Abstract: A universal power probe fixture (UPPF) that is configured to be installed into a power signal path between a source device and a load device has one or more UPPF base modules, each UPPF base module including an input terminal block, an output terminal block, and a power transfer circuit including a multiple signal lines electrically connected between the input terminal block and the output terminal block, the signal lines structured to convey high power, and each of the signal lines includes a current probe connection point and at least one voltage probe connection point. The UPPF also has a source device connector adapted to electrically connect the source device to the input terminal block, and a load device connector adapted to electrically connect the load device to the output terminal block. A test system using the UPPF, and an application-specific electric vehicle motor probe adapter are also disclosed.

Abstract: A system to classify signals includes an input to receive incoming waveform data; a memory, and one or more processors configured to execute code to cause the one or more processors to: generate a ramp sweep signal from the incoming waveform data, locate a data burst in the incoming waveform data using a burst detector, receive a signal from the burst detector to cause the memory to store cyclic loop image data in the form of the incoming waveform data as y-axis data and the ramp sweep signal as x-axis data, and employ a machine learning system to receive the cyclic loop image data and classify the data burst. A method of classifying signals includes generating a ramp sweep signal from incoming waveform data, locating a data burst in the incoming waveform data, storing cyclic loop image data for the data burst in the form of the incoming waveform data as Y-axis data and the ramp sweep signal as X-axis data, and using a machine learning system to receive the cyclic loop image and classify the data burst.

Abstract: An isolated differential current shunt measurement probe for a test and measurement system having an isolation barrier between an input side and output side of the probe. The input side is configured to receive a voltage signal across a current shunt connected to a device under test and transmit the voltage signal across the isolation barrier. The output side is configured to receive the voltage signal across the isolation barrier and output the voltage signal to a test and measurement instrument.

Abstract: An oscilloscope includes input channels for receiving at least one voltage signal and at least one current signal from at least one component of a photovoltaic power system under test (SUT), a user interface including a display and one or more controls for receiving one or more test configuration settings from a user, and one or more processors configured to acquire waveforms of the at least one voltage signal and the at least one current signal, and implement a photovoltaic power system compliance test module that automatically determines, in real-time, one or more SUT performance measurements based on the acquired voltage and current waveforms and the one or more test configuration settings, displays, in real-time, the one or more SUT performance measurements to the user on the display. Methods of performing automated hardware-in-the-loop testing of a photovoltaic power system under test using an oscilloscope are also disclosed.

Abstract: A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.

Abstract: A test and measurement system has a test and measurement instrument having an adaptor with an interface configured to communicate through one or more communications links with a new device under test to receive new test results, a memory configured to store a database of test results and a database of analyzed test results related to tests performed with one or more prior devices under test, a data analyzer connected to the test and measurement instrument through the one or more communications link, the data analyzer configured to analyze the new test results based on the stored test results, and a health score generator configured to generate a health score for the new device under test based on the analysis from the data analyzer.

Abstract: A measurement probe for producing a test signal for a measurement instrument includes a probe head structured to be connected to at least a first testing point and a second testing point of a Device Under Test (DUT), a current detector in the measurement probe structured to determine a current flowing between the first testing point and the second testing point of the DUT, a first selectable signal path that causes a voltage signal from the first testing point or a voltage signal from the second testing point to be routed to the measurement instrument as a selected voltage test signal, and a second selectable signal path that causes a current signal from an output of the current detector to be routed to the measurement instrument as a selected current test signal. Methods of testing a DUT using the measurement probe are also described, as well as a system for measuring signals from a DUT using the measurement probe.

Abstract: A test and measurement system includes a machine learning system, a test and measurement device including a port configured to connect the test and measurement device to a device under test (DUT), and one or more processors, configured to execute code that causes the one or more processors to: acquire a waveform from the device under test (DUT), transform the waveform into a composite waveform image, and send the composite waveform image to the machine learning system to obtain a bit error ratio (BER) value for the DUT. A method of determining a bit error ratio for a device under test (DUT), includes acquiring one or more waveforms from the DUT, transforming the one or more waveforms into a composite waveform image, and sending the composite waveform image to a machine learning system to obtain a bit error ratio (BER) value for the DUT.

Abstract: A heat spreader may include a body having a first surface and a second surface opposite the first surface. Also, the heat spreader may include a wall disposed along a perimeter of the body, the wall extending from the first surface, the wall having a plurality of cut-outs. Furthermore, the heat spreader may include at least one channel extending from a first edge of the body to a second edge of the body parallel to the first edge, where the at least one channel disposed in a first cut-out of a first side of the wall and in a second cut-out of a second side of the wall opposite the first side.

Abstract: A test and measurement instrument having an integrated analog front end that includes one or more amplifiers, the one or more amplifiers implemented on a high-speed amplifier integrated circuit die, a controlled-impedance signal path between an input and a reference voltage, the controlled-impedance signal path including one or more signal taps and one or more controlled-impedance attenuator stages, the one or more controlled-impedance attenuator stages implemented on the amplifier integrated circuit die, and a switching network structured to selectively couple a signal tap of the controlled-impedance signal path to a respective amplifier of the one or more amplifiers, the switching network implemented on the amplifier integrated circuit die

Abstract: A test and measurement instrument includes an input to receive a non-return-to-zero (NRZ) waveform signal from a device under test, a ramp generator to use the NRZ waveform signal to generate a ramp sweep signal, a gate to gate the ramp sweep signal and the NRZ waveform signal to produce gated X-axis and Y-axis data, and a display to display the gated X-axis and Y-axis data as a cyclic loop image. A method of generating a cyclic loop image includes receiving an input waveform, using the input waveform to generate a ramp sweep signal, gating the ramp sweep signal and the input waveform to produce gated X-axis and Y-axis data, and displaying the gated X-axis and Y-axis data as a cyclic loop image.

Abstract: A test and measurement instrument has a user interface configured to allow a user to provide one or more user inputs, a display to display results to the user, a memory, one or more processors configured to execute code to cause the one or more processors to receive a waveform array containing waveforms resulting from sweeping one or more parameters from a set of parameters, recover a clock signal from the waveform array, generate a waveform image for each waveform, render the waveform images into video frames to produce an image array of the video frames, select at least some of the video frames to form a video sequence, and play the video sequence on a display.

Abstract: A test and measurement device includes an interface configured to acquire analog three-phase signals from a device under test, and a processor programmed to execute instructions that cause the processor to perform a direct-quadrature-zero, DQ0, transformation and produce DQ0 signals based on the analog three-phase signals, and measure performance of the device under test based on the DQ0 signals. A method includes acquiring three-phase signals from a device under test, performing a direct-quadrature-zero, DQ0, transformation on the three-phase signals to produce DQ0 signals, and using the DQ0 signals to measure performance of the device under test.

Abstract: A communication network has multiple nodes, each node having one or more antennas, one or more input ports to receive communication signals from the antenna, a memory to store data associated with the communication signals, and one or more processors to gather local data about an environment, communicate with other nodes as needed, and use the local data to determine optimized operational settings for the node. A sensor device has one or more antennas to receive communication signals from other nodes in a communication network, one or more input ports to receive the communication signals, one or more output ports to transmit communication signals, a memory to store data associated with the communication signals, and one or more processors to determine a position of the sensor, transmit signals, receive return signals, produce return signal data, and use a machine learning system on the return signal data to identify unblocked ports.

Abstract: A margin tester including an identification reader configured to receive an adaptor identifier of an adaptor, an interface configured to connect to a device under test through the adaptor, and one or more processors configured to assess a margin, such as an electrical margin or an optical margin, of a device under test and tag the assessment with the adaptor identifier. Assessing the margin can include assessing the margin based on an expected margin that is predicted or provided based on the adaptor identifier.

Abstract: A margin testing device includes at least one interface structured to connect to a device under test (DUT) one or more controllers structured to create a set of test signals based on a sequence of pseudo random data and one or more pre-defined parameters, and an output structured to send the set of test signals to the DUT. Methods and a system for testing a DUT with the disclosed margin tester and other testing device are also described.

Abstract: A cable structured to be repeatedly connected to a device, each repeated connection causing degradation of the cable, the cable including a condition indicator disposed on the cable and configured to be updated with each successive connection of the cable into the device.

Abstract: A method of securing a probe tip to a device under test (DUT), the method comprising: positioning the probe tip near a test point of the DUT, the probe tip comprising a connection point on a signal-path portion of the probe tip and an attachment tab, the connection point making an electrical connection with the test point of the DUT, the attachment tab extending away from the signal-path portion of the probe tip; applying an adhesive to the DUT through a hole in the attachment tab of the probe tip; and curing the adhesive to secure the probe tip to the DUT.