Patents Assigned to HITACHI HIGH-TECH CORPORATION
  • Publication number: 20250146985
    Abstract: To provide a method for controlling a liquid chromatograph mass spectrometer by which contamination of a mobile phase solvent caused by a foreign substance can be detected without using an internal standard substance. The method for controlling a liquid chromatograph mass spectrometer according to the present disclosure includes: calculating a first ratio of signal intensities at a first time point and a second time point when measurement is performed using a first mobile phase solvent; calculating a second ratio of signal intensities at the first time point and the second time point when measurement is further performed using a second mobile phase solvent; and determining whether or not the second mobile phase solvent is contaminated according to an absolute difference between the first ratio and the second ratio.
    Type: Application
    Filed: September 21, 2022
    Publication date: May 8, 2025
    Applicant: HITACHI HIGH-TECH CORPORATION
    Inventors: Yuka Sugawara, Hiroyuki Yasuda, Riku Tamura, Tsugunao Toma, Yuichiro Hashimoto, Masuyuki Sugiyama
  • Publication number: 20250145393
    Abstract: Provided are a conveying device and a conveying method capable of improving the position detection accuracy of the holder as compared with the related art. A conveying device 100 includes a coil 107 including a core 105 and a winding 106, a drive unit 108 that supplies a current to the winding 106, a current detection unit 109 that detects the value of the current flowing through the winding 106, and a control unit 110 that calculates the position of a holder 102, in which the control unit 110 calculates the position of the holder 102 based on the current value detected by the current detection unit 109 and the calibration curve obtained in advance, and changes the calibration curve used depending on how the drive voltage is applied by the drive unit 108.
    Type: Application
    Filed: October 28, 2022
    Publication date: May 8, 2025
    Applicant: HITACHI HIGH-TECH CORPORATION
    Inventors: Shinji Azuma, Hiroshi Watanabe, Shigeru Yano
  • Publication number: 20250146972
    Abstract: An electrolyte concentration measuring device measures an ion concentration of analyte ions contained in a liquid, and includes: an ion selective electrode to which the liquid is supplied; a reference electrode serving as a potential reference; and a control unit outputting the ion concentration of the analyte ions based on an electromotive force between the reference electrode and the ion selective electrode to, whereby the control unit obtains a selectivity coefficient of interfering ions that affect measurement of a concentration of the analyte ions or a value corresponding to a concentration of the interfering ions from a trained model by inputting a measured potential of a solution containing the analyte and interfering ions into the model, the model outputting the selectivity coefficient of the interfering ions or the value corresponding to the concentration of the interfering ions based on the potential of the solution containing the ions.
    Type: Application
    Filed: November 29, 2022
    Publication date: May 8, 2025
    Applicant: Hitachi High-Tech Corporation
    Inventor: Kotaro YAMASHITA
  • Patent number: 12292453
    Abstract: The object of the invention is to provide an automatic analysis apparatus which is capable of both sterilizing a reagent and suppressing property variations in the reagent. Provided is an automatic analysis apparatus including a reagent vessel which holds a reagent; a suction nozzle which sucks the reagent; an analysis unit which executes an analysis operation by adding a reagent sucked from the reagent vessel to a specimen via the suction nozzle; an ultraviolet ray source which sterilizes a reagent by ultraviolet irradiation; and an electrode or a substrate which supplies electric power to the ultraviolet ray source, in which a heat insulation portion is arranged between a reagent in the suction nozzle and the ultraviolet ray source and the electrode or the substrate, or, it is isolated between a reagent in the suction nozzle and the ultraviolet ray source and the electrode or the substrate.
    Type: Grant
    Filed: October 31, 2018
    Date of Patent: May 6, 2025
    Assignee: Hitachi High-Tech Corporation
    Inventors: Takeshi Ishida, Yoshihiro Yamashita, Hisashi Yabutani, Koshin Hamasaki
  • Patent number: 12292330
    Abstract: Provided is a spectrometry apparatus that suppresses a reduction in usage efficiency of an irradiation energy of a light. A spectrometry apparatus of the disclosure includes a stage on which a sample is placed, an electromagnetic source that emits an electromagnetic wave, one or a plurality of optical elements that transform a spatial energy distribution of the electromagnetic wave and emit the electromagnetic wave, and a reflective objective lens that collects the electromagnetic wave after a transformation of the spatial energy distribution and irradiates the sample with the collected electromagnetic wave.
    Type: Grant
    Filed: April 6, 2023
    Date of Patent: May 6, 2025
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Kaifeng Zhang, Masahiro Watanabe, Takenori Hirose
  • Patent number: 12292389
    Abstract: A defect inspection apparatus including a stand that supports a sample, an illumination optical system that irradiates the sample with illumination light, a scanning device that drives the sample stand to change position, detection optical systems that condense illumination scattered light from a surface of the sample, sensors that convert the condensed light into an electric signal and output a detection signal, a storage device that stores a plurality of feature vectors for each defect type, and a signal processing device that processes detection signals input from the plurality of sensors. The signal processing device calculates a measurement vector that is a feature vector of a defect on the surface of the sample, generates a feature vector of a virtual defect in which a form of the detection defect has been changed, from the actual measurement vector, and accumulates the feature vector of the virtual defect of one instruction defect.
    Type: Grant
    Filed: June 5, 2020
    Date of Patent: May 6, 2025
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventor: Toshifumi Honda
  • Patent number: 12292438
    Abstract: Provided is an automatic analyzer to control a temperature of a reagent supplied to a magnetic separator with high accuracy. The automatic analyzer includes a magnetic separator that separates a magnetic component and a non-magnetic component from liquid obtained by reacting a sample with a first reagent, a storage unit that accommodates a second reagent, a pipe used to supply the second reagent to the magnetic separator, and a heat exchanger that adjusts a temperature around the pipe. It is preferable that the heat exchanger includes a heat absorption and dissipation unit and a fan that blows air heat-exchanged by the heat absorption and dissipation unit, and the air blown from the fan is blown onto the pipe.
    Type: Grant
    Filed: February 25, 2020
    Date of Patent: May 6, 2025
    Assignee: Hitachi High-Tech Corporation
    Inventors: Koki Yokoyama, Takenori Okusa
  • Publication number: 20250137965
    Abstract: In order to provide an electrophoresis device requiring no realignment of the optical axis of excitation light with the capillary array even if the outer diameter of the capillary may change, the electrophoresis device includes: a capillary array including a planar arrangement of capillaries used for electrophoresis of a sample; an excitation light source that applies excitation light along an arrangement direction of the capillaries; a fluorescence measuring unit that measures fluorescence induced from the capillary array; a reference member on which the capillary array is arranged; and a capillary mounting stand having a window through which the excitation light passes, and being to be abutted against the reference member. The reference member has a step that is set based on outer diameters of the capillaries.
    Type: Application
    Filed: February 15, 2022
    Publication date: May 1, 2025
    Applicant: HITACHI HIGH-TECH CORPORATION
    Inventor: Hitoshi Miyata
  • Publication number: 20250138047
    Abstract: A scanning probe microscope in which an objective lens used to radiate exciting light and collect Raman scattering light can be disposed more near a sample and a tip is provided. The scanning probe microscope includes: a sample holder configured to hold a sample; a tip disposed near the sample; an exciting light source configured to output exciting light; an objective lens configured to condense the exciting light and radiating the exciting light to the tip; a light reception unit configured to detect scattering light generated from the sample through the radiation of the exciting light; and an incident position adjustment unit configured to cause the exciting light to be incident on a position deviating from an optical axis of the objective lens.
    Type: Application
    Filed: July 4, 2022
    Publication date: May 1, 2025
    Applicant: Hitachi High-Tech Corporation
    Inventors: Kaifeng ZHANG, Masahiro WATANABE, Takenori HIROSE
  • Patent number: 12282000
    Abstract: The present invention aims to provide a biological sample analysis device which achieves an improvement in accuracy of an analysis result, a reduction in reagent cost, and shortening of a required time. The biological sample analysis device according to the present invention compares first measurement data acquired by measuring a biological sample and second measurement data acquired by measuring a reference sample and determines that when the difference between the two exceeds a threshold value, it is necessary to remeasure the reference sample before remeasuring the biological sample and reacquire a reference value (refer to FIG. 3A).
    Type: Grant
    Filed: September 17, 2019
    Date of Patent: April 22, 2025
    Assignee: Hitachi High-Tech Corporation
    Inventors: Ayaka Okuno, Michiru Fujioka, Toru Yokoyama
  • Patent number: 12283452
    Abstract: Provided is a charged particle beam apparatus capable of realizing a highly reliable insulating structure. This charged particle beam apparatus emits a charged particle beam from a charged particle beam emission device onto a sample, detects charged particles generated from the sample, and creates a sample image or processes the sample. The charged particle beam emission device is provided with a charged particle source and a shield arranged in an interior of a metal housing that is filled with an insulating gas, and an acceleration electrode arranged below the charged particle source, power being supplied to the acceleration electrode via the shield.
    Type: Grant
    Filed: April 15, 2021
    Date of Patent: April 22, 2025
    Assignee: Hitachi High-Tech Corporation
    Inventors: Hiroshi Morita, Takashi Kubo, Minoru Sakamaki, Shuhei Ishikawa, Shunichi Watanabe
  • Patent number: 12283091
    Abstract: The objective of the present invention is to provide an image classification device and a method therefor with which suitable teaching data can be created. An image classification device that carries out image classification using images which are in a class to be classified and include teaching information, and images which are in a class not to be classified and to which teaching information has not been assigned, said image classification device being characterized by being provided with: an image group input unit for receiving inputs of an image group belonging to a class to be classified and an image group belonging to a class not to be classified; and a subclassification unit for extracting a feature amount for each image in an image group, clustering the feature amounts of the images in the image group belonging to a class not to be classified, and thereby dividing the images into sub-classes.
    Type: Grant
    Filed: November 6, 2020
    Date of Patent: April 22, 2025
    Assignee: Hitachi High-Tech Corporation
    Inventors: Sota Komatsu, Masayoshi Ishikawa, Fumihiro Bekku, Takefumi Kakinuma
  • Patent number: 12283458
    Abstract: There is provided a technique capable of shortening a photographing time and obtaining a more accurate photographed image when photographing a sample SAM using a charged particle beam device 1. The charged particle beam device 1 includes an electron gun 3, an objective lens 6, a stage 8, detectors 10 and 11, an integrated control unit C0, a photographing function, and an autofocus function. Each of a plurality of photographing visual fields is focused in a focus value calculation visual field 64 adjacent to a designated visual field 61 designated as a photographing target among the plurality of photographing visual fields, and a focus value calculated in the focus value calculation visual field 64 is used for calculating focus values of each of the plurality of photographing visual fields.
    Type: Grant
    Filed: March 18, 2020
    Date of Patent: April 22, 2025
    Assignee: Hitachi High-Tech Corporation
    Inventors: Mai Yoshihara, Hirotsugu Kajiyama, Hiroyuki Chiba
  • Patent number: 12282034
    Abstract: Provided are a device and a method capable of determining an optimal retrieving condition of a specimen rack according to various situations, when an error occurs in any specimen among a plurality of specimens mounted on the specimen rack. When the error occurs in a specimen accommodated in a specimen container mounted on the specimen rack, conveyance of the specimen rack is controlled on the basis of information about the specimen having the error and a specimen accommodated in another specimen container on the specimen rack on which the specimen container with the specimen accommodated therein is mounted, and the retrieval condition of the specimen rack.
    Type: Grant
    Filed: December 13, 2019
    Date of Patent: April 22, 2025
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Takeshi Setomaru, Hiroyuki Mishima
  • Patent number: 12276635
    Abstract: The present invention aims to provide an electrophoresis device which detects the presence or absence of foreign matter in a flow path 111. In order to solve the above problems, the electrophoresis device of the present invention is characterized by including a flow path 111 filled thereinside with a migration medium, a migration medium container which stores a migration medium, a liquid feeding mechanism which feeds the migration medium to the flow path 111, a photographing device 115 which photographs the flow path 111, and a control unit which analyzes an image of the flow path 111 photographed by the photographing device 115 and in that the control unit determines the presence or absence of the foreign matter in the flow path 111 on the basis of the image of the flow path 111.
    Type: Grant
    Filed: November 11, 2019
    Date of Patent: April 15, 2025
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Masashi Tomiyoshi, Masashi Watanabe, Takeshi Ooura, Motohiro Yamazaki
  • Patent number: 12276608
    Abstract: In an analysis method and an analysis system for detecting fluorescences from each of a plurality of light-emitting points in a plurality of wavelength bands in order to identify fluorescence emissions of a plurality of types of fluorophores from the plurality of light-emitting points, spatial crosstalk and spectral crosstalk are present between the plurality of light-emitting points and between the plurality of wavelength bands, and then performance of the identification is reduced. The spatial crosstalk and the spectral crosstalk are eliminated and concentrations of each of the plurality of types of fluorophores at each of the plurality of light-emitting points are derived by inputting all detection signals in the plurality of wavelength bands for the plurality of light-emitting points to a predetermined arithmetic operation expression.
    Type: Grant
    Filed: April 21, 2020
    Date of Patent: April 15, 2025
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Takashi Anazawa, Ryoji Inaba, Shuhei Yamamoto, Taro Nakazawa, Michiru Fujioka, Motohiro Yamazaki
  • Patent number: 12276618
    Abstract: The purpose of the present disclosure is to provide a defect inspection device with which it is possible to suppress variation in an output signal occurring when an imaging operation condition for an image sensor is changed. The defect inspection device according to the present disclosure comprises a detector that outputs a detection signal for signal light generated by irradiating a sample with light. The detector is controlled so that a first operation state of the detector in a first signal acquisition condition and a second operation state of the detector in a second signal acquisition condition are the same.
    Type: Grant
    Filed: October 30, 2020
    Date of Patent: April 15, 2025
    Assignee: Hitachi High-Tech Corporation
    Inventors: Kazuhide Sato, Yukihisa Mohara, Masami Makuuchi
  • Patent number: 12270822
    Abstract: Provided is an automatic analysis device and an analysis method which are capable of reliably detecting an abnormality in a dispensing amount of a solution such as a specimen or a reagent to be dispensed and suppressing a decrease in analysis accuracy.
    Type: Grant
    Filed: August 26, 2019
    Date of Patent: April 8, 2025
    Assignee: Hitachi High-Tech Corporation
    Inventors: Daisuke Ebihara, Shinya Matsuoka, Makoto Nogami, Taku Sakazume
  • Patent number: 12266500
    Abstract: The present disclosure provides a charged particle beam device capable of simultaneously achieving protection of a charged particle source against electrical discharging inside a charged particle gun and highly accurate control of the charged particle gun, for both DC and AC components. A charged particle gun according to the present disclosure is configured such that an extraction voltage and an acceleration voltage are superposed and supplied to a charged particle beam source, a wiring between the charged particle beam source and a voltage circuit is covered with first and second enclosures, the first enclosure is configured to be connected to an extraction electrode, and the second enclosure is configured to be connected to an acceleration electrode and to a reference voltage of the voltage circuit.
    Type: Grant
    Filed: December 13, 2019
    Date of Patent: April 1, 2025
    Assignee: Hitachi High-Tech Corporation
    Inventor: Tomoyo Sasaki
  • Patent number: 12265041
    Abstract: A risk of breakage of a sample holder can be reduced and a biochemical sample or a liquid sample can be observed easily and with a high observation throughput. A sample holder 101 holding a sample includes: a sample chamber including a first insulating thin film 110 and a second insulating thin film 111 that sandwich and hold the sample 200 in a liquid or gel form and face each other, a vacuum partition wall inside which the sample chamber holding the sample is fixed in a state in which the thin film is exposed to a surrounding atmosphere, and whose internal space is kept at a degree of vacuum at least lower than that of the sample room at the time of observation of the sample, a detection electrode 820 disposed to face the second insulating thin film in a state in which the sample chamber is fixed to the vacuum partition wall, and a signal detection unit 50 connected to the detection electrode.
    Type: Grant
    Filed: October 10, 2019
    Date of Patent: April 1, 2025
    Assignees: Hitachi High-Tech Corporation, National Institute of Advanced Industrial Science and Technology
    Inventors: Michio Hatano, Mitsuhiro Nakamura, Toshihiko Ogura