Patents Assigned to Tektronix, Inc.
  • Publication number: 20240087776
    Abstract: A shunt resistor has a substrate having electrically conductive structures to carry current in a current path, a resistive portion in electrical contact with the electrically conductive structures, and one or more canceling inductance leads electrically connected to the electrically conductive structures and the resistive portion, the one or more canceling inductance configured to cancel inductive effects in a voltage measurement across the resistive portion. A modular tip interconnect has a connector at a first end of the interconnect configured to connect to a probe tip of a test and measurement instrument, and the above shunt resistor located at a second end of the interconnect configured to connect to a device under test (DUT).
    Type: Application
    Filed: September 7, 2023
    Publication date: March 14, 2024
    Applicant: Tektronix, Inc.
    Inventors: Julie A. Campbell, Christopher R. Muggli, Daniel G. Knierim, David M. Ediger, Richard N. Atherton
  • Patent number: 11927627
    Abstract: A system for data creation, storage, analysis, and training while margin testing includes a margin test generator coupled through an interface to a Device Under Test (DUT). The margin test generator is structured to modify test signals for testing the DUT during one or more testing states of a test session to create testing results. The testing results are stored in a data repository along with a DUT identifier of the DUT tested during the test session. A comparator determine whether any results of the DUT test results match a predictive outcome that is based from an analysis of previous DUT tests. If so, a message generator produces an indication that the tested DUT matched the predictive outcome.
    Type: Grant
    Filed: November 23, 2021
    Date of Patent: March 12, 2024
    Assignee: Tektronix, Inc.
    Inventors: Daniel S. Froelich, Sam J. Strickling
  • Patent number: 11923896
    Abstract: A test and measurement device has a connection to allow the test and measurement device to connect to an optical transceiver, one or more processors, configured to execute code that causes the one or more processors to: initially set operating parameters for the optical transceiver to average parameters, acquire a waveform from the optical transceiver, measure the acquired waveform and determine if operation of the transceiver passes or fails, send the waveform and the operating parameters to a machine learning system to obtain estimated parameters if the transceiver fails, adjust the operating parameters based upon the estimated parameters, and repeat the acquiring, measuring, sending, and adjusting as needed until the transceiver passes.
    Type: Grant
    Filed: March 22, 2022
    Date of Patent: March 5, 2024
    Assignee: Tektronix, Inc.
    Inventors: Evan Douglas Smith, John J. Pickerd, Williams Fabricio Flores Yepez, Heike Tritschler
  • Patent number: 11923895
    Abstract: A test and measurement system includes a test and measurement device, a connection to allow the test and measurement device to connect to an optical transceiver, and one or more processors, configured to execute code that causes the one or more processors to: set operating parameters for the optical transceiver to reference operating parameters; acquire a waveform from the optical transceiver; repeatedly execute the code to cause the one or more processors to set operating parameters and acquire a waveform, for each of a predetermined number of sets of reference operating parameters; build one or more tensors from the acquired waveforms; send the one or more tensors to a machine learning system to obtain a set of predicted operating parameters; set the operating parameters for the optical transceiver to the predicted operating parameters; and test the optical transceiver using the predicted operating parameters.
    Type: Grant
    Filed: March 22, 2022
    Date of Patent: March 5, 2024
    Assignee: Tektronix, Inc.
    Inventors: John J. Pickerd, Kan Tan, Evan Douglas Smith, Heike Tritschler
  • Publication number: 20240069094
    Abstract: A test system includes a test and measurement device having an input port for receiving signals for testing or measuring, a reprogrammable test accessory having an output coupled to the input port of the test and measurement device. The reprogrammable test accessory includes a test port structured to accept one or more test signals from a Device Under Test (DUT), a processor, a reprogrammable data protocol analyzer for determining whether data carried by the one or more test signals from the DUT conform to a predetermined data protocol, and a reprogramming facility for modifying the reprogrammable data protocol analyzer from a first configuration to a second configuration. Methods of operation are also described.
    Type: Application
    Filed: November 7, 2023
    Publication date: February 29, 2024
    Applicant: Tektronix, Inc.
    Inventors: Charles W. Case, Daniel G. Knierim, Joshua J. O'Brien, Josiah A. Bartlett, Julie A. Campbell
  • Publication number: 20240069065
    Abstract: An apparatus includes a fixed substrate having at least two contact structures, a movable substrate having at least two electrically conductive paths, a housing containing the fixed substrate and the movable substrate, a plurality of connectors in the housing, each connector connecting to one of the at least two contact structures to connect to ground and a spring contact, the plurality of connectors arranged to connect to at least one of the conductive paths depending upon a position of the movable substrate, and a motorized stage in the housing to move the movable substrate to align one of the at least two conductive paths to form a connection between two of the connectors. The apparatus may be part of a test and measurement instrument, and a method of operating the apparatus is also included.
    Type: Application
    Filed: November 6, 2023
    Publication date: February 29, 2024
    Applicant: TEKTRONIX, INC.
    Inventors: JULIE A. CAMPBELL, DANIEL G. KNIERIM, BARTON T. HICKMAN
  • Patent number: 11916302
    Abstract: A test and measurement system includes a test and measurement device having input channels, a reference array of antennas connected to the input channels, one or more processors in the test and measurement device configured to execute code to cause the one or more processors to receive a first signal from a phased array of antennas connected to a device under test directed at a first side of the reference array, receive a second signal from the phased array of antennas connected to the device under test directed at a second side of the reference array, without moving the device under test, the phased array, or the reference array.
    Type: Grant
    Filed: December 2, 2021
    Date of Patent: February 27, 2024
    Assignee: Tektronix, Inc.
    Inventors: Donald J. Dalebroux, Amr Haj-Omar
  • Publication number: 20240061021
    Abstract: A current measurement device with a shunt resistor of a resistive core with an opening and measurement leads, a Rogowski coil with electrical contacts surrounding the resistive core, conductive layers on first and second sides of the resistive core, one or more insulative layers between the conductive layers and the Rogowski coil, the current measurement device configured to combine signals from the shunt resistor and the Rogowski core. The current measurement device may have a Rogowski coil on a flexible substrate at least partially wrapped around the shunt resistor. A current measurement device has a rigid substrate, vias filled with a conductive material through the rigid substrate, conductive layers on the top surface and the bottom surface connecting to the vias to form a Rogowski coil structure, one or more insulative layers directly on the coil structure, a shunt resistor directly on the one or more insulative layers.
    Type: Application
    Filed: October 31, 2023
    Publication date: February 22, 2024
    Applicant: Tektronix, Inc.
    Inventors: Julie A. Campbell, Emily L. Becher, David M. Ediger, Matthew J. Hull, Daniel G. Knierim
  • Patent number: 11907090
    Abstract: A test and measurement instrument has an input configured to receive a signal from a device under test, a memory, a user interface to allow the user to input settings for the test and measurement instrument, and one or more processors, the one or more processors configured to execute code that causes the one or more processors to: acquire a waveform representing the signal received from the device under test; generate one or more tensor arrays based on the waveform; apply machine learning to the one or more tensor arrays to produce equalizer tap values; and apply equalization to the waveform using the equalizer tap values to produce an equalized waveform; and perform a measurement on the equalized waveform to produce a value related to a performance requirement for the device under test.
    Type: Grant
    Filed: July 29, 2022
    Date of Patent: February 20, 2024
    Assignee: Tektronix, Inc.
    Inventors: Kan Tan, John J. Pickerd
  • Patent number: 11898927
    Abstract: A test and measurement device includes one or more ports configured to connect to a device under test (DUT), a time domain reflectometry (TDR) source configured receive a source control signal and to produce an incident signal to be applied to the DUT, one or more analog-to-digital converters (ADC) configured to receive a sample clock and sample the incident signal from the TDR source and a time domain reflection (TDR) signal or a time domain transmission (TDT) signal from the DUT to produce an incident waveform and a TDR/TDT waveform, one or more processors configured to execute code to cause the one or more processors to: control a clock synthesizer to produce the sample clock and the source control signal, and use a period of the TDR source, a period of the sample clock, and the number of samples to determine time locations for samples in the incident waveform and the TDR/TDT waveform, and a display configured to display the incident waveform and the TDR/TDT waveform.
    Type: Grant
    Filed: May 2, 2022
    Date of Patent: February 13, 2024
    Assignee: Tektronix, Inc.
    Inventor: Kan Tan
  • Publication number: 20240044968
    Abstract: A test and measurement instrument includes a user interface, one or more probes to connect to a device under test (DUT), and one or more processors to take measurements during application of a double pulse test to the DUT to create measurement data, identify a measurement start point, find a measurement stop point, use the measurement data between the measurement start point and the measurement stop point to determine an output charge, Qoss, of the DUT, and display the output charge to a user. A method of determining output charge of a device under test (DUT) includes taking measurements during application of a double pulse test to create measurement data, identifying a measurement start point, finding a measurement stop point, using the measurement data between the measurement start point and the measurement stop point to determine an output charge, Qoss, of the DUT, and displaying the output charge.
    Type: Application
    Filed: July 28, 2023
    Publication date: February 8, 2024
    Applicant: Tektronix, Inc.
    Inventors: Vivek Shivaram, Niranjan R. Hegde, Krishna N H Sri, Abhishek Naik, Shubha B, Yogesh M. Pai, Venkatraj Melinamane
  • Publication number: 20240044975
    Abstract: A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.
    Type: Application
    Filed: October 17, 2023
    Publication date: February 8, 2024
    Applicant: Tektronix, Inc.
    Inventors: Pirooz Hojabri, Joshua J. O'Brien, Gregory A. Martin, Patrick Satarzadeh, Karen Hovakimyan
  • Publication number: 20240036079
    Abstract: A current measurement device includes a shunt having sense leads, the shunt configured to be located in a current path for a current to be measured, and a Rogowski coil at least partially wrapped around the shunt, the current measuring device configured to combine signals from the shunt and the Rogowski coil. A current measurement device includes a shunt having sense leads configured to be located in a current path for a current to be measured, a Rogowski coil in series with the sense leads and at least partially wrapped around the shunt, a compensating pole connected to the Rogowski coil, and an isolation barrier connected to the compensating pole.
    Type: Application
    Filed: July 21, 2023
    Publication date: February 1, 2024
    Applicant: Tektronix, Inc.
    Inventors: Daniel G. Knierim, David L. Knierim
  • Publication number: 20240036143
    Abstract: A system for measuring characteristics of wide bandgap Devices Under Test (DUTs) includes a testing fixture including one or more wide bandgap DUTs, and a measurement instrument having one or more processors configured to apply a stimulus to provoke a response of one or more wide bandgap DUTs, measure the response, graph the response on one or more displays, each display having a vertical scale, and automatically adjusting the vertical scale of the one or more displays until no clipping occurs in the one or more displays. Methods of dynamically configuring a test and measurement instrument based on a particular testing setup are also described.
    Type: Application
    Filed: July 26, 2023
    Publication date: February 1, 2024
    Applicant: Tektronix, Inc.
    Inventors: Shubha B, Krishna N H Sri, Sathish Kumar K, Yogesh M. Pai
  • Publication number: 20240039645
    Abstract: A communication system includes one or more transmitters, each transmitter to: transmit communication signals using a defined signaling protocol with multiple antenna elements to a target receiver, the communication signals containing known specific transmit sequences spread across a frequency spectrum of the communication signals to be detectable only by receivers having the known specific transmit sequences, and receive feedback from the target receiver indicating any errors in reception of the communication signals based upon the known specific transmit sequences, and a machine learning system to use configuration of the multiple antenna elements when the communication signal was sent and the feedback to predict preconfigured settings for transmitters.
    Type: Application
    Filed: July 24, 2023
    Publication date: February 1, 2024
    Applicant: Tektronix, Inc.
    Inventor: Keith R. Tinsley
  • Publication number: 20240027497
    Abstract: A test and measurement instrument has an acquisition system to receive and digitize a batch of waveforms into a batch of digitized waveforms, a memory configured as a raster plane having rows and columns, a graphics processing unit (GPU) capable of processing multiple threads to rasterize the batch of digitized waveforms to the raster plane to form a batch histogram and to group multiple threads into groups of a first type of group, assign each thread group of the first type of group to one column in the raster plane, execute a common instruction per thread group of the first type to populate the raster plane, and transfer the batch histogram upon completion, and a central processing unit (CPU) to receive the batch histogram from the GPU, and display a map of the batch histogram on a display.
    Type: Application
    Filed: July 17, 2023
    Publication date: January 25, 2024
    Applicant: Tektronix, Inc.
    Inventors: Andy K. Lim, Daniel G. Knierim
  • Publication number: 20240028002
    Abstract: A test and measurement system includes a test and measurement instrument configured to receive waveform data from a device under test (DUT) on a manufacturing line, a machine learning system connected to the test and measurement instrument, and one or more processors configured to execute code that causes the one or more processors to: collect optimal tuning parameter data sets from the DUT after the DUT is tuned on the manufacturing line, determine one or more parameter data sets from the optimal tuning parameter data, load the one or more parameter data sets into the DUT, collect waveform data from the DUT for the one or more parameter data sets as training data sets, train the machine learning system using the training data sets, and use the machine learning system after training to produce an output related to the DUT.
    Type: Application
    Filed: July 17, 2023
    Publication date: January 25, 2024
    Applicant: Tektronix, Inc.
    Inventors: Wenzheng Sun, Evan Douglas Smith, John J. Pickerd
  • Publication number: 20240027507
    Abstract: A test and measurement instrument has an arbitrary waveform generator having at least two waveform generators. Each waveform generator includes a signal generator to generate in-phase (I) and quadrature (Q) digital signals according to a selected signal type for a digital constituent output signal, a pulse envelope sequencer to modulate amplitude of the I and Q digital signals, and one or more multipliers to combine the I and Q digital signals with a carrier signal to produce the digital constituent output signal. The arbitrary waveform generator includes a stream manager to produce modulation descriptor words for the waveform generators, a summing block to selectively combine digital constituent output signals to produce a digital multi-constituent output signal, a digital-to-analog converter to convert the digital multi-constituent output signal to an analog output signal, and an internal signal analyzer to receive an analyzer input of one of more of the digital output signals.
    Type: Application
    Filed: July 18, 2023
    Publication date: January 25, 2024
    Applicant: Tektronix, Inc.
    Inventors: Donald J. Dalebroux, Alexander Krauska, Maria Agoston, Alejandro C. Buritica
  • Publication number: 20240027498
    Abstract: A test and measurement instrument includes an input configured to accept an input signal from a Device Under Test, an acquisition memory handler structured to store the input signal as a series of digital samples in an acquisition memory, and a rasterizer structured to generate a histogram of the values of the digital samples prior to or simultaneously with the values being stored in the acquisition memory. Methods of generating a raster display from a series of digital samples from an input display are also described.
    Type: Application
    Filed: July 19, 2023
    Publication date: January 25, 2024
    Applicant: Tektronix, Inc.
    Inventor: Ronald Allan Brown
  • Publication number: 20240027513
    Abstract: A system for determining an amount of time skew between two measurement probes includes a first probe and a second probe and one or more processors configured to measure a current signal from a Device Under Test (DUT) through the first probe, measure a voltage signal from the DUT through the second probe, generate a modeled voltage signal from the measured current signal, compare the modeled voltage signal to the measured voltage signal, and determine the amount of time skew between the first and the second probe from the compared signals. Methods are also described.
    Type: Application
    Filed: July 10, 2023
    Publication date: January 25, 2024
    Applicant: Tektronix, Inc.
    Inventors: Vivek Shivaram, Niranjan R. Hedge, Shubha B, Krishna N H Sri, Yogesh M. Pai, Venkatraj Melinamane