Micrometer

- Brown & Sharpe Tesa S.A.
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Description

FIG. 1 is a front, perspective view of a first embodiment of said micrometer;

FIG. 2 is a front elevational view of that which is shown in FIG. 1;

FIG. 3 is a rear elevational view of that which is shown in FIG. 1;

FIG. 4 is a top view of that which is shown in FIG. 2;

FIG. 5 is a bottom view of that which is shown in FIG. 2;

FIG. 6 is a left side view of that which is shown in FIG. 2; and,

FIG. 7 is a right side of that which is shown in FIG. 2.

Referenced Cited
U.S. Patent Documents
D334719 April 13, 1993 Yeo
D344240 February 15, 1994 Schnyder
D377912 February 11, 1997 Walser
D386994 December 2, 1997 Reymond
D387690 December 16, 1997 Reymond
D401170 November 17, 1998 Reymond
4578868 April 1, 1986 Sasaki et al.
5383286 January 24, 1995 Kipnes
5433016 July 18, 1995 Tachikake et al.
5477621 December 26, 1995 Koizumi et al.
5495677 March 5, 1996 Tachikake et al.
Foreign Patent Documents
0719999A1 July 1996 EPX
2481441 October 1981 FRX
2703145 September 1994 FRX
3434993 November 1985 DEX
3834306 April 1990 DEX
9005309 U November 1990 DEX
4207142 September 1993 DEX
101636 October 1923 CHX
165061 October 1933 CHX
Other references
  • Patent Abstracts of Japan, vol. 7, No. 224 (p. 227), Oct. 5, 1983.
Patent History
Patent number: D429172
Type: Grant
Filed: Dec 24, 1998
Date of Patent: Aug 8, 2000
Assignee: Brown & Sharpe Tesa S.A.
Inventor: Jean-Claude Reymond (Chavannes-pres-Res-Renes)
Primary Examiner: Antoine Duval Davis
Law Firm: Smith, Gambrell & Russell, LLP
Application Number: 0/98,327
Classifications
Current U.S. Class: Micrometer, Caliper Or Divider Type (D10/73)
International Classification: 1004;