CHIRAL PLASMONIC METASURFACES FOR POLARIZATION DETECTION AND MANIPULATION
A circular polarization filter of a chiral metasurface structure is disclosed including a substrate having a nanograting pattern extending from the substrate, a dielectric layer formed directly on the nanograting pattern, and a plasmonic structure in direct contact with the dielectric layer, where the plasmonic structure may be oriented at a nonzero angle with respect to the nanograting pattern. An integrated polarization filter array is also disclosed including include a linear polarization filter, and a circular polarization filter. Methods of detecting full-stokes polarization using an integrated polarization filter array having both linear and circular polarization filters made from chiral metasurface structures is disclosed. Methods of using a Mueller matrix to evaluate polarization response of any optical device or system is also disclosed.
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This application is a divisional application of U.S. patent application Ser. No. 17/157,438, filed Jan. 25, 2021, issued as U.S. Pat. No. 11,487,051, and claims the benefit of provisional patent application Ser. No. 62/965,510, filed Jan. 24, 2020, the disclosures of all which are hereby incorporated herein by reference in their entireties.
STATEMENT OF GOVERNMENT INTERESTThis invention was made with government support under FA9550-16-1-0183 awarded by the Air Force Office of Scientific Research. The government has certain rights in the invention.
TECHNICAL FIELDThis disclosure relates to chiral plasmonic metasurfaces for generation, manipulation, and detection of the polarization state of light.
BACKGROUNDChiral materials and molecules are useful for various applications, including optical communication, circular dichroism (CD) spectroscopy, chemical analysis, biomedical diagnosis as well as polarization detection and imaging. Yet, chiral materials in nature usually have weak chiral-optical effect and require long optical paths to achieve sufficiently large chirality for practical applications, resulting in fundamental limitations on device miniaturization. Recent demonstrations of chiral metamaterials have achieved much stronger chiral effects than their natural counterparts with ultra-compact footprints, which may lead to miniaturization of polarization manipulation and detection devices and may also enable a number of new applications such as hologram multiplexing and refractive index sensing. Various types of chiral metamaterial/metasurface structures have been explored with different efficiency and performance (CD and circular polarization extinction ratio (CPER)). 3D helical structures may exhibit high efficiency up to 92% and CD up to 0.87. However, the fabrication of 3D structures is very challenging and not scalable. While chiral metamaterials based on single or stacked planar plasmonic metasurfaces may have the potential to significantly reduce fabrication complexity, it is challenging to mitigate the high optical loss of such plasmonic structures. The state-of-art solutions for low-loss chiral metamaterials are based on dielectric and dielectric-metal hybrid structures. Some of the more efficient planar chiral metamaterial designs are based on dielectric gammadion which has a transmission efficiency of up to 87%, yet with low CPER (<10). Therefore, it remains challenging to achieve high-performance chiral metamaterials with both high efficiency and large CPER.
In addition, optical losses in plasmonic structures severely limit practical applications, particularly in visible (VIS) and near-infrared (NIR) wavelength ranges. Here we present the design concept and experimental demonstration for highly efficient subwavelength-thick plasmonic chiral metamaterials with strong chirality. Therefore, there is a need for designs that utilize plasmonic metasurfaces to control the phase and polarization of light and exploit anisotropic thin-film interference effects to enhance optical chirality while minimizing optical loss. There is further a need for circular polarization filters with transmission efficiency >90% and extinction ratio >180, polarization converters with conversion efficiency >90% as well as on-chip integrated micro-filter arrays for full-Stokes polarization detection over a broad wavelength range (3.5˜5 μm), and potentially applicable from near-infrared (NIR) to Terahertz regions via structural engineering.
SUMMARYThe following presents a simplified summary in order to provide a basic understanding of some aspects of one or more embodiments of the present teachings. This summary is not an extensive overview, nor is it intended to identify key or critical elements of the present teachings, nor to delineate the scope of the disclosure. Rather, its primary purpose is merely to present one or more concepts in simplified form as a prelude to the detailed description presented later.
A circular polarization filter is disclosed which includes a substrate. The circular polarization filter also includes a nanograting pattern extending from the substrate, a dielectric layer formed directly on the nanograting pattern, and a plasmonic structure in direct contact with the dielectric layer, where the plasmonic structure may be oriented at a nonzero angle with respect to the nanograting pattern. In certain embodiments, the circular polarization filter may include a nanograting pattern having parallel protrusions extending from the substrate. The plasmonic structure may include plasmonic bar antennas, which may further include parallel protrusions extending from or buried in the dielectric layer. The dielectric layer may include SiOx, aluminum oxide, or an undoped semiconductor. The substrate of the circular polarization filter may transmit light in an operation wavelength of the circular polarization filter. The nanograting pattern of the circular polarization filter may have a duty cycle between about 20% and about 80% or between about 40% and about 60%, and the dielectric layer may have a thickness between about 100 nm and about 10,000 nm, between about 100 nm and about 1000 nm, or between about 300 nm and about 400 nm.
An integrated polarization filter array is also disclosed. The integrated polarization filter array may include a linear polarization filter, and a circular polarization filter which further includes a substrate, a nanograting pattern extending from the substrate, a dielectric layer formed directly on the nanograting pattern, and a plasmonic structure in direct contact with the dielectric layer, where the plasmonic structure is oriented at a nonzero angle with respect to the nanograting pattern. In certain embodiments, the integrated polarization filter array may have a nanograting pattern which may include parallel protrusions extending from the substrate, and the plasmonic structure may include parallel protrusions extending from or buried in the dielectric layer.
A method of detecting full-stokes polarization is also disclosed. The method of detecting full-stokes polarization may include introducing polarized light into an integrated polarization filter array having at least two polarization filters, measuring intensity of linear and circular polarization components of the polarized light, collecting incident light transmitted from the integrated polarization filter array with a detector, and calculating stokes parameters of the incident light. The method may include moving the integrated polarization filter array in an x-axis and/or a y-axis relative to the polarized light. The method may also include measuring insertion loss for a polarization state transmitted by one of the polarization filters or generating additional polarization states of the polarized light by changing a rotation angle of a linear polarizer and a quarter wave plate coupled to the integrated polarization filter array. The integrated polarization filter array may include six polarization filters, including in an embodiment, four linear polarization filters and two circular polarization filters.
The following description of various typical aspect(s) is merely exemplary in nature and is in no way intended to limit the disclosure, its application, or uses.
As used throughout, ranges are used as shorthand for describing each and every value that is within the range. Any value within the range may be selected as the terminus of the range. In addition, all references cited herein are hereby incorporated by reference in their entireties. In the event of a conflict in a definition in the present disclosure and that of a cited reference, the present disclosure controls.
Additionally, all numerical values are “about” or “approximately” the indicated value, and take into account experimental error and variations that would be expected by a person having ordinary skill in the art. It should be appreciated that all numerical values and ranges disclosed herein are approximate values and ranges, whether “about” is used in conjunction therewith. It should also be appreciated that the term “about,” as used herein, in conjunction with a numeral refers to a value that may be ±0.01% (inclusive), ±0.1% (inclusive), ±0.5% (inclusive), ±1% (inclusive) of that numeral, ±2% (inclusive) of that numeral, ±3% (inclusive) of that numeral, ±5% (inclusive) of that numeral, ±10% (inclusive) of that numeral, or ±15% (inclusive) of that numeral. It should further be appreciated that when a numerical range is disclosed herein, any numerical value falling within the range is also specifically disclosed.
As used herein, the term “or” is an inclusive operator, and is equivalent to the term “and/or,” unless the context clearly dictates otherwise. The term “based on” is not exclusive and allows for being based on additional factors not described, unless the context clearly dictates otherwise. In the specification, the recitation of “at least one of A, B, and C,” includes embodiments containing A, B, or C, multiple examples of A, B, or C, or combinations of A/B, A/C, B/C, A/B/B/ B/B/C, A/B/C, etc. In addition, throughout the specification, the meaning of “a,” “an,” and “the” include plural references. The meaning of “in” includes “in” and “on.”
Reference will now be made in detail to exemplary embodiments of the present teachings, examples of which are illustrated in the accompanying drawings. Wherever possible, the same reference numbers will be used throughout the drawings to refer to the same, similar, or like parts.
Plasmonic chiral metasurface structures as circular polarization (CP) filters for wavelength ranges from visible through mid-infrared ranges and beyond are disclosed. In one implementation, CP filters with a transmission efficiency >85% and an extinction ratio (r=TLCP/TRCP) over 100 at 4 μm are described. These structures include rationally designed plasmonic antennas and nanowires that are vertically integrated with a subwavelength-thick dielectric spacer layer. The total thickness of the device can be less than 1/10 of the operation wavelength. The CP filters can be integrated with nanowire grating linear polarization filters on the same chip for full stokes polarization detection. The operation wavelength of the devices can be engineered from visible to far-infrared (FIR) regions (400 nm to 30 μm) and beyond by changing the design parameters. The designs can be directly integrated onto various semiconductor-based photodetectors and imaging arrays, and thus enable on-chip polarization detection and imaging for various applications such as circular dichroism (CD) spectroscopy, polarimetric imaging and sensing, and molecular spectroscopy.
Plasmonic chiral metamaterial structures described herein may include two anisotropic metasurfaces and a dielectric spacer layer between them, as shown in
Exemplary implementations of chiral plasmonic metamaterials (CPMs) with strong chirality (CD>0.9), high transmission efficiency (>90%) and subwavelength thickness (<λ/7) in mid-infrared (mid-IR) spectral range are described herein. The aforementioned rationale for such highly efficient plasmonic metamaterials with ultra-strong optical chiral effects has been established, and experimental demonstration of polarization converters with conversion efficiency up to 90% and CP filters with CPER up to 180 is further disclosed herein. By integrating the CPMs into an on-chip microscale polarization filter array, full-Stokes polarization detection with high accuracy over a broad wavelength range from 3.5 to 5 μm may be realized.
The circular dichroism (CD) of the right-handed CPM (RCPM,
respectively. Multi-order transmission and reflection occur between the top and bottom metasurfaces, as indicated by a set of arrows 268 Transmitted light 270, 272, 274 is also indicated.
By rationally engineering the top and bottom plasmonic metasurfaces, the constructive/destructive interferences of the partial waves may be exploited for incident LCP/RCP light to achieve strong chirality (˜0.9), as illustrated by the phasor diagrams in
First, a widely used simple method was adopted to obtain Stokes parameters (S0, S1, S2, S3) by measuring the intensity of linear and circular polarization components to(I1 to I6) with the polarization filter array (P1 to P6). For simplicity, relative Stokes parameters were used in the following discussion.
In the experiment, the response of each polarization filter was first measured to obtain the insertion loss for the corresponding polarization state it transmits (see method section for details). Then various additional input polarization states were generated by changing the rotation angle of the linear polarizer and QWP (operation wavelength around 4 μm). For each input polarization state, transmitted light through all six polarization filters was collected onto an MCT detector sequentially while moving the motorized stage as described previously in regard to
where I0(λ) is the input light intensity obtained by the empty cell P0; and the instrument matrix A6×4(λ) is formed by the Muller matrix elements of all six polarization filters obtained previously:
During the experiment, an incident beam was generated with different polarization states from 3.5 to 5 μm with a linear polarizer and a low-order QWP. Since the retardance of the QWP is dispersive, the generated beam will have different Stokes Parameters at different wavelength. The transmitted light intensity was measured through all 6 polarization filters to obtain the vector on the left of Eq. (2). According to the Rouché-Capelli theorem, the existence of a unique solution of Eq. (2) requires the rank of the matrix A6×4 (λ) to be 4, which can be satisfied as long as the LPER/CPER is not equal to 1 at the wavelengths of interest. In practice, since the noise is unavoidable during measurement, Large LPER and CPER would be desirable to achieve high measurement accuracy.
for S1, S2 and S3 are 0.01, 0.022 and 0.008, from 3.5 to 5 μm. The corresponding measurement errors for DOCP and DOLP were 0.009 and 0.016, respectively. The measurement errors can be further reduced by increasing extinction ratios of the polarization filters and improving measurement accuracy of the Muller matrix of the polarization filters.
The results illustrated in
In embodiments described herein, design strategies are demonstrated for realizing high performance chiral plasmonic metamaterials based on anisotropic thin-film interferences effects facilitated by metasurface structures. The chiral effects are enhanced while simultaneously minimizing the optical loss, which has been one of the major limitations for various plasmonic devices. The resulting CPM structures obtain high efficiency (>90%), large CD and CPER (up to 180) and subwavelength thickness (<λ/7), which outperforms all reported chiral metamaterial/metasurface structure known in the art. Certain embodiments of CPMs have been utilized in device applications, such as circular polarization filter, polarization conversion and full-Stokes polarization detection. The circular polarization filters were featured with simultaneously high CPER (up to 180) and transmission efficiency (>90%). The polarization converters exhibited high polarization conversion efficiency (˜90%) from LP to CP and elliptically polarized light and produced near-perfect CP light with DOCP up to 0.99998. By integrating the circular polarization filters with nanograting-based linear polarization filters on the same chip, full-Stokes polarization detection is demonstrated with record-high measurement accuracy (measurement error: S1 0.01; S2 0.022; S3 0.008) and broadband wavelength coverage from 3.5 to 5 μm. Embodiments of CPM design concepts are also applicable for applications in other wavelength ranges from near-IR to THz and hold great promise to enable ultra-compact high-performance devices for various polarization related applications, such as optical communication, biomedical diagnosis, polarization imaging and spectroscopy.
Numerical SimulationsThe Finite-difference time-domain (FDTD) simulations were performed using Lumerical Solutions FDTD. The material optical properties are obtained from the Lumerical library. The unit cell was simulated in the periodic structures with the normal incidence of plane wave source(s), periodic in-plane boundary conditions and perfectly matched layer (PML) out-of-plane boundary conditions. For CPM simulation, 2 orthogonally placed LP sources with ±π/2 relative phase retardance go through the gold nanoantenna, SiOx spacer, gold nanograting and sapphire substrate. For oblique incidence cases, Bloch boundary conditions were used and combined with the results from 2 individual orthogonal-placed LP sources to make sure the incident angle is the same over the full wavelength range in the simulation. For CP generation simulation, a LP source polarized perpendicular to the gold nanoantenna is transmitted through the sapphire substrate, gold nanoantenna, SiOx spacer layer and gold nanoantenna. The mesh accuracy was set to 4 and the auto-shutoff for convergence of simulations was set to 10−5.
Theoretical Model of Anisotropic MetasurfacesEach metasurface introduces different abrupt phase and amplitude changes for transmitted and reflected light31. Due to the anisotropic light responses of the top and bottom metasurfaces, the reflection and transmission coefficients for normal incidence on each metasurface can be modeled by 2-by-2 matrices48.
where
represents the complex amplitude of the reflected electric field incident from medium m to n propagating in -z-direction, linearly polarized in y-direction for excitation in x-direction, similarly for mnxy. The reflection and transmission coefficients of the metasurfaces can be obtained from a full-wave simulation (FDTD, Lumerical Inc.). The amplitude and phase of the reflected and transmitted electric fields were first exported along X- and Y-directions for X-polarized or Y-polarized LP input light normally incident on the nanogratings, respectively. The nanograting is oriented along the y-axis. Similarly, the reflected and transmitted electric fields of nanoantenna can be obtained along the u-axis. The propagation phases from the source to the nearside of the metasurface and from the metasurface to the nearside of the monitor are subtracted. Since the amplitude of the light source is 1, the reflection and transmission coefficients are the same as the obtained complex electric field.
The reflection and transmission coefficients of nanoantenna along ultraviolet (UV) coordinates as defined and described in regard to
in the following equations.
r′mn(θ)=ROT(−θ)·rmn·ROT(θ) (6)
t′mn(θ)=ROT(−θ)·tmn·ROT(θ) (7)
where θ is the rotation angle between UV and XY coordinates.
Since the x-axis selected is perpendicular or parallel to the nanograting, the off-diagonal terms of r12, t12, r21 and t21 are all zero. Yet for the nanoantenna, after transferring the UV coordinates to XY coordinates, the off-diagonal terms of r23, t23, r32 and t32 are non-zero, indicating the interconversion of the x and y field components (Ex and Ey) upon light incidence onto the anisotropic metasurfaces.
The lth order of reflection coefficient for the device embodiment described in regard to
where
and d is the spacer thickness. The total reflected field can be expressed as (Σl=1∞r(l))·Einc and the total reflectivity
Similarly, the lth order of the transmitted electric field can be calculated as
t(l)=t23·(r21·r32)l−1·t12·ei(2l−1)k
The total transmitted field can be expressed as (Σl=1∞t(l))·Einc and the total transmission is
We also employed a transfer matrix approach (4*4 matrix) to model the relation between the complex reflection coefficients mnxy, transmission coefficients mnxy and the forwards and backward propagating electric field through our device.
where M1, M2, M3, M4 are each 2*2 matrix relating the electric fields before the top nanoantenna and after the bottom nanograting (
Here rmn and tmn are the reflectance and transmittance matrix with,
and d is the spacer thickness. The complex reflection and transmission coefficients at each interface at various wavelengths used in the transfer matrix are obtained directly from FDTD simulation. Since there is no backward electric field in the substrate
for a given incident
the reflected and transmitted electric fields from our device, E1b and E3f, can be calculated with the transfer matrix. The transmission spectra obtained from FDTD simulation, thin-film interference model and transfer matrix approach show good consistency with each other. The difference between the transmission spectrums are a result of the assumption that Rmn and Tmn obtained from FDTD simulation have a plane wave incident at each interface. For a very thin SiOx spacer layer, the interlayer interaction between the nanoantenna and nanograting is strong and the electric field incident from the nanoantenna to the nanograting is not exactly plane wave. Nevertheless, this serves as a good approximation to simplify the calculation.
FabricationEmbodiments of chiral plasmonic metasurfaces as discussed herein, in particular in regard to
To fabricate the SiOx spacer layer, the sample was cleaned by O2 plasma using a Plasma-Therm 790, with the following parameters: O2 10 sccm, 8 mT, 25 W for 3 min and deposited with 349 nm SiOx by Sputtering using a Lesker PVD 75, at a rate of 0.5 Å/s.
The gold nanoantennas were completed by coating the sample with a thin layer of Cr (˜6 nm) by thermal evaporation and spin-coating with double layer PMMA (100 nm 495K+70 nm 950K). Then the sample is patterned with EBL, developed in MIBK/IPA and cleaned with O2 plasma as described earlier. After that, Cr(5 nm)/Au(50 nm) was thermally evaporated on the sample and lifted off in acetone. Finally, the Cr discharging layer was removed by Cr dry etching using a PlasmaLab M80 Plus with Cl2/O2 38/2 sccm, 40 s.
MeasurementOptical characterization of devices was performed with a Bruker Vertex 70 FTIR spectrometer and Hyperion 2000 microscope. One 15× objective and one condenser lenses with N.A.=0.4 were used.
Reference polarization state measurement with PSA
Unpolarized light from FTIR is first polarized with a linear polarizer and a QWP and then characterized by the PSA, a rotating linear polarizer. The fully polarized input light can be described by the Jones vector as
where Ex0 and Ey0 is the amplitude of electric field along x and y-axis and δ (−180°<δ≤180°) is the phase different between Ey0 and Ex0, respectively. Then the angle-resolved transmission T(α) through the linear polarizer rotated along angle α (0≤α<180°) can be describe as the following equation.
T(α)=Ex02 cos2α+Ey0eiδsin α|2 (12)
which is equivalent to eq. (13).
T(α)=Ex02 cos2 α+Ey02 sin2 α+Ex0Ey0 sin 2α cos δ (13)
With measurements along 3 angles, we can obtain Ex0, Ey0 and |δ| which can be converted to Stokes parameters. Measurements for more angles can be taken to increase the measurement accuracy with least-mean-square method. In these experiments, 13 or more T(α) are measured to characterize each input polarization state. This method can be used to measure the Stokes parameters over a broad wavelength range with a FTIR, which reduces the requirement for the broadband QWP. However, it cannot tell the handedness of light and the measurement accuracy relies on high extinction ratio of the polarizer used for the angle-resolved measurement and the signal-to-noise ratio of the measurement system.
CPM CharacterizationFor CPM characterization measurement, unpolarized light from an FTIR was converted to circularly polarized light with a linear polarizer and a low-order QWP (WPLQ05M-4000) around 4 μm. The handedness of the CP light was controlled to be right-handed (or left-handed) by setting the angle between the fast axis of the QWP and the axis of the polarizer to be 45° (or −45°). The light was then focused onto the sample and the transmitted light was collected by a Mercury Cadmium Telluride (MCT) detector.
CPM GenerationFor CP generation measurement, unpolarized light from FTIR was first converted to LP light with its electrical field oriented perpendicular to the axis of the nanogratings. Then it was incident onto the device from the nanograting side. The transmitted light passed through a rotating linear polarizer before getting collected by the MCT detector of the FTIR system to obtain the polarization state of the transmitted light and conversion efficiency. Conventional methods of measuring the full Stokes parameter utilizes a QWP and a linear polarizer. However, the lack of broadband QWP in mid-IR makes it challenging for the polarization measurement over the entire 3˜5 μm. The microscope of FTIR system used does not have enough space for the QWP. Therefore, a method was developed to use only a linear polarizer to measure the Stokes parameters, which can only be used for fully polarized light and cannot tell the sign of S3 or DOCP. The Stokes parameters of the output light through the device were extracted from the FDTD simulation and obtain the estimated sign of S3 and DOCP.
Stokes Parameters DetectionTo obtain the transmission coefficient of each polarization filter, 6 polarization states were generated, including LP light polarized along 90°, 0°, −45°, 45°, LCP and RCP light and measured the transmission through the microscale polarization filters, P1 to P6, correspondingly. The transmission coefficients of each of the polarization filters were used to calibrate the measured intensity for Stokes parameter detection.
For Stokes parameters detection measurement, arbitrary polarization states of the input light were generated by changing the rotation angle of the linear polarizer and quarter-waveplate (QWP, operation wavelength around 4 μm). To determine the measurement accuracy, the input polarization states were characterized with a PSA based on a rotating linear polarizer. Assume the input light is purely polarized. By measuring the angle-resolved transmission spectra with a linear polarizer, the Jones vector of the input light can be obtained, which can be converted to S1, S2 and magnitude of S3 of the input light. Then the sign of S3 was estimated based on the retardance curve of the QWP from the vendor. After that, the PSA was replaced with samples representing an embodiment described herein, refocused and measured the transmission of each of the six polarization filters by moving the motorized stage and selecting the point-of interests with an aperture at the image plane.
Muller Matrix Characterization of the DeviceThe polarization response of an optical device or system can be described by a Muller matrix M, which links the input polarization states {right arrow over (Sin)}=(S0, S1, S2, S3) and the output polarization states {right arrow over (Sout)}=(S′0, S′1, S′2, S′3) written in the form of Stokes parameters.
From eq. (14), the output light intensity (S′0) can be described by the first row of the Muller matrix and {right arrow over (Sin)}
S′0=M0S0+M10S1+M20S2+M30S3 (15)
The first row of the Muller matrix for each polarization filter can be determined by transmitting four polarization states with known Stokes parameters measured with the PSA and measuring the corresponding output Stokes parameters for each of the filter. Then the following equation can be solved to obtain the Muller matrix elements (M00(λ) M10(λ) M20(λ) M30(λ)) at each wavelength.
where SiPol
The determinant of the matrix in eq. (16) should be nonzero to have unique solutions for the Muller matrix elements. More than 4 polarization states can also be used to solve the over-constrained equation to obtain the Muller Matrix with least-mean-square method for higher accuracy. Here 6 input polarization states were measured to obtain the Muller matrix elements for all 6 polarization filters.
Although this disclosure contains many specific embodiment details, these should not be construed as limitations on the scope of the subject matter or on the scope of what may be claimed, but rather as descriptions of features that may be specific to particular embodiments. Certain features that are described in this disclosure in the context of separate embodiments can also be implemented, in combination, in a single embodiment. Conversely, various features that are described in the context of a single embodiment can also be implemented in multiple embodiments, separately, or in any suitable sub-combination. Moreover, although previously described features may be described as acting in certain combinations and even initially claimed as such, one or more features from a claimed combination can, in some cases, be excised from the combination, and the claimed combination may be directed to a sub-combination or variation of a sub-combination.
Particular embodiments of the subject matter have been described. Other embodiments, alterations, and permutations of the described embodiments are within the scope of the following claims as will be apparent to those skilled in the art. While operations are depicted in the drawings or claims in a particular order, this should not be understood as requiring that such operations be performed in the particular order shown or in sequential order, or that all illustrated operations be performed (some operations may be considered optional), to achieve desirable results.
Accordingly, the previously described example embodiments do not define or constrain this disclosure. Other changes, substitutions, and alterations are also possible without departing from the spirit and scope of this disclosure.
The present disclosure has been described with reference to exemplary implementations. Although a limited number of implementations have been shown and described, it will be appreciated by those skilled in the art that changes may be made in these implementations without departing from the principles and spirit of the preceding detailed description. It is intended that the present disclosure be construed as including all such modifications and alterations insofar as they come within the scope of the appended claims or the equivalents thereof.
Claims
1. A method of detecting Full-Stokes polarization, comprising:
- introducing polarized light into an integrated polarization filter array having at least two polarization filters;
- measuring an intensity of linear and circular polarization components of the polarized light;
- collecting incident light transmitted from the integrated polarization filter array with a detector; and
- calculating Stokes parameters of the incident light.
2. The method of claim 1, further comprising moving the integrated polarization filter array in an x-axis and/or a y-axis relative to the polarized light.
3. The method of claim 1, further comprising measuring insertion loss for a polarization state transmitted by one of the polarization filters.
4. The method of claim 1, further comprising generating additional polarization states of the polarized light by changing a rotation angle of a linear polarizer and a quarter-wave plate coupled to the integrated polarization filter array.
5. The method of claim 1, wherein the integrated polarization filter array comprises six polarization filters.
6. The method of claim 5, wherein the integrated polarization filter array comprises four linear polarization filters and two circular polarization filters.
Type: Application
Filed: Oct 21, 2022
Publication Date: May 4, 2023
Applicant: Arizona Board of Regents on behalf of Arizona State University (Scottsdale, AZ)
Inventors: Yu Yao (Chandler, AZ), Jing Bai (Tempe, AZ)
Application Number: 18/048,553