Inspection device

Skip to: Description  ·  Claims  ·  References Cited  · Patent History  ·  Patent History
Description

FIG. 1 is a perspective view of an inspection device according to the present invention.

FIG. 2 is a front view of the inspection device of FIG. 1.

FIG. 3 is a left side view of the inspection device of FIG. 1.

FIG. 4 is a right side view of the inspection device of FIG. 1.

FIG. 5 is a top side view of the inspection device of FIG. 1.

FIG. 6 is a bottom view of the inspection device of FIG. 1.

FIG. 7 is a rear view of the inspection device of FIG. 1.

FIG. 8 is a front perspective view of the inspection device shown in an alternate configuration with the rear portion extended.

FIG. 9 is a front view of the inspection device of FIG. 8.

FIG. 10 is a left side view of the inspection device of FIG. 8.

FIG. 11 is a right side view of the inspection device of FIG. 8.

FIG. 12 is a top side view of the inspection device of FIG. 8.

FIG. 13 is a bottom view of the inspection device of FIG. 8.

FIG. 14 is a rear view of the inspection device of FIG. 8.

FIG. 15 is another front perspective view of the inspection device shown in an alternate configuration with the rear portion extended.

FIG. 16 is a front view of the inspection device of FIG. 15.

FIG. 17 is a left side view of the inspection device of FIG. 15.

FIG. 18 is a right side view of the inspection device of FIG. 15.

FIG. 19 is a top side view of the inspection device of FIG. 15.

FIG. 20 is a bottom view of the inspection device of FIG. 15; and,

FIG. 21 is a rear view of the inspection device of FIG. 15.

The broken lines in the drawings form no part of the claimed design. Any shading and crosshatching are not features of the design but are utilized to illustrate the surface contours of the claimed design in the drawings.

Claims

The ornamental design for a hand-held ultrasonic inspection device, as shown and described.

Referenced Cited
U.S. Patent Documents
D438849 March 13, 2001 Adachi
D467512 December 24, 2002 Miyazaki
D488472 April 13, 2004 Haase
D531068 October 31, 2006 Fan
D535031 January 9, 2007 Barrett
D540205 April 10, 2007 Hsu
D541798 May 1, 2007 Ichida
D576618 September 9, 2008 Wong
D582916 December 16, 2008 Wada
D608746 January 26, 2010 Tu
D638813 May 31, 2011 Liu
D658155 April 24, 2012 Ohta
D675584 February 5, 2013 Sharp
D695139 December 10, 2013 Kent
D702570 April 15, 2014 Emge
D726047 April 7, 2015 Laurino
D730895 June 2, 2015 Anundi
D731992 June 16, 2015 Budde
D770313 November 1, 2016 Turcotte
D817951 May 15, 2018 Chang
D830209 October 9, 2018 Wang
D837074 January 1, 2019 Lu
D850307 June 4, 2019 Souillard
D868020 November 26, 2019 Deng
D875694 February 18, 2020 Crees
D946763 March 22, 2022 Ubbesen
D949816 April 26, 2022 Guo
D956591 July 5, 2022 Yao
D983379 April 11, 2023 McIlvaine
D1009027 December 26, 2023 Katayama
20060274493 December 7, 2006 Richardson
20150107051 April 23, 2015 Sakai
Foreign Patent Documents
001624305-0003 October 2009 EM
D1156978 November 2002 JP
D1170093 April 2003 JP
D1428054 November 2011 JP
D1438206 April 2012 JP
D1452385 October 2012 JP
122239-0001 April 2008 TW
WO D102968-002 December 2018 WO
Other references
  • Ultrasonic Flaw Detector Rentals, date not known [online], retrieved Oct. 12, 2022, retrieved from the internet: < https://www.bergeng.com/category/rental-flaw.html > (Year: 2022).
  • UltraSonic Industrial Imager: 2 kHz to 52 kHz, date not known [online], retrieved Oct. 12, 2022, retrieved from the internet: < https://www.grainger.com/product/54XZ83?> (Year: 2022).
  • Compact Thermal Camera Flir C5, date not known [online], retrieved Oct. 12, 2022, retrieved from the internet: < https://www.flir.com/products/c5/? > (Year: 2022).
  • Industrial Ultrasonic Testing, date not known [online], retrieved Oct. 12, 2022, retrieved from the internet: < https://www.bakerhughes.com/waygate-technologies/ultrasonic-testing > (Year: 2022).
Patent History
Patent number: D1034255
Type: Grant
Filed: Jul 2, 2020
Date of Patent: Jul 9, 2024
Assignee: Baker Hughes Oilfield Operations LLC (Houston, TX)
Inventors: Wenda Zhu (Shanghai), Appu Gopakumar (Hurth), Ralf Ratering (Bruhl), Johannes Buechler (Siegburg), Jiamin Lei (Shanghai)
Primary Examiner: Janice Hallmark
Assistant Examiner: Rodolfo Castro, Jr.
Application Number: 29/740,322