Adjustment plate for observation device for samples such as cells
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The features shown in evenly-dashed broken lines depict environmental subject matter only and form no part of the claimed design. The dot-dash broken lines in the drawings represent the bounds of the claimed subject matter, the dot-dash lines, themselves forming no part thereof. The dot-dot-dash lines in the drawings depict the boundaries of the enlarged views that form no part of the claimed design.
Claims
The ornamental design for an adjustment plate for observation device for samples such as cells, as shown and described.
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- Broadcom AFBR-S4N44P164M 4×4 NUV-MT Photo Multiplier Array. Online, published date Jul. 21, 2022. Retrieved on Mar. 1, 2023 from URL: https://www.electronics-lab.com/broadcom-afbr-s4n44p164m-4x4-nuv-mt-photo-multiplier-array/.
Type: Grant
Filed: Nov 20, 2020
Date of Patent: Feb 20, 2024
Assignee: HAMAMATSU PHOTONICS K.K. (Hamamatsu)
Inventor: Satoshi Yamamoto (Hamamatsu)
Primary Examiner: Omeed Agilee
Application Number: 29/759,206