Sample rack

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Description

FIG. 1 is a front, top and right side perspective view of a sample rack according to the design;

FIG. 2 is a rear, top and left side perspective view thereof.

FIG. 3 is a rear, bottom and left side perspective view thereof;

FIG. 4 is a front elevational view thereof;

FIG. 5 is a rear elevational view thereof;

FIG. 6 is a left side elevational view thereof;

FIG. 7 is a right side elevational view thereof;

FIG. 8 is a top plan view thereof;

FIG. 9 is a bottom plan view thereof;

FIG. 10 is a cross-sectional view taken along line 10-10 of FIG. 4;

FIG. 11 is a cross-sectional view taken along line 11-11 of FIG. 8;

FIG. 12 is a cross-sectional view taken along line 12-12 of FIG. 8;

FIG. 13 is a cross-sectional view taken along line 13-13 of FIG. 4; and,

FIG. 14 is a cross-sectional view taken along line 14-14 of FIG. 4.

The broken lines illustrate portions of the sample rack that form no part of the claimed design.

Claims

The ornamental design for a sample rack, as shown and described.

Referenced Cited
U.S. Patent Documents
D288845 March 17, 1987 Borer
D413391 August 31, 1999 Lapeus
D413677 September 7, 1999 Dumitrescu
D420747 February 15, 2000 Dumitrescu
D421130 February 22, 2000 Cohen
D428497 July 18, 2000 Lapeus
7132082 November 7, 2006 Aviles
7276208 October 2, 2007 Sevigny
D675338 January 29, 2013 Suzuki
D837401 January 1, 2019 Gardner
D954991 June 14, 2022 Hintikka
D975313 January 10, 2023 Tanaka
D979091 February 21, 2023 Chi
D984672 April 25, 2023 Tanaka
20200072857 March 5, 2020 Oda
Foreign Patent Documents
307988933 April 2023 CN
Other references
  • U.S. Appl. No. 29/828,132, filed Feb. 24, 2022.
Patent History
Patent number: D1006252
Type: Grant
Filed: Feb 24, 2022
Date of Patent: Nov 28, 2023
Assignee: Hitachi High-Tech Corporation (Tokyo)
Inventors: Yudai Fukushi (Tokyo), Yasuhiro Keta (Tokyo), Eiichiro Takada (Tokyo), Fuka Matsudaira (Tokyo), Ai Masuda (Tokyo)
Primary Examiner: Omeed Agilee
Application Number: 29/828,131