Adjustment plate for observation device for samples such as cells

- HAMAMATSU PHOTONICS K.K.
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Description

FIG. 1 is a front view of an adjustment plate for observation device for samples such as cells of the first embodiment of the present invention;

FIG. 2 is a rear view thereof;

FIG. 3 is an enlarged view showing a portion 3 of FIG. 2;

FIG. 4 is an enlarged view showing a portion 4 of FIG. 2;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof;

FIG. 7 is a right side view thereof;

FIG. 8 is a left side view thereof;

FIG. 9 is a front, top plan and left side perspective view thereof;

FIG. 10 is a rear, top plan and right side perspective view thereof;

FIG. 11 is an enlarged cross-sectional view along the line 11-11 in FIG. 1;

FIG. 12 is an enlarged cross-sectional view along the line 12-12 in FIG. 1;

FIG. 13 is an enlarged view showing a portion 13 of FIG. 3;

FIG. 14 is an enlarged view showing a portion 14 of FIG. 3;

FIG. 15 is an enlarged view showing a portion 15 of FIG. 4;

FIG. 16 is an enlarged view showing a portion 16 of FIG. 4;

FIG. 17 is a front view of an adjustment plate for observation device for samples such as cells of the second embodiment of the present invention;

FIG. 18 is a rear view thereof;

FIG. 19 is an enlarged view showing a portion 19 of FIG. 18;

FIG. 20 is an enlarged view showing a portion 20 of FIG. 18;

FIG. 21 is a top plan view thereof;

FIG. 22 is a bottom plan view thereof;

FIG. 23 is a right side view thereof;

FIG. 24 is a left side view thereof;

FIG. 25 is a front, top plan and left side perspective view thereof;

FIG. 26 is a rear, top plan and right side perspective view thereof;

FIG. 27 is an enlarged cross-sectional view along the line 27-27 in FIG. 17;

FIG. 28 is an enlarged cross-sectional view along the line 28-28 in FIG. 17;

FIG. 29 is an enlarged view showing a portion 29 of FIG. 19;

FIG. 30 is an enlarged view showing a portion 30 of FIG. 19;

FIG. 31 is an enlarged view showing a portion 31 of FIG. 20; and,

FIG. 32 is an enlarged view showing a portion 32 of FIG. 20.

The features shown in broken lines depict environmental subject matter only and form no part of the claimed design. The dot-dot-dash lines in the drawings depict the boundaries of the enlarged views that form no part of the claimed design.

Claims

The ornamental design for an adjustment plate for observation device for samples such as cells, as shown and described.

Referenced Cited
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Foreign Patent Documents
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Other references
  • Broadcom AFBR-S4N44P164M 4×4 Nuv-Mt Photo Multiplier Array. Online, published date Jul. 21, 2022. Retrieved on Mar. 1, 2023 from URL: https://www.electronics-lab.com/broadcom-afbr-s4n44p164m-4x4-nuv-mt-photo-multiplier-array/.
Patent History
Patent number: D1015567
Type: Grant
Filed: Nov 20, 2020
Date of Patent: Feb 20, 2024
Assignee: HAMAMATSU PHOTONICS K.K. (Hamamatsu)
Inventor: Satoshi Yamamoto (Hamamatsu)
Primary Examiner: Omeed Agilee
Application Number: 29/759,219
Classifications