Instrument cart
Latest Tektronix, Inc. Patents:
- Automating PCIe 6.0 tx equalizer calibration using a multivariable approach
- System and method for high performance distribution of large waveform captures to multiple viewers
- Integrated development environment for protocol design, evaluation and debugging
- Eye classes separator with overlay, and composite, and dynamic eye-trigger for humans and machine learning
- Analog signal isolator
Description
FIG. 1 is a front perspective view of the instrument cart showing our new design; and
FIG. 2 is a rear perspective view thereof.
Referenced Cited
U.S. Patent Documents
D192792 | May 1962 | Morris |
2992833 | July 1961 | Hoedinghaus |
Patent History
Patent number: D247169
Type: Grant
Filed: Jul 14, 1976
Date of Patent: Feb 7, 1978
Assignee: Tektronix, Inc.
Inventors: Phillip Weston Sheeley (Aloha, OR), Howard Michael Meehan (Portland, OR)
Primary Examiner: Wallace R. Burke
Assistant Examiner: James M. Gandy
Attorney: Kenneth M. Durk
Application Number: 5/705,238
Type: Grant
Filed: Jul 14, 1976
Date of Patent: Feb 7, 1978
Assignee: Tektronix, Inc.
Inventors: Phillip Weston Sheeley (Aloha, OR), Howard Michael Meehan (Portland, OR)
Primary Examiner: Wallace R. Burke
Assistant Examiner: James M. Gandy
Attorney: Kenneth M. Durk
Application Number: 5/705,238
Classifications
Current U.S. Class:
D12/29
International Classification: D1202;
International Classification: D1202;