Abstract: A test and measurement instrument includes a spectrogram generator for producing a first spectrogram image from an input signal, a display for showing the spectrogram image, and a user interface operating in conjunction with the display, the user interface including one or more user controllable inputs and the user interface configured to detect a user action, where the spectrogram generator is structured to produce a second spectrogram image, different from the first spectrogram image, based on the detected user action by the user interface. Methods of automatically generating spectrograms based on user actions are also described.

Abstract: A test and measurement accessory has a shunt configured to be located in a current path between a busbar and an electronic module and structured to minimize length added to the current path, the shunt having an opening extending through the shunt, and a resistive portion, the resistive portion configured to form a portion of the current path, and two or more contacts, at least one of the contacts extending through the opening and electrically insulated from the resistive portion of the shunt. A test and measurement accessory has a shunt, two or more contacts, at least one of the contacts extending through the opening, and a resistive portion comprising a plurality of resistors surrounding an insulative portion. A test and measurement accessory has a shunt including a washer having an opening, a resistive portion, and two or more contacts.

Abstract: A current measurement device with a shunt resistor of a resistive core with an opening and measurement leads, a Rogowski coil with electrical contacts surrounding the resistive core, conductive layers on first and second sides of the resistive core, one or more insulative layers between the conductive layers and the Rogowski coil, the current measurement device configured to combine signals from the shunt resistor and the Rogowski coil. The current measurement device may have a Rogowski coil on a flexible substrate at least partially wrapped around the shunt. A current measurement device has a rigid substrate, vias filled with a conductive material through the rigid substrate, conductive layers on the top surface and the bottom surface connecting to the vias to form a Rogowski coil structure, one or more insulative layers directly on the coil structure, a shunt resistor directly on the one or more insulative layers.

Abstract: A test and measurement probe device is disclosed. In some implementations, the device may include one or more sensors. In addition, the device may include a plurality of analog signal paths, each analog signal path connected to one of the one or more sensors. The device may include an adjustable gain element within each analog signal path. Moreover, the device may include a combiner to combine the output of each adjustable gain element together to produce a probe output signal. Also, the device may include a digital path including a processor, where the processor is configured to compute a gain value for at least one adjustable gain element.

Abstract: A test monitor extracts waveforms from a differential transmission line of an automobile network without disrupting the differential transmission line, and stores the data decoded from the extracted waveforms. The test monitor includes a first input configured to receive a voltage waveform from a voltage probe electrically coupled to the differential transmission line that electrically connects a first ECU device and a second device, a second input configured to receive a current waveform from a current probe electrically coupled to the differential transmission line, and one or more processors configured to receive the voltage waveform and the current waveform and determine a voltage of the first ECU device and a voltage of the second device based on the voltage waveform and the current waveform. The test monitor may be embodied in an FPGA. The test monitor enables monitoring of message transfers across a network in a non-intrusive and non-invasive manner, without the necessity of using a repeater or switch.

Abstract: A probe may include a probe head with a probe tip for connecting to a device under test (DUT), and a probe body for electro-mechanically connecting to a channel of a test and measurement instrument, the channel having a pre-assigned color identifier. The probe may include a probe cable connected between the probe head and the probe body. The probe may include a light source, and an optical fiber having a first end coupled to the light source and a second end coupled to the probe head. The probe head has a channel indicator coupled to the optical fiber. The probe has communication and control circuitry configured to, when the probe is connected to the channel of the test and measurement instrument, cause the light source and the channel indicator to illuminate in a color matching the color identifier of the channel.

Abstract: A test and measurement device has an interface, one or more connectors, each connector to allow the test and measurement device to connect to a test and measurement instrument, and one or more processors, the one or more processors configured to execute code to cause the one or more processors to: receive one or more user inputs through the interface identifying one or more tests to perform on a device under test (DUT); form a connection through one of the one or more connectors to the DUT to perform the one or more tests and receive test result data; apply one or more machine learning models to the test result data to identify potentially anomalous test results; and generate and present a representation of the test result data and the potentially anomalous test results.

Abstract: A test and measurement system includes a proximity coupling device to transmit a wireless carrier signal and a proximity integrated circuit card to load modulate the transmitted wireless carrier signal to generate a BPSK-modulated subcarrier signal on the transmitted wireless carrier. A test and measurement instrument acquires the wireless carrier signal and includes a BPSK subcarrier filtering demodulator to demodulate the carrier signal including the BPSK-modulated subcarrier signal without performing down conversion of the wireless carrier signal. The BPSK subcarrier filtering demodulator low pass filters the wireless carrier signal including the BPSK-modulated subcarrier signal to generate a low pass filtered BPSK-modulated subcarrier signal and detects amplitude peaks in the low pass filtered BPSK-modulated subcarrier signal. The BPSK subcarrier filtering demodulator generates a BPSK-demodulated signal in response to the detected amplitude peaks.

Abstract: A test system includes a test and measurement instrument, ovens to hold devices under test (DUT), each oven having an oven switch selectably connected to the DUTs, channel switches selectably connected to the oven switches and to one channel of the instrument, one or more processors to: select an oven and its oven switch, connect that oven switch to a subset of DUTs in that oven, connect the channel switches to that oven switch to receive signals from the subset of DUTs, send the signals to channels of the instrument to acquire waveforms from the subset of DUTs in parallel, and repeat connecting of the channel switches and that oven switch until the instrument has acquired waveforms from each DUT in that oven, use machine learning to tune each DUT, test whether each DUT in that oven is optimally tuned, and repeat until all DUTs have been tuned and tested.

Abstract: A test and measurement probe system, including an input to receive an input signal, the input signal including a low frequency (LF) and/or direct current (DC) component and an alternating current (AC) component, an extractor circuit, such as an AC coupling circuit or a LF and/or DC rejection circuit, configured to receive the input signal and to separate the AC component and the LF and/or DC component from the input signal, a first output to output the alternating current component to the test and measurement instrument, and a second output to output the direct current component to the test and measurement instrument. In some embodiments, the LF and/or DC component is digitized prior to being output by the second output.

Abstract: A test and measurement instrument connects to one or more devices under test (DUT) having tuning screws, and to a robot, and has one or more processors to: command the robot to position the tuning screws on the DUTs to one or more sets of positions, each set of positions being a parameter set for the tuning screws, acquire a set of operating parameters for each parameter set from the DUTs, generate a parameter set image for each set, create a combined image of the parameter set images, provide the combined image to a machine learning system to obtain a predicted set of values, adjust the predicted set of values to produce a set of predicted positions, command the robot to position the tuning screws to positions in the set of predicted positions, obtain a set of tuned operating parameters from the DUTs, and validate operation of the DUTs.

Abstract: A cable assembly has a connector to receive a signal, a cable connected to the connector, the cable having a length and one or more conductors along at least part of the length to conduct the signal, a magnetic material external to the one or more conductors, and an elastomer material external to the one or more conductors. A cable assembly has a connector to receive a differential signal, a cable connected to the connector having symmetric pair conductors, one or more discrete magnetic components spaced along the length of the cable, and one or more elastomer components next to at least one of the one or more magnetic components. A cable assembly has a connector to receive a differential signal, a cable connected to the connector having symmetric pair conductors, an elastomer material at least partially enclosing the cable, and a magnetic material at least partially enclosing the cable.

Abstract: A test and measurement instrument includes one or more channels to receive a signal under test, each channel comprising an input port, a filter, and a sampler, at least one analog-to-digital converter (ADC), the at least one ADC having two pipes connected to the sampler of one of the one or more channels, the at least one ADC to produce digital samples of the signal at a sample rate, and one or more processors configured to execute code that causes the one more processors to acquire a spectrum of the digital samples for each pipe in the at least one ADC, and use the spectrums of the digital samples for each pipe in the at least one ADC to reconstruct the spectrum of the signal under test. A method of operating a test and measurement instrument, and a method a method of calibrating a test and measurement instrument is included.

Abstract: A test and measurement system includes a machine learning system configured to communicate with a test automation system, a user interface configured to allow a user to provide one or more user inputs and to provide results to the user, and one or more processors, the one or more processors configured to execute code that causes the one or more processors to receive one or more user inputs through the user interface, the one or more user inputs at least identifying a selected machine learning system configuration to be used to configure the machine learning system, receive a waveform created by operation of a device under test, apply the configured machine learning system to analyze the waveform, and provide an output of predicted metadata about the waveform.

Abstract: A test and measurement device has a port to receive a signal from a device under test (DUT), one or more analog-to-digital converters (ADC) to digitize the signal to create one or more waveforms, a display, and one or more processors configured to execute code that causes the one or more processors to: generate a histogram from the waveform, the histogram having one or more dimensions; and calculate one or more entropy values for each of the one or more dimensions. A method includes receiving a signal from a device under test (DUT) at a test and measurement device, digitizing the signal using one or more analog-to-digital converters (ADC) to produce a waveform, generating a histogram from the waveform, the histogram having one or more dimensions, and calculating one or more entropy values for each of the one or more dimensions.

Abstract: An input selector for electrically connecting one of a plurality of test signals from a device under test to a test and measurement instrument includes a multiplexer having multiple inputs, each of the multiple inputs coupled to a different one of the plurality of test signals from the device under test, and having an output of a selected one of the multiple inputs, and an amplifier coupled to the output of the multiplexer for amplifying the selected test signal of the device under test before being sent as an output of the input selector to the test and measurement instrument. In alternative architectures, two or more amplifiers are coupled to the plurality of test signals, and the multiplexer selects an output of one of the two amplifiers to pass to a measurement instrument for testing.

Abstract: A test and measurement instrument has an input to receive a signal under test having a repeating pattern. one or more analog-to-digital converters (ADC) to sample the signal under test at a sample rate over many repeating patterns to digitize the signal, one or more processors configured to execute code to cause the one or more processors to: recover a clock from the sampled signal under test, use the clock to generate an original pattern waveform, interpolate and resample from the original pattern waveform to generate an evenly time-spaced pattern waveform, apply an equalizer to the evenly time-spaced pattern waveform to produce an equalized pattern waveform, interpolate and resample from the equalized pattern waveform to produce a new waveform having equalized samples at sample times of the sampled signal under test, recover an updated clock from the new waveform, and use the updated clock to produce an updated waveform.

Abstract: A test and measurement instrument includes an input for receiving a pulse amplitude modulated n-level (PAMn) signal, an analog-to-digital converter (ADC) coupled to the input to digitize the PAMn signal, an acquisition memory coupled to the ADC and configured to store at least a portion of the digitized PAMn signal as a waveform, trigger circuitry coupled to the ADC and to the acquisition memory, and configured to generate a trigger signal to cause the test and measurement instrument to trigger an acquisition of the waveform, PAMn clock and data recovery (CDR) circuitry configured to decode bits from the PAMn signal, and transition detection logic circuitry coupled to the PAMn CDR circuitry and to the trigger circuitry, and configured to detect symbol transitions based on the decoded bits, and to cause the trigger circuitry to generate the trigger signal in response to detecting a particular symbol transition.