Test device

Skip to: Description  ·  Claims  ·  References Cited  · Patent History  ·  Patent History
Description

FIG. 1 is a perspective view of the test device according to the present design, wherein the test device does not have a cap;

FIG. 2 is another perspective view of the test device of FIG. 1;

FIG. 3 is a top view of the test device of FIG. 1;

FIG. 4 is a bottom view of the test device of FIG. 1;

FIG. 5 is a right view of the test device of FIG. 1;

FIG. 6 is a left view of the test device of FIG. 1;

FIG. 7 is a front view of the test device of FIG. 1; and,

FIG. 8 is a rear view of the test device of FIG. 1.

The broken lines show portions of the test device that form no part of the claimed design.

Claims

The ornamental design for a test device, as shown and described.

Referenced Cited
U.S. Patent Documents
D323116 January 14, 1992 Dart
6342183 January 29, 2002 Lappe
6406922 June 18, 2002 Casterlin
D494279 August 10, 2004 Cogan
D582767 December 16, 2008 Batton
D610700 February 23, 2010 Khoury
D690826 October 1, 2013 Kuroda
D767158 September 20, 2016 Wang
D797303 September 12, 2017 Wan
D831196 October 16, 2018 Fang
D895139 September 1, 2020 Hong
D901677 November 10, 2020 Hong
D901678 November 10, 2020 Hong
D912271 March 2, 2021 Rathbone
D912806 March 9, 2021 Lei
D913521 March 16, 2021 Hong
D918412 May 4, 2021 Hong
D930154 September 7, 2021 Luebbers
D954987 June 14, 2022 Veenendaal
D960388 August 9, 2022 Fang
20030021727 January 30, 2003 Weyker
20030022392 January 30, 2003 Hudak
20050106750 May 19, 2005 Tung
20070196234 August 23, 2007 Huff
20190250075 August 15, 2019 Wu
20210033598 February 4, 2021 Wu
Patent History
Patent number: D1032015
Type: Grant
Filed: Oct 16, 2019
Date of Patent: Jun 18, 2024
Assignee: Hangzhou Biotest Biotech Co., Ltd. (Hangzhou)
Inventors: Todd Bailey (Shorewood, MN), Lorraine Cogan (San Diego, CA), Liang Hong (Hangzhou), John Wu (San Diego, CA), Yangyu Zhu (San Diego, CA)
Primary Examiner: Nathan M Johnston
Application Number: 29/709,650