Patents Assigned to Tektronix, Inc.
  • Publication number: 20220299566
    Abstract: A test and measurement device includes an input for receiving a test waveform from a Device Under Test (DUT), where the test waveform has a plurality of input level transitions, a selector structured to respectively and individually extract only those portions of the test waveform that match two or more predefined patterns of input level transitions of the test waveform, a noise compensator structured to individually determine and remove, for each of the extracted portions of the waveform, a component of a jitter measurement caused by random noise of the test and measurement device receiving the test waveform, a summer structured to produce a composite distribution of timing measurements with removed noise components from the extracted portions of the test waveform, and a jitter processor structured to determine a first noise-compensated jitter measurement of the DUT from the composite distribution. Methods of determining noise-compensated jitter measurements are also disclosed.
    Type: Application
    Filed: March 15, 2022
    Publication date: September 22, 2022
    Applicant: Tektronix, Inc.
    Inventor: Mark L. Guenther
  • Patent number: 11449697
    Abstract: A test and measurement instrument for analyzing signals using machine learning. The test and measurement instrument can determine a recovered clock signal based on the digital signal, set window positions for a fast Fourier transform of the digital signal, window the digital signal into a series of windowed waveform data based on the window positions, transform each of the windowed waveform data into a frequency-domain windowed waveform data using a fast Fourier transform, and determine high-order spectrum data of each of the frequency-domain windowed waveform data. The test and measurement instrument includes a neural network configured to receive the high-order spectrum data of the frequency-domain windowed transform data and classify each windowed waveform data based on the high-order spectrum data.
    Type: Grant
    Filed: September 11, 2020
    Date of Patent: September 20, 2022
    Assignee: Tektronix, Inc.
    Inventor: John J. Pickerd
  • Patent number: 11442105
    Abstract: Disaggregated distributed measurement analysis systems provide a test and measurement automation platform that uses solution workflow metadata to create automation test suites as solutions to be deployed in an automation engine of a test and measurement automation platform. The automation platform provides tools and techniques to develop measurements and deploy solutions in an automation engine without requiring the system to restart. The system enables, by the test and measurement automation platform, a user to develop measurements for the solutions and deploy and execute each of the solutions in the automation engine of the test and measurement automation platform without requiring the solution to compile.
    Type: Grant
    Filed: January 10, 2020
    Date of Patent: September 13, 2022
    Assignee: Tektronix, Inc.
    Inventors: Sriram Mandyam Krishnakumar, Mahesha Guttahalli Lakshmipathy, Satish Kumar Makanahalli Ramaiah, Vishnu Vardhan Kandan, Rovin Jolly Pulikken
  • Patent number: 11442102
    Abstract: A test and measurement system for parallel waveform analysis acquires waveforms resulting from performing tests on a device under test (DUT) and performs, at least partially in parallel, respective analyses of the waveforms resulting from performing tests on the DUT. The system also acquires a first waveform resulting from performing a first test with an oscilloscope on a DUT and performs analysis of the first waveform at least partially in parallel with acquiring a second waveform. Additionally, the system tracks a plurality of testing assets using inventory information of a plurality of testing equipment on the network and enables remote users to access equipment logs and results of the respective analyses of the waveforms stored on a cloud computing system for performance of analytics.
    Type: Grant
    Filed: May 10, 2020
    Date of Patent: September 13, 2022
    Assignee: Tektronix, Inc.
    Inventors: Sriram Mandyam Krishnakumar, Sunil Mahawar, Mahesha Guttahalli Lakshmipathy, Satish Kumar Makanahalli Ramaiah
  • Patent number: 11422584
    Abstract: A test and measurement instrument for generating an analog waveform, including an interpolator configured to receive a digital signal and output interpolated samples of the digital signal at a sample rate, a filter modulation controller configured to output first filter coefficients at a first time and second filter coefficients at a second time, a convolver configured to generate a convolved signal by convolving the interpolated samples of the digital signal and the first filter coefficients and convolving the interpolated samples of the digital signal and the second filter coefficients; and a digital-to-analog converter configured to convert the convolved signal to an analog signal based on a fixed, constant clock signal.
    Type: Grant
    Filed: November 7, 2019
    Date of Patent: August 23, 2022
    Assignee: Tektronix, Inc.
    Inventor: John J. Pickerd
  • Patent number: 11408919
    Abstract: A test and measurement instrument for extracting waveforms from a differential transmission line without disrupting the differential transmission line. The test and measurement instrument includes a first input configured to receive a voltage waveform from a voltage probe electrically coupled to the first and second lines of the differential transmission line that electrically connect a first device and a second device, a second input configured to receive a current waveform from a current probe coupled to the differential transmission line, and one or more processors configured to receive the voltage waveform and the current waveform and determine a voltage of the first device and a voltage of the second device based on the voltage waveform and the current waveform.
    Type: Grant
    Filed: December 19, 2019
    Date of Patent: August 9, 2022
    Assignee: Tektronix, Inc.
    Inventors: P E Ramesh, Tsuyoshi Miyazaki
  • Patent number: 11385258
    Abstract: A method for acquiring a signal from an encapsulated test point on a device under test, includes forming a hole in an encapsulant adjacent to the test point, the hole extending through the encapsulant to the test point, delivering a UV-curable conductive adhesive into the hole such that the delivered adhesive contacts the test point, applying UV light from a UV light source to cure the delivered adhesive, and connecting a conductive element between the cured adhesive and a test and measurement instrument.
    Type: Grant
    Filed: October 4, 2020
    Date of Patent: July 12, 2022
    Assignee: Tektronix, Inc.
    Inventors: Julie A. Campbell, Karl A. Rinder, Regina R. Mrozik
  • Patent number: 11385272
    Abstract: A test and measurement device measures an insertion loss of a material under test. The test and measurement device includes a reference device in contact with a first surface of a material under test, the reference device including a reflective component and an absorbing component. A testing device is in contact with a second surface of the material under test, opposite the first surface. The testing device includes a first transmitter to output a first signal at a predetermined frequency to the reflective component of the reference device through the material under test, a first receiver to receive a first reflected signal from the reflective component, a second transmitter output a second signal at the predetermined frequency to the absorbing component of the reference device through the material under test, and a second receiver to receive a second reflected signal from the material under test.
    Type: Grant
    Filed: June 3, 2020
    Date of Patent: July 12, 2022
    Assignee: Tektronix, Inc.
    Inventor: Alexander Krauska
  • Patent number: 11372025
    Abstract: A system includes a plurality of oscilloscopes, each oscilloscope having an output port and an input port, a cable connecting the output port of an initial oscilloscope of the plurality of oscilloscopes to the input port of a second oscilloscope of the plurality of oscilloscopes, the initial oscilloscope having a processing element to generate a master run clock, the second oscilloscope having a processing element including a phase-locked loop to lock a slave run clock to the master run clock, wherein the processing element of one of the oscilloscopes executes code to cause the processing element to manipulate one of the run clocks to pass trigger information to another of the plurality of oscilloscopes.
    Type: Grant
    Filed: May 11, 2021
    Date of Patent: June 28, 2022
    Assignee: Tektronix, Inc.
    Inventors: Daniel G. Knierim, Barton T. Hickman, Joshua J. O'Brien
  • Publication number: 20220192486
    Abstract: A method of generating a calibration signal includes setting a first parameter to an initial first value and a second parameter to an initial second value, generating an initial eye diagram using the initial first value and the initial second value, determining a first difference between a first dimension of the initial eye diagram and a target first dimension, and a second difference between a second dimension of the initial eye diagram and a second target dimension, estimating a next first value to cause the first difference to be zero, setting the first parameter to the next first value, generating a next eye diagram, repeating the estimating, setting, and generating until the first dimension of a most recent next eye diagram is within the first target dimension, setting a final first parameter value to a most recent next first value, setting a final second parameter value to the initial second value when the second dimension of the most recent next eye diagram is within the second target dimension, genera
    Type: Application
    Filed: December 13, 2021
    Publication date: June 23, 2022
    Applicant: Tektronix, Inc.
    Inventors: Subhankar Ghose, Ankit Dash, David M. Bouse
  • Publication number: 20220196701
    Abstract: A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.
    Type: Application
    Filed: November 30, 2021
    Publication date: June 23, 2022
    Applicant: Tektronix, Inc.
    Inventors: Tyler B. Niles, Daniel G. Knierim, Michael J. Wadzita, Joshua J. O'Brien, David Everett Burgess
  • Publication number: 20220148065
    Abstract: A test and measurement instrument includes a system and/or method to generate a recommendation of a feature upgrade to the instrument. Such a method may include receiving a request by a user to perform an action on the instrument and performing the requested action by the instrument to generate first results. Then the instrument modifies an instrument parameter to one that is not presently available to the user, and performs the requested action again with the modified parameter to generate second results. After both results are generated, the instrument compares the first results to the second results and informs the user when the second results differ from the first results. Informing the user may include instructions for upgrading the instrument to include the modified parameter.
    Type: Application
    Filed: October 29, 2021
    Publication date: May 12, 2022
    Applicant: Tektronix, Inc.
    Inventor: Joshua J. O'Brien
  • Patent number: 11329633
    Abstract: A mechanism is included for jointly determining filter coefficients for Finite Impulse Response (FIR) filters in a Linear, Memory-less Non-linear (LNL), Linear compensator. Calibration signals are applied to a signal converter input in a test and measurement system. Non-linear signal components are determined in signal output from the signal converter. Non-linear filter components are determined at the LNL compensator based on the calibration signals. The non-linear signal components are then compared to the non-linear filter components. The comparison is then resolved to determine filter coefficients for first stage Finite Impulse Response (FIR) filters and second stage FIR filters in the LNL.
    Type: Grant
    Filed: April 9, 2018
    Date of Patent: May 10, 2022
    Assignee: Tektronix, Inc.
    Inventors: Karen Hovakimyan, Pirooz Hojabri, Tigran Hovakimyan, Norayr Yengibaryan
  • Publication number: 20220137091
    Abstract: A test and measurement instrument includes one or more processors to execute code to cause the processors to: access a user instance of the test and measurement instrument; receive one or more requests from the user instance of the test and measurement instrument; determine any collisions between the one or more requests and any other requests for elements of the test and measurement instrument; resolve any collisions as necessary; perform one or more operations to fulfill the request; and display information resulting from the one or more operations on an instance user interface.
    Type: Application
    Filed: October 29, 2021
    Publication date: May 5, 2022
    Applicant: Tektronix, Inc.
    Inventor: Josiah A. Bartlett
  • Patent number: 11323152
    Abstract: A sampling gate comprising a first frequency input coupled to a first frequency path from a broadband photodiode. The sampling gate also includes a positive bias input coupled to a positive offset portion of a second frequency path from the broadband photodiode. The sampling gate also includes a negative bias input coupled to a negative offset portion of the second frequency path from the broadband photodiode. The sampling gate combines a first frequency signal from the first frequency path and a second frequency signal from the second frequency path to create a combined broadband frequency signal from the broadband photodiode.
    Type: Grant
    Filed: April 21, 2020
    Date of Patent: May 3, 2022
    Assignee: TEKTRONIX, INC.
    Inventor: Noah Brummer
  • Publication number: 20220099706
    Abstract: A current sensor configured to measure current in a current-carrying conductor. The current sensor includes a Rogowski coil having plurality of conductor segments. The plurality of conductor segments are positionable to form a substantially complete loop. A first conductor segment of the plurality of conductor segments is electrically isolated from a second conductor segment of the plurality of conductor segments.
    Type: Application
    Filed: September 17, 2021
    Publication date: March 31, 2022
    Applicant: Tektronix, Inc.
    Inventor: Josiah A. Bartlett
  • Publication number: 20220099782
    Abstract: A vector network analyzer (VNA) can include a control processor, a receiver coupled with the control processor, switching circuitry coupled with the receiver, a radio frequency (RF) bridge coupled with the switching circuitry, a transmission line coupled with the RF bridge, wherein the transmission line is configured to be coupled with a load; and a signal generator coupled with the RF bridge.
    Type: Application
    Filed: December 10, 2021
    Publication date: March 31, 2022
    Applicant: Tektronix, Inc.
    Inventor: Alexander Krauska
  • Publication number: 20220091185
    Abstract: A margin tester including an identification reader configured to receive an adaptor identifier of an adaptor, an interface configured to connect to a device under test through the adaptor, and one or more processors configured to assess a margin, such as an electrical margin or an optical margin, of a device under test and tag the assessment with the adaptor identifier. Assessing the margin can include assessing the margin based on an expected margin that is predicted or provided based on the adaptor identifier.
    Type: Application
    Filed: August 13, 2021
    Publication date: March 24, 2022
    Applicant: Tektronix, Inc.
    Inventors: Sam J. Strickling, Daniel S. Froelich, Michelle L. Baldwin, Jonathan San, Lin-Yung Chen
  • Patent number: 11275131
    Abstract: A test and measurement instrument, including at least one port configured to receive a signal from a device under test (DUT), the signal including a current signal acquired across a magnetic core of the DUT and a voltage signal acquired across the magnetic core of the DUT, and one or more processors. The one or more processors are configured to determine a hysteresis loop based on the current signal and the voltage signal, determine a magnetic flux of the magnetic core based on the voltage signal and the current signal for a number of sample points for each cycle, and determine a maximum magnetic flux for all cycles and a hysteresis loop cycle that corresponds to the maximum magnetic flux. A display configured to display at least one of the hysteresis loop, the signal received from the DUT, and the hysteresis loop cycle that corresponds to the maximum magnetic flux.
    Type: Grant
    Filed: October 10, 2019
    Date of Patent: March 15, 2022
    Assignee: Tektronix, Inc.
    Inventors: U N Vasudev, Suman Babu Alaparthi, Niranjan R Hegde, Krishna N H Sri
  • Patent number: D947693
    Type: Grant
    Filed: September 20, 2019
    Date of Patent: April 5, 2022
    Assignee: Tektronix, Inc.
    Inventors: David Thomas Engquist, Heather J. Vermilyea, Karl A. Rinder, Michael J. Mende, Tony Lee Tarr