Sample tray for analysis device
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Description
The dash-dash broken lines in the drawings depict portions of the sample tray for analysis device that form no part of the claimed design. The dot-dash broken lines illustrate the bounds of the claim and form no part of the claimed design.
Claims
The ornamental design for a sample tray for analysis device as shown and described.
Referenced Cited
U.S. Patent Documents
Other references
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Patent History
Patent number: D1134936
Type: Grant
Filed: Dec 24, 2024
Date of Patent: Jul 14, 2026
Assignee: SHIMADZU CORPORATION (Kyoto)
Inventor: Yuji Tsukamoto (Kyoto)
Primary Examiner: Michael A. Pratt
Assistant Examiner: Bria' L Simmons-Holloway
Application Number: 29/980,491
Type: Grant
Filed: Dec 24, 2024
Date of Patent: Jul 14, 2026
Assignee: SHIMADZU CORPORATION (Kyoto)
Inventor: Yuji Tsukamoto (Kyoto)
Primary Examiner: Michael A. Pratt
Assistant Examiner: Bria' L Simmons-Holloway
Application Number: 29/980,491
Classifications
Current U.S. Class:
Circular Aperture Or Recess (D24/230)