Probe for measuring electrical characteristics
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The dashed broken lines illustrate portions of the probe for measuring electrical characteristics that form no part of the claimed design. The dot-dash broken lines define boundaries of the claimed design and form no part thereof.
Claims
The ornamental design for a probe for measuring electrical characteristics, as shown and described.
305059488 | March 2019 | CN |
D1445607 | July 2012 | JP |
D1635839 | July 2019 | JP |
D1716912 | June 2022 | JP |
D198372 | July 2019 | TW |
- Anonymous, “Contact probe / checker pin,” SK Koki Co., Ltd., accessed Jul. 2022, pp. 1-6, Available at: http://www.sk-kohki.co.jp/content.php?tp=n&c1=12.
Type: Grant
Filed: Apr 26, 2022
Date of Patent: Apr 30, 2024
Assignee: OKINS ELECTRONICS CO., LTD. (Gyeonggi-do)
Inventor: Masafumi Okuma (Tokyo)
Primary Examiner: Antoine Duval Davis
Application Number: 29/836,243