Microscope stand

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Description

FIG. 1 is a front perspective view of a microscope stand, showing my new design;

FIG. 2 is a front perspective view in another angle thereof;

FIG. 3 is a rear perspective view thereof;

FIG. 4 is a front elevational view thereof;

FIG. 5 is a rear elevational view thereof;

FIG. 6 is a left side view thereof;

FIG. 7 is a right side view thereof;

FIG. 8 is a top plan view thereof;

FIG. 9 is a bottom plan view thereof;

FIG. 10 is a partial enlarged view of FIG. 1;

FIG. 11 is a partial enlarged view of FIG. 1;

FIG. 12 is a partial enlarged view of FIG. 1;

FIG. 13 is a partial enlarged view of FIG. 1;

FIG. 14 is a partial enlarged view of FIG. 1;

FIG. 15 is a partial enlarged view of FIG. 1;

FIG. 16 is a partial enlarged view of FIG. 1;

FIG. 17 is a partial enlarged view of FIG. 1;

FIG. 18 is a partial enlarged view of FIG. 2;

FIG. 19 is a partial enlarged view of FIG. 2;

FIG. 20 is a partial enlarged view of FIG. 2;

FIG. 21 is a partial enlarged view of FIG. 2;

FIG. 22 is a partial enlarged view of FIG. 2;

FIG. 23 is a partial enlarged view of FIG. 2;

FIG. 24 is a partial enlarged view of FIG. 2;

FIG. 25 is a partial enlarged view of FIG. 3;

FIG. 26 is a partial enlarged view of FIG. 3;

FIG. 27 is a partial enlarged view of FIG. 3;

FIG. 28 is a partial enlarged view of FIG. 3; and,

FIG. 29 is a partial enlarged view of FIG. 3.

The dash-dash broken lines in the drawings depict portions of the microscope stand and form no part of the claimed design. The dot-dash broken lines demarcate the boundaries of the enlarged views and form no part of the claimed design.

Claims

The ornamental design for a microscope stand, as shown and described.

Referenced Cited
U.S. Patent Documents
D235478 June 1975 Armbruster
D656977 April 3, 2012 Nojima
D962321 August 30, 2022 Jiang
D983853 April 18, 2023 Liu
D1008331 December 19, 2023 Wu
Patent History
Patent number: D1044903
Type: Grant
Filed: Dec 7, 2022
Date of Patent: Oct 1, 2024
Inventor: Xiaoli Jiang (Henan)
Primary Examiner: Maria J. Edwards
Assistant Examiner: Dina Michelle Hoeynck
Application Number: 29/862,163
Classifications
Current U.S. Class: Element Or Attachment (D16/136)