Eye testing apparatus and equipment
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Description
The broken lines depict portions of the eye testing apparatus and equipment that form no part of the claimed design.
Claims
The ornamental design for an eye testing apparatus and equipment as shown and described.
Referenced Cited
U.S. Patent Documents
Foreign Patent Documents
Other references
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Patent History
Patent number: D1057170
Type: Grant
Filed: Feb 17, 2022
Date of Patent: Jan 7, 2025
Assignee: TOPCON CORPORATION (Tokyo)
Inventors: Hiroyuki Okada (Tokyo), Takeo Aoki (Tokyo), Yasuhisa Kaneda (Tokyo)
Primary Examiner: Wendy L Arminio
Assistant Examiner: Maheen Khurshid
Application Number: 29/827,120
Type: Grant
Filed: Feb 17, 2022
Date of Patent: Jan 7, 2025
Assignee: TOPCON CORPORATION (Tokyo)
Inventors: Hiroyuki Okada (Tokyo), Takeo Aoki (Tokyo), Yasuhisa Kaneda (Tokyo)
Primary Examiner: Wendy L Arminio
Assistant Examiner: Maheen Khurshid
Application Number: 29/827,120
Classifications
Current U.S. Class:
Ophthalmic (44) (D24/172)