Adjustment plate for observation device for samples such as cells

- HAMAMATSU PHOTONICS K.K.
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Description

FIG. 1 is a front view of an adjustment plate for observation device for samples such as cells of the first embodiment of the present invention;

FIG. 2 is a rear view thereof;

FIG. 3 is an enlarged view showing a portion 3 of FIG. 2;

FIG. 4 is an enlarged view showing a portion 4 of FIG. 2;

FIG. 5 is an enlarged view showing a portion 5 of FIG. 2;

FIG. 6 is a top plan view thereof;

FIG. 7 is a bottom plan view thereof;

FIG. 8 is a right side view thereof;

FIG. 9 is a left side view thereof;

FIG. 10 is a front, top plan and left side perspective view thereof;

FIG. 11 is a rear, top plan and right side perspective view thereof;

FIG. 12 is an enlarged cross-sectional view along the line 12-12 in FIG. 1;

FIG. 13 is an enlarged cross-sectional view along the line 13-13 in FIG. 1;

FIG. 14 is an enlarged cross-sectional view along the line 14-14 in FIG. 1;

FIG. 15 is an enlarged view showing a portion 15 of FIG. 3;

FIG. 16 is an enlarged view showing a portion 16 of FIG. 4;

FIG. 17 is an enlarged view showing a portion 17 of FIG. 3;

FIG. 18 is an enlarged view showing a portion 18 of FIG. 5;

FIG. 19 is an enlarged view showing a portion 19 of FIG. 5;

FIG. 20 is a front view of an adjustment plate for observation device for samples such as cells of the second embodiment of the present invention;

FIG. 21 is a rear view thereof;

FIG. 22 is an enlarged view showing a portion 22 of FIG. 21;

FIG. 23 is an enlarged view showing a portion 23 of FIG. 21;

FIG. 24 is an enlarged view showing a portion 24 of FIG. 21;

FIG. 25 is a top plan view thereof;

FIG. 26 is a bottom plan view thereof;

FIG. 27 is a right side view thereof;

FIG. 28 is a left side view thereof;

FIG. 29 is a front, top plan and left side perspective view thereof;

FIG. 30 is a rear, top plan and right side perspective view thereof;

FIG. 31 is an enlarged cross-sectional view along the line 31-31 in FIG. 20;

FIG. 32 is an enlarged cross-sectional view along the line 32-32 in FIG. 20;

FIG. 33 is an enlarged cross-sectional view along the line 33-33 in FIG. 20;

FIG. 34 is an enlarged view showing a portion 34 of FIG. 22;

FIG. 35 is an enlarged view showing a portion 35 of FIG. 23;

FIG. 36 is an enlarged view showing a portion 36 of FIG. 22;

FIG. 37 is an enlarged view showing a portion 37 of FIG. 24; and,

FIG. 38 is an enlarged view showing a portion 38 of FIG. 24.

The features shown in evenly-dashed broken lines depict environmental subject matter only and form no part of the claimed design. The dot-dash broken lines in the drawings represent the bounds of the claimed subject matter, the dot-dash lines, themselves forming no part thereof. The dot-dot-dash lines in the drawings depict the boundaries of the enlarged views that form no part of the claimed design.

Claims

The ornamental design for an adjustment plate for observation device for samples such as cells, as shown and described.

Referenced Cited
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Foreign Patent Documents
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Other references
  • Broadcom AFBR-S4N44P164M 4×4 NUV-MT Photo Multiplier Array. Online, published date Jul. 21, 2022. Retrieved on Mar. 1, 2023 from URL: https://www.electronics-lab.com/broadcom-afbr-s4n44p164m-4x4-nuv-mt-photo-multiplier-array/.
Patent History
Patent number: D1015566
Type: Grant
Filed: Nov 20, 2020
Date of Patent: Feb 20, 2024
Assignee: HAMAMATSU PHOTONICS K.K. (Hamamatsu)
Inventor: Satoshi Yamamoto (Hamamatsu)
Primary Examiner: Omeed Agilee
Application Number: 29/759,206
Classifications