Abstract: A test and measurement system includes a network and multiple nodes coupled to the network. Each node incorporates a device under test (DUT), one or more test and measurement instruments, one or more artificial intelligence (AI) models, and one or more processors. The processors are configured to generate measurement training data from the DUT using the test and measurement instruments, train the AI models using the measurement training data, and determine a predictive estimate of a performance metric of the DUT based on outputs of the AI models. The system enables distributed or federated learning across nodes without centralizing raw DUT measurements, allowing each node to refine model parameters locally while optionally sharing model updates. By leveraging locally generated measurement data and AI-based predictive analytics, the system enhances device characterization, reliability assessment, and design workflows while reducing data-handling burdens and preserving device-specific confidentiality.

Abstract: A test and measurement instrument includes one or more processors to acquire first, second, and third phase drive signals applied to a three-phase motor. A motor drive analyzer performs a direct-quadrature-zero, DQZ, transformation on the acquired first, second, and third phase drive signals to produce direct (D), quadrature (Q), and zero (Z) components, and generates an overlapped DQ phasor plot illustrating the D and Q components along with frequency domain representations of the D and Q components. The motor driver analyzer displays, on a user interface, the generated overlapped DQ phasor plot and an overlapped DQ spectra plot from the frequency domain representations of the D and Q components to enable a user to detect motor defects through visual characteristics of the overlapped DQ phasor and DQ spectra plots. The motor driver analyzer removes an offset and filters the D and Q components prior generating the overlapped DQ phasor plot.

Abstract: A system for determining an amount of time skew between two measurement probes includes a first probe and a second probe and one or more processors configured to measure a current signal from a Device Under Test (DUT) through the first probe, measure a voltage signal from the DUT through the second probe, generate a modeled voltage signal from the measured current signal, compare the modeled voltage signal to the measured voltage signal, and determine the amount of time skew between the first and the second probe from the compared signals. Methods are also described.

Abstract: A test and measurement system includes a test and measurement instrument configured to receive waveform data from a device under test (DUT) on a manufacturing line, a machine learning system connected to the test and measurement instrument, and one or more processors configured to execute code that causes the one or more processors to: collect optimal tuning parameter data sets from the DUT after the DUT is tuned on the manufacturing line, determine one or more parameter data sets from the optimal tuning parameter data, load the one or more parameter data sets into the DUT, collect waveform data from the DUT for the one or more parameter data sets as training data sets, train the machine learning system using the training data sets, and use the machine learning system after training to produce an output related to the DUT.

Abstract: A test and measurement instrument has an input port to allow the instrument to receive one or more waveforms from a device under test (DUT), one or more low pass filters to remove a portion of the noise from the one or more waveforms, and one or more processors to: select a waveform pattern from the waveforms, measure noise in the one or more waveforms and generate a noise representation of the noise removed, create one or more images using the waveform pattern and the one or more filtered waveforms, add the noise representation to the one or more images to produce at least one combined image, input the at least one combined image to one or more deep learning networks, and receive one or more predicted values for the DUT.

Abstract: A test and measurement instrument may include a test channel to connect to a device under test (DUT) and analyze signals generated by the DUT. The instrument may include a processor configured to execute code to: measure a first ripple value of a power supply signal from a DUT; measure a first periodic jitter (PJ) value of a high-speed signal, where the high-speed signal is based on the power supply signal; determine a first time interval error (TIE) spectrum from the first PJ value; filter the first TIE spectrum of the first PJ value to receive a second TIE spectrum corresponding to a second PJ value; determine a second ripple value by applying a jitter ratio based on the second PJ value and the first PJ value and a noise factor to the first ripple value; and apply the second ripple value to the power supply signal.

Abstract: A test and measurement system includes a proximity coupling device to transmit a modulated carrier signal and a proximity integrated circuit card to load modulate the transmitted modulated carrier signal and generate a modulated subcarrier signal on the wireless carrier signal. A test and measurement instrument acquires the modulated carrier signal and includes a phase-aligned subcarrier demodulator to demodulate the carrier signal including the modulated subcarrier signal. A demodulator detects commands and responses in the modulated carrier signal, removes the commands, and identifies a correlation index for each response. Each correlation index indicates a phase of the modulated carrier signal of the corresponding response relative to a replica carrier signal. The demodulator adjusts the phase of the replica carrier signal based on the correlation index for each response and down converts each response using the phase-aligned replica carrier signal.

Abstract: A test system includes a test and measurement device having an input port for receiving signals for testing or measuring, a reprogrammable test accessory having an output coupled to the input port of the test and measurement device. The reprogrammable test accessory includes a test port structured to accept one or more test signals from a Device Under Test (DUT), a processor, a reprogrammable data protocol analyzer for determining whether data carried by the one or more test signals from the DUT conform to a predetermined data protocol, and a reprogramming facility for modifying the reprogrammable data protocol analyzer from a first configuration to a second configuration. Methods of operation are also described.

Abstract: A test and measurement system includes a multi-stack test subsystem including a plurality of test and measurement instruments, each instrument coupled to a device under test (DUT) to receive a plurality of test signals from the DUT during a test mode of operation. One test and measurement instrument is designated as a master and the remainder are designated as extension test and measurement instruments. The master communicates control signals to each of the extensions to synchronize the test and measurement instruments to simultaneously acquire the plurality of test signals provided by the DUT. An automation engine is coupled to the multi-stack test subsystem to receive the acquired plurality of test signals from the master, and the automation engine analyzes the acquired test signals to perform validation testing for each of plurality of test signals and simultaneously display results of the validation testing for the plurality of test signals.

Abstract: An input selector for electrically connecting one of a plurality of test signals from one or more devices under test to a test and measurement instrument, the input selector includes a first multiplexer having a first set of multiple inputs, each of the first set of multiple inputs coupled to a different one of the plurality of test signals from one or more devices under test, and having a first output of a selected one of the first multiple inputs, and a second multiplexer having a second set of multiple inputs, each of the second set of multiple inputs coupled to a different one of the plurality of test signals from the one or more devices under test, and having a second output of a selected one of the multiple inputs. Methods are also described.

Abstract: A test and measurement instrument includes a spectrogram generator for producing a first spectrogram image from an input signal, a display for showing the spectrogram image, and a user interface operating in conjunction with the display, the user interface including one or more user controllable inputs and the user interface configured to detect a user action, where the spectrogram generator is structured to produce a second spectrogram image, different from the first spectrogram image, based on the detected user action by the user interface. Methods of automatically generating spectrograms based on user actions are also described.

Abstract: A test and measurement accessory has a shunt configured to be located in a current path between a busbar and an electronic module and structured to minimize length added to the current path, the shunt having an opening extending through the shunt, and a resistive portion, the resistive portion configured to form a portion of the current path, and two or more contacts, at least one of the contacts extending through the opening and electrically insulated from the resistive portion of the shunt. A test and measurement accessory has a shunt, two or more contacts, at least one of the contacts extending through the opening, and a resistive portion comprising a plurality of resistors surrounding an insulative portion. A test and measurement accessory has a shunt including a washer having an opening, a resistive portion, and two or more contacts.

Abstract: A current measurement device with a shunt resistor of a resistive core with an opening and measurement leads, a Rogowski coil with electrical contacts surrounding the resistive core, conductive layers on first and second sides of the resistive core, one or more insulative layers between the conductive layers and the Rogowski coil, the current measurement device configured to combine signals from the shunt resistor and the Rogowski coil. The current measurement device may have a Rogowski coil on a flexible substrate at least partially wrapped around the shunt. A current measurement device has a rigid substrate, vias filled with a conductive material through the rigid substrate, conductive layers on the top surface and the bottom surface connecting to the vias to form a Rogowski coil structure, one or more insulative layers directly on the coil structure, a shunt resistor directly on the one or more insulative layers.

Abstract: A test and measurement probe device is disclosed. In some implementations, the device may include one or more sensors. In addition, the device may include a plurality of analog signal paths, each analog signal path connected to one of the one or more sensors. The device may include an adjustable gain element within each analog signal path. Moreover, the device may include a combiner to combine the output of each adjustable gain element together to produce a probe output signal. Also, the device may include a digital path including a processor, where the processor is configured to compute a gain value for at least one adjustable gain element.

Abstract: A test monitor extracts waveforms from a differential transmission line of an automobile network without disrupting the differential transmission line, and stores the data decoded from the extracted waveforms. The test monitor includes a first input configured to receive a voltage waveform from a voltage probe electrically coupled to the differential transmission line that electrically connects a first ECU device and a second device, a second input configured to receive a current waveform from a current probe electrically coupled to the differential transmission line, and one or more processors configured to receive the voltage waveform and the current waveform and determine a voltage of the first ECU device and a voltage of the second device based on the voltage waveform and the current waveform. The test monitor may be embodied in an FPGA. The test monitor enables monitoring of message transfers across a network in a non-intrusive and non-invasive manner, without the necessity of using a repeater or switch.

Abstract: A probe may include a probe head with a probe tip for connecting to a device under test (DUT), and a probe body for electro-mechanically connecting to a channel of a test and measurement instrument, the channel having a pre-assigned color identifier. The probe may include a probe cable connected between the probe head and the probe body. The probe may include a light source, and an optical fiber having a first end coupled to the light source and a second end coupled to the probe head. The probe head has a channel indicator coupled to the optical fiber. The probe has communication and control circuitry configured to, when the probe is connected to the channel of the test and measurement instrument, cause the light source and the channel indicator to illuminate in a color matching the color identifier of the channel.

Abstract: A test and measurement device has an interface, one or more connectors, each connector to allow the test and measurement device to connect to a test and measurement instrument, and one or more processors, the one or more processors configured to execute code to cause the one or more processors to: receive one or more user inputs through the interface identifying one or more tests to perform on a device under test (DUT); form a connection through one of the one or more connectors to the DUT to perform the one or more tests and receive test result data; apply one or more machine learning models to the test result data to identify potentially anomalous test results; and generate and present a representation of the test result data and the potentially anomalous test results.

Abstract: A test and measurement system includes a proximity coupling device to transmit a wireless carrier signal and a proximity integrated circuit card to load modulate the transmitted wireless carrier signal to generate a BPSK-modulated subcarrier signal on the transmitted wireless carrier. A test and measurement instrument acquires the wireless carrier signal and includes a BPSK subcarrier filtering demodulator to demodulate the carrier signal including the BPSK-modulated subcarrier signal without performing down conversion of the wireless carrier signal. The BPSK subcarrier filtering demodulator low pass filters the wireless carrier signal including the BPSK-modulated subcarrier signal to generate a low pass filtered BPSK-modulated subcarrier signal and detects amplitude peaks in the low pass filtered BPSK-modulated subcarrier signal. The BPSK subcarrier filtering demodulator generates a BPSK-demodulated signal in response to the detected amplitude peaks.

Abstract: A test system includes a test and measurement instrument, ovens to hold devices under test (DUT), each oven having an oven switch selectably connected to the DUTs, channel switches selectably connected to the oven switches and to one channel of the instrument, one or more processors to: select an oven and its oven switch, connect that oven switch to a subset of DUTs in that oven, connect the channel switches to that oven switch to receive signals from the subset of DUTs, send the signals to channels of the instrument to acquire waveforms from the subset of DUTs in parallel, and repeat connecting of the channel switches and that oven switch until the instrument has acquired waveforms from each DUT in that oven, use machine learning to tune each DUT, test whether each DUT in that oven is optimally tuned, and repeat until all DUTs have been tuned and tested.

Abstract: A test and measurement probe system, including an input to receive an input signal, the input signal including a low frequency (LF) and/or direct current (DC) component and an alternating current (AC) component, an extractor circuit, such as an AC coupling circuit or a LF and/or DC rejection circuit, configured to receive the input signal and to separate the AC component and the LF and/or DC component from the input signal, a first output to output the alternating current component to the test and measurement instrument, and a second output to output the direct current component to the test and measurement instrument. In some embodiments, the LF and/or DC component is digitized prior to being output by the second output.