Measuring device for x-ray emission spectrochemical analysis

- RIGAKU CORPORATION
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Description

1. Measuring device for x-ray emission spectrochemical analysis

1.1 : Front perspective view

1.2 : Back perspective view

1.3 : Front

1.4 : Top plan view

1.5 : Back

1.6 : Left

1.7 : Right

1.8 : Bottom

1.9 : Front reference view showing a transparent part

1.10 : Front reference view showing a translucent part

1.11 : Reference view showing a usage state

Claims

The ornamental design for measuring device for x-ray emission spectrochemical analysis as shown.

Referenced Cited
U.S. Patent Documents
3409769 November 1968 Mckinney
4459258 July 10, 1984 Zeits
D973903 December 27, 2022 Gadasi
20090141862 June 4, 2009 Dunham
20220128495 April 28, 2022 Sato
20240288592 August 29, 2024 Yurugi
20250244264 July 31, 2025 Omori
Patent History
Patent number: D1116883
Type: Grant
Filed: Nov 27, 2024
Date of Patent: Mar 10, 2026
Assignee: RIGAKU CORPORATION (Tokyo)
Inventors: Hikari Takahara (Takatsuki), Kenji Ikesaka (Takatsuki), Koichi Aoyagi (Takatsuki), Kazuki Matsufuji (Osaka), Shinya Ikejiri (Osaka)
Primary Examiner: Antoine Duval Davis
Application Number: 35/524,076