Test card

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Description

FIG. 1 is a front elevational view of a test card showing our new design;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a left side view thereof;

FIG. 4 is a right side view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof; and,

FIG. 7 is a top, front, and left side perspective view thereof.

The broken lines depict portions of the test card that form no part of the claimed design.

Claims

The ornamental design for a test card as shown and described.

Referenced Cited
U.S. Patent Documents
D299860 February 14, 1989 Fan
D792602 July 18, 2017 Meng
D897555 September 29, 2020 Chou
D908914 January 26, 2021 Heron
D915618 April 6, 2021 Heron
D990332 June 27, 2023 Wu
D990334 June 27, 2023 Wu
D1028278 May 21, 2024 Fang
D1053379 December 3, 2024 Shen
D1066725 March 11, 2025 Wu
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D1116153 March 3, 2026 Rao
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Foreign Patent Documents
15114501-0005 August 2025 EM
6466992 September 2025 GB
Patent History
Patent number: D1153777
Type: Grant
Filed: Nov 13, 2025
Date of Patent: Oct 13, 2026
Inventors: Jianqiu Fang (Houston, TX), Siyu Lei (Huzhou), Ying Zhang (Huzhou), Lili Shen (Huzhou)
Primary Examiner: Rebekah A Caruso
Application Number: 30/032,601