Abstract: Provided is an automatic analyzer having an information leakage prevention function for managing viewing of specimen information by a user. For this purpose, when a logged-in user causes a display device to display specimen information on a predetermined specimen ID, a computer refers to reference authority information set for each analysis item regarding a user ID of the user and reference classification information in specimen ID data on the predetermined specimen ID, and determines whether a measurement value of an analysis item can be displayed. For example, a measurement value of an analysis item requested for the predetermined specimen ID is hidden on the display device when reference classification information on the analysis item is a classification indicating presence of a reference restriction in the specimen ID data and reference authority information set for the analysis item regarding the user ID is a classification indicating absence of a reference authority.

Abstract: This defect inspection device for emitting illumination light onto a moving and rotating sample and inspecting for sample defects by scanning the sample in a spiral shape or concentric circle shapes comprises: an illumination and detection unit comprising an emission optical system and a detection optical system; a rotary stage for rotating the sample; a rectilinear stage for rectilinearly moving the rotary stage; and a controller for controlling the illumination and detection unit, rotary stage, and rectilinear stage. On the linear path of the rectilinear stage are a scanning start position where illumination light is emitted onto the sample and scanning is started and a sample delivery position where movement of the sample to the scanning start position starts.

Abstract: A countersunk hole is added to a back surface of a dispensing chip mounting position of a sample dispensing chip installation table such that, when the dispensing chip is pulled up from the installation table, the amount of contact of a chip side surface is reduced and the chip is stably mounted. In addition, a posture control member during falling is added to a chip waste position, and the chip is caused to fall vertically and attachment of a sample to a waste route is suppressed. When a dispensing probe moves upward during dispensing chip separation, an upper end of the chip is moved upward up to a position in contact with a base and stopped and then is moved upward again. Thus, the posture of the chip during separation is stable. Further, plural positions for separating the chip are provided such that the position changes depending on waste timing.

Abstract: A plasma processing apparatus in which each of a plurality of source gas supply paths includes a first valve, a second valve disposed on an upstream side of the first valve, a flow rate regulator disposed between the first valve and the second valve, and a connection unit between the source gas supply path and an inert gas supply path. For each of the source gas supply paths, leakage in the first valve is sequentially determined, in a first inspection step, using a flow rate of the inert gas passing through the flow rate regulator, and in a second inspection step of, supplying the inert gas and detecting the leakage of the first valve on the source gas supply path using a change amount of a pressure of the inert gas if it is not determined in the first inspection step that there is a leakage in the first valve.

Abstract: A charged particle beam device 100 includes: an irradiation unit 110 configured to irradiate a sample S with a charged particle beam; a particle detection unit 130 configured to detect a particle caused by the irradiation of the sample with the charged particle beam; and a control unit 151 configured to generate an image of the sample based on an output from the particle detection unit, wherein the control unit 151 inputs the image of the sample S into models M1 and M2 for detecting a first structure 401 and a second structure 402, acquires a first detection result related to the first structure 401 and a second detection result related to the second structure 402 from the models M1 and M2, determines locations or regions of the first structure 401 and the second structure 402 based on the first detection result and the second detection result, and outputs an integration result image 203 representing the location or the region of the first structure 401 and the location or the region of the second structure 4

Abstract: A robot teaching system reproduces predetermined work with high accuracy. A position/posture fixing tool having a gripped structure in which a position/posture with respect to a first end effector and a second end effector are uniquely determined; and a teaching data transformation unit that transforms first teaching data representing position/posture information of the first end effector during a teaching operation into second teaching data representing position/posture information of the second end effector are included.

Abstract: Provided is an automatic analysis device in which even an operator can easily identify the type of processing and the type of individual and erroneous setting hardly occurs. A vessel holder for holding a sample vessel, a reading unit for reading an identification area formed in the vessel holder, and a control unit for performing processing based on information read by the reading unit are included, in which the control unit identifies the type of processing based on the type of color applied to the identification area, and identifies the type of individual in the sample vessel based on how the identification area is colored.

Abstract: The present invention makes a directional control means for a specimen carrier unnecessary, reduces costs, and saves time. A high friction member 102 is provided on the bottom surface of a specimen carrier 100, thereby offsetting the center 14 of the frictional force 11 between the bottom surface and a conveyance surface, at a position separate from the rotational center of the bottom part of the specimen carrier 100. As a result, the friction between the conveyance surface and the bottom surface during conveyance of the specimen carrier 100 aligns the orientation of the specimen carrier 100 with respect to a conveyance direction 10, and makes it possible to make a carrier ID 101 and a specimen ID label 151 face towards a barcode reader.

Abstract: Provided is an automatic analyzer in which user work is in conjunction with apparatus driving and operation of a user even in complicated maintenance work is simplified. The automatic analyzer includes a measurement device 2 and a control device 3. The control device controls the measurement device. The control device includes an input unit 32 that receives a start instruction of maintenance work by a user, a control unit 31 that controls an apparatus to perform a predetermined first processing in accordance with input, a driving unit that performs driving in accordance with processing of the control unit, a display unit 33 that displays a second processing to be performed by the user in conjunction with the first processing after the first processing is terminated by the driving unit. The control device sequentially guides maintenance work of the user by performing the first processing or the second processing after the displayed second processing is executed by the user.

Abstract: A thermal cycler includes: a support block configured to support a reaction vessel; a Peltier element thermally connected to the support block and configured to adjust a temperature of a sample solution stored in the reaction vessel by heating/cooling the support block; a temperature sensor configured to measure a temperature of the support block; and a temperature adjusting unit configured to control a current and a voltage supplied to the Peltier element based on the temperature of the support block measured by the temperature sensor. As the reaction vessel, a reaction vessel including a conical portion which opens at an upper portion and tapers toward a lower portion is used, and the Peltier element is arranged so as to be parallel to a conical generatrix portion of the reaction vessel.

Abstract: The purpose of the present invention is to provide a defect inspection device with which it is possible to determine a defect candidate position more accurately than before, even when design data cannot be obtained or are difficult to be utilized sufficiently. The present invention solves the problem by: setting an appropriate reference die or reference chip over a wafer to be inspected; setting, with respect to each of swath channel die images obtained by dividing a reference die swath image into a plurality of portions and detecting the portions, one or more reference patterns; correcting a position error of a swath image obtained from another die to be inspected, using the reference pattern for each swath channel image; and performing defect detection using the corrected swath channel image.

Abstract: In a diagnosis apparatus for diagnosing a state of a plasma processing apparatus, prior distribution information including a probability distribution function is previously obtained for each of first sensors by using first sensor values obtained by the first sensors in a first plasma processing apparatus, a probability distribution in each of second sensors corresponding to each of the first sensors is estimated based on the previously obtained prior distribution information and second sensor values obtained by the second sensors in a second plasma processing apparatus different from the first plasma processing apparatus, and a state of the second plasma processing apparatus is diagnosed by using the estimated probability distribution.

Abstract: An object of the invention is to provide a technique capable of enhancing a cleaning effect of a dispensing probe while preventing an influence on an analysis throughput. In a method according to the invention, an inner surface of a dispensing probe is cleaned by repeating an inner surface liquid-feeding period in which a cleaning liquid is fed to an inside of the dispensing probe and an inner surface stop period in which the cleaning liquid is not fed.

Abstract: A capillary electrophoresis device includes: a light source; a plurality of capillaries; a light detection unit; and a plurality of detection optical fibers each having one end face disposed in association with corresponding one of the capillaries and another end face connected to the light detection unit, wherein the light detection unit selectively detects light in a central portion of the detection optical fiber.

Abstract: An automatic chemical analyzer, maintenance kit, and maintenance method capable of, even in a case where a problem of the automatic chemical analyzer occurs, clarifying a cause of the problem in a user site and coping with the problem without collecting a device or a component. The automatic chemical analyzer maintenance kit is connectable to an automatic chemical analyzer including a reaction vessel for accommodating at least a pipetted specimen and a reagent, and a stirring mechanism including a piezoelectric element that irradiates the reaction vessel with ultrasonic waves. The piezoelectric element includes a plurality of divided electrodes. The automatic chemical analyzer maintenance kit measures, for each of the divided electrodes, an absolute value of an impedance of the piezoelectric element and a phase difference between a voltage applied to the divided electrode and a current, and determines if there is an abnormality an electrode based on a measurement result.

Abstract: The purpose of the present invention is to provide a single cell analysis device in which the improvement of the nucleic acid capturing efficiency and the improvement of the cell capturing efficiency are both achieved and a highly accurate single cell analysis data is thereby obtained. The present invention relates to an improvement of a cell analysis device including a two-dimensional array chip having a plurality of cell capture parts capable of capturing a single cell in each of the capture parts, and nucleic acid capture parts corresponding to the respective cell capture parts, the nucleic acid capture parts being capable of capturing a nucleic acid extracted from the cell captured by the cell capture part.

Abstract: A transport container includes: a bottom member where the transported object is placed; left and right side members disposed beside the bottom member; a handle disposed above the bottom member; left and right lower connecting members interconnecting the bottom member and side members; and left and right upper connecting members interconnecting the side and the handle members, which are respectively interconnected via hinges. When the handle is not lifted, the side members are separated from the bottom member. When the handle is lifted, the side members laterally support the transported object. As for the transport method, with the transported object stacked in the up-down direction, the transport container is installed at an unloading location such that the lower and upper connecting members are laid to be non-parallel to the side member, and the transported object is taken out from the front or rear between the left and right side members.

Abstract: There is provided a mass spectrometer that can appropriately maintain the atmospheric pressure of a vacuum chamber, and a method of controlling the same. An example of a mass spectrometer according to the present invention includes first vacuum chambers, first vacuum pumps, an atmospheric pressure relating value acquiring unit, and an adjustment unit configured to adjust the effective exhaust velocity of the first vacuum pumps, and controllers. The controllers control the adjustment unit corresponding to an atmospheric pressure relating value.

Abstract: Provided is an automatic analysis device that can suppress concentration of a reagent made to react with a specimen. This automatic analysis device is provided with: a reagent container which accommodates a reagent and which has attached thereto a perforable lid; a perforation unit for perforating the lid; and a reagent suction nozzle that is inserted into a hole formed by perforation and that sucks up the reagent. The automatic analysis device is characterized by being further provided with a state storage unit that stores the state as to whether the reagent container is in an unused state or in a used state, and a state update unit that, when the lid is perforated by the perforation unit while the reagent container is in an unused state, updates the state stored in the state storage unit to the used state.

Abstract: It is not preferable to use a material other than materials that are used in the related art in order to prevent a section from peeling from a microscope slide. This is because, even if adhesiveness is improved, it is necessary to eliminate influence on processes such as dyeing. An object of the invention is to provide a technique for preventing a section from peeling off without applying an additional material. In the invention, the above-described problem is solved by etching at least a part of a region of a surface of a substrate with reactive ions.