Automobile fault detector

- AUTOPHIX TECH CO., LTD
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Description

FIG. 1 is a front and bottom perspective view of an automobile fault detector showing our new design;

FIG. 2 is a rear and top perspective view thereof;

FIG. 3 is a front elevation view thereof;

FIG. 4 is a rear elevation view thereof;

FIG. 5 is a left side elevation view thereof;

FIG. 6 is a right side elevation view thereof;

FIG. 7 is a top plan view thereof; and,

FIG. 8 is a bottom plan view thereof.

The dash-dash broken lines in the drawings depict the portions of the automobile fault detector which form no part of the claimed design.

Claims

The ornamental design for an automobile fault detector, as shown and described.

Referenced Cited
U.S. Patent Documents
D629318 December 21, 2010 Disch
D827464 September 4, 2018 Hao
D838195 January 15, 2019 Wu
D839113 January 29, 2019 Xie
D839114 January 29, 2019 Xie
D871943 January 7, 2020 Xie
D903515 December 1, 2020 Zhao
D918074 May 4, 2021 Zhao
D918748 May 11, 2021 Zhao
D937693 December 7, 2021 Lu
D947048 March 29, 2022 Gao
D963497 September 13, 2022 Hao
D978000 February 14, 2023 Peng
Foreign Patent Documents
302855880 July 2013 CN
307000708 August 2021 CN
307141019 November 2021 CN
009046519-0002 May 2022 EM
6211612 June 2022 GB
Other references
  • Autophix Store, BAS300 Plus OBD2 Scanner Battery Tester 2 in 1 Car Code Reader,Date first available Nov. 2, 2022,[online]retrieved Dec. 1, 2023,available from https://www.amazon.com/DP/BAS300 Plus (Year: 2022).
  • Autophix Store, Car Battery Tester 12V 24V Autophix BAS100,Date first available Nov. 4, 2022, [online]retrieved Dec. 1, 2023, available from https://www.amazon.com/DP/B0BLH6PTTZ (Year: 2022).
  • Thinkcar Store, OBD2 Scanner,Date first available Jan. 2, 2020,[online]retrieved Dec. 1, 2023,available from https://www.amazon.com/DP/B083F65T8Q (Year: 2020).
Patent History
Patent number: D1019438
Type: Grant
Filed: Nov 7, 2022
Date of Patent: Mar 26, 2024
Assignee: AUTOPHIX TECH CO., LTD (Shenzhen)
Inventors: Yutao Zhao (Shenzhen), Qing Huang (Shenzhen), Jian Hao (Shenzhen)
Primary Examiner: Keli L Hill
Assistant Examiner: Sara S Sahneh
Application Number: 29/859,034
Classifications