data sequence from a signal of the bus received on a main channel of the device, and use information from at least one other signal of the bus on an auxiliary channel of the device based upon a protocol associated with the bus to adjust parameters for performing error detection on the data sequence.
    Type: Application
    Filed: November 10, 2020
    Publication date: May 20, 2021
    Applicant: Tektronix, Inc.
    Inventor: Joshua J. O'Brien
  • Patent number: 11009546
    Abstract: A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.
    Type: Grant
    Filed: June 13, 2019
    Date of Patent: May 18, 2021
    Assignee: Tektronix, Inc.
    Inventors: Pirooz Hojabri, Joshua O'Brien, Gregory A. Martin, Patrick Satarzadeh, Karen Hovakimyan
  • Patent number: 11005492
    Abstract: A signal source device includes at least one digital-to-analog converter, at least one connector, a first output path from the at least one digital-to-analog converter to the at least one connector, and a second output path from the at least one digital-to-analog converter to the at least one connector. A method of generating a analog signal includes generating at least one analog signal from at least one digital-to-analog converter, transmitting a first analog signal of the at least one analog signal along a first output path from the at least one digital-to-analog converter to at least one connector, and transmitting a second analog signal of the at least one analog signal along a second output path from the at least one digital-to-analog converter to the at least one connector.
    Type: Grant
    Filed: September 30, 2019
    Date of Patent: May 11, 2021
    Assignee: Tektronix, Inc.
    Inventors: Gregory A. Martin, Pirooz Hojabri
  • Patent number: 11002764
    Abstract: A system includes a plurality of oscilloscopes, each oscilloscope having an output port and an input port, a cable connecting the output port of an initial oscilloscope of the plurality of oscilloscopes to the input port of a second oscilloscope of the plurality of oscilloscopes, the initial oscilloscope having a processing element to generate a master run clock, the second oscilloscope having a processing element including a phase-locked loop to lock a slave run clock to the master run clock, wherein the processing element of one of the oscilloscopes executes code to cause the processing element to manipulate one of the run clocks to pass trigger information to another of the plurality of oscilloscopes.
    Type: Grant
    Filed: February 11, 2020
    Date of Patent: May 11, 2021
    Assignee: Tektronix, Inc.
    Inventors: Daniel G. Knierim, Barton T. Hickman, Joshua J. O'Brien
  • Patent number: 10996178
    Abstract: Disclosed is a signal isolating test instrument, such as an electronics test probe. The instrument includes an input to receive a floating analog signal. An upconverter is employed to modulate the floating analog signal to a microwave frequency analog signal. An isolation barrier in the instrument prevents coupling of the floating analog signal to an earth ground. The instrument employs a microwave structure to transmit the microwave frequency analog signal across the isolation barrier via electromagnetic coupling. A downconverter is then employed to demodulate the microwave frequency analog signal to obtain a ground referenced test signal corresponding to the floating analog signal.
    Type: Grant
    Filed: August 31, 2017
    Date of Patent: May 4, 2021
    Assignee: Tektronix, Inc.
    Inventors: Jonathan S. Dandy, Daniel G. Knierim
  • Patent number: 10983146
    Abstract: A test and measurement system is disclosed that includes an input for receiving a digital bus conducting a plurality of digital values, a display, and a memory. The memory stores hit frequencies for the digital values, and stores data indicating the digital values. The test and measurement system also includes at least one processor coupled to the display and the memory. The processor causes the display to depict the digital values and hit frequencies of the digital values by depicting persistence of the digital values over time and by depicting decay of the digital values over time.
    Type: Grant
    Filed: December 28, 2016
    Date of Patent: April 20, 2021
    Assignee: Tektronix, Inc.
    Inventor: Kevin C. Spisak
  • Publication number: 20210096971
    Abstract: A test and measurement instrument includes a processor configured to execute instructions that cause the processor to: receive a bus auto-detect signal; receive signals from a bus connected to the test and measurement instrument; and apply machine learning to the signals from the bus to output a predicted a bus type; at least one memory to store the instructions and data used in the machine learning, and a display to display information for a user including the predicted bus type. A method of automatically detecting a bus type includes receiving a bus auto-detect signal when a bus is connected to a test and measurement instrument, receiving signals from the bus at a processor, and using the processor to apply machine learning to the signals from the bus to predict a bus identity.
    Type: Application
    Filed: September 30, 2020
    Publication date: April 1, 2021
    Applicant: Tektronix, Inc.
    Inventors: Mark Anderson Smith, Byron T. Faber, Rohan Dhesikan, Kimberly Horton, Yurim Lee, Kathleen Elisabeth Smith
  • Patent number: 10962566
    Abstract: Test and measurement probes include a body, an adjustable member moveably coupled to the body and having a changeable position relative to the body, and a transducer subsystem structured to measure the position of the adjustable member and configured to output a position signal indicative of the position of the adjustable member. A change in the position of the adjustable member causes a change in an electrical characteristic of the probe. A position-dependent correction factor may be used to correct the change in the electrical characteristic. Methods of compensating for a change in a response of a test and measurement system include monitoring a position sensor output to detect a position change of a first part of a probe relative to a second part, determining that the position sensor output value has crossed a boundary value between a first and second range, and applying a compensation factor corresponding to the second range to modify the response of the system.
    Type: Grant
    Filed: January 7, 2019
    Date of Patent: March 30, 2021
    Assignee: Tektronix, Inc.
    Inventors: Julie A. Campbell, Josiah A. Bartlett, David A. Sailor, Jay Schwichtenberg
  • Publication number: 20210088553
    Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.
    Type: Application
    Filed: December 7, 2020
    Publication date: March 25, 2021
    Applicant: Tektronix, Inc.
    Inventors: Daniel G. Knierim, William A. Hagerup, Barton T. Hickman, Ira G. Pollock
  • Patent number: 10955488
    Abstract: A modular power supply including a voltage regulator configured to output a voltage, a first output configured to connect to a device under test and output the voltage from the regulator, a microcontroller connected to the voltage regulator, and an interface configured to connect to a test and measurement instrument. The interface includes an input configured to receive power from the test and measurement instrument and a second output configured to output a signal characteristic of the first output.
    Type: Grant
    Filed: April 20, 2018
    Date of Patent: March 23, 2021
    Assignee: Tektronix, Inc.
    Inventors: Haiping Lv, Hai Wen Yu
  • Publication number: 20210081630
    Abstract: A test and measurement instrument for analyzing signals using machine learning. The test and measurement instrument can determine a recovered clock signal based on the digital signal, set window positions for a fast Fourier transform of the digital signal, window the digital signal into a series of windowed waveform data based on the window positions, transform each of the windowed waveform data into a frequency-domain windowed waveform data using a fast Fourier transform, and determine high-order spectrum data of each of the frequency-domain windowed waveform data. The test and measurement instrument includes a neural network configured to receive the high-order spectrum data of the frequency-domain windowed transform data and classify each windowed waveform data based on the high-order spectrum data.
    Type: Application
    Filed: September 11, 2020
    Publication date: March 18, 2021
    Applicant: Tektronix, Inc.
    Inventor: John J. Pickerd
  • Publication number: 20210081257
    Abstract: A method of synchronizing tasks in a test and measurement system, includes receiving, at a client in the system, a task input, receiving, at a job manager running on a first device processor in the system, a call from the client to create a job associated with the task, returning to the client an action containing at least one job code block associated with the job, receiving a call for the action, executing the at least one job code block by at least one processor in the system, determining that the job has completed, and completing the task.
    Type: Application
    Filed: September 11, 2020
    Publication date: March 18, 2021
    Applicant: Tektronix, Inc.
    Inventors: Timothy E. Sauerwein, Clinton M. Alter, Sean T. Marty, Jenny Yang, Keith D. Rule
  • Publication number: 20210063488
    Abstract: A test and measurement instrument including a user interface configured to receive instructions to perform a signal path calibration for a user-specific setting from a user; a memory configured to store signal path calibration data; and one or more processors that can determine an actual signal path hardware setting for the user-specific setting, determine an adjustment to adjust the actual signal path hardware setting to the user-specific setting, adjust the actual signal path hardware setting by the adjustment to accurately represent the user-specific setting, and store the user-specific setting and the adjusted signal path hardware setting in the signal path calibration data.
    Type: Application
    Filed: August 24, 2020
    Publication date: March 4, 2021
    Applicant: Tektronix, Inc.
    Inventor: Barton T. Hickman
  • Publication number: 20210042212
    Abstract: A protocol designer for a test and measurement instrument, comprising an input to receive a signal, a memory configured to store the signal, an author configured to generate protocol definitions based on a user input, a debugger configured to output textual and visual decode results based on the protocol definitions and the signal, and a deployer configured to output a complied protocol definition file to the test and measurement instrument.
    Type: Application
    Filed: March 13, 2019
    Publication date: February 11, 2021
    Applicant: Tektronix, Inc.
    Inventors: Mark Anderson Smith, Michael Scott Silliman, Andrew Loofburrow, Eric T. Anderson