NANOSTRUCTURE PIXEL SENSING METHOD
A sensing method for a nanostructure pixel sensor includes shining light from an incident angle onto a nanostructure pixel sensor; capturing an image of nanostructure pixels of the nanostructure pixel sensor; obtaining brightness values of the nanostructure pixels from the image; and determining a presence and/or amount of an analyte based on an image pattern. The nanostructure pixel sensor includes a plurality of the nanostructure pixels. Each of the nanostructure pixels includes periodic nanostructures. At least two nanostructure pixels have different periodic spacings, and the analyte is applied on the nanostructure pixel sensor before capturing the image.
This is a divisional application of U.S. application Ser. No. 16/152,767, filed on Oct. 5, 2018, which claims priority to U.S. Provisional Patent Application Ser. No. 62/569,467 filed Oct. 6, 2017, the disclosure of which is hereby incorporated in its entirety by reference.
TECHNICAL FIELDThe field of the invention generally relates to a sensor and a sensing method and in particular, but not exclusively, to a nanostructure pixel sensor for use in detecting and quantifying biological, chemical, or biochemical analytes.
BACKGROUNDNanostructures offer unconventional control of light to shape optical wavefronts. Light can generate collective oscillations of electrons as surface plasmon resonance (SPR) bound to a nanostructure metallic surface. Metallic nanostructures in a certain arrangement can induce a coherent response of SPRs creating localized electromagnetic fields with a specific distribution. These nanostructure arrangements enable the efficient electromagnetic coupling of propagating light with localized fields that are highly sensitive to the surrounding environment. The sensitive responses of surface plasmon resonances have been utilized to detect biological, chemical, and biochemical analytes and analyse the interaction of molecules in real time.
SPR detection typically employs a noble metal film and optical structures such as prism, gratings, or waveguides to achieve momentum matching between the incident light and plasmon resonances. The excitation of SPRs occurs when incident light impinges on the metal film at a given angle, which results in a reduced intensity of the reflected light. A slight perturbation on the metal film surface, e.g. refractive index or surface geometry may disturb the momentum matching and cause an intensity change of the reflected light, which leads to an angular shift of the resonance. Traditional SPR sensing techniques rely on the detection of these angle changes for biological or chemical analysis.
Light transmission through a subwavelength aperture or an array of such apertures, such as nanoholes and nano-slits has been extensively studied recently, and these studies have revealed several unique properties of the manipulation of interactions between light and nanostructures. An approach using nanohole array has been developed for chemical and biomolecule detection. The technique, based on the extraordinary optical transmission of the subwavelength nanohole array, has demonstrated its sensitivity to detect viruses and observe a single monolayer of antibodies. The extraordinary or enhanced optical responses are not a unique phenomenon in the perforated metals such as nanohole structures or nanostructures with apertures. Corrugated metal films or flat metal films with properly arranged nanostructures can excite plasmon resonances on the surfaces, which result in similar enhanced transmission effects and Fano resonances.
A general interpretation of the phenomenon is represented by the well-accepted Bloch-mode excitation of a surface electromagnetic wave in the dielectric and metal interface. In periodic nanostructures or nanostructures with certain symmetries, these excitations can meet the Bloch condition and constructively couple with each other that result in strong Fano resonances. Incident light interfering with the nanostructures gives rise to an asymmetric Fano resonance in the transmission spectrum. The wavelength shift of the resonance directly corresponds to the changes of the refractive index. This technique measures this change in the transmission spectra to detect specific analytes and/or determine the concentration of analytes surrounding the detection surface. The detection can be performed in zero order transmission under broadband white light illumination, which eliminates the requirement of the prism, laser source and rotation stage that are commonly used in the total internal reflection SPR method. However, SPR detection based on plasmonic nanostructures still relies on spectrometers to determine small spectral changes and most of them only operate in transmission mode.
Nanostructured plasmonic thin films can be used either in a transmission or reflection operation mode for SPR detection. In the reflective operation mode, nanostructured plasmonic thin films can be fabricated as a periodic nanostructure array. Only considering in one dimension along the periodic arrangement, the periodic nanostructure array can be treated as a diffraction grating, which satisfies the general grating equation: mλ=p(sin θi+sin θr), where m is the diffraction order and a light beam with a wavelength of A is incident on a diffraction grating with a periodic spacing of p at an angle θi and diffracted at an angle θr. Consider a plane wave incident from a small angle (sin θi=0). When a constructive interference occurs at the surface normal (sin θr=0), SPRs can be excited as p≈λ. At such an angle, a nanostructured plasmonic thin film can yield an enhanced reflection. Since the incident angle is small, the diffraction from the plasmonic resonances is extremely surface sensitive. They are strong coherent plasmonic responses and resemble the asymmetric spectral feature of Fano resonances. Furthermore, there is a fundamental difference between the conventional non-plasmonic and plasmonic gratings that the plasmonic phenomenon occurs only for the TM (transverse magnetic) polarized light. The strength of the plasmonic enhancement for a given wavelength directly depends on the distance (period) between individual nanostructures in a periodic nanostructure array. Therefore, varying the period of a nanostructured plasmonic thin film can change its response to light with a certain wavelength. In general, the relationship of the period and wavelength can be expressed as λ=neffp, where p is the period or the distance between individual nanostructures in a periodic nanostructure array and neff is effective refractive index. Factors such as surrounding medium, structure profile and fabrication accuracy affect the effective refractive index. For nanostructures covered with a plasmonic thin film and nanostructure size less than the wavelength, the effective refractive index can be treated as 1.
Current nanofabrication technology offers many methods to fabricate the plasmonic nanostructures. However, the nanofabrication for plasmonic nanostructures typically involves lift-off and dry etching which introduce sharp edges, corners, and rough surfaces. In these structures, propagating light and surface plasmons can be scattered to all directions that reduce their transmission and reflection efficiency. These losses can be minimized by shaping plasmonic structures with a smooth profile rather than an abrupt one. Plasmonic nanostructures with a smooth profile can achieve sharp Fano resonances and increase the sensing ability.
SUMMARYThe disclosed invention provides a nanostructure pixel sensor and a method for detecting and quantifying chemical, biological or biochemical analytes. A nanostructure pixel sensor consists of a plurality of nanostructure pixels each comprising a periodic array of nanostructures. Optical responses of transmitted or reflected light affect the light intensity or brightness level of the nanostructure pixels, which depend on the periodic spacing or pitch of the nanostructures. The nanostructure pixels with different periodic arrays of nanostructures may be organized in a specific format. These organized pixels illuminated by light at a given wavelength have different levels of brightness that generate a wavelength-dependent image pattern. The brightness is sensitive to the surrounding environment. Altering the environment such as capturing an analyte on the nanostructure pixel sensor changes the brightness of the nanostructure pixels that results in a different image pattern. A presence and/or amount of an analyte is determined based on such a change of the image pattern. The nanostructure pixel sensor described in the present invention utilizes image patterns to detect analytes and/or determine the amount of an analyte on the sensor surface or in the vicinity of the sensor surface. The disclosed invention further provides a method to use the nanostructure pixel sensor.
In one embodiment, the nanostructure pixel 101 includes a periodic array of nanostructures 201 and a metallic thin film 202. The periodic array of nanostructures 201 form a grating structure, wherein every nanostructure is an elevation surface relief as illustrated in
In one embodiment, the nanostructure pixel 101 includes an alternative periodic array of nanostructures 301 and a metallic thin film 302, wherein the nanostructure is a depression surface relief as illustrated in
Analytes sought to be detected are brought in contact with or in the vicinity of the metallic thin film surface of the nanostructure pixels. These analytes change the local refractive index around the nanostructures, which affect the constructive or destructive interferences of the surface plasmon and evanescent electromagnetic waves. Therefore, the nanostructure pixels light up or dim when the analytes are altering the environment. The detection is based on a change or difference of the light before and after capturing an analyte on the nanostructure pixels. The light signals from the nanostructure pixels are collected by a camera when a light source operates in a transmission mode, a reflection mode, or a combination of both. The incident and detected light can be set perpendicular or with a certain angle to the surface of the nanostructure pixel sensor.
The principle of sensing for using a nanostructure pixel sensor 100 is further explained referring to
The image captured from a nanostructure pixel sensor can be processed to quantify the brightness for enhancing the detection accuracy.
Although embodiments have been described with reference to a number of illustrative embodiments thereof, it should be understood that numerous other modifications and embodiments can be devised by those skilled in the art that will fall within the spirit and scope of the principles of this disclosure. More particularly, various variations and modifications are possible in the component parts and/or arrangements of the subject combination arrangement within the scope of the disclosure, the drawings, and the appended claims. In addition to variations and modifications in the component parts and/or arrangements, alternative uses will also be apparent to those skilled in the art.
Claims
1. A sensing method, comprising:
- shining light from an incident angle onto a nanostructure pixel sensor;
- capturing an image of nanostructure pixels of the nanostructure pixel sensor;
- obtaining brightness values of the nanostructure pixels from the image;
- determining a presence and/or amount of an analyte based on an image pattern;
- wherein the nanostructure pixel sensor includes a plurality of the nanostructure pixels, each of the nanostructure pixels includes periodic nanostructures, at least two nanostructure pixels have different periodic spacings, and the analyte is applied on the nanostructure pixel sensor before capturing the image.
2. The method according to claim 1, before capturing the image of the nanostructure pixels of the nanostructure pixel sensor, further comprising:
- capturing a reference image of the nanostructure pixels of the nanostructure pixel sensor, wherein the reference image is captured before the analyte is applied on the nanostructure pixel sensor.
3. The method according to claim 2, wherein determining the presence and/or the amount of the analyte based on the image pattern includes:
- comparing the reference image and the image to determine a change of the image pattern; and
- determining the presence and/or the amount of the analyte based on the change of the image pattern.
4. The method according to claim 2, wherein the reference image is captured with the light shining from the incident angle.
5. The method according to claim 1, after obtaining the brightness values of the nanostructure pixels from the image, further comprising:
- locating at least one of the nanostructure pixels having a largest brightness value in the image.
6. The method according to claim 2, after obtaining the brightness values of the nanostructure pixels from the image, further comprising:
- locating at least one of the nanostructure pixels having a largest brightness value; and
- comparing the reference image and the image to determine a change of the nanostructure pixels having the largest brightness value.
7. The method according to claim 6, wherein determining the presence and/or the amount of the analyte based on the image pattern includes:
- determining that the analyte is captured on the nanostructure pixel sensor, wherein the nanostructure pixels having the largest brightness value in the reference image have larger periodic spacings than the nanostructure pixels having the largest brightness values in the image do.
8. The method according to claim 5, wherein locating at least one of the nanostructure pixels having the largest brightness value includes:
- converting the image to a grayscale image for obtaining the brightness value of each of the nanostructure pixels.
9. The method according to claim 8, wherein locating at least one of the nanostructure pixels having the largest brightness value further includes:
- binarizing the grayscale image at a binarization threshold to a black and white image, wherein the nanostructure pixels have a same size, and the nanostructure pixels having the largest brightness value show a largest size in the black and white image.
10. The method according to claim 8, wherein locating at least one of the nanostructure pixels having the largest brightness value further includes:
- adjusting a binarization threshold to binarize the grayscale image to narrow down the nanostructure pixels having the largest brightness value, wherein the nanostructure pixels have a same size, and the nanostructure pixels having the largest brightness value show a largest size in the black and white image.
11. The method according to claim 1, wherein the brightness values of the nanostructure pixels is obtained from pixels of the image taken by an image sensor or a camera, and light intensities of the pixels showing an area of a nanostructure pixel are used to obtain a brightness value of the nanostructure pixel.
12. The method according claim 1, wherein each of the nanostructure pixels includes a metallic thin film and the metallic thin film covers the periodic nanostructures.
13. The method according to claim 1, wherein the periodic nanostructures have a smooth profile with rounded corners.
14. The method according to claim 1, wherein the light is monochromatic.
15. The method according to claim 1, wherein the light is illuminated from a side of the nanostructure pixel sensor, and the image is captured from an opposite side of the nanostructure pixel sensor.
16. The method according to claim 1, where the light is illuminated from a side of the nanostructure pixel sensor, and the image is captured from the side of the nanostructure pixel sensor.
17. The method according to claim 1, wherein the light is polarized light, and a magnetic field vector of the polarized light is perpendicular to a grating vector of the periodic nanostructures.
18. The method according to claim 1, wherein a width of the periodic nanostructures is less than 20% of a periodic spacing of the periodic nanostructures.
19. The method according to claim 1, wherein the periodic nanostructures are a depression surface relief.
20. The method according to claim 1, where the image is captured by an image sensor or a camera.
Type: Application
Filed: Jul 7, 2020
Publication Date: Oct 22, 2020
Inventor: Bo Xiao (Virginia Beach, VA)
Application Number: 16/922,181