Patents Assigned to Tektronix, Inc.
  • Publication number: 20200212945
    Abstract: A signal generator device includes a digital signal waveform generator to produce a digital signal waveform, a first frequency band signal path having a first frequency band filter to receive the digital signal waveform and to pass first frequency band components of the digital signal waveform, and a first digital-to-analog converter to receive the first frequency band components of the digital signal waveform and to produce a first frequency band analog signal, a second frequency band signal path having a second frequency band filter to receive the digital signal waveform and to pass second frequency band components of the digital signal waveform, a second digital-to-analog converter to receive the second frequency band components of the digital signal waveform and to produce a second frequency band analog signal, and a combining element to combine the first frequency band analog signal and the second frequency band analog signal to produce a wideband analog signal.
    Type: Application
    Filed: September 30, 2019
    Publication date: July 2, 2020
    Applicant: Tektronix, Inc.
    Inventor: Gregory A. Martin
  • Publication number: 20200212926
    Abstract: A signal source device includes at least one digital-to-analog converter, at least one connector, a first output path from the at least one digital-to-analog converter to the at least one connector, and a second output path from the at least one digital-to-analog converter to the at least one connector. A method of generating a analog signal includes generating at least one analog signal from at least one digital-to-analog converter, transmitting a first analog signal of the at least one analog signal along a first output path from the at least one digital-to-analog converter to at least one connector, and transmitting a second analog signal of the at least one analog signal along a second output path from the at least one digital-to-analog converter to the at least one connector.
    Type: Application
    Filed: September 30, 2019
    Publication date: July 2, 2020
    Applicant: Tektronix, Inc.
    Inventors: Gregory A. Martin, Pirooz Hojabri
  • Publication number: 20200212922
    Abstract: A time-interleaved digital-to-analog converter system, comprising a digital pre-distorter configured to receive an input digital signal and an error signal and output a distorted digital signal based on the input digital signal and the error signal; a time-interleaved digital-to-analog converter having a first sample rate, the time-interleaved digital-to-analog converter configured to convert the distorted digital signal to an analog signal; and a calibration system. The calibration system includes an analog-to-digital converter having a second sample rate equal to or lower than the first sample rate, the analog-to-digital converter configured to receive the analog signal and covert the analog signal to a down-sampled digital signal, a discrete-time linear model configured to receive the input digital signal and the error signal and output a model signal, and a combiner to subtract the down-sampled digital signal from the model signal to generate the error signal.
    Type: Application
    Filed: July 30, 2019
    Publication date: July 2, 2020
    Applicant: Tektronix, Inc.
    Inventors: Karen Hovakimyan, Gregory A. Martin, Daniel G. Knierim
  • Publication number: 20200212923
    Abstract: A test and measurement instrument including a digital-to-analog converter having an output sample rate configured to receive a digital sample waveform and a reference clock and output an analog waveform at the sample rate, a waveform synthesizer configured to receive an input waveform having a baud rate and output a digital sample waveform having a baud rate less than the sample rate of the digital-to-analog converter, and a port configured to output the analog waveform.
    Type: Application
    Filed: August 28, 2019
    Publication date: July 2, 2020
    Applicant: Tektronix, Inc.
    Inventors: Gregory A. Martin, Patrick Satarzadeh, John J. Pickerd, Daniel G. Knierim
  • Publication number: 20200209307
    Abstract: A test and measurement device having a signal source, including an impairment generator configured to output an impairment and a waveform synthesizer. The waveform synthesizer receives an input digital signal to be synthesized, receives the impairment, and synthesizes a synthesized digital signal based on the input digital signal and the impairment. The test and measurement instrument also includes a fixed sample rate digital-to-analog converter configured to receive a clock signal and the synthesized digital signal and output an analog signal.
    Type: Application
    Filed: August 12, 2019
    Publication date: July 2, 2020
    Applicant: Tektronix, Inc.
    Inventors: Gregory A. Martin, Patrick Satarzadeh, Karen Hovakimyan, Hungming Chang
  • Publication number: 20200211986
    Abstract: A multilayer circuit board having a central conductor and core layers between a first set of alternating layers and a second set of alternating layers. The central conductor includes a first compound via through the first set of alternating layers, and a second compound via through the second set of alternating layers. A gap extends from a first side of the multilayer circuit board to a second side of the multilayer circuit board. A first array of ground protrusions surrounds the gap and is arranged in a first pattern on the first side of the multilayer circuit board. A second array of ground protrusions surrounds the gap and is arranged in a second pattern on the second side of the multilayer circuit board. A ground path connects the first array of ground protrusions to the second array of ground protrusions.
    Type: Application
    Filed: December 27, 2018
    Publication date: July 2, 2020
    Applicant: Tektronix, Inc.
    Inventor: George S. Curtis
  • Publication number: 20200209290
    Abstract: A test and measurement instrument for extracting waveforms from a differential transmission line without disrupting the differential transmission line. The test and measurement instrument includes a first input configured to receive a voltage waveform from a voltage probe electrically coupled to the differential transmission line that electrically connects a first device and a second device, a second input configured to receive a current waveform from a current probe electrically coupled to the differential transmission line, and one or more processors configured to receive the voltage waveform and the current waveform and determine a voltage of the first device and a voltage of the second device based on the voltage waveform and the current waveform.
    Type: Application
    Filed: December 19, 2019
    Publication date: July 2, 2020
    Applicant: Tektronix, Inc.
    Inventors: P E. Ramesh, Tsuyoshi Miyazaki
  • Publication number: 20200209282
    Abstract: An oscilloscope including an input port for receiving training data including waveforms and corresponding known classifications and a processor for training a plurality of classifiers on the training data. Training includes iteratively applying each classifier to each waveform of the training data to obtain corresponding predicted waveform classifications and comparing the predicted waveform classifications with the known classifications. Classifiers are corrected when predicted waveform classifications does not match the known classifications. Models for each classification are constructed with suggested measurements or actions. Subsequently, live waveform data is captured by the oscilloscope and the classifiers are applied to the live data. When a confidence value for a single classification exceeds a threshold, the waveform data is classified, and suggested measurements or actions are implemented in the oscilloscope based on the classification.
    Type: Application
    Filed: March 6, 2020
    Publication date: July 2, 2020
    Applicant: TEKTRONIX, INC.
    Inventors: Ian R. Absher, Kraig M. Strong
  • Publication number: 20200200794
    Abstract: A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.
    Type: Application
    Filed: June 18, 2018
    Publication date: June 25, 2020
    Applicant: Tektronix, Inc.
    Inventors: Tyler B. Niles, Daniel G. Knierim, Michael J. Wadzita, Joshua J. O'Brien, David Everett Burgess
  • Publication number: 20200191831
    Abstract: An abstracted digital memory acquisition circuit, including an analog input configured to receive an analog signal, an analog-to-digital converter configured to receive the analog signal and convert the analog signal to a first digital signal, a digital input configured to receive a second digital signal, a controller configured to receive the first digital signal and the second digital signal and output a stream of bits, the stream of bits including the first digital signal and the second digital signal, and a control signal, and an output configured to electrically connect to a digital input of a test and measurement instrument and output the stream of bits and the control signal.
    Type: Application
    Filed: December 17, 2018
    Publication date: June 18, 2020
    Applicant: Tektronix, Inc.
    Inventor: Jonathan D. Clem
  • Patent number: 10684311
    Abstract: The disclosure includes an electro-optical sensor. The electro-optical sensor includes a test signal input to receive a test signal from a device under test (DUT). A bias circuit is employed to generate a bias signal. The electro-optical sensor also includes a Mach-Zehnder Modulator (MZM) that employs an optical input, an optical output, and a bias input. The MZM is configured to receive an optical carrier signal via the optical input. The MZM also receives both the test signal and the bias signal on the bias input. The MZM modulates the test signal from the bias input onto the optical carrier to generate an optical signal while operating in a mode selected by the bias signal. The MZM also outputs the optical signal over the optical output.
    Type: Grant
    Filed: April 9, 2018
    Date of Patent: June 16, 2020
    Assignee: Tektronix, Inc.
    Inventors: Michael J. Mende, Richard A. Booman
  • Patent number: 10680588
    Abstract: Methods of triggering a test and measurement instrument having a plurality of inputs include the step of generating a trigger signal in response to every occurrence of any one of a plurality of specified trigger events. A first specified trigger event occurs in at least a first one of the inputs and a second specified trigger event occurs in at least a second one of the plurality of inputs. A specified trigger event may include at least one selected input from the plurality of inputs and a selected activity type. Some methods include configuring each of a plurality of event activity detectors to produce a pulse in a logic signal in response to every occurrence of one of the specified trigger events. The plurality of logic signals are combined in a logical OR circuit to generate the trigger signal. Trigger circuits configured according to these methods are also disclosed.
    Type: Grant
    Filed: January 13, 2016
    Date of Patent: June 9, 2020
    Assignee: Tektronix, Inc.
    Inventors: Patrick A. Smith, Daniel G. Knierim
  • Patent number: 10670632
    Abstract: A test and measurement instrument can include an input to receive an analog signal, a sampler to produce digital sample data corresponding to the analog signal, a buffer to store a portion of the sample data, a memory to store sample data from the buffer, a plurality of comparators to establish a vertical range, and a controller configured to configure the plurality of comparators to establish a first vertical range based on sample data in the buffer, and determine whether any of the sample data in the buffer transitions outside the first vertical range during a period of time.
    Type: Grant
    Filed: April 13, 2018
    Date of Patent: June 2, 2020
    Assignee: Tektronix, Inc.
    Inventors: David A. Holaday, Joshua J. O'Brien
  • Publication number: 20200168066
    Abstract: A method of capturing instrument data using a communications device includes sending an actuation signal to a camera to take a photograph of at least one instrument, one of either transmitting or receiving a trigger message between the communications device and the at least one instrument, storing the photograph in a memory on the communications device, determining associated information for the photograph, and transmitting the photograph, associated information and user information to a network.
    Type: Application
    Filed: November 26, 2019
    Publication date: May 28, 2020
    Applicant: Tektronix, Inc.
    Inventors: Frederick B. Kuhlman, III, Shane L. Arnold
  • Publication number: 20200166546
    Abstract: A method of classifying waveform data includes receiving input waveform data at a test and measurement system, accessing a repository of reference waveform data and corresponding classes, analyzing the input waveform data and the reference waveform data to designate a class of the input waveform data, and using the class designation to provide information to a user. A test and measurement system has a user interface, at least one input port, a communications port, a processor, the processor configured to execute instructions causing the processor to: receive input waveform data through at least one of the input port or the user interface; access a repository of reference waveform data; analyze the input waveform data using the reference waveform data; designate a class of the input waveform data; and use the class to provide information to the user about the input waveform.
    Type: Application
    Filed: November 26, 2019
    Publication date: May 28, 2020
    Applicant: Tektronix, Inc.
    Inventors: Joshua J. O'Brien, Brian S. Mantel
  • Patent number: 10666321
    Abstract: A sampling gate comprising a first frequency input coupled to a first frequency path from a broadband photodiode. The sampling gate also includes a positive bias input coupled to a positive offset portion of a second frequency path from the broadband photodiode. The sampling gate also includes a negative bias input coupled to a negative offset portion of the second frequency path from the broadband photodiode. The sampling gate combines a first frequency signal from the first frequency path and a second frequency signal from the second frequency path to create a combined broadband frequency signal from the broadband photodiode.
    Type: Grant
    Filed: December 29, 2016
    Date of Patent: May 26, 2020
    Assignee: Tektronix, Inc.
    Inventor: Noah Brummer
  • Patent number: 10656183
    Abstract: A test and measurement instrument, such as an oscilloscope, including one or more ports to receive one or more signals from a device under test, a trigger enable logic circuit configured to output a trigger enabled signal when a trigger enable event occurs within the one or more signals, the trigger enable event being a real-time event of the one or more signals, one or more trigger logic circuits configured to generate a plurality of trigger signals when the trigger enable signal is received, each trigger signal being generated when a trigger event occurs within one of the one or more signals, and an acquisition circuit configured to acquire and store data in a memory in response to each of the trigger signals.
    Type: Grant
    Filed: October 27, 2017
    Date of Patent: May 19, 2020
    Assignee: Tektronix, Inc.
    Inventors: David L. Kelly, Jed H. Andrews, Patrick A. Smith, Michael A. Martin
  • Publication number: 20200136282
    Abstract: A device can include a coaxial connector that has a signal portion to electrically couple with a signal portion of a printed circuit board (PCB) to enable transmission of a signal therebetween, a ground portion to electrically couple with a ground portion of the PCB, and a mounting to interact with a mounting component to secure the coaxial connector to the PCB. A compressible and conductive component can be positioned and deformed between the ground portion of the coaxial connector and the ground portion of the PCB.
    Type: Application
    Filed: April 17, 2018
    Publication date: April 30, 2020
    Applicant: Tektronix, Inc.
    Inventor: Devin M. Bingham
  • Patent number: 10628284
    Abstract: Disclosed herein are systems and methods for converting physical input signals into bitstreams using syntax trees regardless of the physical input signal's protocol. Using declarative language definitions within a protocol declaration, a test and measurement system can compile a syntax tree that automatically translates the input data into a proper bitstream output. The declarative language definitions within the protocol declaration allow custom or standard protocol rules to be written for multiple or arbitrary input protocols without writing unsafe functions, having to access memory, or debugging more complex language codes.
    Type: Grant
    Filed: April 9, 2018
    Date of Patent: April 21, 2020
    Assignee: Tektronix, Inc.
    Inventors: Mark Anderson Smith, Michael Scott Silliman, Andrew Loofburrow, Eric T. Anderson
  • Publication number: 20200116805
    Abstract: A test and measurement instrument, comprising at least one port configured to receive a signal from a device under test; a user interface configured to receive a user input, the user input indicating magnetic properties of a magnetic material of the device under test, and one or more processors. The one or more processors are configured to generate a hysteresis loop mask based on the magnetic properties of the magnetic material, determine whether the signal received from the device under test violates the hysteresis loop mask, and generate an alert when the signal received from the device under test violates the hysteresis loop mask. The test and measurement instrument may also include a display configured to display the hysteresis loop mask, the signal received from the device under test, and/or the alert.
    Type: Application
    Filed: October 15, 2018
    Publication date: April 16, 2020
    Applicant: Tektronix, Inc.
    Inventors: U N Vasudev, Gajendra Kumar Patro, Krishna N H Sri