Reagent rack

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Description

FIG. 1 is a rear, top and left side perspective view of a reagent rack according to the design;

FIG. 2 is a front, bottom and right side perspective view thereof;

FIG. 3 is a front elevational view thereof;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a left side elevational view thereof;

FIG. 6 is a right side elevational view thereof;

FIG. 7 is a top plan view thereof;

FIG. 8 is a bottom plan view thereof;

FIG. 9 is a cross-sectional view taken along line 9-9 of FIG. 3;

FIG. 10 is a cross-sectional view taken along line 10-10 of FIG. 7;

FIG. 11 is a cross-sectional view taken along line 11-11 of FIG. 7;

FIG. 12 is a cross-sectional view taken along line 12-12 of FIG. 3; and,

FIG. 13 is a cross-sectional view taken along line 13-13 of FIG. 3.

The dashed broken lines in the drawings show portions of the reagent rack that form no part of the claimed design. The dot-dash broken lines in the drawings indicate boundaries of the claimed subject matter that form no part of the claimed design.

Claims

The ornamental design for a reagent rack, as shown and described.

Referenced Cited
U.S. Patent Documents
D287632 January 6, 1987 Moore
D333522 February 23, 1993 Gianino
D337387 July 13, 1993 Frenkel
D382346 August 12, 1997 Buhler
5687849 November 18, 1997 Borenstein
D413677 September 7, 1999 Dumitrescu
D420747 February 15, 2000 Dumitrescu
D421130 February 22, 2000 Cohen
7132082 November 7, 2006 Aviles
7276208 October 2, 2007 Sevigny
7282182 October 16, 2007 Dale
D675338 January 29, 2013 Suzuki
D837401 January 1, 2019 Gardner
D937435 November 30, 2021 Rai
D938612 December 14, 2021 Liu
D969311 November 8, 2022 Jansson
D975313 January 10, 2023 Tanaka
20200072857 March 5, 2020 Oda
Other references
  • U.S. Appl. No. 29/828,314, filed Feb. 25, 2022.
Patent History
Patent number: D1003454
Type: Grant
Filed: Feb 25, 2022
Date of Patent: Oct 31, 2023
Assignee: Hitachi High-Tech Corporation (Tokyo)
Inventors: Yudai Fukushi (Tokyo), Yasuhiro Keta (Tokyo), Eiichiro Takada (Tokyo), Fuka Matsudaira (Tokyo), Ai Masuda (Tokyo)
Primary Examiner: Omeed Agilee
Application Number: 29/828,306