IDENTIFICATION OF DAMAGED TOOLS
Identifying a damaged tool, including capturing, by an optical scanner, images of a manufactured part machined by the damaged tool; determining, from the captured images by a data processor operatively coupled to the scanner, measurements of the part; and determining, by the data processor based upon the measurements, that the tool is damaged.
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This patent application claims the benefit and priority of U.S. Provisional Patent Application No. 61/871,002, filed Aug. 28, 2013, and entitled “Optical Systems For Measuring A Drilled Hole In A Structure And Methods Relating Thereto.”
BACKGROUNDMuch research and manufacturing today requires precision metrology, very accurate measurement and inspection of mass produced and custom components, components in wind turbines, jet engines, combustion gas turbines, nuclear reactors, ships, automobiles, other aviation components, medical devices and prosthetics, 3D printers, plastics, fiber optics, other optics for telescopes, microscopes, cameras, and so on. The list is long, and the problems are large. In inspecting an airframe, for example, an inspection checks the diameter and circularity of each of thousands of holes at different depths to ensure that each hole is perpendicular to a surface, circular in cross section as opposed to elliptical, not conical, not hourglass-shaped, and so on. Such inspections are performed by human quality assurance inspectors, who inspect large groups of holes at one time, extremely laboriously.
When a drill bit or mill head becomes chipped or otherwise damaged, its current hole and all its potentially hundreds or thousands of subsequent holes are out of tolerance, none of which are identified in prior art until inspection. In aircraft manufacturing and other applications in which thousands, or even millions, of holes may be drilled in a single day, a damaged drill is to be identified as soon as possible. Such damage may take the form of a chipped or bent drill bit or a mis-aligned drill, which could cause the drilled hole to not be perpendicular to the drilled surface. A damaged drill, if not quickly identified, risks thousands of drilled holes out of tolerance, necessitating re-drilling of the holes, or worse, replacement of the drilled structure.
Prior art attempts at the high precision measurement that could, for example, quickly identify a damaged drill or machine tool, include focal microscopy for fringe pattern analysis, that is image analysis by comparison with a pre-image of a correct part, all difficult to deploy and not very accurate. Other prior art includes capacitive probes such as described for example in U.S. 2012/0288336. Such capacitive probes, however, take measurements in only one direction at a time, requiring multiple measurements to assess a part, never assembling a complete image of the inside of a part. Moreover, a capacitive probe must fit tightly into or onto a part to be measured, aligned closely to the center axis of the hole, and for calibration purposes, must have the same probe-to-hole-side separation at all times—because its capacitance is calibrated according to the thickness of the layer of air between the probe and a component to be scanned or measured. When such a capacitive probe identifies a problem with a part, and the part is redrilled or remilled to a larger size, the capacitive probe must be swapped out to a larger diameter probe in order to remeasure the part.
Prior art optical scanners that otherwise might be able, for example, to quickly identify a damaged drill or machine tool, typically are too bulky to move with respect to a part under inspection. Such optical scanners are typically mounted on a fixture with a scanned part in a jig that moves with respect to the scanner. This fixed physical orientation between the optical scanner and a part to be scanned or measured means that there are always aspects of the part that cannot be reached, measured, scanned, or imaged by such a prior art optical scanner. This limitation of prior art has given rise to so-called multi-sensor metrology devices that include both optical scan capability and also tactile sensors that attempt to measure portions of a part that optical scan illumination cannot reach—all in an attempt to build a scanner that can scan a part accurately and completely. One manufacturer of metrology equipment, for example, combines three types of sensor probes, a light section sensor, a shape-from-focus (SFF) sensor, and a tactile sensor, all of which are said to work in unison to achieve optimum measurement, even in areas where scan illumination cannot reach. There continues in the industry some real need for an optical scanner with better reach.
Example apparatus for identification of a damaged tool according to embodiments of the present invention are described with reference to the accompanying drawings, beginning with
An object to be scanned is represented in this example of
Optical scanners according to many embodiments of the present invention have the capability of acquiring by imaging and profilometry a “full service profile” of a scanned object. Such a full service profile optionally includes both a high precision 3D scan and also a high precision surface profile of an object. The high accuracy 3D scan achieves microresolution regarding volumetric aspects of an object, that is, linear measurement along volumetric aspects, length, width, circumference, diameter, cavity or hole depths, and so on, with precision on the order of micrometers. The surface profile is effected as optical profilometry, measurements of roughness or smoothness of surfaces, through focus detection, intensity detection, differential detection, Fourier profilometry, or the like, also typically with precision on the order of micrometers.
In the example of
After it is machined, as a usual step in manufacturing, the part is tested for quality, for compliance with specifications, and the test includes an optical scan of the part. The optical scanner (118) scans the part by capturing images (304) of the manufactured part through the scanner's optical sensor (112). The scanner (103), or more particularly, the scanner's optical sensor, is coupled (152) for data communication to one or more data processors (154), and, as each image is captured by the sensor, the processor retrieves each image through the coupling (152). The coupling (152) is an internal data bus such as a processor's front side bus or the like, and, because the processor may be located remotely from the scanner, the coupling (152) can be an RS-232 connection, a Universal Serial Bus (‘USB’), or even a data communications network such as an internet or the like.
From the captured images, the processor determines measurements (148) of the part, and from the measurements, the processor determines that the tool is damaged. In this example, the processor is (150) coupled for data communications to a database (170) that stores the measurements (148) in association with a profile of the part. Coupling (150) can be implemented, for example, as a Fibre Channel, an Infiniband fabric, a Serial ATA connection, a PCI Express bus, and so on. An association among data elements in the database is established and maintained by a part identifier or ‘part ID’ (142) that implements a foreign key that links all the stored information about the part. The part's ‘profile’ is composed of elements of the part's design and manufacturing specifications, including attributes (144) of the part to be measured, specified values (146) of the attributes, and tolerances (147), that is, amounts by which a measured value of an attribute are allowed to vary and still pass inspection. In addition, failure of a measured value to fall within tolerance is an indication of tool damage. In at least some embodiments having high speed and good coordination among the scanner, one or more processors, and data storage, a determination that the tool is damaged is effected in ‘real time,’ that is, immediately after the damaged tool machines the part and before the damaged tool machines another part.
Set forth just below is an example schema of a database for storing measurements of a part in a profile. Each paragraph in the schema represents a database record type having a record name followed by a description of the record. Each record includes several fields each of which is composed of a field name, indented under the record name, and a description of the data to be stored in the field. This example schema is organized into records with fields. The following example schema is focused on profiles for drilled holes in manufacturing aircraft, but readers will recognize the adaptability of such a database structure to any or all manufactured parts. The example schema:
- TopLevelAircraftPartMatch—each record matches a specific part to a specific aircraft
- Index_id—unique entry ID, foreign key relating all records in a profile
- AircraftSerialNumber—unique ID for an aircraft
- PartNumber—component ID within an aircraft
- PartSerialNumber—system-wide ID for the component
- AircraftHolePartMatch—matches holes to specific parts, related one-to-many with TopLevelAircraftPartMatch
- Index_id—same
- PartSerialNumber—same
- Hole_id—uniquely identifying a hole in the part to be scanned
- HoleClass—assigned hole identifier linking the design specifications
- HoleSliceMatch—each record represents a single captured image, these records are related many-to-one with AircraftHolePartMatch
- Index_id—same
- Hole_id—same as in AircraftHolePartMatch
- Slice_id—unique identifier of a single capture of a scan image
- ImageStore—the image data itself
- TimeStamp—time of capture of the image represented by this record
- SliceData—each record represents a point from a slice from processing ImageStore, related one-to-many with HoleSliceMatch
- Index_id—same
- Point_id—identifies a point in part space as an element of a slice, a point in an image
- X—x coordinate of the point in bore space
- Y—y coordinate of the point in bore space
- Z—z coordinate of the point in bore space
- IntensityFlag—Boolean indication of the presence of intensity values of scan illumination read from an image sensor that are outside a deviation window for a slice, possible indications of surface abnormalities, burrs, cracks, or the like.
- SliceComputedData—each record represents a slice built up from point data, these records are related one-to-one with HoleSliceMatch and many-to-one with SliceData
- Index_id—same
- Slice_id—same as in HoleSliceMatch
- Z—hole depth of a slice
- Diameter—computed diameter for hole slice
- CenterX—x coordinate in bore space of the center of a slice
- CenterY—y coordinate in bore space of the center of a slice
- SizeOfLargestFlaggedPointCluster—maximum measured scan line thickness
- DeviationFlag—Boolean indication whether scan slice meets specification
- HoleComputedData—each record represents profile data for an entire hole as built up from slice data, these records are related one-to-one with AircraftHolePartMatch and many-to-one with SliceComputedData
- Index_id—same
- Hole_id—same as in AircraftHolePartMatch
- CounterSinkAngle—measured countersink slope from surface to top of hole
- CSA_Pass—Boolean indication whether countersink angle meets specification
- CS_Depth—countersink measured depth
- CSD_Pass—Boolean indication whether countersink depth meets specification
- Diameter—measured specification for hole diameter
- DiameterPass—Boolean indication whether measured diameter meets specification
- DeviationAlert—Boolean indication of usefulness of slice data for hole calculations
- TimeStamp—time when this data was computed for a hole
- AverageCircularity—average of values from slices of a hole
- Concentricity—computed with respect to top surface neighboring a hole
- Perpendicularity—maximum deviation from vertical axis among slices of a hole
- GripLength—total depth of bore from outer surface to bottom or rear
- Fastenerinstall—each record represents profile data for a fastener for a hole, these records are related one-to-one with AircraftHolePartMatch
- Index_id—same
- Hole_id—same
- PointCloudStore—reflection data from fan illumination, similar to ImageStore
- HeadFlushness—height of top of fastener from surrounding surface
- HeadAngleToSurface—slope from top of fastener to surrounding surface
- HeadDepth—depth of top of fastener under surrounding surface, when applicable
- InstallPass—Boolean indication whether fastener meets specification
- HoleSpec—each record represents a set of design specifications for a hole, these records may be related one-to-many with HoleComputedData because many holes can use the same design specifications
- Index_id—same
- HoleClass—same
- Diameter—design specified diameter
- Tolerance+—design+limit
- Tolerance−—design−limit
- CSFlag—Boolean indication of the presence of a countersink
- CSDepth—design countersink depth, if applicable
- CSAngle—design countersink angle, if applicable
- CBFlag—Boolean indication of the presence of a counterbore
- CBDepth—design counterbore depth, if applicable
- CBDiameter—design counterbore diameter, if applicable
- GripLength—total depth of bore from outer surface to bottom or rear
- Perpendicularity—design perpendicularity
- Circularity—design circularity
- MultiMaterialFlag—Boolean indication of the presence of a multi material stack
- MaterialTransition1—material stack transition location 1, if applicable
- MaterialTransition2—material stack transition location 2, if applicable
- MaterialTransition3—material stack transition location 3, if applicable
The scanner in the example of
As an aspect of determining measurements of the part, one or more of the processors establishes, for each scanned image, a set of values of a transforming tensor (100), that is, a tensor that expresses the relationship between part space and scanner space. Such a tensor can be expressed, for example, as Tensor 1.
The T values in Tensor 1 express the translation of scanner space with respect to part space, and the R value express the rotation of scanner space with respect to part space. Having the tensor values, the processor then transforms locations in scanner space of imaging pixels from each scanned image to corresponding locations of scanned points in part space. This transform of points in scanner space to points in part space is carried out according to Equation 1.
Equation 1 transforms by matrix multiplication with Tensor 1 a vector x,y,z representation of a point in scanner space into a vector representing a point x′,y′,z′ in part space. Readers will recognize this as a multiplication of one vertical matrix x,y,z,1 by a square matrix, resulting in another vertical matrix x′,y′,z′,1. The vertical matices in this example represent pixel locations in scanner space and reflection point locations in part space and therefore are characterized as vectors. The square matrix effectively implements a linear transformation, rotating and translating scanner space with respect to part space—and therefore is characterized as a tensor.
Although the position of the scanner in part space has been described as optically tracked, optical tracking is not the only way to track a scanner. A part can, for example be mounted in a fixed position with respect to one or more tactile fiducials that define part space, and an optical probe can be moved by robotic transport, CNC machine, or the like, to physically touch, with a certain orientation, a tactile fiducial, establishing an initial orientation of scanner space with respect to part space. Then the transport can track by dead reckoning the motion of the motion of the probe with respect to its initial orientation and populate a transform tensor for each captured image with values derived from dead reckoning of the motion of the scanner and probe. Alternatively, a tactile probe can be switched into deployment position on an end effector of a robotic transport, a CNC machine, or the like, the initial orientation of scanner space with respect to part space can be established by a touch of the tactile probe to a tactile fiducial defining part space, and the transport can switch the probe into deployment and track probe motion by dead reckoning. Now this specification has described three ways to track probe motion. No doubt persons of skill in the art will think of other ways, and all such ways are well within the scope of the present invention.
Having derived the scan point locations x′,y′,z′ in part space, the processor then determines measurements of the part. The point locations in part space are points in a traditional Cartesian space, and the part's attributes, which after all are disposed within part space, therefore can be determined through techniques of analytic geometry, least squares analysis, regression analysis, Tikhonov regularization, the Lasso method, minimum mean square error (Bayesian estimator), best linear unbiased estimator (BLUE), best linear unbiased prediction (BLUP), and the like. For further explanation, consider an example of measurement in part space with analytic geometry—for the particular example of a radial scan of the interior surface of a drilled hole for which each partial image forms a circle, in effect, 2D cross sections of the hole. For each image, a processor identifies the center of the image, which is carried out by taking a centroid or first moment of weighted averages of intensity values of reflected scan illumination for each point in the image, in both the X and Y directions, and taking the resulting x.y tuple as the center of the image. Then the processor draws radially from the center to edges of the image a relatively large number of radii, for example, a thousand radii, and selects from each such radius the brightest point on the radius, the set of brightest points being most likely to image the interior surface of the hole. The processor then carries out an initial regression analysis to derive a formula for the circle represented by the one thousand brightest points disposed in part space on radii from the center of the image. The processor then removes from the point set all bright points falling more than a predetermined threshold distance from the derived circle; for accuracy at this stage, a large proportion, perhaps even a majority, of the bright points may be removed, leaving perhaps a few hundred in the set, given the example of starting with a thousand. The processor then performs another regression analysis to derive a best fit formula for a circle, which gives diameter and also is used for comparison with actual part space point locations to measure circularity, perpendicularity, and so on.
For further explanation,
A data processor operating according to embodiments of the present invention would determine from the measurements of a part as reported in the record of
The example record of
For further explanation,
The method of
Determining (303) the measurements in the example of
Determining (303) measurements in the example of
Determining (303) the measurements in the example of
For further explanation,
The optical probe (106) in the example of
The optical probe includes light conducting apparatus (119) disposed so as to conduct scan illumination (123) from a source (182) of scan illumination through the probe. The light conducting apparatus in this example is a tubular wall of the probe itself, composed of optical glass, quartz crystal, or the like, that conducts scan illumination from a source (182) of such illumination to line forming apparatus (224) or reflecting apparatus (226) in the probe. The scan illumination may be conducted from a source (182) to the probe wall (119) for transmission to a line former or reflector by, as in the example here, optical fiber (121), or through optical glass, a conical reflector, a reflaxicon, and in other ways as will occur to those of skill in the art. The sources (182) themselves may be implemented with LEDs (186), lasers (184), or with other sources of scan illumination as may occur to those of skill in the art.
The optical probe (106) in the example of
The example apparatus of
The optical probe (106) in the example of
The optical probe (106) in the example of
The example apparatus of
In the example apparatus of
The example apparatus of
The controller (156) is coupled through a memory bus (157) to computer memory (168), which in this example is used to store the controller's measurements (314) or captured images (315) of a scanned object. Measurements (314) of a scanned object can include for example:
-
- diameter, circularity, and perpendicularity of drilled or milled holes and other cavities,
- countersink dimensions, depth and diameter,
- fastener flushness with respect to a surface of a scanned object,
- dimensions of milled cavities having irregular internal structures,
- measurements indicating manufacturing defects in scanned objects, cracks, burrs, or the like, and
- measurements indicating defects in tools, drill bits, mill heads, and the like,
- and so on.
Regarding manufacturing defects, the controller in example embodiments is programmed to determine according to image processing algorithms the location of a light source and probe in an image, and the light source and probe are configured for an expected surface finish for material of which a scanned object is composed. If there is a significant deviation in surface finish indicating a crack or if there are burrs, reflected scan illumination does not appear as radially symmetric on the sensor. Rather it will have significant local variations in its appearance. That these variations are greater than a threshold is an indicator of a manufacturing defect such as a burr or crack. Burrs can also be identified from white light images of the entrance and exit of a drilled or milled cavity because the edge of the cavity will not appear smooth.
For further explanation,
The example apparatus of
The optical probe includes light conducting apparatus (119) disposed so as to conduct scan illumination (123) from a source (182) of scan illumination through the probe. The light conducting apparatus in this example is a tubular wall of the probe itself, composed of optical glass, quartz crystal, or the like, that conducts scan illumination from a source (182) of such illumination to line reflecting apparatus (226) in the probe. The scan illumination may be conducted from a source (182) to the probe wall (119) for transmission to a line former or reflector by optical fiber, through optical glass, a conical reflector, a reflaxicon, and in other ways as will occur to those of skill in the art. The sources (182) themselves may be implemented with LEDs (186), lasers (184), or with other sources of scan illumination as may occur to those of skill in the art.
The optical probe (106) in the example of
The optical probe (106) in the example of
In the example apparatus of
For further explanation,
The example apparatus of
The optical probe includes light conducting apparatus (119) disposed so as to conduct scan illumination (123) from a source (182) of scan illumination through the probe. The light conducting apparatus in this example is a tubular wall of the probe itself, composed of optical glass, quartz crystal, or the like, that conducts scan illumination from a source (182) of such illumination to line forming apparatus (224) in the probe. The scan illumination may be conducted from a source (182) to the probe wall (119) for transmission to a line former by optical fiber, optical glass, a conical reflector, a reflaxicon, and in other ways as will occur to those of skill in the art. The sources (182) themselves may be implemented with LEDs (186), lasers (184), or with other sources of scan illumination as may occur to those of skill in the art.
The optical probe (106) in the example of
The optical probe (106) in the example of
The wide-angle effect of L0 also disposes a focal plane (108) distally from the front of the probe (106) so that a projected line (110) of scan illumination is in focus where a fan (111) of scan illumination strikes a scanned object (203). Lens elements L0-L10 conduct through the probe to an optical sensor (112) scan illumination (137) reflected from a line (110) of scan illumination projected upon a scanned object (203).
In the example apparatus of
For further explanation of line forming apparatus,
The apparatus in the example of
The apparatus in the example of
For further explanation,
For further explanation,
For further explanation,
For further explanation,
In the example of
In the example of
In the example of
In the example of
In the example of
For further explanation,
The method of
The method of
The method of
The method of
Example embodiments of the present invention are described largely in the context of fully functional apparatus that detects damaged tools by optical scan and measurement of machined parts. Readers of skill in the art will recognize, however, that the present invention also may be embodied in a computer program product disposed upon computer readable storage media for use with any suitable data processing system. Such computer readable storage media may be any storage medium for machine-readable information, including magnetic media, optical media, or other suitable media. Examples of such media include magnetic disks in hard drives or diskettes, compact disks for optical drives, magnetic tape, and others as will occur to those of skill in the art. Persons skilled in the art will immediately recognize that any computer system having suitable programming means will be capable of executing the steps of the method of the invention as embodied in a computer program product. Persons skilled in the art will recognize also that, although some of the example embodiments described in this specification are oriented to software installed and executing on computer hardware, nevertheless, alternative embodiments implemented as firmware or as hardware are well within the scope of the present invention. The flowcharts and block diagrams in the Figures illustrate the architecture, functionality, and operation of possible implementations of computer apparatus, methods, and computer program products according to various embodiments of the present invention.
It will be understood from the foregoing description that modifications and changes may be made in various embodiments of the present invention without departing from its true spirit. The descriptions in this specification are for purposes of illustration only and are not to be construed in a limiting sense. The scope of the present invention is limited only by the language of the following claims.
Claims
1. Apparatus for identification of a damaged tool, the apparatus comprising:
- an optical scanner configured so that the scanner captures images of a manufactured part machined by the damaged tool; and
- a data processor configured so that it determines, from the captured images, measurements of the part, and also determines, based upon the measurements, that the tool is damaged.
2. The apparatus of claim 1 wherein a manufactured part machined by a damaged tool comprises a hole drilled by a damaged drill bit.
3. The apparatus of claim 1 wherein determining that the tool is damaged is effected in real time, immediately after the damaged tool machines the part and before the damaged tool machines another part.
4. The apparatus of claim 1 wherein at least one measurement identifying the tool as damaged further comprises a measurement whose value exceeds a predetermined tolerance value.
5. The apparatus of claim 1 wherein the optical scanner further comprises:
- a source of scan illumination;
- optical apparatus disposed within the scanner so as to project scan illumination onto the part;
- a lens disposed within the scanner so as to conduct to an optical sensor scan illumination reflected from the part; and
- the optical sensor disposed within the scanner so as to capture, from the scan illumination reflected through the lens from the part, the images of the part.
6. The apparatus of claim 1 further comprising at least one of the data processors configured to:
- establish, for each scanned image, transforming tensor values for a transforming tensor that expresses a relationship between a coordinate system defining part space and a coordinate system defining scanner space;
- transform according to the transforming tensor values locations in scanner space of imaging pixels from each scanned image to corresponding locations of scanned points in part space; and
- determine measurements of the part in dependence upon the scanned points in part space.
7. The apparatus of claim 6 wherein: the tensor comprises [ R 11 R 12 R 13 T 1 R 21 R 22 R 23 T 2 R 31 R 32 R 33 T 3 0 0 0 1 ],
- the T values in the tensor express the translation of scanner space with respect to part space, and the R values express the rotation of scanner space with respect to part space.
8. A method of identifying a damaged tool, the method comprising:
- capturing, by an optical scanner, images of a manufactured part machined by the damaged tool;
- determining, from the captured images by a data processor operatively coupled to the scanner, measurements of the part; and
- determining, by the data processor based upon the measurements, that the tool is damaged.
9. The method of claim 8 wherein a manufactured part machined by a damaged tool comprises a hole drilled by a damaged drill bit.
10. The method of claim 8 wherein determining that the tool is damaged is effected in real time with respect to the capturing of images, immediately after the damaged tool machines the part and before the damaged tool machines another part.
11. The method of claim 8 wherein determining that the tool is damaged further comprises determining that at least one measurement value exceeds a predetermined tolerance value.
12. The method of claim 8 wherein the optical scanner further comprises:
- a source of scan illumination;
- optical apparatus disposed within the scanner so as to project scan illumination onto the part;
- a lens disposed within the scanner so as to conduct to an optical sensor scan illumination reflected from the part; and
- the optical sensor disposed within the scanner so as to capture, from the scan illumination reflected through the lens from the part, the images of the part.
13. The method of claim 8 wherein determining measurements further comprises:
- establishing, for each scanned image, transforming tensor values for a transforming tensor that expresses a relationship between a coordinate system defining a part space and a coordinate system defining a scanner space;
- transforming, according to the transforming tensor values, locations in scanner space of scanner pixels of each image to corresponding locations of scanned points in part space; and
- determining measurements of the part based upon the locations of the scanned points in part space.
14. The method of claim 13 wherein: the tensor comprises [ R 11 R 12 R 13 T 1 R 21 R 22 R 23 T 2 R 31 R 32 R 33 T 3 0 0 0 1 ],
- the T values in the tensor express the translation of scanner space with respect to part space, and the R values express the rotation of scanner space with respect to part space.
15. A computer program product for identifying a damaged tool, the computer program product comprising computer program instructions that, when installed on a computer and executed by one or more data processors, cause the processors to function by:
- determining, from images captured through an optical scanner, measurements of a part machined by the damaged tool; and
- determining, based upon the measurements, that the tool is damaged.
16. The computer program product of claim 15 wherein a manufactured part machined by a damaged tool comprises a hole drilled by a damaged drill bit.
17. The computer program product of claim 15 wherein determining that the tool is damaged is effected in real time with respect to the capture of the images, immediately after the damaged tool machines the part and before the damaged tool machines another part.
18. The computer program product of claim 15 wherein determining that the tool is damaged further comprises determining that at least one measurement value exceeds a predetermined tolerance value.
19. The computer program product of claim 15 wherein the optical scanner further comprises:
- a source of scan illumination;
- optical apparatus disposed within the scanner so as to project scan illumination onto the part;
- a lens disposed within the scanner so as to conduct to an optical sensor scan illumination reflected from the part; and
- the optical sensor disposed within the scanner so as to capture, from the scan illumination reflected through the lens from the part, the images of the part.
20. The computer program product of claim 15 wherein determining measurements further comprises:
- establishing, for each scanned image, transforming tensor values for a transforming tensor that expresses a relationship between a coordinate system defining a part space and a coordinate system defining a scanner space;
- transforming, according to the transforming tensor values, locations in scanner space of scanner pixels of each image to corresponding locations of scanned points in part space; and
- determining measurements of the part based upon the locations of the scanned points in part space.
Type: Application
Filed: Dec 6, 2013
Publication Date: Mar 5, 2015
Applicant: UNITED SCIENCES, LLC (ATLANTA, GA)
Inventors: KEITH A. BLANTON (ALPHARETTA, GA), KAROL HATZILIAS (ATLANTA, GA), STEFAN T. POSEY (AUSTELL, GA), WESS ERIC SHARPE (VININGS, GA)
Application Number: 14/099,536
International Classification: G07C 3/14 (20060101);