Specimen analysis apparatus
Description
The broken lines depict portions of the specimen analysis apparatus and form no portion of the claimed design.
Claims
The ornamental design for a specimen analysis apparatus as shown and described.
Referenced Cited
U.S. Patent Documents
Other references
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Patent History
Patent number: D1140081
Type: Grant
Filed: Aug 22, 2024
Date of Patent: Aug 4, 2026
Assignee: Arkray, Inc. (Kyoto)
Inventors: Kenya Hara (Tokyo), Chiyong Kim (Chiba), Kanako Ohashi (Tokyo)
Primary Examiner: Mary Shannon Malley
Application Number: 29/958,886
Type: Grant
Filed: Aug 22, 2024
Date of Patent: Aug 4, 2026
Assignee: Arkray, Inc. (Kyoto)
Inventors: Kenya Hara (Tokyo), Chiyong Kim (Chiba), Kanako Ohashi (Tokyo)
Primary Examiner: Mary Shannon Malley
Application Number: 29/958,886
Classifications
Current U.S. Class:
Specimen Handling, Preparation Or Testing (62) (D24/216)