Patents Assigned to Tektronix, Inc.
  • Patent number: 10345339
    Abstract: Embodiments of the present invention provide techniques and methods for improving signal-to-noise ratio (SNR) when averaging two or more data signals by finding a group delay between the signals and using it to calculate an averaged result. In one embodiment, a direct average of the signals is computed and phases are found for the direct average and each of the data signals. Phase differences are found between each signal and the direct average. The phase differences are then used to compensate the signals. Averaging the compensated signals provides a more accurate result than conventional averaging techniques. The disclosed techniques can be used for improving instrument accuracy while minimizing effects such as higher-frequency attenuation. For example, in one embodiment, the disclosed techniques may enable a real-time oscilloscope to take more accurate S parameter measurements.
    Type: Grant
    Filed: April 29, 2016
    Date of Patent: July 9, 2019
    Assignee: Tektronix, Inc.
    Inventors: Kan Tan, John J. Pickerd
  • Publication number: 20190207614
    Abstract: An arbitrary waveform generator including a first processor configured to output first digital data, a second processor configured to output second digital data, a first digital-to-analog converter to receive the first digital data from the first processor and output a first analog signal representing the first digital data, a second digital-to-analog converter to receive the second digital data from the second processor and output a second analog signal representing the second digital data, a system phase detector to receive the first analog signal and the second analog signal and determine a phase difference between the first analog signal and the second analog signal, and a controller configured to receive the phase difference from the system phase detector and determine a delay time for the first processor to delay an output of third digital data based on the phase difference.
    Type: Application
    Filed: December 30, 2017
    Publication date: July 4, 2019
    Applicant: Tektronix, Inc.
    Inventors: Geoffrey D. Cheren, Jordan Edgar, Brett Trevor, Brandon Z. Fry
  • Publication number: 20190204356
    Abstract: A mechanism is included for receiving a phase modulated optical signal. The phase modulated signal is modulated by a remote electrical test signal at a sensor head. A reference optical signal is also received. A phase difference between the phase modulated optical signal and the reference optical signal is then determined. The phase difference is employed to recover the remote electrical test signal from the sensor head. The phase difference may be determined by employing a phase modulator in a controller that tracks a phase modulator in the sensor head. The phase difference may also be determined by comparison of the signals in the complex signal domain.
    Type: Application
    Filed: December 31, 2017
    Publication date: July 4, 2019
    Applicant: Tektronix, Inc.
    Inventors: Michael J. Mende, Daniel G. Knierim, Richard A. Booman
  • Publication number: 20190207830
    Abstract: A network oscilloscope, including a network interface configured to receive a stream of network data, one or more processors, and a display. The one or more processors generate a timestamp for each data packet parsed from the stream of network data, extract a portion of information from each of the data packets received from the stream of network data, the portion of information being less than an entirety of information in each data packet, and generate a data record indicating extracted information and a timestamp for each data packet parsed from the stream of network data. The display configured to display at least a portion of the data record.
    Type: Application
    Filed: November 30, 2018
    Publication date: July 4, 2019
    Applicant: Tektronix, Inc.
    Inventors: Thomas E. Chabreck, George W. Tusing, Michael S. Overton
  • Patent number: 10340931
    Abstract: An arbitrary waveform generator including a first processor configured to output first digital data, a second processor configured to output second digital data, a first digital-to-analog converter to receive the first digital data from the first processor and output a first analog signal representing the first digital data, a second digital-to-analog converter to receive the second digital data from the second processor and output a second analog signal representing the second digital data, a system phase detector to receive the first analog signal and the second analog signal and determine a phase difference between the first analog signal and the second analog signal, and a controller configured to receive the phase difference from the system phase detector and determine a delay time for the first processor to delay an output of third digital data based on the phase difference.
    Type: Grant
    Filed: December 30, 2017
    Date of Patent: July 2, 2019
    Assignee: Tektronix, Inc.
    Inventors: Geoffrey D. Cheren, Jordan Edgar, Brett Trevor, Brandon Z. Fry
  • Patent number: 10330700
    Abstract: A signal acquisition probe stores compressed or compressed and filtered time domain data samples representing at least one of an impulse response or step response characterizing the signal acquisition probe. The compressed or compressed and filtered time domain data samples of the impulse response or the step response are provided to a signal measurement instrument for compensating the signal measurement instrument for the impulse or step response of the signal measurement instrument.
    Type: Grant
    Filed: August 18, 2015
    Date of Patent: June 25, 2019
    Assignee: Tektronix, Inc.
    Inventors: Richard A. Booman, John J. Pickerd
  • Patent number: 10330705
    Abstract: A test and measurement instrument includes a coefficient storage facility coupled to a programmable filter. The coefficient storage facility is configured to store at least two pre-determined filter coefficient sets, and configured to pass a selected one of the at least two pre-determined filter coefficient sets to the filter based on a measurement derived using a compensation oscillator. The measurement may include clock delay and clock skew. In some examples the test and measurement instrument may additionally adjust clock delay and/or clock skew in addition to selecting appropriate filter coefficients.
    Type: Grant
    Filed: December 27, 2016
    Date of Patent: June 25, 2019
    Assignee: Tektronix, Inc.
    Inventors: Daniel G. Knierim, Barton T. Hickman
  • Publication number: 20190170790
    Abstract: A test and measurement probe coupler that may include a substrate, a first signal tap conductor, a first signal contact, a first ground tap conductor, and a first ground contact. The first signal tap conductor may extends a first length along the substrate. The first signal contact may be electrically coupled to the first signal tap conductor, and the first ground tap conductor may extend a second length along the substrate. The first ground tap conductor may be substantially parallel to the first signal tap conductor. The first ground tap conductor may be disposed in a first lateral direction away from the first signal tap conductor, and the first ground contact electrically may be coupled to the first ground tap conductor.
    Type: Application
    Filed: October 16, 2018
    Publication date: June 6, 2019
    Applicant: Tektronix, Inc.
    Inventor: Josiah A. Bartlett
  • Patent number: 10302676
    Abstract: A flexible resistive tip cable assembly includes a probe Radio Frequency (RF) connector structured to receive a RF differential signal and a testing connection assembly. A coaxial cable is structured to conduct the RF differential signal between the probe RF connector and the testing connection assembly. The coaxial cable includes a cable for conducting the differential signal, and a plurality of magnetic elements positioned along a length of the cable and structured to isolate the differential signal from common mode interference. The magnetic elements are separated from adjacent magnetic elements by a gap with elastomeric elements is positioned in each gap to provide cable flexibility. The assembly may also include an Electrically Erasable Programmable Read Only Memory (EEPROM) loaded with an attenuation associated with the flexible resistive tip cable assembly for use in signal testing by a device coupled to the testing connection assembly.
    Type: Grant
    Filed: September 8, 2016
    Date of Patent: May 28, 2019
    Assignee: Tektronix, Inc.
    Inventors: Michael J. Mende, Gary W. Reed, James D. Pileggi, Karl A. Rinder, Richard A. Booman, Martin Van Pelt
  • Patent number: 10274520
    Abstract: A test and measurement instrument, including a splitter configured to split an input signal into two split input signals and output each split input signal onto a separate path and a combiner configured to receive and combine an output of each path to reconstruct the input signal. Each path includes an amplifier configured to receive the split input signal and to compress the split input signal with a sigmoid function, a digitizer configured to digitize an output of the amplifier; and at least one processor configured to apply an inverse sigmoid function on the output of the digitizer.
    Type: Grant
    Filed: September 30, 2015
    Date of Patent: April 30, 2019
    Assignee: Tektronix, Inc.
    Inventors: John J. Pickerd, Kan Tan
  • Publication number: 20190113542
    Abstract: A test-and-measurement instrument is described. A state machine, corresponding to a regular expression, can be stored in the test-and-measurement instrument. The state machine can be modified to reflect a trigger condition received from a user. The modified state machine can then be used to invoke a trigger when the condition is met in the bits of a bit stream.
    Type: Application
    Filed: December 4, 2018
    Publication date: April 18, 2019
    Applicant: Tektronix, Inc.
    Inventors: Aidan A. Daly-Jensen, Keith D. Rule, Dawson C. Green
  • Publication number: 20190104176
    Abstract: Disclosed is a mechanism of operating a Networked Media Open Specifications (NMOS) Application Programming Interface (API) at a node controlling a local device including a local receiver. A flow message is received via the NMOS API. The flow message contains a flow state of a target receiver at a remote node. A local receiver at the local device is configured to mirror the flow state of the target receiver at the remote node. The NMOS API then notifies a registry with an updated flow state of the local receiver at the local device.
    Type: Application
    Filed: December 30, 2017
    Publication date: April 4, 2019
    Applicant: Tektronix, Inc.
    Inventor: Duncan G. Millard
  • Publication number: 20190103999
    Abstract: A continuously or step variable passive noise filter for removing noise from a signal received from a DUT added by a test and measurement instrument channel. The noise filter may include, for example, a splitter splits a signal into at least a first split signal and a second split signal. A first path receives the first split signal and includes a variable attenuator and/or a variable delay line which may be set based on the channel response of the DUT which is connected. The variable attenuator and/or the variable delay line may be continuously or stepped variable, as will be discussed in more detail below. A second path is also included to receive the second split signal and a combiner combines a signal from the first path and a signal from the second path into a combined signal.
    Type: Application
    Filed: August 29, 2018
    Publication date: April 4, 2019
    Applicant: Tektronix, Inc.
    Inventors: John J. Pickerd, Kan Tan, Pirooz Hojabri
  • Patent number: 10241133
    Abstract: A test probe tip can include a resistive element coupled with a tip component. The resistive element can include a resistive layer disposed on an exterior surface of a structural member of the resistive impedance element. In embodiments, the resistive element can be configured to form a structural component of the test probe tip without an insulating covering applied thereto. Additional embodiments may be described and/or claimed herein.
    Type: Grant
    Filed: November 7, 2017
    Date of Patent: March 26, 2019
    Assignee: Tektronix, Inc.
    Inventors: Julie A. Campbell, William A. Hagerup, Ira G. Pollock, Christina D. Enns, James E. Spinar, Kathleen F. M. Ullom, Charles M. Hartmann, Daniel J. Ayres
  • Patent number: 10234501
    Abstract: A sensor head of a test and measurement instrument can include an input configured to receive an input signal from a device under test (DUT), an optical voltage sensor having signal input electrodes and control electrodes or one set of electrodes, wherein the input is connected to the signal input electrodes, and a bias control unit connected to the control electrodes and configured to reduce an error signal or the input signal bias control signal are electrically combined and applied to a single set of electrodes.
    Type: Grant
    Filed: September 16, 2016
    Date of Patent: March 19, 2019
    Assignee: Tektronix, Inc.
    Inventors: Michael J. Mende, Richard A. Booman
  • Patent number: 10228390
    Abstract: Embodiments of the present invention provide an improved cable assembly for connecting an electrical test and measurement probe to a device under test. One end of the probe is connected to a device under test (“DUT”), while the other end is connected to the instrument through one or more cables. To prevent mechanical stresses to the probe-DUT interface caused by the cables' resistance to bending and twisting, embodiments of the improved cable assembly use one or more pliable spines to hold the cable assembly in position after it has been bent or twisted. This provides a more secure connection to the DUT and prevents damage to the probe-DUT interface. Each spine is anchored to the tip of the probe, and may be further secured by an outer housing or additional anchors. A flexible boot may surround the cable assembly and/or outer housing, further protecting the cables from damage. Alternatively, one or more spines may be placed inside the boot.
    Type: Grant
    Filed: August 11, 2015
    Date of Patent: March 12, 2019
    Assignee: Tektronix, Inc.
    Inventors: James H. McGrath, Jr., David Thomas Engquist
  • Patent number: 10225022
    Abstract: An electro-optical sensor comprises an optical input configured to receive an optical carrier via an upstream fiber. The electro-optical sensor also includes an optical modulator configured to modulate an electrical signal onto the optical carrier to create an optical signal. The electro-optical sensor further includes an optical output configured to transmit the optical signal via a downstream fiber. The electro-optical sensor employs a variation output configured to transmit variation data indicating variation in the received optical carrier to support compensation for corresponding variation in the optical signal.
    Type: Grant
    Filed: December 29, 2016
    Date of Patent: March 5, 2019
    Assignee: Tektronix, Inc.
    Inventors: Richard A. Booman, Michael J. Mende, Daniel G. Knierim
  • Publication number: 20190068411
    Abstract: Disclosed is a mechanism for limiting Intersymbol Interference (ISI) when measuring uncorrelated jitter in a test and measurement system. A waveform is obtained that describes a signal. Such waveform may be obtained from memory. A processor then extracts a signal impulse response from the waveform. The processor selects a window function based on a shape of the signal impulse response. Further, the processor applies the window function to the signal impulse response to remove ISI outside a window of the window function while measuring waveform jitter. The window function may be applied by applying the window function to the signal impulse response to obtain a target impulse response. A linear equalizer is then generated that results in the target impulse response when convolved with the signal impulse response. The linear equalizer is then applied to the waveform to limit ISI for jitter measurement.
    Type: Application
    Filed: September 8, 2018
    Publication date: February 28, 2019
    Applicant: Tektronix, Inc.
    Inventor: Kan Tan
  • Patent number: 10215776
    Abstract: Test and measurement probes include a body, an adjustable member moveably coupled to the body and having a changeable position relative to the body, and a transducer subsystem structured to measure the position of the adjustable member and configured to output a position signal indicative of the position of the adjustable member. A change in the position of the adjustable member causes a change in an electrical characteristic of the probe. A position-dependent correction factor may be used to correct the change in the electrical characteristic. Methods of compensating for a change in a response of a test and measurement system include monitoring a position sensor output to detect a position change of a first part of a probe relative to a second part, determining that the position sensor output value has crossed a boundary value between a first and second range, and applying a compensation factor corresponding to the second range to modify the response of the system.
    Type: Grant
    Filed: October 26, 2015
    Date of Patent: February 26, 2019
    Assignee: Tektronix, Inc.
    Inventors: Julie A. Campbell, Josiah A. Bartlett, David A. Sailor, Jay Schwichtenberg
  • Patent number: 10209276
    Abstract: A method of employing a Decision Feedback Equalizer (DFE) in a test and measurement system. The method includes obtaining an input signal data associated with an input signal suffering from inter-symbol interference (ISI). A bit sequence encoded in the input signal data is determined to support assigning portions of the input signal data into sets based on the corresponding bit sequences. The DFE is applied to each set by employing a DFE slicer pattern corresponding to each set, which results in obtaining a DFE adjusted waveform histogram/PDF/waveform database graph for each set adjusted for ISI and accurately captures jitter suppression. The DFE adjusted waveform histogram/PDF/waveform database graphs are normalized and combined into a final histogram/PDF/waveform database graph for determining an eye contour of an eye diagram and jitter measurements.
    Type: Grant
    Filed: September 30, 2016
    Date of Patent: February 19, 2019
    Assignee: Tektronix, Inc.
    Inventor: Kan Tan