Darkroom exposure meter and densitometer

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Description

FIG. 1 is a front perspective view of a darkroom exposure meter and densitometer showing my new design;

FIG. 2 is a right side elevational view thereof;

FIG. 3 is a left side elevational view thereof;

FIG. 4 is a back side elevational view thereof;

FIG. 5 is a bottom plan view thereof.

Referenced Cited
U.S. Patent Documents
D235786 July 1975 Zaccai
2333759 November 1943 Akelaitis
2879691 March 1959 Faulhaber
3074312 January 1963 Olson
3565535 February 1971 Monell
3814523 June 1974 Abe
Patent History
Patent number: D246461
Type: Grant
Filed: Feb 6, 1976
Date of Patent: Nov 22, 1977
Inventor: Darwin E. Chapman (Palo Alto, CA)
Primary Examiner: Wallace R. Burke
Assistant Examiner: Catherine Kemper
Attorney: William M. Hobby
Application Number: 5/655,825
Classifications
Current U.S. Class: D16/39
International Classification: D1605;