Probe for measuring electrical characteristics

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Description

FIG. 1 is a perspective view of a probe for measuring electrical characteristics showing my new design;

FIG. 2 is a front view thereof, the rear view being a mirror image thereof;

FIG. 3 is a right side view thereof, the left side view being a mirror image thereof;

FIG. 4 is a top view thereof;

FIG. 5 is a bottom view thereof;

FIG. 6 is a cross-sectional view thereof taken along line 6-6 in FIG. 2;

FIG. 7 is an enlarged cross-sectional view thereof taken along line 7-7 in FIG. 2; and,

FIG. 8 is an enlarged cross-sectional view thereof taken along line 8-8 in FIG. 2.

The dashed broken lines illustrate portions of the probe for measuring electrical characteristics that form no part of the claimed design. The dot-dash broken lines define boundaries of the claimed design and form no part thereof.

Claims

The ornamental design for a probe for measuring electrical characteristics, as shown and described.

Referenced Cited
U.S. Patent Documents
D827459 September 4, 2018 Matsumiya et al.
11639945 May 2, 2023 Jeong
11719720 August 8, 2023 Wei
Foreign Patent Documents
305059488 March 2019 CN
D1445607 July 2012 JP
D1635839 July 2019 JP
D1716912 June 2022 JP
D198372 July 2019 TW
Other references
  • Anonymous, “Contact probe / checker pin,” SK Koki Co., Ltd., accessed Jul. 2022, pp. 1-6, Available at: http://www.sk-kohki.co.jp/content.php?tp=n&c1=12.
Patent History
Patent number: D1024815
Type: Grant
Filed: Apr 26, 2022
Date of Patent: Apr 30, 2024
Assignee: OKINS ELECTRONICS CO., LTD. (Gyeonggi-do)
Inventor: Masafumi Okuma (Tokyo)
Primary Examiner: Antoine Duval Davis
Application Number: 29/836,243