Test device

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Description

FIG. 1 is a top front perspective view of a test device according to the present design;

FIG. 2 is a bottom perspective view of the test device of FIG. 1;

FIG. 3 is a top view of the test device of FIG. 1;

FIG. 4 is a bottom view of the test device of FIG. 1;

FIG. 5 is a left view of the test device of FIG. 1;

FIG. 6 is a back view of the test device of FIG. 1;

FIG. 7 is a front view of the test device of FIG. 1;

FIG. 8 is a top perspective view of the test device of FIG. 1 with a cover; and,

FIG. 9 is a bottom perspective view of the test device of FIG. 1 with a cover.

Claims

The ornamental design for a test device, as shown and described.

Referenced Cited
U.S. Patent Documents
8691147 April 8, 2014 Leck
D907243 January 5, 2021 Sekiguchi
Patent History
Patent number: D990334
Type: Grant
Filed: Mar 23, 2022
Date of Patent: Jun 27, 2023
Assignee: HANGZHOU BIOTEST BIOTECH CO., LTD. (Zhejiang)
Inventors: John Wu (San Diego, CA), Liang Hong (Hangzhou), Lorraine Cogan (San Diego, CA), Yangyu Zhu (San Diego, CA), Shujiang Wu (Hangzhou)
Primary Examiner: Antoine Duval Davis
Application Number: 29/831,880