Digimatic micrometer

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Description

FIG. 1 is a front, right and top side perspective view of a digimatic micrometer showing our new design;

FIG. 2 is a rear, left and bottom side perspective view thereof;

FIG. 3 is a front elevation view thereof;

FIG. 4 is a rear elevation view thereof;

FIG. 5 is a left side elevation view thereof;

FIG. 6 is a right side elevation view thereof;

FIG. 7 is a top plan view thereof;

FIG. 8 is a bottom plan view thereof;

FIG. 9 is an enlarged view of the portion marked ‘9’ of FIG. 1; and,

FIG. 10 is an enlarged view of the portion marked ‘10’ of FIG. 1.

The broken lines shown in the drawings represent portions of the digimatic micrometer that form no part of the claimed design.

The dot-dash broken lines encircling portions of the digimatic micrometer in FIG. 1 and illustrated in enlarged views in FIGS. 9 and 10 form no part of the claimed design.

Claims

The ornamental design for a digimatic micrometer, as shown and described.

Referenced Cited
U.S. Patent Documents
4578868 April 1, 1986 Sasaki
D429172 August 8, 2000 Reymond
D611371 March 9, 2010 Ohtani
8296966 October 30, 2012 Hayashida
D730212 May 26, 2015 Biselx
D740142 October 6, 2015 Zhang
D744359 December 1, 2015 Biselx
RE47140 November 27, 2018 Biselx
D839759 February 5, 2019 Zhang
10295324 May 21, 2019 Matsumoto
10996043 May 4, 2021 Tsujimoto
11280602 March 22, 2022 Jeon
11821724 November 21, 2023 Matsumoto
Patent History
Patent number: D1061287
Type: Grant
Filed: Jun 8, 2023
Date of Patent: Feb 11, 2025
Assignee: Qinghai Measuring Tools (Changzhou) Co., Ltd (Changzhou)
Inventor: Yunchen Sun (Changzhou)
Primary Examiner: Antoine Duval Davis
Application Number: 29/877,541
Classifications